New techniques for functional testing of microprocessor based systems

Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any time. Moreover, testing is a key parameter for assessing the quality of a manufactured product. Consolidated testing techniques are based on special Design for Testability (DfT) features added in the original design to facilitate test effectiveness. Design, integration, and usage of the available DfT for testing purposes are fully supported by commercial EDA tools, hence approaches based on DfT are the standard solutions adopted by silicon vendors for testing their devices. Tests exploiting the available DfT such as scan-chains manipulate the internal state of the system, differently to the normal functional mode, passing through unreachable configurations. Alternative solutions that do not violate such functional mode are defined as functional tests. In microprocessor based systems, functional testing techniques include software-based self-test (SBST), i.e., a piece of software (referred to as test program) which is uploaded in the system available memory and executed, with the purpose of exciting a specific part of the system and observing the effects of possible defects affecting it. SBST has been widely-studies by the research community for years, but its adoption by the industry is quite recent. My research activities have been mainly focused on the industrial perspective of SBST. The problem of providing an effective development flow and guidelines for integrating SBST in the available operating systems have been tackled and results have been provided on microprocessor based systems for the automotive domain. Remarkably, new algorithms have been also introduced with respect to state-of-the-art approaches, which can be systematically implemented to enrich SBST suites of test programs for modern microprocessor based systems. The proposed development flow and algorithms are being currently employed in real electronic control units for automotive products. Moreover, a special hardware infrastructure purposely embedded in modern devices for interconnecting the numerous on-board instruments has been interest of my research as well. This solution is known as reconfigurable scan networks (RSNs) and its practical adoption is growing fast as new standards have been created. Test and diagnosis methodologies have been proposed targeting specific RSN features, aimed at checking whether the reconfigurability of such networks has not been corrupted by defects and, in this case, at identifying the defective elements of the network. The contribution of my work in this field has also been included in the first suite of public-domain benchmark networks

New Design Techniques for Dynamic Reconfigurable Architectures

L'abstract è presente nell'allegato / the abstract is in the attachmen

In-Memory Computing Using Formal Methods and Paths-Based Logic

The continued scaling of the CMOS device has been largely responsible for the increase in computational power and consequent technological progress over the last few decades. However, the end of Dennard scaling has interrupted this era of sustained exponential growth in computing performance. Indeed, we are quickly reaching an impasse in the form of limitations in the lithographic processes used to fabricate CMOS processes and, even more dire, we are beginning to face fundamental physical phenomena, such as quantum tunneling, that are pervasive at the nanometer scale. Such phenomena manifests itself in prohibitively high leakage currents and process variations, leading to inaccurate computations. As a result, there has been a surge of interest in computing architectures that can replace the traditional CMOS transistor-based methods. This thesis is a thorough investigation of how computations can be performed on one such architecture, called a crossbar. The methods proposed in this document apply to any crossbar consisting of two-terminal connective devices. First, we demonstrate how paths of electric current between two wires can be used as design primitives in a crossbar. We then leverage principles from the field of formal methods, in particular the area of bounded model checking, to automate the synthesis of crossbar designs for computing arithmetic operations. We demonstrate that our approach yields circuits that are state-of-the-art in terms of the number of operations required to perform a computation. Finally, we look at the benefits of using a 3D crossbar for computation; that is, a crossbar consisting of multiple layers of interconnects. A novel 3D crossbar computing paradigm is proposed for solving the Boolean matrix multiplication and transitive closure problems and we show how this paradigm can be utilized, with small modifications, in the XPoint crossbar memory architecture that was recently announced by Intel