13,191 research outputs found

    Modeling and Propagation of Noisy Waveforms in Static Timing Analysis

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    A technique based on the sensitivity of the output to input waveform is presented for accurate propagation of delay information through a gate for the purpose of static timing analysis (STA) in the presence of noise. Conventional STA tools represent a waveform by its arrival time and slope. However, this is not an accurate way of modeling the waveform for the purpose of noise analysis. The key contribution of our work is the development of a method that allows efficient propagation of equivalent waveforms throughout the circuit. Experimental results demonstrate higher accuracy of the proposed sensitivity-based gate delay propagation technique, SGDP, compared to the best of existing approaches. SGDP is compatible with the current level of gate characterization in conventional ASIC cell libraries, and as a result, it can be easily incorporated into commercial STA tools to improve their accuracy.Comment: Submitted on behalf of EDAA (http://www.edaa.com/

    Timing Measurement Platform for Arbitrary Black-Box Circuits Based on Transition Probability

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    On Timing Model Extraction and Hierarchical Statistical Timing Analysis

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    In this paper, we investigate the challenges to apply Statistical Static Timing Analysis (SSTA) in hierarchical design flow, where modules supplied by IP vendors are used to hide design details for IP protection and to reduce the complexity of design and verification. For the three basic circuit types, combinational, flip-flop-based and latch-controlled, we propose methods to extract timing models which contain interfacing as well as compressed internal constraints. Using these compact timing models the runtime of full-chip timing analysis can be reduced, while circuit details from IP vendors are not exposed. We also propose a method to reconstruct the correlation between modules during full-chip timing analysis. This correlation can not be incorporated into timing models because it depends on the layout of the corresponding modules in the chip. In addition, we investigate how to apply the extracted timing models with the reconstructed correlation to evaluate the performance of the complete design. Experiments demonstrate that using the extracted timing models and reconstructed correlation full-chip timing analysis can be several times faster than applying the flattened circuit directly, while the accuracy of statistical timing analysis is still well maintained

    Single-Event Upset Analysis and Protection in High Speed Circuits

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    The effect of single-event transients (SETs) (at a combinational node of a design) on the system reliability is becoming a big concern for ICs manufactured using advanced technologies. An SET at a node of combinational part may cause a transient pulse at the input of a flip-flop and consequently is latched in the flip-flop and generates a soft-error. When an SET conjoined with a transition at a node along a critical path of the combinational part of a design, a transient delay fault may occur at the input of a flip-flop. On the other hand, increasing pipeline depth and using low power techniques such as multi-level power supply, and multi-threshold transistor convert almost all paths in a circuit to critical ones. Thus, studying the behavior of the SET in these kinds of circuits needs special attention. This paper studies the dynamic behavior of a circuit with massive critical paths in the presence of an SET. We also propose a novel flip-flop architecture to mitigate the effects of such SETs in combinational circuits. Furthermore, the proposed architecture can tolerant a single event upset (SEU) caused by particle strike on the internal nodes of a flip-flo

    Design of Asynchronous Circuits for High Soft Error Tolerance in Deep Submicron CMOS Circuits

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    As the devices are scaling down, the combinational logic will become susceptible to soft errors. The conventional soft error tolerant methods for soft errors on combinational logic do not provide enough high soft error tolerant capability with reasonably small performance penalty. This paper investigates the feasibility of designing quasi-delay insensitive (QDI) asynchronous circuits for high soft error tolerance. We analyze the behavior of null convention logic (NCL) circuits in the presence of particle strikes, and propose an asynchronous pipeline for soft-error correction and a novel technique to improve the robustness of threshold gates, which are basic components in NCL, against particle strikes by using Schmitt trigger circuit and resizing the feedback transistor. Experimental results show that the proposed threshold gates do not generate soft errors under the strike of a particle within a certain energy range if a proper transistor size is applied. The penalties, such as delay and power consumption, are also presented
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