26,315 research outputs found
Redundant Logic Insertion and Fault Tolerance Improvement in Combinational Circuits
This paper presents a novel method to identify and insert redundant logic
into a combinational circuit to improve its fault tolerance without having to
replicate the entire circuit as is the case with conventional redundancy
techniques. In this context, it is discussed how to estimate the fault masking
capability of a combinational circuit using the truth-cum-fault enumeration
table, and then it is shown how to identify the logic that can introduced to
add redundancy into the original circuit without affecting its native
functionality and with the aim of improving its fault tolerance though this
would involve some trade-off in the design metrics. However, care should be
taken while introducing redundant logic since redundant logic insertion may
give rise to new internal nodes and faults on those may impact the fault
tolerance of the resulting circuit. The combinational circuit that is
considered and its redundant counterparts are all implemented in semi-custom
design style using a 32/28nm CMOS digital cell library and their respective
design metrics and fault tolerances are compared
Apollo experience report: Command and service module sequential events control subsystem
The Apollo command and service module sequential events control subsystem is described, with particular emphasis on the major systems and component problems and solutions. The subsystem requirements, design, and development and the test and flight history of the hardware are discussed. Recommendations to avoid similar problems on future programs are outlined
Limits on Fundamental Limits to Computation
An indispensable part of our lives, computing has also become essential to
industries and governments. Steady improvements in computer hardware have been
supported by periodic doubling of transistor densities in integrated circuits
over the last fifty years. Such Moore scaling now requires increasingly heroic
efforts, stimulating research in alternative hardware and stirring controversy.
To help evaluate emerging technologies and enrich our understanding of
integrated-circuit scaling, we review fundamental limits to computation: in
manufacturing, energy, physical space, design and verification effort, and
algorithms. To outline what is achievable in principle and in practice, we
recall how some limits were circumvented, compare loose and tight limits. We
also point out that engineering difficulties encountered by emerging
technologies may indicate yet-unknown limits.Comment: 15 pages, 4 figures, 1 tabl
Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level
In recent technology nodes, reliability is considered a part of the standard design ¿ow at all levels of embedded system design. While techniques that use only low-level models at gate- and register transfer-level offer high accuracy, they are too inefficient to consider the overall application of the embedded system. Multi-level models with high abstraction are essential to efficiently evaluate the impact of physical defects on the system. This paper provides a methodology that leverages state-of-the-art techniques for efficient fault simulation of structural faults together with transaction-level modeling. This way it is possible to accurately evaluate the impact of the faults on the entire hardware/software system. A case study of a system consisting of hardware and software for image compression and data encryption is presented and the method is compared to a standard gate/RT mixed-level approac
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