272 research outputs found

    Fault-Tolerant FPGA-Based Systems

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    This paper presents a new approach to on-line fault tolerance via reconfiguration for the systems mapped onto field programmable gate arrays (FPGAs). The fault detection, based on self-checking technique, is introduced at application level; therefore our approach can detect the faults of configurable logic blocks (CLBs) and routing interconnections in the FPGAs concurrently with the normal system work. A grid of tiles is projected on the FPGA structure and a certain number of spare CLBs is reserved inside every tile. The number of spare CLBs per tile, which will be used as a backup upon detecting any faulty CLB, is estimated in accordance with the probability of failure. After locating the faulty CLBs, the faulty tile will be reconfigured with avoiding the faulty CLBs. Our proposed approach uses a combination of hardware and software redundancy. We assume that a module external to the FPGA controls automatically the reconfiguration process in addition to the diagnosis process (DIRC); typically this is an embedded microprocessor having some storage for the various tile configurations. We have implemented our approach using Xilinx Virtex FPGA. The DIRC code is written in JBits software tools. In response to a component failure this approach capitalizes on the unique reconfiguration capabilities of FPGAs and replaces the affected tile with a functionally equivalent one that does not rely on the faulty component. Unlike fixed structure fault-tolerance techniques for ASICs and microprocessors, this approach allows a single physical component to provide redundant backup for several types of components

    Low-overhead fault-tolerant logic for field-programmable gate arrays

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    While allowing for the fabrication of increasingly complex and efficient circuitry, transistor shrinkage and count-per-device expansion have major downsides: chiefly increased variation, degradation and fault susceptibility. For this reason, design-time consideration of faults will have to be given to increasing numbers of electronic systems in the future to ensure yields, reliabilities and lifetimes remain acceptably high. Many mathematical operators commonly accelerated in hardware are suited to modification resulting in datapath error detection and correction capabilities with far lower area, performance and/or power consumption overheads than those incurred through the utilisation of more established, general-purpose fault tolerance methods such as modular redundancy. Field-programmable gate arrays are uniquely placed to allow further area savings to be made thanks to their dynamic reconfigurability. The majority of the technical work presented within this thesis is based upon a benchmark hardware accelerator---a matrix multiplier---that underwent several evolutions in order to detect and correct faults manifesting along its datapath at runtime. In the first instance, fault detectability in excess of 99% was achieved in return for 7.87% additional area and 45.5% extra latency. In the second, the ability to correct errors caused by those faults was added at the cost of 4.20% more area, while 50.7% of this---and 46.2% of the previously incurred latency overhead---was removed through the introduction of partial reconfiguration in the third. The fourth demonstrates further reductions in both area and performance overheads---of 16.7% and 8.27%, respectively---through systematic data width reduction by allowing errors of less than ±0.5% of the maximum output value to propagate.Open Acces

    A Framework for implementing radiation-tolerant circuits on reconfigurable FPGAs

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    The outstanding versatility of SRAM-based FPGAs make them the preferred choice for implementing complex customizable circuits. To increase the amount of logic available, manufacturers are using nanometric technologies to boost logic density and reduce prices. However, the use of nanometric scales also makes FPGAs particularly vulnerable to radiation-induced faults, especially because of the increasing amount of configuration memory cells that are necessary to define their functionality. This paper describes a framework for implementing circuits immune to radiation-induced faults, based on a customized Triple Modular Redundancy (TMR) infrastructure and on a detection-and-fix controller. This controller is responsible for the detection of data incoherencies, location of the faulty module and restoration of the original configuration, without affecting the normal operation of the mission logic. A short survey of the most recent data published concerning the impact of radiation-induced faults in FPGAs is presented to support the assumptions underlying our proposed framework. A detailed explanation of the controller functionality is also provided, followed by an experimental case study

    Characterization of Interconnection Delays in FPGAS Due to Single Event Upsets and Mitigation

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    RÉSUMÉ L’utilisation incessante de composants électroniques à géométrie toujours plus faible a engendré de nouveaux défis au fil des ans. Par exemple, des semi-conducteurs à mémoire et à microprocesseur plus avancés sont utilisés dans les systèmes avioniques qui présentent une susceptibilité importante aux phénomènes de rayonnement cosmique. L'une des principales implications des rayons cosmiques, observée principalement dans les satellites en orbite, est l'effet d'événements singuliers (SEE). Le rayonnement atmosphérique suscite plusieurs préoccupations concernant la sécurité et la fiabilité de l'équipement avionique, en particulier pour les systèmes qui impliquent des réseaux de portes programmables (FPGA). Les FPGA à base de cellules de mémoire statique (SRAM) présentent une solution attrayante pour mettre en oeuvre des systèmes complexes dans le domaine de l’avionique. Les expériences de rayonnement réalisées sur les FPGA ont dévoilé la vulnérabilité de ces dispositifs contre un type particulier de SEE, à savoir, les événements singuliers de changement d’état (SEU). Un SEU est considérée comme le changement de l'état d'un élément bistable (c'est-à-dire, un bit-flip) dû à l'effet d'un ion, d'un proton ou d’un neutron énergétique. Cet effet est non destructif et peut être corrigé en réécrivant la partie de la SRAM affectée. Les changements de délai (DC) potentiels dus aux SEU affectant la mémoire de configuration de routage ont été récemment confirmés. Un des objectifs de cette thèse consiste à caractériser plus précisément les DC dans les FPGA causés par les SEU. Les DC observés expérimentalement sont présentés et la modélisation au niveau circuit de ces DC est proposée. Les circuits impliqués dans la propagation du délai sont validés en effectuant une modélisation précise des blocs internes à l'intérieur du FPGA et en exécutant des simulations. Les résultats montrent l’origine des DC qui sont en accord avec les mesures expérimentales de délais. Les modèles proposés au niveau circuit sont, aux meilleures de notre connaissance, le premier travail qui confirme et explique les délais combinatoires dans les FPGA. La conception d'un circuit moniteur de délai pour la détection des DC a été faite dans la deuxième partie de cette thèse. Ce moniteur permet de détecter un changement de délai sur les sections critiques du circuit et de prévenir les pannes de synchronisation engendrées par les SEU sans utiliser la redondance modulaire triple (TMR).----------ABSTRACT The unrelenting demand for electronic components with ever diminishing feature size have emerged new challenges over the years. Among them, more advanced memory and microprocessor semiconductors are being used in avionic systems that exhibit a substantial susceptibility to cosmic radiation phenomena. One of the main implications of cosmic rays, which was primarily observed in orbiting satellites, is single-event effect (SEE). Atmospheric radiation causes several concerns regarding the safety and reliability of avionics equipment, particularly for systems that involve field programmable gate arrays (FPGA). SRAM-based FPGAs, as an attractive solution to implement systems in aeronautic sector, are very susceptible to SEEs in particular Single Event Upset (SEU). An SEU is considered as the change of the state of a bistable element (i.e., bit-flip) due to the effect of an energetic ion or proton. This effect is non-destructive and may be fixed by rewriting the affected part. Sensitivity evaluation of SRAM-based FPGAs to a physical impact such as potential delay changes (DC) has not been addressed thus far in the literature. DCs induced by SEU can affect the functionality of the logic circuits by disturbing the race condition on critical paths. The objective of this thesis is toward the characterization of DCs in SRAM-based FPGAs due to transient ionizing radiation. The DCs observed experimentally are presented and the circuit-level modeling of those DCs is proposed. Circuits involved in delay propagation are reverse-engineered by performing precise modeling of internal blocks inside the FPGA and executing simulations. The results show the root cause of DCs that are in good agreement with experimental delay measurements. The proposed circuit level models are, to the best of our knowledge, the first work on modeling of combinational delays in FPGAs.In addition, the design of a delay monitor circuit for DC detection is investigated in the second part of this thesis. This monitor allowed to show experimentally cumulative DCs on interconnects in FPGA. To this end, by avoiding the use of triple modular redundancy (TMR), a mitigation technique for DCs is proposed and the system downtime is minimized. A method is also proposed to decrease the clock frequency after DC detection without interrupting the process

    UniFuzz: Optimizing Distributed Fuzzing via Dynamic Centralized Task Scheduling

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    Fuzzing is one of the most efficient technology for vulnerability detection. Since the fuzzing process is computing-intensive and the performance improved by algorithm optimization is limited, recent research seeks to improve fuzzing performance by utilizing parallel computing. However, parallel fuzzing has to overcome challenges such as task conflicts, scalability in a distributed environment, synchronization overhead, and workload imbalance. In this paper, we design and implement UniFuzz, a distributed fuzzing optimization based on a dynamic centralized task scheduling. UniFuzz evaluates and distributes seeds in a centralized manner to avoid task conflicts. It uses a "request-response" scheme to dynamically distribute fuzzing tasks, which avoids workload imbalance. Besides, UniFuzz can adaptively switch the role of computing cores between evaluating, and fuzzing, which avoids the potential bottleneck of seed evaluation. To improve synchronization efficiency, UniFuzz shares different fuzzing information in a different way according to their characteristics, and the average overhead of synchronization is only about 0.4\%. We evaluated UniFuzz with real-world programs, and the results show that UniFuzz outperforms state-of-the-art tools, such as AFL, PAFL and EnFuzz. Most importantly, the experiment reveals a counter-intuitive result that parallel fuzzing can achieve a super-linear acceleration to the single-core fuzzing. We made a detailed explanation and proved it with additional experiments. UniFuzz also discovered 16 real-world vulnerabilities.Comment: 14 pages, 4 figure

    Fault-free performance validation of fault-tolerant multiprocessors

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    A validation methodology for testing the performance of fault-tolerant computer systems was developed and applied to the Fault-Tolerant Multiprocessor (FTMP) at NASA-Langley's AIRLAB facility. This methodology was claimed to be general enough to apply to any ultrareliable computer system. The goal of this research was to extend the validation methodology and to demonstrate the robustness of the validation methodology by its more extensive application to NASA's Fault-Tolerant Multiprocessor System (FTMP) and to the Software Implemented Fault-Tolerance (SIFT) Computer System. Furthermore, the performance of these two multiprocessors was compared by conducting similar experiments. An analysis of the results shows high level language instruction execution times for both SIFT and FTMP were consistent and predictable, with SIFT having greater throughput. At the operating system level, FTMP consumes 60% of the throughput for its real-time dispatcher and 5% on fault-handling tasks. In contrast, SIFT consumes 16% of its throughput for the dispatcher, but consumes 66% in fault-handling software overhead

    Développement des techniques de test et de diagnostic pour les FPGA hiérarchique de type mesh

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    The evolution trend of shrinking feature size and increasing complexity in modern electronics is being slowed down due to physical limits that generate numerous imperfections and defects during fabrication steps or projected life time of the chip. Field Programmable Gate Arrays (FPGAs) are used in complex digital systems mainly due to their reconfigurability and shorter time-to-market. To maintain a high reliability of such systems, FPGAs should be tested thoroughly for defects. FPGA architecture optimization for area saving and better signal routability is an ongoing process which directly impacts the overall FPGA testability, hence the reliability. This thesis presents a complete strategy for test and diagnosis of manufacturing defects in mesh-based FPGAs containing a novel multilevel interconnects topology which promises to provide better area and routability. Efficiency of the proposed test schemes is analyzed in terms of test cost, respective fault coverage and diagnostic resolution.L’évolution tendant à réduire la taille et augmenter la complexité des circuits électroniques modernes, est en train de ralentir du fait des limitations technologiques, qui génèrent beaucoup de d’imperfections et de defaults durant la fabrication ou la durée de vie de la puce. Les FPGAs sont utilisés dans les systèmes numériques complexes, essentiellement parce qu’ils sont reconfigurables et rapide à commercialiser. Pour garder une grande fiabilité de tels systèmes, les FPGAs doivent être testés minutieusement pour les defaults. L’optimisation de l’architecture des FPGAs pour l’économie de surface et une meilleure routabilité est un processus continue qui impacte directement la testabilité globale et de ce fait, la fiabilité. Cette thèse présente une stratégie complète pour le test et le diagnostique des defaults de fabrication des “mesh-based FPGA” contenant une nouvelle topologie d’interconnections à plusieurs niveaux, ce qui promet d’apporter une meilleure routabilité. Efficacité des schémas proposes est analysée en termes de temps de test, couverture de faute et résolution de diagnostique

    OAST Space Theme Workshop. Volume 2: Theme summary. 4: Solar system exploration (no. 10). A: Statement of theme: B. 26 April 1976 Presentation. C. Summary. D. Initiative actions (form 5)

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    Major strategies for exploring the solar system focus on the return of information and the return of matter. Both the planetary exploration facility, and an orbiting automated space station, and the sample return and exploration facility have similar requirements. The single most essential need to enable intensive study of the outer solar system is nuclear propulsion and power capability. New initiatives in 1978 related to the reactor, data and sample acquisition and return, navigation, and environmental protection are examined

    The Fifth NASA Symposium on VLSI Design

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    The fifth annual NASA Symposium on VLSI Design had 13 sessions including Radiation Effects, Architectures, Mixed Signal, Design Techniques, Fault Testing, Synthesis, Signal Processing, and other Featured Presentations. The symposium provides insights into developments in VLSI and digital systems which can be used to increase data systems performance. The presentations share insights into next generation advances that will serve as a basis for future VLSI design
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