DeSyRe: on-Demand System Reliability

The DeSyRe project builds on-demand adaptive and reliable Systems-on-Chips (SoCs). As fabrication technology scales down, chips are becoming less reliable, thereby incurring increased power and performance costs for fault tolerance. To make matters worse, power density is becoming a significant limiting factor in SoC design, in general. In the face of such changes in the technological landscape, current solutions for fault tolerance are expected to introduce excessive overheads in future systems. Moreover, attempting to design and manufacture a totally defect and fault-free system, would impact heavily, even prohibitively, the design, manufacturing, and testing costs, as well as the system performance and power consumption. In this context, DeSyRe delivers a new generation of systems that are reliable by design at well-balanced power, performance, and design costs. In our attempt to reduce the overheads of fault-tolerance, only a small fraction of the chip is built to be fault-free. This fault-free part is then employed to manage the remaining fault-prone resources of the SoC. The DeSyRe framework is applied to two medical systems with high safety requirements (measured using the IEC 61508 functional safety standard) and tight power and performance constraints

Développement de circuits logiques programmables résistants aux alas logiques en technologie CMOS submicrométrique

The electronics associated to the particle detectors of the Large Hadron Collider (LHC), under construction at CERN, will operate in a very harsh radiation environment. Most of the microelectronics components developed for the first generation of LHC experiments have been designed with very precise experiment-specific goals and are hardly adaptable to other applications. Commercial Off-The-Shelf (COTS) components cannot be used in the vicinity of particle collision due to their poor radiation tolerance. This thesis is a contribution to the effort to cover the need for radiation-tolerant SEU-robust programmable components for application in High Energy Physics (HEP) experiments. Two components are under development: a Programmable Logic Device (PLD) and a Field-Programmable Gate Array (FPGA). The PLD is a fuse-based, 10-input, 8-I/O general architecture device in 0.25 micron CMOS technology. The FPGA under development is instead a 32x32 logic block array, equivalent to ~25k gates, in 0.13 micron CMOS. This work focussed also on the research for an SEU-robust register in both the mentioned technologies. The SEU-robust register is employed as a user data flip-flop in the FPGA and PLD designs and as a configuration cell as well in the FPGA design

Havens: Explicit Reliable Memory Regions for HPC Applications

Supporting error resilience in future exascale-class supercomputing systems is a critical challenge. Due to transistor scaling trends and increasing memory density, scientific simulations are expected to experience more interruptions caused by transient errors in the system memory. Existing hardware-based detection and recovery techniques will be inadequate to manage the presence of high memory fault rates. In this paper we propose a partial memory protection scheme based on region-based memory management. We define the concept of regions called havens that provide fault protection for program objects. We provide reliability for the regions through a software-based parity protection mechanism. Our approach enables critical program objects to be placed in these havens. The fault coverage provided by our approach is application agnostic, unlike algorithm-based fault tolerance techniques.Comment: 2016 IEEE High Performance Extreme Computing Conference (HPEC '16), September 2016, Waltham, MA, US

Development of SEU-robust, radiation-tolerant and industry-compatible programmable logic components

Most of the microelectronics components developed for the first generation of LHC experiments have been defined and designed with very precise experiment-specific goals and are fully optimized for these applications. In an effort to cover the needs for generic programmable components, often needed in the real world, an industry-compatible Programmable Logic Device (PLD) and an industry-compatible Field-Programmable Gate Array (FPGA) are now under development. This effort is targeted to small volume applications or to the cases where small programmable functions are required to fix a system application. The PLD is a fuse-based, 10-input, 8-I/O general architecture device compatible with a popular commercial part, and is fabricated in 0.25 μm CMOS. The FPGA under development is instead a 32 × 32 logic block array, equivalent to 25k gates, to be fabricated in 0.13 μm CMOS. The work focusses on the design of SEU-robust registers which can be employed for configuration storage as well as for user data flip-flops. The SEU-robust registers were tested in a heavy-ion beam facility; test results are presented