A framework for generalized group testing with inhibitors and its potential application in neuroscience

The main goal of group testing with inhibitors (GTI) is to efficiently identify a small number of defective items and inhibitor items in a large set of items. A test on a subset of items is positive if the subset satisfies some specific properties. Inhibitor items cancel the effects of defective items, which often make the outcome of a test containing defective items negative. Different GTI models can be formulated by considering how specific properties have different cancellation effects. This work introduces generalized GTI (GGTI) in which a new type of items is added, i.e., hybrid items. A hybrid item plays the roles of both defectives items and inhibitor items. Since the number of instances of GGTI is large (more than 7 million), we introduce a framework for classifying all types of items non-adaptively, i.e., all tests are designed in advance. We then explain how GGTI can be used to classify neurons in neuroscience. Finally, we show how to realize our proposed scheme in practice

Efficiently Decodable Non-Adaptive Threshold Group Testing

We consider non-adaptive threshold group testing for identification of up to $d$ defective items in a set of $n$ items, where a test is positive if it contains at least $2 \leq u \leq d$ defective items, and negative otherwise. The defective items can be identified using $t = O \left( \left( \frac{d}{u} \right)^u \left( \frac{d}{d - u} \right)^{d-u} \left(u \log{\frac{d}{u}} + \log{\frac{1}{\epsilon}} \right) \cdot d^2 \log{n} \right)$ tests with probability at least $1 - \epsilon$ for any $\epsilon > 0$ or $t = O \left( \left( \frac{d}{u} \right)^u \left( \frac{d}{d -u} \right)^{d - u} d^3 \log{n} \cdot \log{\frac{n}{d}} \right)$ tests with probability 1. The decoding time is $t \times \mathrm{poly}(d^2 \log{n})$. This result significantly improves the best known results for decoding non-adaptive threshold group testing: $O(n\log{n} + n \log{\frac{1}{\epsilon}})$ for probabilistic decoding, where $\epsilon > 0$, and $O(n^u \log{n})$ for deterministic decoding

Group testing:an information theory perspective

The group testing problem concerns discovering a small number of defective items within a large population by performing tests on pools of items. A test is positive if the pool contains at least one defective, and negative if it contains no defectives. This is a sparse inference problem with a combinatorial flavour, with applications in medical testing, biology, telecommunications, information technology, data science, and more. In this monograph, we survey recent developments in the group testing problem from an information-theoretic perspective. We cover several related developments: efficient algorithms with practical storage and computation requirements, achievability bounds for optimal decoding methods, and algorithm-independent converse bounds. We assess the theoretical guarantees not only in terms of scaling laws, but also in terms of the constant factors, leading to the notion of the {\em rate} of group testing, indicating the amount of information learned per test. Considering both noiseless and noisy settings, we identify several regimes where existing algorithms are provably optimal or near-optimal, as well as regimes where there remains greater potential for improvement. In addition, we survey results concerning a number of variations on the standard group testing problem, including partial recovery criteria, adaptive algorithms with a limited number of stages, constrained test designs, and sublinear-time algorithms.Comment: Survey paper, 140 pages, 19 figures. To be published in Foundations and Trends in Communications and Information Theor

Review : Deep learning in electron microscopy

Deep learning is transforming most areas of science and technology, including electron microscopy. This review paper offers a practical perspective aimed at developers with limited familiarity. For context, we review popular applications of deep learning in electron microscopy. Following, we discuss hardware and software needed to get started with deep learning and interface with electron microscopes. We then review neural network components, popular architectures, and their optimization. Finally, we discuss future directions of deep learning in electron microscopy