A low-speed BIST framework for high-performance circuit testing

Testing of high performance integrated circuits is becoming increasingly a challenging task owing to high clock frequencies. Often testers are not able to test such devices due to their limited high frequency capabilities. In this article we outline a design-for-test methodology such that high performance devices can be tested on relatively low performance testers. In addition, a BIST framework is discussed based on this methodology. Various implementation aspects of this technique are also addresse

Power Droop Reduction In Logic BIST By Scan Chain Reordering

Significant peak power (PP), thus power droop (PD), during test is a serious concern for modern, complex ICs. In fact, the PD originated during the application of test vectors may produce a delay effect on the circuit under test signal transitions. This event may be erroneously recognized as presence of a delay fault, with consequent generation of an erroneous test fail, thus increasing yield loss. Several solutions have been proposed in the literature to reduce the PD during test of combinational ICs, while fewer approaches exist for sequential ICs. In this paper, we propose a novel approach to reduce peak power/power droop during test of sequential circuits with scan-based Logic BIST. In particular, our approach reduces the switching activity of the scan chains between following capture cycles. This is achieved by an original generation and arrangement of test vectors. The proposed approach presents a very low impact on fault coverage and test time

Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST

During at-speed test of high performance sequential ICs using scan-based Logic BIST, the IC activity factor (AF) induced by the applied test vectors is significantly higher than that experienced during its in field operation. Consequently, power droop (PD) may take place during both shift and capture phases, which will slow down the circuit under test (CUT) signal transitions. At capture, this phenomenon is likely to be erroneously recognized as due to delay faults. As a result, a false test fail may be generated, with consequent increase in yield loss. In this paper, we propose two approaches to reduce the PD generated at capture during at-speed test of sequential circuits with scan-based Logic BIST using the Launch-On-Shift scheme. Both approaches increase the correlation between adjacent bits of the scan chains with respect to conventional scan-based LBIST. This way, the AF of the scan chains at capture is reduced. Consequently, the AF of the CUT at capture, thus the PD at capture, is also reduced compared to conventional scan-based LBIST. The former approach, hereinafter referred to as Low-Cost Approach (LCA), enables a 50% reduction in the worst case magnitude of PD during conventional logic BIST. It requires a small cost in terms of area overhead (of approximately 1.5% on average), and it does not increase the number of test vectors over the conventional scan-based LBIST to achieve the same Fault Coverage (FC). Moreover, compared to three recent alternative solutions, LCA features a comparable AF in the scan chains at capture, while requiring lower test time and area overhead. The second approach, hereinafter referred to as High-Reduction Approach (HRA), enables scalable PD reductions at capture of up to 87%, with limited additional costs in terms of area overhead and number of required test vectors for a given target FC, over our LCA approach. Particularly, compared to two of the three recent alternative solutions mentioned above, HRA enables a significantly lower AF in the scan chains during the application of test vectors, while requiring either a comparable area overhead or a significantly lower test time. Compared to the remaining alternative solutions mentioned above, HRA enables a similar AF in the scan chains at capture (approximately 90% lower than conventional scan-based LBIST), while requiring a significantly lower test time (approximately 4.87 times on average lower number of test vectors) and comparable area overhead (of approximately 1.9% on average)

A Low Speed BIST Framework for High Speed Circuit Testing

Testing of high performance integrated circuits is becoming increasingly a challenging task owing to high clock frequencies. Often testers are not able to test such devices due to their limited high frequency capabilities. In this article we outline a design-for-test methodology such that high performance devices can be tested on relatively low performance testers. In addition, a BIST framework is discussed based on this methodology. Various implementation aspects of this technique are also addresse

Design-for-delay-testability techniques for high-speed digital circuits

The importance of delay faults is enhanced by the ever increasing clock rates and decreasing geometry sizes of nowadays' circuits. This thesis focuses on the development of Design-for-Delay-Testability (DfDT) techniques for high-speed circuits and embedded cores. The rising costs of IC testing and in particular the costs of Automatic Test Equipment are major concerns for the semiconductor industry. To reverse the trend of rising testing costs, DfDT is\ud getting more and more important

Scalable algorithms for software based self test using formal methods

textTransistor scaling has kept up with Moore's law with a doubling of the number of transistors on a chip. More logic on a chip means more opportunities for manufacturing defects to slip in. This, in turn, has made processor testing after manufacturing a significant challenge. At-speed functional testing, being completely non-intrusive, has been seen as the ideal way of testing chips. However for processor testing, generating instruction level tests for covering all faults is a challenge given the issue of scalability. Data-path faults are relatively easier to control and observe compared to control-path faults. In this research we present a novel method to generate instruction level tests for hard to detect control-path faults in a processor. We initially map the gate level stuck-at fault to the Register Transfer Level (RTL) and build an equivalent faulty RTL model. The fault activation and propagation constraints are captured using Control and Data Flow Graphs of the RTL as a Liner Temporal Logic (LTL) property. This LTL property is then negated and given to a Bounded Model Checker based on a Bit-Vector Satisfiability Module Theories (SMT) solver. From the counter-example to the property we can extract a sequence of instructions that activates the gate level fault and propagates the fault effect to one of the observable points in the design. Other than the user supplying instruction constraints, this approach is completely automatic and does not require any manual intervention. Not all the design behaviors are required to generate a test for a fault. We use this insight to scale our previous methodology further. Underapproximations are design abstractions that only capture a subset of the original design behaviors. The use of RTL for test generation affords us two types of under-approximations: bit-width reduction and operator approximation. These are abstractions that perform reductions based on semantics of the RTL design. We also explore structural reductions of the RTL, called path based search, where we search through error propagation paths incrementally. This approach increases the size of the test generation problem step by step. In this way the SMT solver searches through the state space piecewise rather than doing the entire search at once. Experimental results show that our methods are robust and scalable for generating functional tests for hard to detect faults.Electrical and Computer Engineerin

REDUCING POWER DURING MANUFACTURING TEST USING DIFFERENT ARCHITECTURES

Power during manufacturing test can be several times higher than power consumption in functional mode. Excessive power during test can cause IR drop, over-heating, and early aging of the chips. In this dissertation, three different architectures have been introduced to reduce test power in general cases as well as in certain scenarios, including field test. In the first architecture, scan chains are divided into several segments. Every segment needs a control bit to enable capture in a segment when new faults are detectable on that segment for that pattern. Otherwise, the segment should be disabled to reduce capture power. We group the control bits together into one or more control chains. To address the extra pin(s) required to shift data into the control chain(s) and significant post processing in the first architecture, we explored a second architecture. The second architecture stitches the control bits into the chains they control as EECBs (embedded enable capture bits) in between the segments. This allows an ATPG software tool to automatically generate the appropriate EECB values for each pattern to maintain the fault coverage. This also works in the presence of an on-chip decompressor. The last architecture focuses primarily on the self-test of a device in a 3D stacked IC when an existing FPGA in the stack can be programmed as a tester. We show that the energy expended during test is significantly less than would be required using low power patterns fed by an on-chip decompressor for the same very short scan chains

Phase Locking Authentication for Scan Architecture

Scan design is a widely used Design for Testability (DfT) approach for digital circuits. It provides a high level of controllability and observability resulting in a high fault coverage. To achieve a high level of testability, scan architecture must provide access to the internal nodes of the circuit-under-test (CUT). This access however leads to vulnerability in the security of the CUT. If an unrestricted access is provided through a scan architecture, unlimited test vectors can be applied to the CUT and its responses can be captured. Such an unrestricted access to the CUT can potentially undermine the security of the critical information stored in the CUT. There is a need to secure scan architecture to prevent hardware attacks however a secure solution may limit the CUT testability. There is a trade-off between security and testability, therefore, a secure scan architecture without hindering its controllability and observability is required. Three solutions to secure scan architecture have been proposed in this thesis. In the first method, the tester is authenticated and the number of authentication attempts has been limited. In the second method, a Phase Locked Loop (PLL) is utilized to secure scan architecture. In the third method, the scan architecture is secured through a clock and data recovery (CDR) technique. This is a manuscript based thesis and the results of this study have been published in two conference proceedings. The latest results have also been prepared as an article for submission to a high rank conference

A Discrete Event System approach to On-line Testing of digital circuits with measurement limitation

AbstractIn the present era of complex systems like avionics, industrial processes, electronic circuits, etc., on-the-fly or on-line fault detection is becoming necessary to provide uninterrupted services. Measurement limitation based fault detection schemes are applied to a wide range of systems because sensors cannot be deployed in all the locations from which measurements are required. This paper focuses towards On-Line Testing (OLT) of faults in digital electronic circuits under measurement limitation using the theory of discrete event systems. Most of the techniques presented in the literature on OLT of digital circuits have emphasized on keeping the scheme non-intrusive, low area overhead, high fault coverage, low detection latency etc. However, minimizing tap points (i.e., measurement limitation) of the circuit under test (CUT) by the on-line tester was not considered. Minimizing tap points reduces load on the CUT and this reduces the area overhead of the tester. However, reduction in tap points compromises fault coverage and detection latency. This work studies the effect of minimizing tap points on fault coverage, detection latency and area overhead. Results on ISCAS89 benchmark circuits illustrate that measurement limitation have minimal impact on fault coverage and detection latency but reduces the area overhead of the tester. Further, it was also found that for a given detection latency and fault coverage, area overhead of the proposed scheme is lower compared to other similar schemes reported in the literature