Dual-tree Complex Wavelet Transform based Local Binary Pattern Weighted Histogram Method for Palmprint Recognition

In the paper, we improve the Local Binary Pattern Histogram (LBPH) approach and combine it with Dual-Tree Complex Wavelet Transform (DT-CWT) to propose a Dual-Tree Complex Wavelet Transform based Local Binary Pattern Weighted Histogram (DT-CWT based LBPWH) method for palmprint representation and recognition. The approximate shift invariant property of the DT-CWT and its good directional selectively in 2D make it a very appealing choice for palmprint representation. LBPH is a powerful texture description method, which considers both shape and texture information to represent an image. To enhance the representation capability of LBPH, a weight set is computed and assigned to the finial feature histogram. Here we needn't construct a palmprint model by a train sample set, which is not like some methods based on subspace discriminant analysis or statistical learning. In the approach, a palmprint image is first decomposed into multiple subbands by using DT-CWT. After that, each subband in complex wavelet domain is divided into non-overlapping sub-regions. Then LBPHs are extracted from each sub-region in each subband, and lastly, all of LBPHs are weighted and concatenated into a single feature histogram to effectively represent the palmprint image. A Chi square distance is used to measure the similarity of different feature histograms and the finial recognition is performed by the nearest neighborhood classifier. A group of optimal parameters is chosen by 20 verification tests on our palmprint database. In addition, the recognition results on our palmprint database and the database from the Hong Kong Polytechnic University show the proposed method outperforms other methods

A VISION-BASED QUALITY INSPECTION SYSTEM FOR FABRIC DEFECT DETECTION AND CLASSIFICATION

Published ThesisQuality inspection of textile products is an important issue for fabric manufacturers. It is desirable to produce the highest quality goods in the shortest amount of time possible. Fabric faults or defects are responsible for nearly 85% of the defects found by the garment industry. Manufacturers recover only 45 to 65% of their profits from second or off-quality goods. There is a need for reliable automated woven fabric inspection methods in the textile industry. Numerous methods have been proposed for detecting defects in textile. The methods are generally grouped into three main categories according to the techniques they use for texture feature extraction, namely statistical approaches, spectral approaches and model-based approaches. In this thesis, we study one method from each category and propose their combinations in order to get improved fabric defect detection and classification accuracy. The three chosen methods are the grey level co-occurrence matrix (GLCM) from the statistical category, the wavelet transform from the spectral category and the Markov random field (MRF) from the model-based category. We identify the most effective texture features for each of those methods and for different fabric types in order to combine them. Using GLCM, we identify the optimal number of features, the optimal quantisation level of the original image and the optimal intersample distance to use. We identify the optimal GLCM features for different types of fabrics and for three different classifiers. Using the wavelet transform, we compare the defect detection and classification performance of features derived from the undecimated discrete wavelet and those derived from the dual-tree complex wavelet transform. We identify the best features for different types of fabrics. Using the Markov random field, we study the performance for fabric defect detection and classification of features derived from different models of Gaussian Markov random fields of order from 1 through 9. For each fabric type we identify the best model order. Finally, we propose three combination schemes of the best features identified from the three methods and study their fabric detection and classification performance. They lead generally to improved performance as compared to the individual methods, but two of them need further improvement

IRDO: Iris Recognition by Fusion of DTCWT and OLBP

Iris Biometric is a physiological trait of human beings. In this paper, we propose Iris an Recognition using Fusion of Dual Tree Complex Wavelet Transform (DTCWT) and Over Lapping Local Binary Pattern (OLBP) Features. An eye is preprocessed to extract the iris part and obtain the Region of Interest (ROI) area from an iris. The complex wavelet features are extracted for region from the Iris DTCWT. OLBP is further applied on ROI to generate features of magnitude coefficients. The resultant features are generated by fusing DTCWT and OLBP using arithmetic addition. The Euclidean Distance (ED) is used to compare test iris with database iris features to identify a person. It is observed that the values of Total Success Rate (TSR) and Equal Error Rate (EER) are better in the case of proposed IRDO compared to the state-of-the art technique

Hybrid Discrete Wavelet Transform and Gabor Filter Banks Processing for Features Extraction from Biomedical Images

A new methodology for automatic feature extraction from biomedical images and subsequent classification is presented. The approach exploits the spatial orientation of high-frequency textural features of the processed image as determined by a two-step process. First, the two-dimensional discrete wavelet transform(DWT) is applied to obtain the HH high-frequency subband image. Then, a Gabor filter bank is applied to the latter at different frequencies and spatial orientations to obtain new Gabor-filtered image whose entropy and uniformity are computed. Finally, the obtained statistics are fed to a support vector machine (SVM) binary classifier. The approach was validated on mammograms, retina, and brain magnetic resonance (MR) images.The obtained classification accuracies show better performance in comparison to common approaches that use only the DWT or Gabor filter banks for feature extraction

Classification of EMI discharge sources using time–frequency features and multi-class support vector machine

This paper introduces the first application of feature extraction and machine learning to Electromagnetic Interference (EMI) signals for discharge sources classification in high voltage power generating plants. This work presents an investigation on signals that represent different discharge sources, which are measured using EMI techniques from operating electrical machines within power plant. The analysis involves Time-Frequency image calculation of EMI signals using General Linear Chirplet Analysis (GLCT) which reveals both time and frequency varying characteristics. Histograms of uniform Local Binary Patterns (LBP) are implemented as a feature reduction and extraction technique for the classification of discharge sources using Multi-Class Support Vector Machine (MCSVM). The novelty that this paper introduces is the combination of GLCT and LBP applications to develop a new feature extraction algorithm applied to EMI signals classification. The proposed algorithm is demonstrated to be successful with excellent classification accuracy being achieved. For the first time, this work transfers expert's knowledge on EMI faults to an intelligent system which could potentially be exploited to develop an automatic condition monitoring system

Pattern Recognition

Pattern recognition is a very wide research field. It involves factors as diverse as sensors, feature extraction, pattern classification, decision fusion, applications and others. The signals processed are commonly one, two or three dimensional, the processing is done in real- time or takes hours and days, some systems look for one narrow object class, others search huge databases for entries with at least a small amount of similarity. No single person can claim expertise across the whole field, which develops rapidly, updates its paradigms and comprehends several philosophical approaches. This book reflects this diversity by presenting a selection of recent developments within the area of pattern recognition and related fields. It covers theoretical advances in classification and feature extraction as well as application-oriented works. Authors of these 25 works present and advocate recent achievements of their research related to the field of pattern recognition