Comparison of Stochastic Methods for the Variability Assessment of Technology Parameters

This paper provides and compares two alternative solutions for the simulation of cables and interconnects with the inclusion of the effects of parameter uncertainties, namely the Polynomial Chaos (PC) method and the Response Surface Modeling (RSM). The problem formulation applies to the telegraphers equations with stochastic coefficients. According to PC, the solution requires an expansion of the unknown parameters in terms of orthogonal polynomials of random variables. On the contrary, RSM is based on a least-square polynomial fitting of the system response. The proposed methods offer accuracy and improved efficiency in computing the parameter variability effects on system responses with respect to the conventional Monte Carlo approach. These approaches are validated by means of the application to the stochastic analysis of a commercial multiconductor flat cable. This analysis allows us to highlight the respective advantages and disadvantages of the presented method

Worst-Case Analysis of Electrical and Electronic Equipment via Affine Arithmetic

In the design and fabrication process of electronic equipment, there are many unkown parameters which significantly affect the product performance. Some uncertainties are due to manufacturing process fluctuations, while others due to the environment such as operating temperature, voltage, and various ambient aging stressors. It is desirable to consider these uncertainties to ensure product performance, improve yield, and reduce design cost. Since direct electromagnetic compatibility measurements impact on both cost and time-to-market, there has been a growing demand for the availability of tools enabling the simulation of electrical and electronic equipment with the inclusion of the effects of system uncertainties. In this framework, the assessment of device response is no longer regarded as deterministic but as a random process. It is traditionally analyzed using the Monte Carlo or other sampling-based methods. The drawback of the above methods is large number of required samples to converge, which are time-consuming for practical applications. As an alternative, the inherent worst-case approaches such as interval analysis directly provide an estimation of the true bounds of the responses. However, such approaches might provide unnecessarily strict margins, which are very unlikely to occur. A recent technique, affine arithmetic, advances the interval based methods by means of handling correlated intervals. However, it still leads to over-conservatism due to the inability of considering probability information. The objective of this thesis is to improve the accuracy of the affine arithmetic and broaden its application in frequency-domain analysis. We first extend the existing literature results to the efficient time-domain analysis of lumped circuits considering the uncertainties. Then we provide an extension of the basic affine arithmetic to the frequency-domain simulation of circuits. Classical tools for circuit analysis are used within a modified affine framework accounting for complex algebra and uncertainty interval partitioning for the accurate and efficient computation of the worst case bounds of the responses of both lumped and distributed circuits. The performance of the proposed approach is investigated through extensive simulations in several case studies. The simulation results are compared with the Monte Carlo method in terms of both simulation time and accuracy

Biological Networks

Networks of coordinated interactions among biological entities govern a myriad of biological functions that span a wide range of both length and time scales—from ecosystems to individual cells and from years to milliseconds. For these networks, the concept “the whole is greater than the sum of its parts” applies as a norm rather than an exception. Meanwhile, continued advances in molecular biology and high-throughput technology have enabled a broad and systematic interrogation of whole-cell networks, allowing the investigation of biological processes and functions at unprecedented breadth and resolution—even down to the single-cell level. The explosion of biological data, especially molecular-level intracellular data, necessitates new paradigms for unraveling the complexity of biological networks and for understanding how biological functions emerge from such networks. These paradigms introduce new challenges related to the analysis of networks in which quantitative approaches such as machine learning and mathematical modeling play an indispensable role. The Special Issue on “Biological Networks” showcases advances in the development and application of in silico network modeling and analysis of biological systems

Harnessing machine learning for fiber-induced nonlinearity mitigation in long-haul coherent optical OFDM

© 2018 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).Coherent optical orthogonal frequency division multiplexing (CO-OFDM) has attracted a lot of interest in optical fiber communications due to its simplified digital signal processing (DSP) units, high spectral-efficiency, flexibility, and tolerance to linear impairments. However, CO-OFDM’s high peak-to-average power ratio imposes high vulnerability to fiber-induced non-linearities. DSP-based machine learning has been considered as a promising approach for fiber non-linearity compensation without sacrificing computational complexity. In this paper, we review the existing machine learning approaches for CO-OFDM in a common framework and review the progress in this area with a focus on practical aspects and comparison with benchmark DSP solutions.Peer reviewe

How affine arithmetic helps beat uncertainties in electrical systems

The ever-increasing impact of uncertainties in electronic circuits and systems is requiring the development of robust design tools capable of taking this inherent variability into account. Due to the computational inefficiency of repeated design trials, there has been a growing demand for smart simulation tools that can inherently and effectively capture the results of parameter variations on the system responses. To improve product performance, improve yield and reduce design cost, it is particularly relevant for the designer to be able to estimate worst-case responses. Within this framework, the article addresses the worst-case simulation of lumped and distributed electrical circuits. The application of interval-based methods, like interval analysis, Taylor models and affine arithmetic, is discussed and compared. The article reviews in particular the application of the affine arithmetic to complex algebra and fundamental matrix operations for the numerical frequency-domain simulation. A comprehensive and unambiguous discussion appears in fact to be missing in the available literature. The affine arithmetic turns out to be accurate and more efficient than traditional solutions based on Monte Carlo analysis. A selection of relevant examples, ranging from linear lumped circuits to distributed transmission-line structures, is used to illustrate this technique