Plug & Test at System Level via Testable TLM Primitives

With the evolution of Electronic System Level (ESL) design methodologies, we are experiencing an extensive use of Transaction-Level Modeling (TLM). TLM is a high-level approach to modeling digital systems where details of the communication among modules are separated from the those of the implementation of functional units. This paper represents a first step toward the automatic insertion of testing capabilities at the transaction level by definition of testable TLM primitives. The use of testable TLM primitives should help designers to easily get testable transaction level descriptions implementing what we call a "Plug & Test" design methodology. The proposed approach is intended to work both with hardware and software implementations. In particular, in this paper we will focus on the design of a testable FIFO communication channel to show how designers are given the freedom of trading-off complexity, testability levels, and cos

Using formal methods to support testing

Formal methods and testing are two important approaches that assist in the development of high quality software. While traditionally these approaches have been seen as rivals, in recent years a new consensus has developed in which they are seen as complementary. This article reviews the state of the art regarding ways in which the presence of a formal specification can be used to assist testing

Relative timing

Journal ArticleRelative Timing is introduced as an informal method for aggressive asynchronous design. It is demonstrated on three example circuits (C-Element, FIFO, and RAPPID Tag Unit), facilitating transformations from speed-independent circuits to burst-mode, relative timed, and pulse-mode circuits. Relative timing enables improved performance, area, power and testability in all three cases

08351 Abstracts Collection -- Evolutionary Test Generation

From September 24th to September 29th 2008 the Dagstuhl Seminar 08351 ``Evolutionary Test Generation \u27\u27 was held in Schloss Dagstuhl~--~Leibniz Center for Informatics. During the seminar, several participants presented their current research, and ongoing work and open problems were discussed. Abstracts of the presentations given during the seminar as well as abstracts of seminar results and ideas are put together in this paper. The first section describes the seminar topics and goals in general. Links to extended abstracts or full papers are provided, if available

Self-timed design in GaAs - case study of a high-speed parallel multiplier

Journal ArticleAbstract-The problems with synchronous designs at high clock frequencies have been well documented. This makes an asynchronous approach attractive for high speed technologies like GaAs. We investigate the issues involved by describing the design of a parallel multiplier that can be part of a floating point multiplier. We first present a new architecture called the partial army of array (PAA) that is more regular than a partial tree approach while having the same latency. We then show how this architecture can be used in a self-timed implementation in the style of micropipelines. We next describe how we can design the final carry propagate adder using a new precharged logic family in GaAs that we developed as part of this project. We conclude with some genera1 observations on doing asynchronous design in GaAs

Using genetic algorithms to generate test sequences for complex timed systems

The generation of test data for state based specifications is a computationally expensive process. This problem is magnified if we consider that time con- straints have to be taken into account to govern the transitions of the studied system. The main goal of this paper is to introduce a complete methodology, sup- ported by tools, that addresses this issue by represent- ing the test data generation problem as an optimisa- tion problem. We use heuristics to generate test cases. In order to assess the suitability of our approach we consider two different case studies: a communication protocol and the scientific application BIPS3D. We give details concerning how the test case generation problem can be presented as a search problem and automated. Genetic algorithms (GAs) and random search are used to generate test data and evaluate the approach. GAs outperform random search and seem to scale well as the problem size increases. It is worth to mention that we use a very simple fitness function that can be eas- ily adapted to be used with other evolutionary search techniques

An empirical investigation into branch coverage for C programs using CUTE and AUSTIN

Automated test data generation has remained a topic of considerable interest for several decades because it lies at the heart of attempts to automate the process of Software Testing. This paper reports the results of an empirical study using the dynamic symbolic-execution tool. CUTE, and a search based tool, AUSTIN on five non-trivial open source applications. The aim is to provide practitioners with an assessment of what can be achieved by existing techniques with little or no specialist knowledge and to provide researchers with baseline data against which to measure subsequent work. To achieve this, each tool is applied 'as is', with neither additional tuning nor supporting harnesses and with no adjustments applied to the subject programs under test. The mere fact that these tools can be applied 'out of the box' in this manner reflects the growing maturity of Automated test data generation. However, as might be expected, the study reveals opportunities for improvement and suggests ways to hybridize these two approaches that have hitherto been developed entirely independently. (C) 2010 Elsevier Inc. All rights reserved

Doctor of Philosophy

dissertationThe design of integrated circuit (IC) requires an exhaustive verification and a thorough test mechanism to ensure the functionality and robustness of the circuit. This dissertation employs the theory of relative timing that has the advantage of enabling designers to create designs that have significant power and performance over traditional clocked designs. Research has been carried out to enable the relative timing approach to be supported by commercial electronic design automation (EDA) tools. This allows asynchronous and sequential designs to be designed using commercial cad tools. However, two very significant holes in the flow exist: the lack of support for timing verification and manufacturing test. Relative timing (RT) utilizes circuit delay to enforce and measure event sequencing on circuit design. Asynchronous circuits can optimize power-performance product by adjusting the circuit timing. A thorough analysis on the timing characteristic of each and every timing path is required to ensure the robustness and correctness of RT designs. All timing paths have to conform to the circuit timing constraints. This dissertation addresses back-end design robustness by validating full cyclical path timing verification with static timing analysis and implementing design for testability (DFT). Circuit reliability and correctness are necessary aspects for the technology to become commercially ready. In this study, scan-chain, a commercial DFT implementation, is applied to burst-mode RT designs. In addition, a novel testing approach is developed along with scan-chain to over achieve 90% fault coverage on two fault models: stuck-at fault model and delay fault model. This work evaluates the cost of DFT and its coverage trade-off then determines the best implementation. Designs such as a 64-point fast Fourier transform (FFT) design, an I2C design, and a mixed-signal design are built to demonstrate power, area, performance advantages of the relative timing methodology and are used as a platform for developing the backend robustness. Results are verified by performing post-silicon timing validation and test. This work strengthens overall relative timed circuit flow, reliability, and testability