Traveling Salesman Problem

This book is a collection of current research in the application of evolutionary algorithms and other optimal algorithms to solving the TSP problem. It brings together researchers with applications in Artificial Immune Systems, Genetic Algorithms, Neural Networks and Differential Evolution Algorithm. Hybrid systems, like Fuzzy Maps, Chaotic Maps and Parallelized TSP are also presented. Most importantly, this book presents both theoretical as well as practical applications of TSP, which will be a vital tool for researchers and graduate entry students in the field of applied Mathematics, Computing Science and Engineering

Dynamic analysis of synchronous machine using neural network based characterization clustering and pattern recognition

Synchronous generators form the principal source of electric energy in power systems. Dynamic analysis for transient condition of a synchronous machine is done under different fault conditions. Synchronous machine models are simulated numerically based on mathematical models where saturation on main flux was ignored in one model and taken into account in another. The developed models were compared and scrutinized for transient conditions under different kind of faults – loss of field (LOF), disturbance in torque (DIT) & short circuit (SC). The simulation was done for LOF and DIT for different levels of fault and time durations, whereas, for SC simulation was done for different time durations. The model is also scrutinized for stability stipulations. Based on the synchronous machine model, a neural network model of synchronous machine is developed using neural network based characterization. The model is trained to approximate different transient conditions; such as – loss of field, disturbance in torque and short circuit conditions. In the case of multiple or mixture of different kinds of faults, neural network based clustering is used to distinguish and identify specific fault conditions by looking at the behaviour of the load angle. By observing the weight distribution pattern of the Self Organizing Map (SOM) space, specific kinds of faults is recognized. Neural network patter identification is used to identify and specify unknown fault patterns. Once the faults are identified neural network pattern identification is used to recognize and indicate the level or time duration of the fault

Center for Space Microelectronics Technology

The 1990 technical report of the Jet Propulsion Laboratory Center for Space Microelectronics Technology summarizes the technical accomplishments, publications, presentations, and patents of the center during 1990. The report lists 130 publications, 226 presentations, and 87 new technology reports and patents