Algorithms and methodologies for interconnect reliability analysis of integrated circuits

The phenomenal progress of computing devices has been largely made possible by the sustained efforts of semiconductor industry in innovating techniques for extremely large-scale integration. Indeed, gigantically integrated circuits today contain multi-billion interconnects which enable the transistors to talk to each other -all in a space of few mm2. Such aggressively downscaled components (transistors and interconnects) silently suffer from increasing electric fields and impurities/defects during manufacturing. Compounded by the Gigahertz switching, the challenges of reliability and design integrity remains very much alive for chip designers, with Electro migration (EM) being the foremost interconnect reliability challenge. Traditionally, EM containment revolves around EM guidelines, generated at single-component level, whose non-compliance means that the component fails. Failure usually refers to deformation due to EM -manifested in form of resistance increase, which is unacceptable from circuit performance point of view. Subsequent aspects deal with correct-by-construct design of the chip followed by the signoff-verification of EM reliability. Interestingly, chip designs today have reached a dilemma point of reduced margin between the actual and reliably allowed current densities, versus, comparatively scarce system-failures. Consequently, this research is focused on improved algorithms and methodologies for interconnect reliability analysis enabling accurate and design-specific interpretation of EM events. In the first part, we present a new methodology for logic-IP (cell) internal EM verification: an inadequately attended area in the literature. Our SPICE-correlated model helps in evaluating the cell lifetime under any arbitrary reliability speciation, without generating additional data - unlike the traditional approaches. The model is apt for today's fab less eco-system, where there is a) increasing reuse of standard cells optimized for one market condition to another (e.g., wireless to automotive), as well as b) increasing 3rd party content on the chip requiring a rigorous sign-off. We present results from a 28nm production setup, demonstrating significant violations relaxation and flexibility to allow runtime level reliability retargeting. Subsequently, we focus on an important aspect of connecting the individual component-level failures to that of the system failure. We note that existing EM methodologies are based on serial reliability assumption, which deems the entire system to fail as soon as the first component in the system fails. With a highly redundant circuit topology, that of a clock grid, in perspective, we present algorithms for EM assessment, which allow us to incorporate and quantify the benefit from system redundancies. With the skew metric of clock-grid as a failure criterion, we demonstrate that unless such incorporations are done, chip lifetimes are underestimated by over 2x. This component-to-system reliability bridge is further extended through an extreme order statistics based approach, wherein, we demonstrate that system failures can be approximated by an asymptotic kth-component failure model, otherwise requiring costly Monte Carlo simulations. Using such approach, we can efficiently predict a system-criterion based time to failure within existing EDA frameworks. The last part of the research is related to incorporating the impact of global/local process variation on current densities as well as fundamental physical factors on EM. Through Hermite polynomial chaos based approach, we arrive at novel variations-aware current density models, which demonstrate significant margins (> 30 %) in EM lifetime when compared with the traditional worst case approach. The above research problems have been motivated by the decade-long work experience of the author dealing with reliability issues in industrial SoCs, first at Texas Instruments and later at Qualcomm.L'espectacular progrés dels dispositius de càlcul ha estat possible en gran part als esforços de la indústria dels semiconductors en proposar tècniques innovadores per circuits d'una alta escala d'integració. Els circuits integrats contenen milers de milions d'interconnexions que permeten connectar transistors dins d'un espai de pocs mm2. Tots aquests components estan afectats per camps elèctrics, impureses i defectes durant la seva fabricació. Degut a l’activitat a nivell de Gigahertzs, la fiabilitat i integritat són reptes importants pels dissenyadors de xips, on la Electromigració (EM) és un dels problemes més importants. Tradicionalment, el control de la EM ha girat entorn a directrius a nivell de component. L'incompliment d’alguna de les directrius implica un alt risc de falla. Per falla s'entén la degradació deguda a la EM, que es manifesta en forma d'augment de la resistència, la qual cosa és inacceptable des del punt de vista del rendiment del circuit. Altres aspectes tenen a veure amb la correcta construcció del xip i la verificació de fiabilitat abans d’enviar el xip a fabricar. Avui en dia, el disseny s’enfronta a dilemes importants a l’hora de definir els marges de fiabilitat dels xips. És un compromís entre eficiència i fiabilitat. La recerca en aquesta tesi se centra en la proposta d’algorismes i metodologies per a l'anàlisi de la fiabilitat d'interconnexió que permeten una interpretació precisa i específica d'esdeveniments d'EM. A la primera part de la tesi es presenta una nova metodologia pel disseny correcte-per-construcció i verificació d’EM a l’interior de les cel·les lògiques. Es presenta un model SPICE correlat que ajuda a avaluar el temps de vida de les cel·les segons qualsevol especificació arbitrària de fiabilitat i sense generar cap dada addicional, al contrari del que fan altres tècniques. El model és apte per l'ecosistema d'empreses de disseny quan hi ha a) una reutilització creixent de cel·les estàndard optimitzades per unes condicions de mercat i utilitzades en un altre (p.ex. de wireless a automoció), o b) la utilització de components del xip provinents de terceres parts i que necessiten una verificació rigorosa. Es presenten resultats en una tecnologia de 28nm, demostrant relaxacions significatives de les regles de fiabilitat i flexibilitat per permetre la reavaluació de la fiabilitat en temps d'execució. A continuació, el treball tracta un aspecte important sobre la relació entre les falles dels components i les falles del sistema. S'observa que les tècniques existents es basen en la suposició de fiabilitat en sèrie, que porta el sistema a fallar tant aviat hi ha un component que falla. Pensant en topologies redundants, com la de les graelles de rellotge, es proposen algorismes per l'anàlisi d'EM que permeten quantificar els beneficis de la redundància en el sistema. Utilitzant com a mètrica l’esbiaixi del senyal de rellotge, es demostra que la vida dels xips pot arribar a ser infravalorada per un factor de 2x. Aquest pont de fiabilitat entre component i sistema es perfecciona a través d'una tècnica basada en estadístics d'ordre extrem on es demostra que les falles poden ser aproximades amb un model asimptòtic de fallada de l'ièssim component, evitant així simulacions de Monte Carlo costoses. Amb aquesta tècnica, es pot predir eficientment el temps de fallada a nivell de sistema utilitzant eines industrials. La darrera part de la recerca està relacionada amb avaluar l'impacte de les variacions de procés en les densitats de corrent i factors físics de la EM. Mitjançant una tècnica basada en polinomis d'Hermite s'han obtingut uns nous models de densitat de corrent que mostren millores importants (>30%) en l'estimació de la vida del sistema comprades amb les tècniques basades en el cas pitjor. La recerca d'aquesta tesi ha estat motivada pel treball de l'autor durant més d'una dècada tractant temes de fiabilitat en sistemes, primer a Texas Instruments i després a Qualcomm.Postprint (published version

Optical inertial space sextant for an advanced space navigation system

Dual field optical tracking system and television camera chain combined with two gyroscopes to form space navigation sextant

Hierarchical architecture design and simulation environment

The Hierarchical Architectural design and Simulation Environment (HASE)is intended as a flexible tool for computer architects who wish to experiment with alternative architectural configurations and design parameters. HASE is both a design environment and a simulator. Architecture components are described by a hierarchical library of objects defined in terms of an object oriented simulation language. HASE instantiates these objects to simulate and animate the execution of a computer architecture. An event trace generated by the simulator therefore describes the interaction between architecture components, for example, fetch stages, address and data buses, sequencers, instruction buffers and register files. The objects can model physical components at different abstraction levels, eg. PMS (processor memory switch), ISP (instruction set processor) and RTL (register transfer level). HASE applies the concepts of inheritance, encapsulation and polymorphism associated with object orientation, to simplify the design and implementation of an architecture simulation that models component operations at different abstraction levels. For example, HASE can probe the performance of a processor's floating point unit, executing a multiplication operation, at a lower level of abstraction, i.e. the RTL, whilst simulating remaining architecture components at a PMS level of abstraction. By adopting this approach, HASE returns a more meaningful and relevant event trace from an architecture simulation. Furthermore, an animator visualises the simulation's event trace to clarify the collaborations and interactions between architecture components. The prototype version of HASE is based on GSS (Graphical Support System), and DEMOS (Discrete Event Modelling On Simula)

Study of radar pulse compression for high resolution satellite altimetry

Pulse compression techniques are studied which are applicable to a satellite altimeter having a topographic resolution of + 10 cm. A systematic design procedure is used to determine the system parameters. The performance of an optimum, maximum likelihood processor is analysed, which provides the basis for modifying the standard split-gate tracker to achieve improved performance. Bandwidth considerations lead to the recommendation of a full deramp STRETCH pulse compression technique followed by an analog filter bank to separate range returns. The implementation of the recommended technique is examined

Modern DRAM Memory Systems: Performance Analysis and Scheduling Algorithm

The performance characteristics of modern DRAM memory systems are impacted by two primary attributes: device datarate and row cycle time. Modern DRAM device datarates and row cycle times are scaling at different rates with each successive generation of DRAM devices. As a result, the performance characteristics of modern DRAM memory systems are becoming more difficult to evaluate at the same time that they are increasingly limiting the performance of modern computer systems. In this work, a performance evaluation framework that enables abstract performance analysis of DRAM memory systems is presented. The performance evaluation framework enables the performance characterization of memory systems while fully accounting for the effects of datarates, row cycle times, protocol overheads, device power constraints, and memory system organizations. This dissertation utilizes the described evaluation framework to examine the performance impact of the number of banks per DRAM device, the effects of relatively static DRAM row cycle times and increasing DRAM device datarates, power limitation constraints, and data burst lengths in future generations of DRAM devices. Simulation results obtained in the analysis provide insights into DRAM memory system performance characteristics including, but not limited to the following observations. The performance benefit of having a 16 banks over 8 banks increases with increasing datarate. The average performance benefit reaches 18% at 1 Gbps for both open-page and close-page systems. Close-page systems are greatly limited by DRAM device power constraints, while open-page systems are less sensitive to DRAM device power constraints. Increasing burst lengths of future DRAM devices can adversely impact cache-limited processors despite the increasing bandwidth. Performance losses of greater than 50% are observed. Finally, This dissertation also present a unique rank hopping DRAM command-scheduling algorithm designed to alleviate the bandwidth constraints in DDR2 and future DDRx SDRAM memory systems. The proposed rank hopping scheduling algorithm schedules DRAM transactions and command sequences to avoid the power limiting constraints and amortizes the rank-to-rank switching overhead. Execution based simulations show that some workloads are able to fully utilize the additional bandwidth and significant performance improvements are observed across a range of workloads

Sparsity in deep learning: Pruning and growth for efficient inference and training in neural networks

The growing energy and performance costs of deep learning have driven the community to reduce the size of neural networks by selectively pruning components. Similarly to their biological counterparts, sparse networks generalize just as well, sometimes even better than, the original dense networks. Sparsity promises to reduce the memory footprint of regular networks to fit mobile devices, as well as shorten training time for ever growing networks. In this paper, we survey prior work on sparsity in deep learning and provide an extensive tutorial of sparsification for both inference and training. We describe approaches to remove and add elements of neural networks, different training strategies to achieve model sparsity, and mechanisms to exploit sparsity in practice. Our work distills ideas from more than 300 research papers and provides guidance to practitioners who wish to utilize sparsity today, as well as to researchers whose goal is to push the frontier forward. We include the necessary background on mathematical methods in sparsification, describe phenomena such as early structure adaptation, the intricate relations between sparsity and the training process, and show techniques for achieving acceleration on real hardware. We also define a metric of pruned parameter efficiency that could serve as a baseline for comparison of different sparse networks. We close by speculating on how sparsity can improve future workloads and outline major open problems in the field

Late-bound code generation

Each time a function or method is invoked during the execution of a program, a stream of instructions is issued to some underlying hardware platform. But exactly what underlying hardware, and which instructions, is usually left implicit. However in certain situations it becomes important to control these decisions. For example, particular problems can only be solved in real-time when scheduled on specialised accelerators, such as graphics coprocessors or computing clusters. We introduce a novel operator for hygienically reifying the behaviour of a runtime function instance as a syntactic fragment, in a language which may in general differ from the source function definition. Translation and optimisation are performed by recursively invoked, dynamically dispatched code generators. Side-effecting operations are permitted, and their ordering is preserved. We compare our operator with other techniques for pragmatic control, observing that: the use of our operator supports lifting arbitrary mutable objects, and neither requires rewriting sections of the source program in a multi-level language, nor interferes with the interface to individual software components. Due to its lack of interference at the abstraction level at which software is composed, we believe that our approach poses a significantly lower barrier to practical adoption than current methods. The practical efficacy of our operator is demonstrated by using it to offload the user interface rendering of a smartphone application to an FPGA coprocessor, including both statically and procedurally defined user interface components. The generated pipeline is an application-specific, statically scheduled processor-per-primitive rendering pipeline, suitable for place-and-route style optimisation. To demonstrate the compatibility of our operator with existing languages, we show how it may be defined within the Python programming language. We introduce a transformation for weakening mutable to immutable named bindings, termed let-weakening, to solve the problem of propagating information pertaining to named variables between modular code generating units.Open Acces