Multiple wavemode scanning for near and far-side defect characterisation

The combination of ultrasonic inspections using different wavemodes can give more information than is available with single mode inspection. In this work, the response of shear and Rayleigh waves to surface-breaking defects propagating on the near-side and far-side of a sample is investigated. The directivity of shear waves generated by a racetrack coil electromagnetic acoustic transducer (EMAT) is identified and used to set an ideal separation for a pair of transmit-receive EMATs. Defects are indicated by a reduction in the transmitted Rayleigh wave amplitude, and by blocking of the shear wave. Used together, these can identify features in the bulk wave behaviour which are due to near-face surface-breaking defects, and give a full picture of both surfaces. By using a combination of the two wavemodes, the angle of propagation and length of any near-side defects can additionally be identified. A scanning method for samples is proposed

Electronic scanning of 2-channel monopulse patterns

Scanning method involves separation of scanning capability into two independent degrees of freedom. One degree of freedom corresponds to azimuthal scanning and other to elevation scanning on spiral coordinate axes. Scanning of both prime-feed and mirrored patterns is accomplished with reduction of mechanical vibration damage to large antennas

Scanning ultrafast electron microscopy

Progress has been made in the development of four-dimensional ultrafast electron microscopy, which enables space-time imaging of structural dynamics in the condensed phase. In ultrafast electron microscopy, the electrons are accelerated, typically to 200 keV, and the microscope operates in the transmission mode. Here, we report the development of scanning ultrafast electron microscopy using a field-emission-source configuration. Scanning of pulses is made in the single-electron mode, for which the pulse contains at most one or a few electrons, thus achieving imaging without the space-charge effect between electrons, and still in ten(s) of seconds. For imaging, the secondary electrons from surface structures are detected, as demonstrated here for material surfaces and biological specimens. By recording backscattered electrons, diffraction patterns from single crystals were also obtained. Scanning pulsed-electron microscopy with the acquired spatiotemporal resolutions, and its efficient heat-dissipation feature, is now poised to provide in situ 4D imaging and with environmental capability

Scanning Quantum Decoherence Microscopy

The use of qubits as sensitive magnetometers has been studied theoretically and recent demonstrated experimentally. In this paper we propose a generalisation of this concept, where a scanning two-state quantum system is used to probe the subtle effects of decoherence (as well as its surrounding electromagnetic environment). Mapping both the Hamiltonian and decoherence properties of a qubit simultaneously, provides a unique image of the magnetic (or electric) field properties at the nanoscale. The resulting images are sensitive to the temporal as well as spatial variation in the fields created by the sample. As an example we theoretically study two applications of this technology; one from condensed matter physics, the other biophysics. The individual components required to realise the simplest version of this device (characterisation and measurement of qubits, nanoscale positioning) have already been demonstrated experimentally.Comment: 11 pages, 5 low quality (but arXiv friendly) image

Scanning microSQUID Force Microscope

A novel scanning probe technique is presented: Scanning microSQUID Force microscopy (SSFM). The instrument features independent topographic and magnetic imaging. The SSFM operates in a dilution refrigerator in cryogenic vacuum. Sample and probe can be cooled to 0.45 K. The probe consists of a microSQUID placed at the edge of a silicon chip attached to a quartz tuning fork. A topographic vertical resolution of 0.02 micrometer is demonstrated and magnetic flux as weak as $10^{-3} \Phi_{0}$ is resolved with a 1 micrometer diameter microSQUID loop.Comment: submitted to Review of Scientific Instrument

Scanning nozzle plating system

A plating system is described in which a substrate to be plated is supported on a stationary platform. A nozzle assembly with a small nozzle is supplied with a plating solution under high pressure, so that a constant-flow stream of solution is directed to the substrate. The nozzle assembly is moved relative to the substrate at a selected rate and movement pattern. A potential difference (voltage) is provided between the substrate and the solution in the assembly. The voltage amplitude is modulated so that only when the amplitude is above a minimum known value plating takes place

Scanning Quantum Dot Microscopy

Interactions between atomic and molecular objects are to a large extent defined by the nanoscale electrostatic potentials which these objects produce. We introduce a scanning probe technique that enables three-dimensional imaging of local electrostatic potential fields with sub-nanometer resolution. Registering single electron charging events of a molecular quantum dot attached to the tip of a (qPlus tuning fork) atomic force microscope operated at 5 K, we quantitatively measure the quadrupole field of a single molecule and the dipole field of a single metal adatom, both adsorbed on a clean metal surface. Because of its high sensitivity, the technique can record electrostatic potentials at large distances from their sources, which above all will help to image complex samples with increased surface roughness.Comment: main text: 5 pages, 4 figures, supplementary information file: 4 pages, 2 figure

Multipurpose binocular scanning apparatus

Optical gimballing apparatus directs narrow fields of view throughout solid angle approaching 4 pi steradians. Image rotation produced by scanning can be eliminated or altered by gear trains directly linked to the scanning drive assembly. It provides the basis for a binocular scanning capability

Distributed Port Scanning Detection

Conventional Network Intrusion Detection System (NIDS) have heavyweight processing and memory requirements as they maintain per flow state using data structures like linked lists or trees. This is required for some specialized jobs such as Stateful Packet Inspection (SPI) where the network communications between entities are recreated in its entirety to inspect application level data. The downside to this approach is that the NIDS must be in a position to view all inbound and outbound traffic of the protected network. The NIDS can be overwhelmed by a DDoS attack since most of these try and exhaust the available state of network entities. For some applications like port scan detection, we do not require to reconstruct the complete network tra�c. We propose to integrate a detector into all routers so that a more distributed detection approach can be achieved. Since routers are devices with limited memory and processing capabilities, conventional NIDS approaches do not work while integrating a detector in them. We describe a method to detect port scans using aggregation. A data structure called a Partial Completion Filter(PCF) or a counting Bloom filter is used to reduce the per flow state

Josephson scanning tunneling microscopy

We propose a set of scanning tunneling microscopy experiments in which the surface of superconductor is scanned by a superconducting tip. Potential capabilities of such experimental setup are discussed. Most important anticipated results of such an experiment include the position-resolved measurement of the superconducting order parameter and the possibility to determine the nature of the secondary component of the order parameter at the surface. The theoretical description based on the tunneling Hamiltonian formalism is presented.Comment: 6 pages, 7 figures, submitted to Phys. Rev.