Soft Error Effects on Arm Microprocessors: Early Estimations versus Chip Measurements

Extensive research efforts are being carried out to evaluate and improve the reliability of computing devices either through beam experiments or simulation-based fault injection. Unfortunately, it is still largely unclear to which extend fault injection can provide an accurate error rate estimation at early stages and if beam experiments can be used to identify the weakest resources in a device. The importance and challenges associated with a timely, but yet realistic reliability evaluation grow with the increase of complexity in both the hardware domain, with the integration of different types of cores in an SoC (System-on-Chip), and the software domain, with the OS (operating system) required to take full advantage of the available resources. In this paper, we combine and analyze data gathered with extensive beam experiments (on the final physical CPU hardware) and microarchitectural fault injections (on early microarchitectural CPU models). We target a standalone Arm Cortex-A5 CPU and an Arm Cortex-A9 CPU integrated into an SoC and evaluate their reliability in bare-metal and Linux-based configurations. Combining experimental data that covers more than 18 million years of device time with the result of more than 176,000 injections we find that both the SoC integration and the presence of the OS increase the system DUEs (Detected Unrecoverable Errors) rate (for different reasons) but do not significantly impact the SDCs (Silent Data Corruptions) rate which is solely attributed to the CPU core. Our reliability analysis demonstrates that even considering SoC integration and OS inclusion, early, pre-silicon microarchitecture-level fault injection delivers accurate SDC rates estimations and lower bounds for the DUE rates

Real-time trace decoding and monitoring for safety and security in embedded systems

Integrated circuits and systems can be found almost everywhere in today’s world. As their use increases, they need to be made safer and more perfor mant to meet current demands in processing power. FPGA integrated SoCs can provide the ideal trade-off between performance, adaptability, and energy usage. One of today’s vital challenges lies in updating existing fault tolerance techniques for these new systems while utilizing all available processing capa bilities, such as multi-core and heterogeneous processing units. Control-flow monitoring is one of the primary mechanisms described for error detection at the software architectural level for the highest grade of hazard level clas sifications (e.g., ASIL D) described in industry safety standards ISO-26262. Control-flow errors are also known to compose the majority of detected errors for ICs and embedded systems in safety-critical and risk-susceptible environ ments [5]. Software-based monitoring methods remain the most popular [6–8]. However, recent studies show that the overheads they impose make actual reliability gains negligible [9, 10]. This work proposes and demonstrates a new control flow checking method implemented in FPGA for multi-core embedded systems called control-flow trace checker (CFTC). CFTC uses existing trace and debug subsystems of modern processors to rebuild their execution states. It can iden tify any errors in real-time by comparing executed states to a set of permitted state transitions determined statically. This novel implementation weighs hardware resource trade-offs to target mul tiple independent tasks in multi-core embedded applications, as well as single core systems. The proposed system is entirely implemented in hardware and isolated from all monitored software components, requiring 2.4% of the target FPGA platform resources to protect an execution unit in its entirety. There fore, it avoids undesired overheads and maintains deterministic error detection latencies, which guarantees reliability improvements without impairing the target software system. Finally, CFTC is evaluated under different software i Resumo fault-injection scenarios, achieving detection rates of 100% of all control-flow errors to wrong destinations and 98% of all injected faults to program binaries. All detection times are further analyzed and precisely described by a model based on the monitor’s resources and speed and the software application’s control-flow structure and binary characteristics.Circuitos integrados estão presentes em quase todos sistemas complexos do mundo moderno. Conforme sua frequência de uso aumenta, eles precisam se tornar mais seguros e performantes para conseguir atender as novas demandas em potência de processamento. Sistemas em Chip integrados com FPGAs conseguem prover o balanço perfeito entre desempenho, adaptabilidade, e uso de energia. Um dos maiores desafios agora é a necessidade de atualizar técnicas de tolerância à falhas para estes novos sistemas, aproveitando os novos avanços em capacidade de processamento. Monitoramento de fluxo de controle é um dos principais mecanismos para a detecção de erros em nível de software para sistemas classificados como de alto risco (e.g. ASIL D), descrito em padrões de segurança como o ISO-26262. Estes erros são conhecidos por compor a maioria dos erros detectados em sistemas integrados [5]. Embora métodos de monitoramento baseados em software continuem sendo os mais populares [6–8], estudos recentes mostram que seus custos adicionais, em termos de performance e área, diminuem consideravelmente seus ganhos reais em confiabilidade [9, 10]. Propomos aqui um novo método de monitora mento de fluxo de controle implementado em FPGA para sistemas embarcados multi-core. Este método usa subsistemas de trace e execução de código para reconstruir o estado atual do processador, identificando erros através de com parações entre diferentes estados de execução da CPU. Propomos uma implementação que considera trade-offs no uso de recuros de sistema para monitorar múltiplas tarefas independetes. Nossa abordagem suporta o monitoramento de sistemas simples e também de sistemas multi-core multitarefa. Por fim, nossa técnica é totalmente implementada em hardware, evitando o uso de unidades de processamento de software que possa adicionar custos indesejáveis à aplicação em perda de confiabilidade. Propomos, assim, um mecanismo de verificação de fluxo de controle, escalável e extensível, para proteção de sistemas embarcados críticos e multi-core

Real-Time Trace Decoding and Monitoring for Safety and Security in Embedded Systems

Integrated circuits and systems can be found almost everywhere in today’s world. As their use increases, they need to be made safer and more perfor mant to meet current demands in processing power. FPGA integrated SoCs can provide the ideal trade-off between performance, adaptability, and energy usage. One of today’s vital challenges lies in updating existing fault tolerance techniques for these new systems while utilizing all available processing capa bilities, such as multi-core and heterogeneous processing units. Control-flow monitoring is one of the primary mechanisms described for error detection at the software architectural level for the highest grade of hazard level clas sifications (e.g., ASIL D) described in industry safety standards ISO-26262. Control-flow errors are also known to compose the majority of detected errors for ICs and embedded systems in safety-critical and risk-susceptible environ ments [5]. Software-based monitoring methods remain the most popular [6–8]. However, recent studies show that the overheads they impose make actual reliability gains negligible [9, 10]. This work proposes and demonstrates a new control flow checking method implemented in FPGA for multi-core embedded systems called control-flow trace checker (CFTC). CFTC uses existing trace and debug subsystems of modern processors to rebuild their execution states. It can iden tify any errors in real-time by comparing executed states to a set of permitted state transitions determined statically. This novel implementation weighs hardware resource trade-offs to target mul tiple independent tasks in multi-core embedded applications, as well as single core systems. The proposed system is entirely implemented in hardware and isolated from all monitored software components, requiring 2.4% of the target FPGA platform resources to protect an execution unit in its entirety. There fore, it avoids undesired overheads and maintains deterministic error detection latencies, which guarantees reliability improvements without impairing the target software system. Finally, CFTC is evaluated under different software i Resumo fault-injection scenarios, achieving detection rates of 100% of all control-flow errors to wrong destinations and 98% of all injected faults to program binaries. All detection times are further analyzed and precisely described by a model based on the monitor’s resources and speed and the software application’s control-flow structure and binary characteristics.Circuitos integrados estão presentes em quase todos sistemas complexos do mundo moderno. Conforme sua frequência de uso aumenta, eles precisam se tornar mais seguros e performantes para conseguir atender as novas demandas em potência de processamento. Sistemas em Chip integrados com FPGAs conseguem prover o balanço perfeito entre desempenho, adaptabilidade, e uso de energia. Um dos maiores desafios agora é a necessidade de atualizar técnicas de tolerância à falhas para estes novos sistemas, aproveitando os novos avanços em capacidade de processamento. Monitoramento de fluxo de controle é um dos principais mecanismos para a detecção de erros em nível de software para sistemas classificados como de alto risco (e.g. ASIL D), descrito em padrões de segurança como o ISO-26262. Estes erros são conhecidos por compor a maioria dos erros detectados em sistemas integrados [5]. Embora métodos de monitoramento baseados em software continuem sendo os mais populares [6–8], estudos recentes mostram que seus custos adicionais, em termos de performance e área, diminuem consideravelmente seus ganhos reais em confiabilidade [9, 10]. Propomos aqui um novo método de monitora mento de fluxo de controle implementado em FPGA para sistemas embarcados multi-core. Este método usa subsistemas de trace e execução de código para reconstruir o estado atual do processador, identificando erros através de com parações entre diferentes estados de execução da CPU. Propomos uma implementação que considera trade-offs no uso de recuros de sistema para monitorar múltiplas tarefas independetes. Nossa abordagem suporta o monitoramento de sistemas simples e também de sistemas multi-core multitarefa. Por fim, nossa técnica é totalmente implementada em hardware, evitando o uso de unidades de processamento de software que possa adicionar custos indesejáveis à aplicação em perda de confiabilidade. Propomos, assim, um mecanismo de verificação de fluxo de controle, escalável e extensível, para proteção de sistemas embarcados críticos e multi-core

Efficient Fault Injection based on Dynamic HDL Slicing Technique

This work proposes a fault injection methodology where Hardware Description Language (HDL) code slicing is exploited to prune fault injection locations, thus enabling more efficient campaigns for safety mechanisms evaluation. In particular, the dynamic HDL slicing technique provides for a highly collapsed critical fault list and allows avoiding injections at redundant locations or time-steps. Experimental results show that the proposed methodology integrated into commercial tool flow doubles the simulation speed when comparing to the state-of-the-art industrial-grade EDA tool flows.Comment: arXiv admin note: substantial text overlap with arXiv:2001.0998

SyRA: early system reliability analysis for cross-layer soft errors resilience in memory arrays of microprocessor systems

© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.Cross-layer reliability is becoming the preferred solution when reliability is a concern in the design of a microprocessor-based system. Nevertheless, deciding how to distribute the error management across the different layers of the system is a very complex task that requires the support of dedicated frameworks for cross-layer reliability analysis. This paper proposes SyRA, a system-level cross-layer early reliability analysis framework for radiation induced soft errors in memory arrays of microprocessor-based systems. The framework exploits a multi-level hybrid Bayesian model to describe the target system and takes advantage of Bayesian inference to estimate different reliability metrics. SyRA implements several mechanisms and features to deal with the complexity of realistic models and implements a complete tool-chain that scales efficiently with the complexity of the system. The simulation time is significantly lower than micro-architecture level or RTL fault-injection experiments with an accuracy high enough to take effective design decisions. To demonstrate the capability of SyRA, we analyzed the reliability of a set of microprocessor-based systems characterized by different microprocessor architectures (i.e., Intel x86, ARM Cortex-A15, ARM Cortex-A9) running both the Linux operating system or bare metal. Each system under analysis executes different software workloads both from benchmark suites and from real applications.Peer ReviewedPostprint (author's final draft

Error Detection and Diagnosis for System-on-Chip in Space Applications

Tesis por compendio de publicacionesLos componentes electrónicos comerciales, comúnmente llamados componentes Commercial-Off-The-Shelf (COTS) están presentes en multitud de dispositivos habituales en nuestro día a día. Particularmente, el uso de microprocesadores y sistemas en chip (SoC) altamente integrados ha favorecido la aparición de dispositivos electrónicos cada vez más inteligentes que sostienen el estilo de vida y el avance de la sociedad moderna. Su uso se ha generalizado incluso en aquellos sistemas que se consideran críticos para la seguridad, como vehículos, aviones, armamento, dispositivos médicos, implantes o centrales eléctricas. En cualquiera de ellos, un fallo podría tener graves consecuencias humanas o económicas. Sin embargo, todos los sistemas electrónicos conviven constantemente con factores internos y externos que pueden provocar fallos en su funcionamiento. La capacidad de un sistema para funcionar correctamente en presencia de fallos se denomina tolerancia a fallos, y es un requisito en el diseño y operación de sistemas críticos. Los vehículos espaciales como satélites o naves espaciales también hacen uso de microprocesadores para operar de forma autónoma o semi autónoma durante su vida útil, con la dificultad añadida de que no pueden ser reparados en órbita, por lo que se consideran sistemas críticos. Además, las duras condiciones existentes en el espacio, y en particular los efectos de la radiación, suponen un gran desafío para el correcto funcionamiento de los dispositivos electrónicos. Concretamente, los fallos transitorios provocados por radiación (conocidos como soft errors) tienen el potencial de ser una de las mayores amenazas para la fiabilidad de un sistema en el espacio. Las misiones espaciales de gran envergadura, típicamente financiadas públicamente como en el caso de la NASA o la Agencia Espacial Europea (ESA), han tenido históricamente como requisito evitar el riesgo a toda costa por encima de cualquier restricción de coste o plazo. Por ello, la selección de componentes resistentes a la radiación (rad-hard) específicamente diseñados para su uso en el espacio ha sido la metodología imperante en el paradigma que hoy podemos denominar industria espacial tradicional, u Old Space. Sin embargo, los componentes rad-hard tienen habitualmente un coste mucho más alto y unas prestaciones mucho menores que otros componentes COTS equivalentes. De hecho, los componentes COTS ya han sido utilizados satisfactoriamente en misiones de la NASA o la ESA cuando las prestaciones requeridas por la misión no podían ser cubiertas por ningún componente rad-hard existente. En los últimos años, el acceso al espacio se está facilitando debido en gran parte a la entrada de empresas privadas en la industria espacial. Estas empresas no siempre buscan evitar el riesgo a toda costa, sino que deben perseguir una rentabilidad económica, por lo que hacen un balance entre riesgo, coste y plazo mediante gestión del riesgo en un paradigma denominado Nuevo Espacio o New Space. Estas empresas a menudo están interesadas en entregar servicios basados en el espacio con las máximas prestaciones y el mayor beneficio posibles, para lo cual los componentes rad-hard son menos atractivos debido a su mayor coste y menores prestaciones que los componentes COTS existentes. Sin embargo, los componentes COTS no han sido específicamente diseñados para su uso en el espacio y típicamente no incluyen técnicas específicas para evitar que los efectos de la radiación afecten su funcionamiento. Los componentes COTS se comercializan tal cual son, y habitualmente no es posible modificarlos para mejorar su resistencia a la radiación. Además, los elevados niveles de integración de los sistemas en chip (SoC) complejos de altas prestaciones dificultan su observación y la aplicación de técnicas de tolerancia a fallos. Este problema es especialmente relevante en el caso de los microprocesadores. Por tanto, existe un gran interés en el desarrollo de técnicas que permitan conocer y mejorar el comportamiento de los microprocesadores COTS bajo radiación sin modificar su arquitectura y sin interferir en su funcionamiento para facilitar su uso en el espacio y con ello maximizar las prestaciones de las misiones espaciales presentes y futuras. En esta Tesis se han desarrollado técnicas novedosas para detectar, diagnosticar y mitigar los errores producidos por radiación en microprocesadores y sistemas en chip (SoC) comerciales, utilizando la interfaz de traza como punto de observación. La interfaz de traza es un recurso habitual en los microprocesadores modernos, principalmente enfocado a soportar las tareas de desarrollo y depuración del software durante la fase de diseño. Sin embargo, una vez el desarrollo ha concluido, la interfaz de traza típicamente no se utiliza durante la fase operativa del sistema, por lo que puede ser reutilizada sin coste. La interfaz de traza constituye un punto de conexión viable para observar el comportamiento de un microprocesador de forma no intrusiva y sin interferir en su funcionamiento. Como resultado de esta Tesis se ha desarrollado un módulo IP capaz de recabar y decodificar la información de traza de un microprocesador COTS moderno de altas prestaciones. El IP es altamente configurable y personalizable para adaptarse a diferentes aplicaciones y tipos de procesadores. Ha sido diseñado y validado utilizando el dispositivo Zynq-7000 de Xilinx como plataforma de desarrollo, que constituye un dispositivo COTS de interés en la industria espacial. Este dispositivo incluye un procesador ARM Cortex-A9 de doble núcleo, que es representativo del conjunto de microprocesadores hard-core modernos de altas prestaciones. El IP resultante es compatible con la tecnología ARM CoreSight, que proporciona acceso a información de traza en los microprocesadores ARM. El IP incorpora técnicas para detectar errores en el flujo de ejecución y en los datos de la aplicación ejecutada utilizando la información de traza, en tiempo real y con muy baja latencia. El IP se ha validado en campañas de inyección de fallos y también en radiación con protones y neutrones en instalaciones especializadas. También se ha combinado con otras técnicas de tolerancia a fallos para construir técnicas híbridas de mitigación de errores. Los resultados experimentales obtenidos demuestran su alta capacidad de detección y potencialidad en el diagnóstico de errores producidos por radiación. El resultado de esta Tesis, desarrollada en el marco de un Doctorado Industrial entre la Universidad Carlos III de Madrid (UC3M) y la empresa Arquimea, se ha transferido satisfactoriamente al entorno empresarial en forma de un proyecto financiado por la Agencia Espacial Europea para continuar su desarrollo y posterior explotación.Commercial electronic components, also known as Commercial-Off-The-Shelf (COTS), are present in a wide variety of devices commonly used in our daily life. Particularly, the use of microprocessors and highly integrated System-on-Chip (SoC) devices has fostered the advent of increasingly intelligent electronic devices which sustain the lifestyles and the progress of modern society. Microprocessors are present even in safety-critical systems, such as vehicles, planes, weapons, medical devices, implants, or power plants. In any of these cases, a fault could involve severe human or economic consequences. However, every electronic system deals continuously with internal and external factors that could provoke faults in its operation. The capacity of a system to operate correctly in presence of faults is known as fault-tolerance, and it becomes a requirement in the design and operation of critical systems. Space vehicles such as satellites or spacecraft also incorporate microprocessors to operate autonomously or semi-autonomously during their service life, with the additional difficulty that they cannot be repaired once in-orbit, so they are considered critical systems. In addition, the harsh conditions in space, and specifically radiation effects, involve a big challenge for the correct operation of electronic devices. In particular, radiation-induced soft errors have the potential to become one of the major risks for the reliability of systems in space. Large space missions, typically publicly funded as in the case of NASA or European Space Agency (ESA), have followed historically the requirement to avoid the risk at any expense, regardless of any cost or schedule restriction. Because of that, the selection of radiation-resistant components (known as rad-hard) specifically designed to be used in space has been the dominant methodology in the paradigm of traditional space industry, also known as “Old Space”. However, rad-hard components have commonly a much higher associated cost and much lower performance that other equivalent COTS devices. In fact, COTS components have already been used successfully by NASA and ESA in missions that requested such high performance that could not be satisfied by any available rad-hard component. In the recent years, the access to space is being facilitated in part due to the irruption of private companies in the space industry. Such companies do not always seek to avoid the risk at any cost, but they must pursue profitability, so they perform a trade-off between risk, cost, and schedule through risk management in a paradigm known as “New Space”. Private companies are often interested in deliver space-based services with the maximum performance and maximum benefit as possible. With such objective, rad-hard components are less attractive than COTS due to their higher cost and lower performance. However, COTS components have not been specifically designed to be used in space and typically they do not include specific techniques to avoid or mitigate the radiation effects in their operation. COTS components are commercialized “as is”, so it is not possible to modify them to improve their susceptibility to radiation effects. Moreover, the high levels of integration of complex, high-performance SoC devices hinder their observability and the application of fault-tolerance techniques. This problem is especially relevant in the case of microprocessors. Thus, there is a growing interest in the development of techniques allowing to understand and improve the behavior of COTS microprocessors under radiation without modifying their architecture and without interfering with their operation. Such techniques may facilitate the use of COTS components in space and maximize the performance of present and future space missions. In this Thesis, novel techniques have been developed to detect, diagnose, and mitigate radiation-induced errors in COTS microprocessors and SoCs using the trace interface as an observation point. The trace interface is a resource commonly found in modern microprocessors, mainly intended to support software development and debugging activities during the design phase. However, it is commonly left unused during the operational phase of the system, so it can be reused with no cost. The trace interface constitutes a feasible connection point to observe microprocessor behavior in a non-intrusive manner and without disturbing processor operation. As a result of this Thesis, an IP module has been developed capable to gather and decode the trace information of a modern, high-end, COTS microprocessor. The IP is highly configurable and customizable to support different applications and processor types. The IP has been designed and validated using the Xilinx Zynq-7000 device as a development platform, which is an interesting COTS device for the space industry. This device features a dual-core ARM Cortex-A9 processor, which is a good representative of modern, high-end, hard-core microprocessors. The resulting IP is compatible with the ARM CoreSight technology, which enables access to trace information in ARM microprocessors. The IP is able to detect errors in the execution flow of the microprocessor and in the application data using trace information, in real time and with very low latency. The IP has been validated in fault injection campaigns and also under proton and neutron irradiation campaigns in specialized facilities. It has also been combined with other fault-tolerance techniques to build hybrid error mitigation approaches. Experimental results demonstrate its high detection capabilities and high potential for the diagnosis of radiation-induced errors. The result of this Thesis, developed in the framework of an Industrial Ph.D. between the University Carlos III of Madrid (UC3M) and the company Arquimea, has been successfully transferred to the company business as a project sponsored by European Space Agency to continue its development and subsequent commercialization.Programa de Doctorado en Ingeniería Eléctrica, Electrónica y Automática por la Universidad Carlos III de MadridPresidenta: María Luisa López Vallejo.- Secretario: Enrique San Millán Heredia.- Vocal: Luigi Di Lill