Flash-memories in Space Applications: Trends and Challenges

Nowadays space applications are provided with a processing power absolutely overcoming the one available just a few years ago. Typical mission-critical space system applications include also the issue of solid-state recorder(s). Flash-memories are nonvolatile, shock-resistant and power-economic, but in turn have different drawbacks. A solid-state recorder for space applications should satisfy many different constraints especially because of the issues related to radiations: proper countermeasures are needed, together with EDAC and testing techniques in order to improve the dependability of the whole system. Different and quite often contrasting dimensions need to be explored during the design of a flash-memory based solid- state recorder. In particular, we shall explore the most important flash-memory design dimensions and trade-offs to tackle during the design of flash-based hard disks for space application

DFT and BIST of a multichip module for high-energy physics experiments

Engineers at Politecnico di Torino designed a multichip module for high-energy physics experiments conducted on the Large Hadron Collider. An array of these MCMs handles multichannel data acquisition and signal processing. Testing the MCM from board to die level required a combination of DFT strategie

Testing Embedded Memories in Telecommunication Systems

Extensive system testing is mandatory nowadays to achieve high product quality. Telecommunication systems are particularly sensitive to such a requirement; to maintain market competitiveness, manufacturers need to combine reduced costs, shorter life cycles, advanced technologies, and high quality. Moreover, strict reliability constraints usually impose very low fault latencies and a high degree of fault detection for both permanent and transient faults. This article analyzes major problems related to testing complex telecommunication systems, with particular emphasis on their memory modules, often so critical from the reliability point of view. In particular, advanced BIST-based solutions are analyzed, and two significant industrial case studies presente

A programmable BIST architecture for clusters of Multiple-Port SRAMs

This paper presents a BIST architecture, based on a single microprogrammable BIST processor and a set of memory wrappers, designed to simplify the test of a system containing many distributed multi-port SRAMs of different sizes (number of bits, number of words), access protocol (asynchronous, synchronous), and timin

The walking robot project

A walking robot was designed, analyzed, and tested as an intelligent, mobile, and a terrain adaptive system. The robot's design was an application of existing technologies. The design of the six legs modified and combines well understood mechanisms and was optimized for performance, flexibility, and simplicity. The body design incorporated two tripods for walking stability and ease of turning. The electrical hardware design used modularity and distributed processing to drive the motors. The software design used feedback to coordinate the system and simple keystrokes to give commands. The walking machine can be easily adapted to hostile environments such as high radiation zones and alien terrain. The primary goal of the leg design was to create a leg capable of supporting a robot's body and electrical hardware while walking or performing desired tasks, namely those required for planetary exploration. The leg designers intent was to study the maximum amount of flexibility and maneuverability achievable by the simplest and lightest leg design. The main constraints for the leg design were leg kinematics, ease of assembly, degrees of freedom, number of motors, overall size, and weight

Safety-Critical Systems and Agile Development: A Mapping Study

In the last decades, agile methods had a huge impact on how software is developed. In many cases, this has led to significant benefits, such as quality and speed of software deliveries to customers. However, safety-critical systems have widely been dismissed from benefiting from agile methods. Products that include safety critical aspects are therefore faced with a situation in which the development of safety-critical parts can significantly limit the potential speed-up through agile methods, for the full product, but also in the non-safety critical parts. For such products, the ability to develop safety-critical software in an agile way will generate a competitive advantage. In order to enable future research in this important area, we present in this paper a mapping of the current state of practice based on {a mixed method approach}. Starting from a workshop with experts from six large Swedish product development companies we develop a lens for our analysis. We then present a systematic mapping study on safety-critical systems and agile development through this lens in order to map potential benefits, challenges, and solution candidates for guiding future research.Comment: Accepted at Euromicro Conf. on Software Engineering and Advanced Applications 2018, Prague, Czech Republi

An On-line BIST RAM Architecture with Self Repair Capabilities

The emerging field of self-repair computing is expected to have a major impact on deployable systems for space missions and defense applications, where high reliability, availability, and serviceability are needed. In this context, RAM (random access memories) are among the most critical components. This paper proposes a built-in self-repair (BISR) approach for RAM cores. The proposed design, introducing minimal and technology-dependent overheads, can detect and repair a wide range of memory faults including: stuck-at, coupling, and address faults. The test and repair capabilities are used on-line, and are completely transparent to the external user, who can use the memory without any change in the memory-access protocol. Using a fault-injection environment that can emulate the occurrence of faults inside the module, the effectiveness of the proposed architecture in terms of both fault detection and repairing capability was verified. Memories of various sizes have been considered to evaluate the area-overhead introduced by this proposed architectur

A Review paper on the Memory Built-In Self-Repair with Redundancy Logic

The Present review paper expresses the word oriented memory test methodology for Built-In Self-Repair (BISR). To replace the defect words few logics are introduced. These logics are memory BIST logic and Wrapper logic. Whenever a test is carries on, the defected words are pointed out by its address only and these addresses are called failing address. The failing addresses are stored in the fuse box. Using fuse box it avoids the classic redundancy concept, where the RAMS has spare rows and columns. After the detection of faulty address, they are stored in redundancy logic. During test and redundancy configuration, the fuse box is connected to a scan registernbsp by this processnbsp inputnbsp and output data can be evaluated