Performance Comparison of Static CMOS and Domino Logic Style in VLSI Design: A Review

Of late, there is a steep rise in the usage of handheld gadgets and high speed applications. VLSI designers often choose static CMOS logic style for low power applications. This logic style provides low power dissipation and is free from signal noise integrity issues. However, designs based on this logic style often are slow and cannot be used in high performance circuits. On the other hand designs based on Domino logic style yield high performance and occupy less area. Yet, they have more power dissipation compared to their static CMOS counterparts. As a practice, designers during circuit synthesis, mix more than one logic style judiciously to obtain the advantages of each logic style. Carefully designing a mixed static Domino CMOS circuit can tap the advantages of both static and Domino logic styles overcoming their own short comings

Application of Decision Diagrams for Information Storage and Retrieval

Technology is improving at an amazing pace and one reason for this advancement is because of unprecedented growth in the field of Information Technology and also in Digital Integrated Circuit technology over the past few decades. The size of a typical modern database is in the order of high ends of gigabytes and even terabytes. Researchers were successful in designing complex databases but there is still lot of activity on effectively making use of this stored information. There have been significant advancements in the field of Logic optimization and also in Information storage and retrieval but there has been very little transfer of these methods. The purpose of this study is to investigate the use of powerful Computer Aided Design (CAD) techniques for efficient information storage and retrieval. In the work presented in this thesis, it is shown that Decision Diagrams can be used for efficient data storage and information retrieval. An efficient technique is proposed for each of the two key areas of research in Database systems known as Query Optimization and Datamining . Encouraging results are obtained indicating that using hardware techniques for information processing can be a new approach for solving these problems. An SQL query is represented using a hardware data structure known as an AND/OR graph and an SQL parser is interfaced with AND/OR package to achieve query optimization. Optimization using AND/OR graphs works only in the Boolean domain and to make the process of query optimization more complete it has to be investigated in Multivalued domain. The possibility of using MDD as a data structure to represent the query in the multi valued domain is discussed and a synthesis technique is developed to synthesize Multi Valued Logic Networks using MDD. Another useful data structure known as BDD can be used to store the large transaction files used in datamining applications very effectively

Symmetric rearrangeable networks and algorithms

A class of symmetric rearrangeable nonblocking networks has been considered in this thesis. A particular focus of this thesis is on Benes networks built with 2 x 2 switching elements. Symmetric rearrangeable networks built with larger switching elements have also being considered. New applications of these networks are found in the areas of System on Chip (SoC) and Network on Chip (NoC). Deterministic routing algorithms used in NoC applications suffer low scalability and slow execution time. On the other hand, faster algorithms are blocking and thus limit throughput. This will be an acceptable trade-off for many applications where achieving ”wire speed” on the on-chip network would require extensive optimisation of the attached devices. In this thesis I designed an algorithm that has much lower blocking probabilities than other suboptimal algorithms but a much faster execution time than deterministic routing algorithms. The suboptimal method uses the looping algorithm in its outermost stages and then in the two distinct subnetworks deeper in the switch uses a fast but suboptimal path search method to find available paths. The worst case time complexity of this new routing method is O(NlogN) using a single processor, which matches the best known results reported in the literature. Disruption of the ongoing communications in this class of networks during rearrangements is an open issue. In this thesis I explored a modification of the topology of these networks which gives rise to what is termed as repackable networks. A repackable topology allows rearrangements of paths without intermittently losing connectivity by breaking the existing communication paths momentarily. The repackable network structure proposed in this thesis is efficient in its use of hardware when compared to other proposals in the literature. As most of the deterministic algorithms designed for Benes networks implement a permutation of all inputs to find the routing tags for the requested inputoutput pairs, I proposed a new algorithm that can work for partial permutations. If the network load is defined as ρ, the mean number of active inputs in a partial permutation is, m = ρN, where N is the network size. This new method is based on mapping the network stages into a set of sub-matrices and then determines the routing tags for each pair of requests by populating the cells of the sub-matrices without creating a blocking state. Overall the serial time complexity of this method is O(NlogN) and O(mlogN) where all N inputs are active and with m < N active inputs respectively. With minor modification to the serial algorithm this method can be made to work in the parallel domain. The time complexity of this routing algorithm in a parallel machine with N completely connected processors is O(log^2 N). With m active requests the time complexity goes down to (logmlogN), which is better than the O(log^2 m + logN), reported in the literature for 2^0.5((log^2 -4logN)^0.5-logN)<= ρ <= 1. I also designed multistage symmetric rearrangeable networks using larger switching elements and implement a new routing algorithm for these classes of networks. The network topology and routing algorithms presented in this thesis should allow large scale networks of modest cost, with low setup times and moderate blocking rates, to be constructed. Such switching networks will be required to meet the bandwidth requirements of future communication networks

DESIGN AND SYNTHESIS OF HIGH DENSITY INTEGRATED CIRCUITS

Gordon E. Moore, a co-founder of Fairchild Semiconductor, and later of Intel, predicted that after 1980 the complexity of an Integrated Circuit would be expected to double every two years. The prevision made by Moore held for decades, for this reason it is also called \u201cMoore\u2019s law\u201d. The trend in ICs is driven by a reduction of area and power consumption. Today scaled CMOS technologies are the main solution for digital processing. However, the interconnection scaling is not optimal. At every new technology node, the number of metal layers and their thickness increases, exploiting the vertical direction. The reduction of the minimum distance between interconnections and the growth in vertical dimension increase the parasitic capacitance and consequently the dynamic power consumption. Moreover, due to the non-optimal scaling of the interconnections, signal routing is becoming more and more challenging at every technology node advancement. Very scaled technologies make possible to reach a great transistor density. However, the design must comply to strict rules for metal interconnections. The aim of this thesis is to find possible solutions to the disadvantages of scaled CMOS technologies. This goal is obtained in two different ways: using ad-hoc design techniques on today CMOS technologies and finding new approaches to logic synthesis of nanocrossbars, that are an emerging post-CMOS technology. The two approaches used corresponds to the two parts of this thesis. The first part presents the design of an Associative Memory focusing the attention on develop design and logic synthesis techniques to reduce power consumption. The field of applicability of AMs is real-time pattern-recognition tasks. The possible uses range from scientific calculations to image processing for intelligent autonomous devices to image reconstruction for electro-medical apparatuses. In particular AMs are used in High Energy Physics (HEP) experiments to detect particle tracks. HEP experiments generate a huge amount of data, but it is necessary to select and save only the most interesting tracks. Being the data compared in parallel, AMs are synchronous ICs that have a very peaked power consumption, and therefore it is necessary to minimize the power consumption. This AM is designed within the projects IMPART and HTT in 28 nm CMOS technology, using a fully-CMOS approach. The logic is based on the propagation of a \u201ckill signal\u201d that, if one of the bits in a word is not matching, inhibits the switching of the following cells. Thanks to this feature, the designed AM array consumes less than 0.7 fJ/bit. A prototype has been fabricated and it has proven to be functional. The final chip will be installed in the data acquisition chain of ATLAS experiment on HL-LHC at CERN. In the future nanocrossbars are expected to reduce device dimensions and interconnection complexity with respect to CMOS. Logic functions are obtained with switching lattices of four-terminal switches. The research activity on nanocrossbars is done within the project NANOxCOMP. To improve synthesis are used some algorithmic approaches based on Boolean function decomposition and regularities, in particular P-circuits, EXOR-Projected Sums of Products (EP-SOP), Dimension-reducible (D-red) functions and autosymmetric functions. The decomposed functions are implemented into lattices using internal and external decomposition methods. Experimental results show that this approaches reduce the complexity of the single synthesis problem and leads, in average, to a reduction of lattice area and synthesis time. Lattices are made of self-assembled structures and they have a non-negligible defectivity ratio. To cope with this limitation, some techniques to reduce sensitivity to defects have been studied

Approximate logic circuits: Theory and applications

CMOS technology scaling, the process of shrinking transistor dimensions based on Moore's law, has been the thrust behind increasingly powerful integrated circuits for over half a century. As dimensions are scaled to few tens of nanometers, process and environmental variations can significantly alter transistor characteristics, thus degrading reliability and reducing performance gains in CMOS designs with technology scaling. Although design solutions proposed in recent years to improve reliability of CMOS designs are power-efficient, the performance penalty associated with these solutions further reduces performance gains with technology scaling, and hence these solutions are not well-suited for high-performance designs. This thesis proposes approximate logic circuits as a new logic synthesis paradigm for reliable, high-performance computing systems. Given a specification, an approximate logic circuit is functionally equivalent to the given specification for a "significant" portion of the input space, but has a smaller delay and power as compared to a circuit implementation of the original specification. This contributions of this thesis include (i) a general theory of approximation and efficient algorithms for automated synthesis of approximations for unrestricted random logic circuits, (ii) logic design solutions based on approximate circuits to improve reliability of designs with negligible performance penalty, and (iii) efficient decomposition algorithms based on approxiiii mate circuits to improve performance of designs during logic synthesis. This thesis concludes with other potential applications of approximate circuits and identifies. open problems in logic decomposition and approximate circuit synthesis

Low harmonic distortion flash A/D converters incorporating dynamic element matching techniques

New dynamic element matching techniques are shown to reduce the harmonic distortion and improve the spurious-free dynamic range of flash ADCs. Resistor chain mismatch errors are negated by randomly rearranging the resistors each sample by utilizing 5(2{dollar}\sp{b}{dollar}-1) digital switches and b + 1 random control signals for a b-bit flash ADC. The integral and differential nonlinearity of a non-ideal flash ADC are derived for three common resistor chain mismatch errors; namely, geometric mismatches, linear gradient mismatches, and dynamic mismatches. The transfer function of a non-ideal flash ADC is also derived and the converter output is shown to consist of a scaled copy of the input, a DC gain, and conversion noise that is a function of the resistor mismatches. A comprehensive summary of dynamic element matching techniques given in literature is provided. In addition, the DEM network introduced by Galton and Jensen is shown to be equivalent to the generalized-cube network used in parallel processing architectures. An alternative version of this network that uses logic gates is also proposed

Transient error mitigation by means of approximate logic circuits

Mención Internacional en el título de doctorThe technological advances in the manufacturing of electronic circuits have allowed to greatly improve their performance, but they have also increased the sensitivity of electronic devices to radiation-induced errors. Among them, the most common effects are the SEEs, i.e., electrical perturbations provoked by the strike of high-energy particles, which may modify the internal state of a memory element (SEU) or generate erroneous transient pulses (SET), among other effects. These events pose a threat for the reliability of electronic circuits, and therefore fault-tolerance techniques must be applied to deal with them. The most common fault-tolerance techniques are based in full replication (DWC or TMR). These techniques are able to cover a wide range of failure mechanisms present in electronic circuits. However, they suffer from high overheads in terms of area and power consumption. For this reason, lighter alternatives are often sought at the expense of slightly reducing reliability for the least critical circuit sections. In this context a new paradigm of electronic design is emerging, known as approximate computing, which is based on improving the circuit performance in change of slight modifications of the intended functionality. This is an interesting approach for the design of lightweight fault-tolerant solutions, which has not been yet studied in depth. The main goal of this thesis consists in developing new lightweight fault-tolerant techniques with partial replication, by means of approximate logic circuits. These circuits can be designed with great flexibility. This way, the level of protection as well as the overheads can be adjusted at will depending on the necessities of each application. However, finding optimal approximate circuits for a given application is still a challenge. In this thesis a method for approximate circuit generation is proposed, denoted as fault approximation, which consists in assigning constant logic values to specific circuit lines. On the other hand, several criteria are developed to generate the most suitable approximate circuits for each application, by using this fault approximation mechanism. These criteria are based on the idea of approximating the least testable sections of circuits, which allows reducing overheads while minimising the loss of reliability. Therefore, in this thesis the selection of approximations is linked to testability measures. The first criterion for fault selection developed in this thesis uses static testability measures. The approximations are generated from the results of a fault simulation of the target circuit, and from a user-specified testability threshold. The amount of approximated faults depends on the chosen threshold, which allows to generate approximate circuits with different performances. Although this approach was initially intended for combinational circuits, an extension to sequential circuits has been performed as well, by considering the flip-flops as both inputs and outputs of the combinational part of the circuit. The experimental results show that this technique achieves a wide scalability, and an acceptable trade-off between reliability versus overheads. In addition, its computational complexity is very low. However, the selection criterion based in static testability measures has some drawbacks. Adjusting the performance of the generated approximate circuits by means of the approximation threshold is not intuitive, and the static testability measures do not take into account the changes as long as faults are approximated. Therefore, an alternative criterion is proposed, which is based on dynamic testability measures. With this criterion, the testability of each fault is computed by means of an implication-based probability analysis. The probabilities are updated with each new approximated fault, in such a way that on each iteration the most beneficial approximation is chosen, that is, the fault with the lowest probability. In addition, the computed probabilities allow to estimate the level of protection against faults that the generated approximate circuits provide. Therefore, it is possible to generate circuits which stick to a target error rate. By modifying this target, circuits with different performances can be obtained. The experimental results show that this new approach is able to stick to the target error rate with reasonably good precision. In addition, the approximate circuits generated with this technique show better performance than with the approach based in static testability measures. In addition, the fault implications have been reused too in order to implement a new type of logic transformation, which consists in substituting functionally similar nodes. Once the fault selection criteria have been developed, they are applied to different scenarios. First, an extension of the proposed techniques to FPGAs is performed, taking into account the particularities of this kind of circuits. This approach has been validated by means of radiation experiments, which show that a partial replication with approximate circuits can be even more robust than a full replication approach, because a smaller area reduces the probability of SEE occurrence. Besides, the proposed techniques have been applied to a real application circuit as well, in particular to the microprocessor ARM Cortex M0. A set of software benchmarks is used to generate the required testability measures. Finally, a comparative study of the proposed approaches with approximate circuit generation by means of evolutive techniques have been performed. These approaches make use of a high computational capacity to generate multiple circuits by trial-and-error, thus reducing the possibility of falling into local minima. The experimental results demonstrate that the circuits generated with evolutive approaches are slightly better in performance than the circuits generated with the techniques here proposed, although with a much higher computational effort. In summary, several original fault mitigation techniques with approximate logic circuits are proposed. These approaches are demonstrated in various scenarios, showing that the scalability and adaptability to the requirements of each application are their main virtuesLos avances tecnológicos en la fabricación de circuitos electrónicos han permitido mejorar en gran medida sus prestaciones, pero también han incrementado la sensibilidad de los mismos a los errores provocados por la radiación. Entre ellos, los más comunes son los SEEs, perturbaciones eléctricas causadas por el impacto de partículas de alta energía, que entre otros efectos pueden modificar el estado de los elementos de memoria (SEU) o generar pulsos transitorios de valor erróneo (SET). Estos eventos suponen un riesgo para la fiabilidad de los circuitos electrónicos, por lo que deben ser tratados mediante técnicas de tolerancia a fallos. Las técnicas de tolerancia a fallos más comunes se basan en la replicación completa del circuito (DWC o TMR). Estas técnicas son capaces de cubrir una amplia variedad de modos de fallo presentes en los circuitos electrónicos. Sin embargo, presentan un elevado sobrecoste en área y consumo. Por ello, a menudo se buscan alternativas más ligeras, aunque no tan efectivas, basadas en una replicación parcial. En este contexto surge una nueva filosofía de diseño electrónico, conocida como computación aproximada, basada en mejorar las prestaciones de un diseño a cambio de ligeras modificaciones de la funcionalidad prevista. Es un enfoque atractivo y poco explorado para el diseño de soluciones ligeras de tolerancia a fallos. El objetivo de esta tesis consiste en desarrollar nuevas técnicas ligeras de tolerancia a fallos por replicación parcial, mediante el uso de circuitos lógicos aproximados. Estos circuitos se pueden diseñar con una gran flexibilidad. De este forma, tanto el nivel de protección como el sobrecoste se pueden regular libremente en función de los requisitos de cada aplicación. Sin embargo, encontrar los circuitos aproximados óptimos para cada aplicación es actualmente un reto. En la presente tesis se propone un método para generar circuitos aproximados, denominado aproximación de fallos, consistente en asignar constantes lógicas a ciertas líneas del circuito. Por otro lado, se desarrollan varios criterios de selección para, mediante este mecanismo, generar los circuitos aproximados más adecuados para cada aplicación. Estos criterios se basan en la idea de aproximar las secciones menos testables del circuito, lo que permite reducir los sobrecostes minimizando la perdida de fiabilidad. Por tanto, en esta tesis la selección de aproximaciones se realiza a partir de medidas de testabilidad. El primer criterio de selección de fallos desarrollado en la presente tesis hace uso de medidas de testabilidad estáticas. Las aproximaciones se generan a partir de los resultados de una simulación de fallos del circuito objetivo, y de un umbral de testabilidad especificado por el usuario. La cantidad de fallos aproximados depende del umbral escogido, lo que permite generar circuitos aproximados con diferentes prestaciones. Aunque inicialmente este método ha sido concebido para circuitos combinacionales, también se ha realizado una extensión a circuitos secuenciales, considerando los biestables como entradas y salidas de la parte combinacional del circuito. Los resultados experimentales demuestran que esta técnica consigue una buena escalabilidad, y unas prestaciones de coste frente a fiabilidad aceptables. Además, tiene un coste computacional muy bajo. Sin embargo, el criterio de selección basado en medidas estáticas presenta algunos inconvenientes. No resulta intuitivo ajustar las prestaciones de los circuitos aproximados a partir de un umbral de testabilidad, y las medidas estáticas no tienen en cuenta los cambios producidos a medida que se van aproximando fallos. Por ello, se propone un criterio alternativo de selección de fallos, basado en medidas de testabilidad dinámicas. Con este criterio, la testabilidad de cada fallo se calcula mediante un análisis de probabilidades basado en implicaciones. Las probabilidades se actualizan con cada nuevo fallo aproximado, de forma que en cada iteración se elige la aproximación más favorable, es decir, el fallo con menor probabilidad. Además, las probabilidades calculadas permiten estimar la protección frente a fallos que ofrecen los circuitos aproximados generados, por lo que es posible generar circuitos que se ajusten a una tasa de fallos objetivo. Modificando esta tasa se obtienen circuitos aproximados con diferentes prestaciones. Los resultados experimentales muestran que este método es capaz de ajustarse razonablemente bien a la tasa de fallos objetivo. Además, los circuitos generados con esta técnica muestran mejores prestaciones que con el método basado en medidas estáticas. También se han aprovechado las implicaciones de fallos para implementar un nuevo tipo de transformación lógica, consistente en sustituir nodos funcionalmente similares. Una vez desarrollados los criterios de selección de fallos, se aplican a distintos campos. En primer lugar, se hace una extensión de las técnicas propuestas para FPGAs, teniendo en cuenta las particularidades de este tipo de circuitos. Esta técnica se ha validado mediante experimentos de radiación, los cuales demuestran que una replicación parcial con circuitos aproximados puede ser incluso más robusta que una replicación completa, ya que un área más pequeña reduce la probabilidad de SEEs. Por otro lado, también se han aplicado las técnicas propuestas en esta tesis a un circuito de aplicación real, el microprocesador ARM Cortex M0, utilizando un conjunto de benchmarks software para generar las medidas de testabilidad necesarias. Por ´último, se realiza un estudio comparativo de las técnicas desarrolladas con la generación de circuitos aproximados mediante técnicas evolutivas. Estas técnicas hacen uso de una gran capacidad de cálculo para generar múltiples circuitos mediante ensayo y error, reduciendo la posibilidad de caer en algún mínimo local. Los resultados confirman que, en efecto, los circuitos generados mediante técnicas evolutivas son ligeramente mejores en prestaciones que con las técnicas aquí propuestas, pero con un coste computacional mucho mayor. En definitiva, se proponen varias técnicas originales de mitigación de fallos mediante circuitos aproximados. Se demuestra que estas técnicas tienen diversas aplicaciones, haciendo de la flexibilidad y adaptabilidad a los requisitos de cada aplicación sus principales virtudes.Programa Oficial de Doctorado en Ingeniería Eléctrica, Electrónica y AutomáticaPresidente: Raoul Velazco.- Secretario: Almudena Lindoso Muñoz.- Vocal: Jaume Segura Fuste

The 1991 3rd NASA Symposium on VLSI Design

Papers from the symposium are presented from the following sessions: (1) featured presentations 1; (2) very large scale integration (VLSI) circuit design; (3) VLSI architecture 1; (4) featured presentations 2; (5) neural networks; (6) VLSI architectures 2; (7) featured presentations 3; (8) verification 1; (9) analog design; (10) verification 2; (11) design innovations 1; (12) asynchronous design; and (13) design innovations 2