5,144 research outputs found

    Efficient Retrieval and Ranking of Undesired Package Cycles in Large Software Systems

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    International audienceMany design guidelines state that a software system architecture should avoid cycles between its packages. Yet such cycles appear again and again in many programs. We believe that the existing approaches for cycle detection are too coarse to assist developers to remove cycles from their programs. In this paper, we describe an efficient algorithm that performs a fine-grained analysis of cycles among application packages. In addition, we define multiple metrics to rank cycles by their level of undesirability, prioritizing cycles that are the more undesired by developers. We compare these multiple ranking metrics on four large and mature software systems in Java and Smalltalk

    Intra-Class Testing of Abstract Class Features

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    One of the characteristics of the increasingly widespread use of object-oriented libraries and the resulting intensive use of inheritance is the proliferation of dependencies on abstract classes. Such classes defer the implementation of some features, and are typically used as a specification or design tool. However, since their features are not fully implemented,abstract classes cannot be instantiated, and thus pose challenges for execution-based testing strategies. This paper presents a structured approach that supports the testing of features in abstract classes. Core to the approach is a series of static analysis steps that build a comprehensive view of the inter-class dependencies in the system under test. We then leveraged this information to define a test order for the methods in an abstract class that minimizes the number of stubs required during testing, and clearly identifies the required functionality of these stubs. Our approach is based on a comprehensive taxonomy of object-oriented classes that provides a framework for our analysis. First we describe the algorithms to calculate the inter-class dependencies and the test-order that minimizes stub creation. Then we give an overview of our tool, AbstractTestJ that implements our approach by generating a test order for the methods in an abstract Java class. Finally, we harness this tool to provide an analysis of 12 substantial Java applications that demonstrates both the feasibility of our approach and the importance of this technique

    Efficient Retrieval and Ranking of Undesired Package Cycles in Large Software Systems.

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    Reducing Object-Oriented Testing Cost Through the Analysis of Antipatterns

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    RÉSUMÉ Les tests logiciels sont d’une importance capitale dans nos sociétés numériques. Le bon fonctionnement de la plupart des activités et services dépendent presqu’entièrement de la disponibilité et de la fiabilité des logiciels. Quoique coûteux, les tests logiciels demeurent le meilleur moyen pour assurer la disponibilité et la fiabilité des logiciels. Mais les caractéristiques du paradigme orienté-objet—l’un des paradigmes les plus utilisés—complexifient les activités de tests. Cette thèse est une contribution à l’effort considérable que les chercheurs ont investi ces deux décennies afin de proposer des approches et des techniques qui réduisent les coûts de test des programmes orientés-objet et aussi augmentent leur efficacité. Notre première contribution est une étude empirique qui vise à évaluer l’impact des antipatrons sur le coût des tests unitaires orienté-objet. Les antipatrons sont des mauvaises solutions à des problèmes récurrents de conception et d’implémentation. De nombreuses études empiriques ont montré l’impact négatif des antipatrons sur plusieurs attributs de qualité logicielle notamment la compréhension et la maintenance des programmes. D’autres études ont également révélé que les classes participant aux antipatrons sont plus sujettes aux changements et aux fautes. Néanmoins, aucune étude ne s’est penchée sur l’impact que ces antipatrons pourraient avoir sur les tests logiciels. Les résultats de notre étude montrent que les antipatrons ont également un effet négatif sur le coût des tests : les classes participants aux antipatrons requièrent plus de cas de test que les autres classes. De plus, bien que le test des antipatrons soit coûteux, l’étude révèle aussi que prioriser leur test contribuerait à détecter plutôt les fautes. Notre seconde contribution se base sur les résultats de la première et propose une nouvelle approche au problème d’ordre d’intégration des classes. Ce problème est l’un des principaux défis du test d’intégration des classes. Plusieurs approches ont été proposées pour résoudre ce problème mais la plupart vise uniquement à réduire le coût des stubs quand l’approche que nous proposons vise la réduction du coût des stubs et l’augmentation de la détection précoce des fautes. Pour ce faire, nous priorisons les classes ayant une grande probabilité de défectuosité, comme celles participant aux antipatrons. L’évaluation empirique des performances de notre approche a montré son habilité à trouver des compromis entre les deux objectifs. Comparée aux approches existantes, elle peut donc aider les testeurs à trouver des ordres d’intégration qui augmentent la capacité de détection précoce des fautes tout en minimisant le coût de stubs à développer. Dans notre troisième contribution, nous proposons d’analyser et améliorer l’utilisabilité de Madum, une stratégie de test unitaire spécifique à l’orienté-objet. En effet, les caractéristiques inhérentes à l’orienté-objet ont rendu insuffisants les stratégies de test traditionnelles telles que les tests boîte blanche ou boîte noire. La stratégie Madum, l’une des stratégies proposées pour pallier cette insuffisance, se présente comme une bonne candidate à l’automatisation car elle ne requiert que le code source pour identifier les cas de tests. Automatiser Madum pourrait donc contribuer à mieux tester les classes en général et celles participant aux antipatrons en particulier tout en réduisant les coûts d’un tel test. Cependant, la stratégie de test Madum ne définit pas de critères de couverture. Les critères de couverture sont un préalable à l’automatisation et aussi à la bonne utilisation de la stratégie de test. De plus, l’analyse des fondements de cette stratégie nous montre que l’un des facteurs clés du coût des tests basés sur Madum est le nombre de "transformateurs" (méthodes modifiant la valeur d’un attribut donné). Pour réduire les coûts de tests et faciliter l’utilisation de Madum, nous proposons des restructurations du code qui visent à réduire le nombre de transformateurs et aussi des critères de couverture qui guideront l’identification des données nécessaires à l’utilisation de cette stratégie de test. Ainsi, partant de la connaissance de l’impact des antipatrons sur les tests orientés-objet, nous contributions à réduire les côuts des tests unitaires et d’intégration.----------ABSTRACT Our modern society is highly computer dependent. Thus, the availability and the reliability of programs are crucial. Although expensive, software testing remains the primary means to ensure software availability and reliability. Unfortunately, the main features of the objectoriented paradigm (OO)—one of the most popular paradigms—complicate testing activities. This thesis is a contribution to the global effort to reduce OO software testing cost and to increase its reliability. Our first contribution is an empirical study to gather evidence on the impact of antipatterns on OO unit testing. Antipatterns are recurring and poor design or implementation choices. Past and recent studies showed that antipatterns negatively impact many software quality attributes, such as maintenability and understandability. Other studies also report that antipatterns are more change- and defect-prone than other classes. However, our study is the first regarding the impact of antipatterns on the cost of OO unit testing. The results show that indeed antipatterns have a negative effect on OO unit testing cost: AP classes are in general more expensive to test than other classes. They also reveal that testing AP classes in priority may be cost-effective and may allow detecting most of the defects and early. Our second contribution is a new approach to the problem of class integration test order (CITO) with the goals of minimizing the cost related to the order and increasing early defect detection. The CITO problem is one of the major problems when integrating classes in OO programs. Indeed, the order in which classes are tested during integration determines the cost (stubbing cost) but also the order on which defects are detected. Most approaches proposed to solve the CITO problem focus on minimizing the cost of stubs. In addition to this goal, our approach aims to increase early defect detection apability, which is one of the most important objectives in testing. Early defect detection allows detecting defects early and thus increases the cost-effectiveness of testing. An empirical study shows the superiority of our approach over existing approaches to provide balanced orders: orders that minimize stubbing cost while maximizing early defect detection. In our third contribution, we analyze and improve the usability of Madum testing, one of the unit testing strategies proposed to overcome the limitations of traditional testing when testing OO programs. Opposite to other OO unit testing, Madum testing requires only the source code to identify test cases. Madum testing is thus a good candidate for automation, which is one of the best ways to reduce testing cost and increase reliability. Automatizing Madum testing can help to test thoroughly AP classes while reducing the testing cost. However, Madum testing does not define coverage criteria that are a prerequisite for using the strategy and also automatically generating test data. Moreover, one of the key factors in the cost of using Madum testing is the number of transformers (methods that modify a given attribute). To reduce testing cost and increase the easiness of using Madum testing, we propose refactoring actions to reduce the number of transformers and formal coverage criteria to guide in generating Madum test data. We also formulate the problem of generating test data for Madum testing as a search-based problem. Thus, based on the evidence we gathered from the impact of antipatterns on OO testing, we reduce the cost of OO unit and integration testing

    IS-EUD 2017 6th international symposium on end-user development:extended abstracts

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    Decompose and Conquer: Addressing Evasive Errors in Systems on Chip

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    Modern computer chips comprise many components, including microprocessor cores, memory modules, on-chip networks, and accelerators. Such system-on-chip (SoC) designs are deployed in a variety of computing devices: from internet-of-things, to smartphones, to personal computers, to data centers. In this dissertation, we discuss evasive errors in SoC designs and how these errors can be addressed efficiently. In particular, we focus on two types of errors: design bugs and permanent faults. Design bugs originate from the limited amount of time allowed for design verification and validation. Thus, they are often found in functional features that are rarely activated. Complete functional verification, which can eliminate design bugs, is extremely time-consuming, thus impractical in modern complex SoC designs. Permanent faults are caused by failures of fragile transistors in nano-scale semiconductor manufacturing processes. Indeed, weak transistors may wear out unexpectedly within the lifespan of the design. Hardware structures that reduce the occurrence of permanent faults incur significant silicon area or performance overheads, thus they are infeasible for most cost-sensitive SoC designs. To tackle and overcome these evasive errors efficiently, we propose to leverage the principle of decomposition to lower the complexity of the software analysis or the hardware structures involved. To this end, we present several decomposition techniques, specific to major SoC components. We first focus on microprocessor cores, by presenting a lightweight bug-masking analysis that decomposes a program into individual instructions to identify if a design bug would be masked by the program's execution. We then move to memory subsystems: there, we offer an efficient memory consistency testing framework to detect buggy memory-ordering behaviors, which decomposes the memory-ordering graph into small components based on incremental differences. We also propose a microarchitectural patching solution for memory subsystem bugs, which augments each core node with a small distributed programmable logic, instead of including a global patching module. In the context of on-chip networks, we propose two routing reconfiguration algorithms that bypass faulty network resources. The first computes short-term routes in a distributed fashion, localized to the fault region. The second decomposes application-aware routing computation into simple routing rules so to quickly find deadlock-free, application-optimized routes in a fault-ridden network. Finally, we consider general accelerator modules in SoC designs. When a system includes many accelerators, there are a variety of interactions among them that must be verified to catch buggy interactions. To this end, we decompose such inter-module communication into basic interaction elements, which can be reassembled into new, interesting tests. Overall, we show that the decomposition of complex software algorithms and hardware structures can significantly reduce overheads: up to three orders of magnitude in the bug-masking analysis and the application-aware routing, approximately 50 times in the routing reconfiguration latency, and 5 times on average in the memory-ordering graph checking. These overhead reductions come with losses in error coverage: 23% undetected bug-masking incidents, 39% non-patchable memory bugs, and occasionally we overlook rare patterns of multiple faults. In this dissertation, we discuss the ideas and their trade-offs, and present future research directions.PHDComputer Science & EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttps://deepblue.lib.umich.edu/bitstream/2027.42/147637/1/doowon_1.pd
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