Modeling defective part level due to static and dynamic defects based upon site observation and excitation balance

Manufacture testing of digital integrated circuits is essential for high quality. However, exhaustive testing is impractical, and only a small subset of all possible test patterns (or test pattern pairs) may be applied. Thus, it is crucial to choose a subset that detects a high percentage of the defective parts and produces a low defective part level. Historically, test pattern generation has often been seen as a deterministic endeavor. Test sets are generated to deterministically ensure that a large percentage of the targeted faults are detected. However, many real defects do not behave like these faults, and a test set that detects them all may still miss many defects. Unfortunately, modeling all possible defects as faults is impractical. Thus, it is important to fortuitously detect unmodeled defects using high quality test sets. To maximize fortuitous detection, we do not assume a high correlation between faults and actual defects. Instead, we look at the common requirements for all defect detection. We deterministically maximize the observations of the leastobserved sites while randomly exciting the defects that may be present. The resulting decrease in defective part level is estimated using the MPGD model. This dissertation describes the MPGD defective part level model and shows how it can be used to predict defective part levels resulting from static defect detection. Unlike many other predictors, its predictions are a function of site observations, not fault coverage, and thus it is generally more accurate at high fault coverages. Furthermore, its components model the physical realities of site observation and defect excitation, and thus it can be used to give insight into better test generation strategies. Next, we investigate the effect of additional constraints on the fortuitous detection of defects-specifically, as we focus on detecting dynamic defects instead of static ones. We show that the quality of the randomness of excitation becomes increasingly important as defect complexity increases. We introduce a new metric, called excitation balance, to estimate the quality of the excitation, and we show how excitation balance relates to the constant τ in the MPGD model

Fault simulation and test generation for small delay faults

Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they model only a subset of delay defect behaviors. To solve this problem, a more realistic delay fault model has been developed which models delay faults caused by the combination of spot defects and parametric process variation. According to the new model, a realistic delay fault coverage metric has been developed. Traditional path delay fault coverage metrics result in unrealistically low fault coverage, and the real test quality is not reflected. The new metric uses a statistical approach and the simulation based fault coverage is consistent with silicon data. Fast simulation algorithms are also included in this dissertation. The new metric suggests that testing the K longest paths per gate (KLPG) has high detection probability for small delay faults under process variation. In this dissertation, a novel automatic test pattern generation (ATPG) methodology to find the K longest testable paths through each gate for both combinational and sequential circuits is presented. Many techniques are used to reduce search space and CPU time significantly. Experimental results show that this methodology is efficient and able to handle circuits with an exponential number of paths, such as ISCAS85 benchmark circuit c6288. The ATPG methodology has been implemented on industrial designs. Speed binning has been done on many devices and silicon data has shown significant benefit of the KLPG test, compared to several traditional delay test approaches

Fault modelling and accelerated simulation of integrated circuits manufacturing defects under process variation

As silicon manufacturing process scales to and beyond the 65-nm node, process variation can no longer be ignored. The impact of process variation on integrated circuit performance and power has received significant research input. Variation-aware test, on the other hand, is a relatively new research area that is currently receiving attention worldwide.Research has shown that test without considering process variation may lead to loss of test quality. Fault modelling and simulation serve as a backbone of manufacturing test. This thesis is concerned with developing efficient fault modelling techniques and simulation methodologies that take into account the effect of process variation on manufacturing defects with particular emphasis on resistive bridges and resistive opens.The first contribution of this thesis addresses the problem of long computation time required to generate logic fault of resistive bridges under process variation by developing a fast and accurate modelling technique to model logic fault behaviour of resistive bridges.The new technique is implemented by employing two efficient voltage calculation algorithms to calculate the logic threshold voltage of driven gates and critical resistance of a fault-site to enable the computation of bridge logic faults without using SPICE. Simulation results show that the technique is fast (on average 53 times faster) and accurate (worst case is 2.64% error) when compared with HSPICE. The second contribution analyses the complexity of delay fault simulation of resistive bridges to reduce the computation time of delay fault when considering process variation. An accelerated delay fault simulation methodology of resistive bridges is developed by employing a three-step strategy to speed up the calculation of transient gate output voltage which is needed to accurately compute delay faults. Simulation results show that the methodology is on average 17.4 times faster, with 5.2% error in accuracy, when compared with HSPICE. The final contribution presents an accelerated simulation methodology of resistive opens to address the problem of long simulation time of delay fault when considering process variation. The methodology is implemented by using two efficient algorithms to accelerate the computation of transient gate output voltage and timing critical resistance of an open fault-site. Simulation results show that the methodology is on average up to 52 times faster than HSPICE, with 4.2% error in accuracy

Prediction And Allocation Of Live To Virtual Communication Bridging Resources

This document summarizes a research effort focused on improving live-to-virtual (L-V) communication systems. The purpose of this work is to address a significant challenge facing the tactical communications training community through the development of the Live-to-Virtual Relay Radio Prediction Algorithm and implementation of the algorithm into an Integrated Live-to-Virtual Communications Server prototype device. The motivation for the work and the challenges of integrating live and virtual communications are presented. Details surrounding the formulation of the prediction algorithm and a description of the prototype system, hardware, and software architectures are shared. Experimental results from discrete event simulation analysis and prototype functionality testing accompany recommendations for future investigation. If the methods and technologies summarized are implemented, an estimated equipment savings of 25%-53% and an estimated cost savings of $150,000.00 -$630,000.00 per site are anticipated. Thus, a solution to a critical tactical communications training problem is presented through the research discussed

The Fifth NASA Symposium on VLSI Design

The fifth annual NASA Symposium on VLSI Design had 13 sessions including Radiation Effects, Architectures, Mixed Signal, Design Techniques, Fault Testing, Synthesis, Signal Processing, and other Featured Presentations. The symposium provides insights into developments in VLSI and digital systems which can be used to increase data systems performance. The presentations share insights into next generation advances that will serve as a basis for future VLSI design

Re-use of tests and arguments for assesing dependable mixed-critically systems

The safety assessment of mixed-criticality systems (MCS) is a challenging activity due to system heterogeneity, design constraints and increasing complexity. The foundation for MCSs is the integrated architecture paradigm, where a compact hardware comprises multiple execution platforms and communication interfaces to implement concurrent functions with different safety requirements. Besides a computing platform providing adequate isolation and fault tolerance mechanism, the development of an MCS application shall also comply with the guidelines defined by the safety standards. A way to lower the overall MCS certification cost is to adopt a platform-based design (PBD) development approach. PBD is a model-based development (MBD) approach, where separate models of logic, hardware and deployment support the analysis of the resulting system properties and behaviour. The PBD development of MCSs benefits from a composition of modular safety properties (e.g. modular safety cases), which support the derivation of mixed-criticality product lines. The validation and verification (V&V) activities claim a substantial effort during the development of programmable electronics for safety-critical applications. As for the MCS dependability assessment, the purpose of the V&V is to provide evidences supporting the safety claims. The model-based development of MCSs adds more V&V tasks, because additional analysis (e.g., simulations) need to be carried out during the design phase. During the MCS integration phase, typically hardware-in-the-loop (HiL) plant simulators support the V&V campaigns, where test automation and fault-injection are the key to test repeatability and thorough exercise of the safety mechanisms. This dissertation proposes several V&V artefacts re-use strategies to perform an early verification at system level for a distributed MCS, artefacts that later would be reused up to the final stages in the development process: a test code re-use to verify the fault-tolerance mechanisms on a functional model of the system combined with a non-intrusive software fault-injection, a model to X-in-the-loop (XiL) and code-to-XiL re-use to provide models of the plant and distributed embedded nodes suited to the HiL simulator, and finally, an argumentation framework to support the automated composition and staged completion of modular safety-cases for dependability assessment, in the context of the platform-based development of mixed-criticality systems relying on the DREAMS harmonized platform.La dificultad para evaluar la seguridad de los sistemas de criticidad mixta (SCM) aumenta con la heterogeneidad del sistema, las restricciones de diseño y una complejidad creciente. Los SCM adoptan el paradigma de arquitectura integrada, donde un hardware embebido compacto comprende múltiples plataformas de ejecución e interfaces de comunicación para implementar funciones concurrentes y con diferentes requisitos de seguridad. Además de una plataforma de computación que provea un aislamiento y mecanismos de tolerancia a fallos adecuados, el desarrollo de una aplicación SCM además debe cumplir con las directrices definidas por las normas de seguridad. Una forma de reducir el coste global de la certificación de un SCM es adoptar un enfoque de desarrollo basado en plataforma (DBP). DBP es un enfoque de desarrollo basado en modelos (DBM), en el que modelos separados de lógica, hardware y despliegue soportan el análisis de las propiedades y el comportamiento emergente del sistema diseñado. El desarrollo DBP de SCMs se beneficia de una composición modular de propiedades de seguridad (por ejemplo, casos de seguridad modulares), que facilitan la definición de líneas de productos de criticidad mixta. Las actividades de verificación y validación (V&V) representan un esfuerzo sustancial durante el desarrollo de aplicaciones basadas en electrónica confiable. En la evaluación de la seguridad de un SCM el propósito de las actividades de V&V es obtener las evidencias que apoyen las aseveraciones de seguridad. El desarrollo basado en modelos de un SCM incrementa las tareas de V&V, porque permite realizar análisis adicionales (por ejemplo, simulaciones) durante la fase de diseño. En las campañas de pruebas de integración de un SCM habitualmente se emplean simuladores de planta hardware-in-the-loop (HiL), en donde la automatización de pruebas y la inyección de faltas son la clave para la repetitividad de las pruebas y para ejercitar completamente los mecanismos de tolerancia a fallos. Esta tesis propone diversas estrategias de reutilización de artefactos de V&V para la verificación temprana de un MCS distribuido, artefactos que se emplearán en ulteriores fases del desarrollo: la reutilización de código de prueba para verificar los mecanismos de tolerancia a fallos sobre un modelo funcional del sistema combinado con una inyección de fallos de software no intrusiva, la reutilización de modelo a X-in-the-loop (XiL) y código a XiL para obtener modelos de planta y nodos distribuidos aptos para el simulador HiL y, finalmente, un marco de argumentación para la composición automatizada y la compleción escalonada de casos de seguridad modulares, en el contexto del desarrollo basado en plataformas de sistemas de criticidad mixta empleando la plataforma armonizada DREAMS.Kritikotasun nahastuko sistemen segurtasun ebaluazioa jarduera neketsua da beraien heterogeneotasuna dela eta. Sistema hauen oinarria arkitektura integratuen paradigman datza, non hardware konpaktu batek exekuzio plataforma eta komunikazio interfaze ugari integratu ahal dituen segurtasun baldintza desberdineko funtzio konkurrenteak inplementatzeko. Konputazio plataformek isolamendu eta akatsen aurkako mekanismo egokiak emateaz gain, segurtasun arauek definituriko jarraibideak jarraitu behar dituzte kritikotasun mistodun aplikazioen garapenean. Sistema hauen zertifikazio prozesuaren kostua murrizteko aukera bat plataformetan oinarritutako garapenean (PBD) datza. Garapen planteamendu hau modeloetan oinarrituriko garapena da (MBD) non modeloaren logika, hardware eta garapen desberdinak sistemaren propietateen eta portaeraren aurka aztertzen diren. Kritikotasun mistodun sistemen PBD garapenak etekina ateratzen dio moduluetan oinarrituriko segurtasun propietateei, adibidez: segurtasun kasu modularrak (MSC). Modulu hauek kritikotasun mistodun produktu-lerroak ere hartzen dituzte kontutan. Berifikazio eta balioztatze (V&V) jarduerek esfortzu kontsideragarria eskatzen dute segurtasun-kiritikoetarako elektronika programagarrien garapenean. Kritikotasun mistodun sistemen konfiantzaren ebaluazioaren eta V&V jardueren helburua segurtasun eskariak jasotzen dituzten frogak proportzionatzea da. Kritikotasun mistodun sistemen modelo bidezko garapenek zeregin gehigarriak atxikitzen dizkio V&V jarduerari, fase honetan analisi gehigarriak (hots, simulazioak) zehazten direlako. Bestalde, kritikotasun mistodun sistemen integrazio fasean, hardware-in-the-loop (Hil) simulazio plantek V&V iniziatibak sostengatzen dituzte non testen automatizazioan eta akatsen txertaketan funtsezko jarduerak diren. Jarduera hauek frogen errepikapena eta segurtasun mekanismoak egiaztzea ahalbidetzen dute. Tesi honek V&V artefaktuen berrerabilpenerako estrategiak proposatzen ditu, kritikotasun mistodun sistemen egiaztatze azkarrerako sistema mailan eta garapen prozesuko azken faseetaraino erabili daitezkeenak. Esate baterako, test kodearen berrabilpena akats aurkako mekanismoak egiaztatzeko, modelotik X-in-the-loop (XiL)-ra eta kodetik XiL-rako konbertsioa HiL simulaziorako eta argumentazio egitura bat DREAMS Europear proiektuan definituriko arkitektura estiloan oinarrituriko segurtasun kasu modularrak automatikoki eta gradualki sortzeko

Efficient algorithms for fundamental statistical timing analysis problems in delay test applications of VLSI circuits

Tremendous advances in semiconductor process technology are creating new challenges for the delay test of today’s digital VLSI circuits. The complexity of state-of-the-art manufacturing processes does not only lead to greater process variability, it also makes today's integrated circuits more prone to defects such as resistive shorts and opens. As a consequence, some of the manufactured circuits do not meet the timing requirements set by the design specification. These circuits must be identified by delay testing and sorted out to ensure the quality of shipped products. Due to the increasing process variability, key transistor and interconnect parameters must be modelled as random variables. These random variables capture the uncertainty caused by process variability, but also the impact of modelling errors and variations in the operating conditions of the circuits, such as the temperature or the supply voltage. The important consequence for delay testing is that a particular delay test detects a delay fault of fixed size in only a subset of all manufactured circuits, which inevitably leads to the shipment of defective products. Despite the fact that this problem is well understood, today's delay test generation methods are unable to consider the distortion of the delay test results, caused by process variability. To analyse and predict the effectiveness of delay tests in a population of circuits which are functionally identical but have varying timing properties, statistical timing analysis is necessary. Although the large runtime of statistical timing analysis is a well known problem, little progress has been made in the development of efficient statistical timing analysis algorithms for the variability-aware delay test generation and delay fault simulation. This dissertation proposes novel and efficient statistical timing analysis algorithms for the variability-aware delay test generation and delay fault simulation in presence of large delay variations. For the detection of path delay faults, a novel probabilistic sensitization analysis is presented which analyses the impact of process variations on the sensitization of the target paths. Furthermore, an efficient method for approximating the probability of detecting small delay faults is presented. Beyond that, efficient statistical SUM and MAX-operations are proposed, which provide the fundamental basis of block-based statistical timing analysis. The experiment results demonstrate the high efficiency of the proposed algorithms

Special Topics in Information Technology

This open access book presents thirteen outstanding doctoral dissertations in Information Technology from the Department of Electronics, Information and Bioengineering, Politecnico di Milano, Italy. Information Technology has always been highly interdisciplinary, as many aspects have to be considered in IT systems. The doctoral studies program in IT at Politecnico di Milano emphasizes this interdisciplinary nature, which is becoming more and more important in recent technological advances, in collaborative projects, and in the education of young researchers. Accordingly, the focus of advanced research is on pursuing a rigorous approach to specific research topics starting from a broad background in various areas of Information Technology, especially Computer Science and Engineering, Electronics, Systems and Control, and Telecommunications. Each year, more than 50 PhDs graduate from the program. This book gathers the outcomes of the thirteen best theses defended in 2020-21 and selected for the IT PhD Award. Each of the authors provides a chapter summarizing his/her findings, including an introduction, description of methods, main achievements and future work on the topic. Hence, the book provides a cutting-edge overview of the latest research trends in Information Technology at Politecnico di Milano, presented in an easy-to-read format that will also appeal to non-specialists