Single-Event Upset Analysis and Protection in High Speed Circuits

The effect of single-event transients (SETs) (at a combinational node of a design) on the system reliability is becoming a big concern for ICs manufactured using advanced technologies. An SET at a node of combinational part may cause a transient pulse at the input of a flip-flop and consequently is latched in the flip-flop and generates a soft-error. When an SET conjoined with a transition at a node along a critical path of the combinational part of a design, a transient delay fault may occur at the input of a flip-flop. On the other hand, increasing pipeline depth and using low power techniques such as multi-level power supply, and multi-threshold transistor convert almost all paths in a circuit to critical ones. Thus, studying the behavior of the SET in these kinds of circuits needs special attention. This paper studies the dynamic behavior of a circuit with massive critical paths in the presence of an SET. We also propose a novel flip-flop architecture to mitigate the effects of such SETs in combinational circuits. Furthermore, the proposed architecture can tolerant a single event upset (SEU) caused by particle strike on the internal nodes of a flip-flo

Transient fault behavior in a microprocessor: A case study

An experimental analysis is described which studies the susceptibility of a microprocessor based jet engine controller to upsets caused by current and voltage transients. A design automation environment which allows the run time injection of transients and the tracing from their impact device to the pin level is described. The resulting error data are categorized by the charge levels of the injected transients by location and by their potential to cause logic upsets, latched errors, and pin errors. The results show a 3 picoCouloumb threshold, below which the transients have little impact. An Arithmetic and Logic Unit transient is most likely to result in logic upsets and pin errors (i.e., impact the external environment). The transients in the countdown unit are potentially serious since they can result in latched errors, thus causing latent faults. Suggestions to protect the processor against these errors, by incorporating internal error detection and transient suppression techniques, are also made

Fault detection and accommodation testing on an F100 engine in an F-15 airplane

The fault detection and accommodation (FDA) methodology for digital engine-control systems may range from simple comparisons of redundant parameters to the more complex and sophisticated observer models of the entire engine system. Evaluations of the various FDA schemes are done using analytical methods, simulation, and limited-altitude-facility testing. Flight testing of the FDA logic has been minimal because of the difficulty of inducing realistic faults in flight. A flight program was conducted to evaluate the fault detection and accommodation capability of a digital electronic engine control in an F-15 aircraft. The objective of the flight program was to induce selected faults and evaluate the resulting actions of the digital engine controller. Comparisons were made between the flight results and predictions. Several anomalies were found in flight and during the ground test. Simulation results showed that the inducement of dual pressure failures was not feasible since the FDA logic was not designed to accommodate these types of failures

Cutting tracks, making CDs: a comparative study of audio time-correction techniques in the desktop age.

Producers have long sought to “tighten” studio performances. Software-based DAW’s now come with proprietary functions to facilitate this, but only the latest generation of platforms allow relative ease of use on longer takes. Each method has advantages and disadvantages in terms of ease and speed of use, transient preservation, implied subsequent workflow and (usually) unwanted artifacts. Whilst rhythmically consistent material with clear transients is readily controllable with contemporary tools, working with complex mixtures of note-values still presents a challenge and requires much user intervention. This paper performs a comparative study of different audio quantize techniques on percussive material, often on rhythmically complex performances. It will seek to compare necessary methodologies and workflow implications through the use of several contemporary systems: Recycle, Pro Tools, Logic, Cubase, Live, Melodyne, and Nuendo. The current level of man-machine interaction will be explored, and the best features from each platform will be collated. A model for the future will be speculatively presented

STUDY OF SINGLE-EVENT EFFECTS ON DIGITAL SYSTEMS

Microelectronic devices and systems have been extensively utilized in a variety of radiation environments, ranging from the low-earth orbit to the ground level. A high-energy particle from such an environment may cause voltage/current transients, thereby inducing Single Event Effect (SEE) errors in an Integrated Circuit (IC). Ever since the first SEE error was reported in 1975, this community has made tremendous progress in investigating the mechanisms of SEE and exploring radiation tolerant techniques. However, as the IC technology advances, the existing hardening techniques have been rendered less effective because of the reduced spacing and charge sharing between devices. The Semiconductor Industry Association (SIA) roadmap has identified radiation-induced soft errors as the major threat to the reliable operation of electronic systems in the future. In digital systems, hardening techniques of their core components, such as latches, logic, and clock network, need to be addressed. Two single event tolerant latch designs taking advantage of feedback transistors are presented and evaluated in both single event resilience and overhead. These feedback transistors are turned OFF in the hold mode, thereby yielding a very large resistance. This, in turn, results in a larger feedback delay and higher single event tolerance. On the other hand, these extra transistors are turned ON when the cell is in the write mode. As a result, no significant write delay is introduced. Both designs demonstrate higher upset threshold and lower cross-section when compared to the reference cells. Dynamic logic circuits have intrinsic single event issues in each stage of the operations. The worst case occurs when the output is evaluated logic high, where the pull-up networks are turned OFF. In this case, the circuit fails to recover the output by pulling the output up to the supply rail. A capacitor added to the feedback path increases the node capacitance of the output and the feedback delay, thereby increasing the single event critical charge. Another differential structure that has two differential inputs and outputs eliminates single event upset issues at the expense of an increased number of transistors. Clock networks in advanced technology nodes may cause significant errors in an IC as the devices are more sensitive to single event strikes. Clock mesh is a widely used clocking scheme in a digital system. It was fabricated in a 28nm technology and evaluated through the use of heavy ions and laser irradiation experiments. Superior resistance to radiation strikes was demonstrated during these tests. In addition to mitigating single event issues by using hardened designs, built-in current sensors can be used to detect single event induced currents in the n-well and, if implemented, subsequently execute fault correction actions. These sensors were simulated and fabricated in a 28nm CMOS process. Simulation, as well as, experimental results, substantiates the validity of this sensor design. This manifests itself as an alternative to existing hardening techniques. In conclusion, this work investigates single event effects in digital systems, especially those in deep-submicron or advanced technology nodes. New hardened latch, dynamic logic, clock, and current sensor designs have been presented and evaluated. Through the use of these designs, the single event tolerance of a digital system can be achieved at the expense of varying overhead in terms of area, power, and delay

Searches for radio transients

Exploration of the transient Universe is an exciting and fast-emerging area within radio astronomy. Known transient phenomena range in time scales from sub-nanoseconds to years or longer, thus spanning a huge range in time domain and hinting a rich diversity in their underlying physical processes. Transient phenomena are likely locations of explosive or dynamic events and they offer tremendous potential to uncover new physics and astrophysics. A number of upcoming next-generation radio facilities and recent advances in computing and instrumentation have provided a much needed impetus for this field which has remained a relatively uncharted territory for the past several decades. In this paper we focus mainly on the class of phenomena that occur on very short time scales (i.e. from $\sim$ milliseconds to $\sim$ nanoseconds), known as {\it fast transients}, the detections of which involve considerable signal processing and data management challenges, given the high time and frequency resolutions required in their explorations, the role of propagation effects to be considered and a multitude of deleterious effects due to radio frequency interference. We will describe the techniques, strategies and challenges involved in their detections and review the world-wide efforts currently under way, both through scientific discoveries enabled by the ongoing large-scale surveys at Parkes and Arecibo, as well as technical developments involving the exploratory use of multi-element array instruments such as VLBA and GMRT. Such developments will undoubtedly provide valuable inputs as next-generation arrays such as LOFAR and ASKAP are designed and commissioned. With their wider fields of view and higher sensitivities, these instruments, and eventually the SKA, hold great potential to revolutionise this relatively nascent field, thereby opening up exciting new science avenues in astrophysics.Comment: To appear in the special issue of the Bulletin of the Astronomical Society of India on Transients at different wavelengths, eds D.J. Saikia and D.A. Green. 21 pages, 5 figures. http://www.ncra.tifr.res.in/~bas

Army/NASA small turboshaft engine digital controls research program

The emphasis of a program to conduct digital controls research for small turboshaft engines is on engine test evaluation of advanced control logic using a flexible microprocessor based digital control system designed specifically for research on advanced control logic. Control software is stored in programmable memory. New control algorithms may be stored in a floppy disk and loaded directly into memory. This feature facilitates comparative evaluation of different advanced control modes. The central processor in the digital control is an Intel 8086 16 bit microprocessor. Control software is programmed in assembly language. Software checkout is accomplished prior to engine test by connecting the digital control to a real time hybrid computer simulation of the engine. The engine currently installed in the facility has a hydromechanical control modified to allow electrohydraulic fuel metering and VG actuation by the digital control. Simulation results are presented which show that the modern control reduces the transient rotor speed droop caused by unanticipated load changes such as cyclic pitch or wind gust transients