Transition Faults and Transition Path Delay Faults: Test Generation, Path Selection, and Built-In Generation of Functional Broadside Tests

As the clock frequency and complexity of digital integrated circuits increase rapidly, delay testing is indispensable to guarantee the correct timing behavior of the circuits. In this dissertation, we describe methods developed for three aspects of delay testing in scan-based circuits: test generation, path selection and built-in test generation. We first describe a deterministic broadside test generation procedure for a path delay fault model named the transition path delay fault model, which captures both large and small delay defects. Under this fault model, a path delay fault is detected only if all the individual transition faults along the path are detected by the same test. To reduce the complexity of test generation, sub-procedures with low complexity are applied before a complete branch-and-bound procedure. Next, we describe a method based on static timing analysis to select critical paths for test generation. Logic conditions that are necessary for detecting a path delay fault are considered to refine the accuracy of static timing analysis, using input necessary assignments. Input necessary assignments are input values that must be assigned to detect a fault. The method calculates more accurate path delays, selects paths that are critical during test application, and identifies undetectable path delay faults. These two methods are applicable to off-line test generation. For large circuits with high complexity and frequency, built-in test generation is a cost-effective method for delay testing. For a circuit that is embedded in a larger design, we developed a method for built-in generation of functional broadside tests to avoid excessive power dissipation during test application and the overtesting of delay faults, taking the functional constraints on the primary input sequences of the circuit into consideration. Functional broadside tests are scan-based two-pattern tests for delay faults that create functional operation conditions during test application. To avoid the potential fault coverage loss due to the exclusive use of functional broadside tests, we also developed an optional DFT method based on state holding to improve fault coverage. High delay fault coverage can be achieved by the developed method for benchmark circuits using simple hardware

The biology and behaviour of a free-living population of black rats (Rattus rattus)

A population of wild Rattus rattus living in the roofs of the laboratory buildings was studied by supplying food every evening and watching the behaviour of the animals at the feeding place. Some observations were also made on caged animals. The rats were predominantly of the black rattus variety but white-bellied greys appeared now and then. In breeding tests the grey colour behaved as though determined by a single recessive gene. The study covered two periods of approximately 9 months each, separated by an interval of 3 months during which a reduced quantity of food was provided and the rat population underwent a major decline. During the two periods of richer feeding the population first increased and then stabilized at a level where the animals remained in good condition and there was no starvation. In the first 9-month period, stabilization was achieved by emigration of young adults who colonized neighbouring buildings. Towards the end of the second period, stabilization was achieved by limitation of breeding. The rats accepted a wide variety of foods, including meat, and a number of instances of predation were seen. Small vertebrates as well as insects were killed and eaten. Small pieces of food were usually eaten in situ but large bits were taken up to the nests in the roof. Such differential treatment in relation to size may be a factor of some importance in the evolution of hoarding. The rats visiting the feeding place formed a unit with a definite social structure. A single dominant male and never more than one, was always present and in certain circumstances a linear male hierarchy was formed. There were usually two or three mutually tolerant top ranking females who were subordinate to the top male but dominant to all other members of the group. Within the group attacks were directed downwards in the social scale. An attacked subordinate either fled or appeased and serious fights therefore did not develop. The most essential component of the appease. ment appeared to be a mouth to mouth contact which may be derived from the infantile pattern of 'mouth suckling'. Appeasement permitted superior rats to maintain their status without the necessity of carrying attacks on subordinates to the point where actual hurt was inflicted. A group territory round the feeding place was defended against interlopers. Both sexes took part in chasing out intruders but since males showed inhibition in attacking females, the exclusion of strange females was due principally to the activities of the home females. The point at which pursuit of an intruder stopped was regarded as the territorial boundary. This was also the limit beyond which a group member would not allow himself to be chased but it was not a prison wall. When agonistic tendencies were not aroused the animals no longer always I turned back at the boundary and foraging beyond its limits allowed them to become familiar with an area larger than the territory. Although intruders were normally driven out, it was occasionally possible for a particularly determined animal of either sex to force its way in and ultimately become a member of the group. The patterns of behaviour seen are described, particularly those concerned with hostile encounters and with mating. Scent marking with urine drip trails was not seen but adults of both sexes marked by rubbing the cheeks and ventral surface on branches. The circumstances in which tooth gnashing was heard suggest that this behaviour is not a form of threat but a response to unfamiliar auditory or visual stimuli. There was some evidence that it functioned as an alarm signal within the group. Pilo-erection and a gait or posture with the hind legs much extended ('stegosauring') are considered to function as threats. Pilo-erection occurred in situations where there was little to suggest conflict and is considered to represent a form of threat which has undergone emancipation. Various forms of displacement and ambivalent behaviour were seen. Rapid vibration of the tail occurred in thwarting situations, either during mating or when a defeated opponent suddenly vanished. There was no evidence that it acted as a signal. The common form of amicable behaviour was social grooming. Another amicable action was sitting together with the bodies in contact. Animals reared in cages remained shy and wary and even hand reared young developed the usual alarm responses to movement and noises. Females had their first litters at ages of 3 to 5 months. For first litters gestation periods were 21 to 22 days but in females that were simultaneously lactating they ranged from 23 to 29 days. Eight was the commonest litter number and ten the highest recorded. At birth the tail is very much shorter than the body but has outstripped it by the time the youngster emerges from the nest. This was found to be the result of a period of extremely rapid tail growth immediately preceding emergence. In Rattus norvegicus the peak in tail growth rate was found to be later and less striking. The difference is interpreted as related to the importance of the tail in climbing in the more arboreal R. rattus. During the second week of life an edge response (retreat from a declivity) and a clinging response made their appearance: these have the function of preventing accidental falls from a nest situated above ground level. Mouth suckling was seen only during a period of a few days towards the end of lactation. Play developed within a few days of emergence from the nest: locomotor and fighting play were the common types. Older animals occasionally joined in play with the young. In problem solving tests, first solutions were not insightful but once a solution had been found, the successful technique was at once adopted and subsequently perfected. There was no evidence of learning by imitation but the rats did learn from each other's behaviour that food could be obtained at a certain location and thus the solution of a problem by one rat accelerated its independent solution by others. The reasons for the differences between the behaviour of the free living population and the caged animals studied by other authors are discussed

Improving timing verification and delay testing methodologies for IC designs

textThe task of ensuring the correct temporal behavior of IC designs, both before and after fabrication, is extremely important. It is becoming even more imperative as the demand for performance increases and process technology advances into the deep sub-micron region. This dissertation tackles the key issues in the timing verification and delay testing methodologies. An efficient methodology is presented to identify false timing paths in the timing verification methodology which utilizes ATPG technique and timing information from an ordered list of timing paths according to the delay information. This dissertation also presents a speed binning methodology which utilizes structural delay tests successfully instead of functional tests. In addition, it establishes a methodology which quantifies the correlation between the timing verification prediction and actual silicon measurement of timing paths. This quantification methodology lays the foundation for further research to study the impact of deep submicron effects on design performanceElectrical and Computer Engineerin

Low-Capture-Power Test Generation for Scan-Based At-Speed Testing

Scan-based at-speed testing is a key technology to guarantee timing-related test quality in the deep submicron era. However, its applicability is being severely challenged since significant yield loss may occur from circuit malfunction due to excessive IR drop caused by high power dissipation when a test response is captured. This paper addresses this critical problem with a novel low-capture-power X-filling method of assigning 0\u27s and 1\u27s to unspecified (X) bits in a test cube obtained during ATPG. This method reduces the circuit switching activity in capture mode and can be easily incorporated into any test generation flow to achieve capture power reduction without any area, timing, or fault coverage impact. Test vectors generated with this practical method greatly improve the applicability of scan-based at-speed testing by reducing the risk of test yield lossIEEE International Conference on Test, 2005, 8 November 2005, Austin, TX, US

A survey of scan-capture power reduction techniques

With the advent of sub-nanometer geometries, integrated circuits (ICs) are required to be checked for newer defects. While scan-based architectures help detect these defects using newer fault models, test data inflation happens, increasing test time and test cost. An automatic test pattern generator (ATPG) exercise’s multiple fault sites simultaneously to reduce test data which causes elevated switching activity during the capture cycle. The switching activity results in an IR drop exceeding the devices under test (DUT) specification. An increase in IR-drop leads to failure of the patterns and may cause good DUTs to fail the test. The problem is severe during at-speed scan testing, which uses a functional rated clock with a high frequency for the capture operation. Researchers have proposed several techniques to reduce capture power. They used various methods, including the reduction of switching activity. This paper reviews the recently proposed techniques. The principle, algorithm, and architecture used in them are discussed, along with key advantages and limitations. In addition, it provides a classification of the techniques based on the method used and its application. The goal is to present a survey of the techniques and prepare a platform for future development in capture power reduction during scan testing

Test Pattern Generation Using LFSR with Reseeding Scheme for BIST Designs

ABSTRACT: In this paper we present LFSR reseeding scheme for BIST. A time -to -market efficient algorithm is introduced for selecting reseeding points in the test sequence. This algorithm targets complete fault coverage and minimization of the test length. Functional broadside tests that avoid over testing by ensuring that a circuit traverses only reachable states during the functional clock cycles of a tes

Engineering evaluations and studies. Volume 2: Exhibit B, part 1

Ku-band communication system analysis, S-band system investigations, payload communication investigations, shuttle/TDRSS and GSTDN compatibility analysis are discussed

Compressed Skewed-Load Delay Test Generation Based on Evolution and Deterministic Initialization of Populations

The current design and manufacturing semiconductor technologies require to test the products against delay related defects. However, complex acpSOC require low-overhead testability methods to keep the test cost at an acceptable level. Skewed-load tests seem to be the appropriate way to test delay faults in these acpSOC because the test application requires only one storage element per scan cell. Compressed skewed-load test generator based on genetic algorithm is proposed for wrapper-based logic cores of acpSOC. Deterministic population initialization is used to ensure the highest achievable aclTDF coverage for the given wrapper and scan cell order. The developed method performs test data compression by generating test vectors containing already overlapped test vector pairs. The experimental results show high fault coverages, decreased test lengths and better scalability in comparison to recent methods

Adaptive Antenna Arrays for Ad-Hoc Millimetre-Wave Wireless Communications

New technologies that employ millimetre-wave frequency bands to achieve high speed wireless links are gaining more attention (Dyadyuk et. al., 2007, 2009b, 2010a; Hirata et. al., 2006; Lockie & Peck, 2009; Kasugi et. al., 2009; Wells, 2009) due to increasing demand for wideband wireless communications. Very wide uncongested spectrum is available in the E—bands (71-76 GHz and 81-86 GHz) recently allocated for wireless communications in USA, Europe, Korea, Russia and Australia. The E-band provides an opportunity for line-of – sight (LOS) links with higher data rates, well suited for fibre replacement and backhaul applications. Future mobile and ad-hoc communications networks will require higher bandwidth and longer range. An ad-hoc or mobile (e.g. inter-aircraft) network that relies on high gain antennas also requires beam scanning. Adaptive antenna arrays have found a wide rage of applications and are becoming essential parts of wireless communications systems (Abbaspour-Tamijani & Sarabandi, 2003; Do-Hong & Russer, 2004; Gross, 2005; Guo, 2004; Krim & Viberg, 1996; Mailloux, 2005, 2007; Rogstad et al., 2003; Singh et al., 2008). While the spectrum available in the millimetre-wave frequency bands enables multi-gigabit-per second data rates, the practically achievable communication range is limited by several factors. These include the higher atmospheric attenuation at these frequencies and limited output power of monolithic microwave integrated circuits (MMIC) (Doan et al., 2004; Dyadyuk et al., 2008a; Kasper et al., 2009; Floyd et al., 2007; Reynolds et. al., 2006; Vamsi et. al., 2005, Zirath et al., 2004) due to physical constraints. Therefore, the performance of the ad-hoc or mobile millimetre-wave networks requires enhancement by using spatial power combining antenna arrays