A Reliable Low-area Low-power PUF-based Key Generator

This paper reports the implementation of a lowarea low-power 128-bit PUF-based key generation module which exploits a novel Two-Stage IDentification (TSID) cell showing a higher noise immunity then a standard SRAM cell. In addition, the pre-selection technique introduced in [1] is applied. This results in a stable PUF response in spite of process and environmental variations thus requiring a low cost error correction algorithm in order to generate a reliable key. The adopted PUF cell array includes 1056 cells and shows a power consumption per bit of 4:2 W at 100MHz with an area per bit of 2:4 m2. In order to evaluate reliability and unpredictability of the generated key, extensive tests have been performed both on the raw PUF data and on the final key. The raw PUF data after pre-selection show a worst case intra-chip Hamming distance below 0:7%. After a total of more than 5 109 key reconstructions, no single fail has been detected

Techniques for Improving Security and Trustworthiness of Integrated Circuits

The integrated circuit (IC) development process is becoming increasingly vulnerable to malicious activities because untrusted parties could be involved in this IC development flow. There are four typical problems that impact the security and trustworthiness of ICs used in military, financial, transportation, or other critical systems: (i) Malicious inclusions and alterations, known as hardware Trojans, can be inserted into a design by modifying the design during GDSII development and fabrication. Hardware Trojans in ICs may cause malfunctions, lower the reliability of ICs, leak confidential information to adversaries or even destroy the system under specifically designed conditions. (ii) The number of circuit-related counterfeiting incidents reported by component manufacturers has increased significantly over the past few years with recycled ICs contributing the largest percentage of the total reported counterfeiting incidents. Since these recycled ICs have been used in the field before, the performance and reliability of such ICs has been degraded by aging effects and harsh recycling process. (iii) Reverse engineering (RE) is process of extracting a circuit’s gate-level netlist, and/or inferring its functionality. The RE causes threats to the design because attackers can steal and pirate a design (IP piracy), identify the device technology, or facilitate other hardware attacks. (iv) Traditional tools for uniquely identifying devices are vulnerable to non-invasive or invasive physical attacks. Securing the ID/key is of utmost importance since leakage of even a single device ID/key could be exploited by an adversary to hack other devices or produce pirated devices. In this work, we have developed a series of design and test methodologies to deal with these four challenging issues and thus enhance the security, trustworthiness and reliability of ICs. The techniques proposed in this thesis include: a path delay fingerprinting technique for detection of hardware Trojans, recycled ICs, and other types counterfeit ICs including remarked, overproduced, and cloned ICs with their unique identifiers; a Built-In Self-Authentication (BISA) technique to prevent hardware Trojan insertions by untrusted fabrication facilities; an efficient and secure split manufacturing via Obfuscated Built-In Self-Authentication (OBISA) technique to prevent reverse engineering by untrusted fabrication facilities; and a novel bit selection approach for obtaining the most reliable bits for SRAM-based physical unclonable function (PUF) across environmental conditions and silicon aging effects

PUFs based on Coupled Oscillators Static Entropy

We live in a digital era, this led to a shift from traditional industry to a society focused on information and communication technologies. The amount of shared information is exponen- tially growing every year. Protecting all this shared information is keeping everyone’s privacy, is making sure the information is authentic, is keeping everyone safe. The solution for such problems is cryptography using hardware-based, System on Chip, SoC solutions such as Random Number Generators, RNGs, and Physical Unclonable Functions, PUFs. RNGs generate random keys from random processes that occurs inside the system. PUFs generate fixed random keys using random processes that originated in the fabrication process of the chip. The objective of this work is to study and compare a static entropy source based on coupled relaxation oscillators against a state-of-the-art architecture like the static entropy source based on ring oscillators, in advanced 130nm technology. The characteristic studied were, area, power consumption, entropy, resistance to temperature, and supply voltage varia- tions. Compared to the ring oscillator implementation, the static entropy source designed showed promising results as a static entropy source, however, it revealed poor results in terms of area, power consumption, and entropy. Such results mean, the coupled relaxation oscillator may not be good at generating random numbers, however, it may be good at keeping its state when under temperature and supply voltage variations.Vivemos numa era digital, o que levou a uma mudança da indústria tradicional para uma sociedade centrada sobre as tecnologias da informação e da comunicação. A quantidade de informação partilhada está a crescer exponencialmente todos os anos. Proteger toda esta in- formação partilhada é manter a privacidade de todos, é garantir que a informação é autêntica, está a manter todos seguros. A solução para tais problemas é a criptografia com base em soluções de hardware, Sys- tem on Chip, SoC tais como Geradores de Números Aleatórios, RNGs e Funções Físicas Inclo- náveis, PUFs. Os RNGs geram chaves aleatórias a partir de processos aleatórios que ocorrem no interior do sistema. Os PUFs geram chaves aleatórias fixas utilizando processos aleatórios que se originaram no processo de fabrico do chip. O principal objetivo deste trabalho é estudar e comparar uma fonte estática de entropia baseada em osciladores de relaxação acoplados contra uma arquitetura de estado de arte como a fonte estática de entropia baseada em osci- ladores de anel, em tecnologia avançada de 130nm. As características estudadas foram, a área, o consumo energia, a entropia, e a resistência à temperatura e variações de tensão de alimen- tação. Em comparação com a implementação do oscilador do anel, a fonte estática de entropia projetada mostrou resultados promissores como fonte estática de entropia, no entanto, reve- lou maus resultados em termos de área, consumo de energia e entropia. Estes resultados sig- nificam que o oscilador de relaxação acoplado pode não ser bom a gerar números aleatórios, no entanto, pode ser bom para manter o seu estado quando sujeito a variações de temperatura e tensão de alimentação

Simulation for Reliability, Hardware Security, and Ising Computing in VLSI Chip Design

The continued scaling of VLSI circuits has provided a wealth of opportunities andchallenges to the VLSI circuit design area. Both these challenges and opportunities, however,require new simulation tools that can enable their solution or exploitation as classicalmethods typically dealt with problem domains with smaller scales or less complexity. Inthis dissertation, simulation methods are presented to address the emerging VLSI designtopics of Electromigration induced aging and Ising computing and are then applied to theapplication areas of hardware security and graph partitioning respectively.The Electromigration aging effect in VLSI circuits is a long-term reliability issueaffecting current carrying metal wires leading to IR drop degradation. Typically, simpleanalytical equations can determine a wire’s effective age or if it will be affected by the EMaging effect at all. However, these classical methods are overly conservative and can lead toover design or unnecessary design iterations. Furthermore, it is expected that the EM agingeffect will become more severe in future Integrated Cirucits (ICs) due to increasing currentdensities and the prevalance of polycrystaline copper atom structures seen at small wiredimensions. For this reason, more comprehensive simulation techniques that can efficientlysimulate the EM effect with less conservative results can help mitigate overdesign andincrease design margins while reducing design iterations.The area of Hardware Security is becoming increasingly important as the chipsupply chain becomes more globalized and the integrity of chips becomes more diffiuclt toverify. Utilizing the accurate simulation techniques for EM, we can utilize this reliabilityeffect to demonstrate how a reliability based attack could be perpatrated. Furthermore, wecan utilize this aging effect as a defense mechanism to help us validate the integrity of anIC and detect counterfeit chips in the component supply chain market.Ising computing is an emerging method of solving combinatorial optimization problemsby simulating the interactions of so-called spin glasses and their interactions. Borrowingconcepts from quantum computing, this methods mimics the quantum interaction betweenspin glasses in such a way that finding a ground state of these spin glass models leadsto the solution of a particular problem. In this dissertation, effective methods of simulatingthe spin glass interactions using General Purpose Graphics Processing Units (GPGPUs)and finding their ground state are developed.In addition to the GPU based Ising model simulations, important combinatorialproblems can be mapped to the Ising model. In this dissertation the Ising solver is appliedto graph partitioning which can be utilized in VLSI design and many other domains as well.Specifically, solvers for the maxcut problem and the balanced min-cut partitioning problemare developed

On Improving Robustness of Hardware Security Primitives and Resistance to Reverse Engineering Attacks

The continued growth of information technology (IT) industry and proliferation of interconnected devices has aggravated the problem of ensuring security and necessitated the need for novel, robust solutions. Physically unclonable functions (PUFs) have emerged as promising secure hardware primitives that can utilize the disorder introduced during manufacturing process to generate unique keys. They can be utilized as \textit{lightweight} roots-of-trust for use in authentication and key generation systems. Unlike insecure non-volatile memory (NVM) based key storage systems, PUFs provide an advantage -- no party, including the manufacturer, should be able to replicate the physical disorder and thus, effectively clone the PUF. However, certain practical problems impeded the widespread deployment of PUFs. This dissertation addresses such problems of (i) reliability and (ii) unclonability. Also, obfuscation techniques have proven necessary to protect intellectual property in the presence of an untrusted supply chain and are needed to aid against counterfeiting. This dissertation explores techniques utilizing layout and logic-aware obfuscation. Collectively, we present secure and cost-effective solutions to address crucial hardware security problems

A secure arbiter physical unclonable functions (PUFs) for device authentication and identification

Recent fourth industrial revolution, industry4.0 results in lot of automation of industrial processes and brings intelligence in many home appliances in the form of IoT, enhances M2M / D2D communication where electronic devices play a prominent role. It is very much necessary to ensure security of those devices. To provide reliable authentication and identification of each device and to abort the counterfeiting from the unauthorized foundries Physical Unclonable Functions (PUFs) emerged as a one of the promising cryptographic hardware security solution. PUF is function, mathematically modeled by using uncontrollable/ unavoidable random variances of the fabrication process of the ICs. These variances can generate unpredictable, random responses can be used to overcome the difficulties such as storing the keys in non-volatile memories (NVMs) in the classical cryptography. A wide variety of PUF architectures such as Arbiter PUFs, Ring oscillator PUFs, SRAM PUFs proposed by authors. But due to its design complexity and low cost, Delay based Arbiter PUFs (D-PUFs) are considering to be a one of the security primitives in authentication applications such as low-cost IoT devices for secure key generation. This paper presents a review on the different types of Delay based PUF architectures proposed by the various authors, sources to exhibit the physical disorders in ICs, methods to estimate the Performance metrics and applications of PUF in different domains

Very-Large-Scale-Integration Circuit Techniques in Internet-of-Things Applications

Heading towards the era of Internet-of-things (IoT) means both opportunity and challenge for the circuit-design community. In a system where billions of devices are equipped with the ability to sense, compute, communicate with each other and perform tasks in a coordinated manner, security and power management are among the most critical challenges. Physically unclonable function (PUF) emerges as an important security primitive in hardware-security applications; it provides an object-specific physical identifier hidden within the intrinsic device variations, which is hard to expose and reproduce by adversaries. Yet, designing a compact PUF robust to noise, temperature and voltage remains a challenge. This thesis presents a novel PUF design approach based on a pair of ultra-compact analog circuits whose output is proportional to absolute temperature. The proposed approach is demonstrated through two works: (1) an ultra-compact and robust PUF based on voltage-compensated proportional-to-absolute-temperature voltage generators that occupies 8.3× less area than the previous work with the similar robustness and twice the robustness of the previously most compact PUF design and (2) a technique to transform a 6T-SRAM array into a robust analog PUF with minimal overhead. In this work, similar circuit topology is used to transform a preexisting on-chip SRAM into a PUF, which further reduces the area in (1) with no robustness penalty. In this thesis, we also explore techniques for power management circuit design. Energy harvesting is an essential functionality in an IoT sensor node, where battery replacement is cost-prohibitive or impractical. Yet, existing energy-harvesting power management units (EH PMU) suffer from efficiency loss in the two-step voltage conversion: harvester-to-battery and battery-to-load. We propose an EH PMU architecture with hybrid energy storage, where a capacitor is introduced in addition to the battery to serve as an intermediate energy buffer to minimize the battery involvement in the system energy flow. Test-case measurements show as much as a 2.2× improvement in the end-to-end energy efficiency. In contrast, with the drastically reduced power consumption of IoT nodes that operates in the sub-threshold regime, adaptive dynamic voltage scaling (DVS) for supply-voltage margin removal, fully on-chip integration and high power conversion efficiency (PCE) are required in PMU designs. We present a PMU–load co-design based on a fully integrated switched-capacitor DC-DC converter (SC-DC) and hybrid error/replica-based regulation for a fully digital PMU control. The PMU is integrated with a neural spike processor (NSP) that achieves a record-low power consumption of 0.61 µW for 96 channels. A tunable replica circuit is added to assist the error regulation and prevent loss of regulation. With automatic energy-robustness co-optimization, the PMU can set the SC-DC’s optimal conversion ratio and switching frequency. The PMU achieves a PCE of 77.7% (72.2%) at VIN = 0.6 V (1 V) and at the NSP’s margin-free operating point

Dependable Embedded Systems

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems