RRAM variability and its mitigation schemes

Emerging technologies such as RRAMs are attracting significant attention due to their tempting characteristics such as high scalability, CMOS compatibility and non-volatility to replace the current conventional memories. However, critical causes of hardware reliability failures, such as process variation due to their nano-scale structure have gained considerable importance for acceptable memory yields. Such vulnerabilities make it essential to investigate new robust design strategies at the circuit system level. In this paper we have analyzed the RRAM variability phenomenon, its impact and variation tolerant techniques at the circuit level. Finally a variation-monitoring circuit is presented that discerns the reliable memory cells affected by process variability.Peer ReviewedPostprint (author's final draft

Highly Scalable Neuromorphic Hardware with 1-bit Stochastic nano-Synapses

Thermodynamic-driven filament formation in redox-based resistive memory and the impact of thermal fluctuations on switching probability of emerging magnetic switches are probabilistic phenomena in nature, and thus, processes of binary switching in these nonvolatile memories are stochastic and vary from switching cycle-to-switching cycle, in the same device, and from device-to-device, hence, they provide a rich in-situ spatiotemporal stochastic characteristic. This work presents a highly scalable neuromorphic hardware based on crossbar array of 1-bit resistive crosspoints as distributed stochastic synapses. The network shows a robust performance in emulating selectivity of synaptic potentials in neurons of primary visual cortex to the orientation of a visual image. The proposed model could be configured to accept a wide range of nanodevices.Comment: 9 pages, 6 figure

Stochastic resonance exploration in current-driven ReRAM devices

© 2022 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.Advances in emerging resistive random-access memory (ReRAM) technology show promise for its use in future computing systems, enabling neuromorphic and memory-centric computing architectures. However, one aspect that holds back the widespread practical use of ReRAM is the behavioral variability of resistive switching devices. In this context, a radically new path towards ReRAM-based electronics concerns the exploitation of noise and the Stochastic Resonance (SR) phenomenon as a mechanism to mitigate the impact of variability. While SR has been already demonstrated in ReRAM devices and its potential impact has been analyzed for memory applications, related works have only focused on voltage input signals. In this work we present preliminary results concerning the exploration of SR in current-driven ReRAM devices, commercially available by Knowm Inc. Our results indicate that additive noise of amplitude s = 0.125uA can stabilize the cycling performance of the devices, whereas higher noise amplitude improves the HRS-LRS resistance window, thus could affect positively the Bit Error Rate (BER) metric in ReRAM memory applications.Supported by the Chilean research grants FONDECYT INICIACION 11180706 and ANID-Basal FB0008, and by the Spanish MCIN grants PID2019-105658RB-I00, and MCIN/AEI/10.13039/501100011033 grant PID2019-103869RB-C33.Peer ReviewedPostprint (author's final draft

Applications of memristors in conventional analogue electronics

This dissertation presents the steps employed to activate and utilise analogue memristive devices in conventional analogue circuits and beyond. TiO2 memristors are mainly utilised in this study, and their large variability in operation in between similar devices is identified. A specialised memristor characterisation instrument is designed and built to mitigate this issue and to allow access to large numbers of devices at a time. Its performance is quantified against linear resistors, crossbars of linear resistors, stand-alone memristive elements and crossbars of memristors. This platform allows for a wide range of different pulsing algorithms to be applied on individual devices, or on crossbars of memristive elements, and is used throughout this dissertation. Different ways of achieving analogue resistive switching from any device state are presented. Results of these are used to devise a state-of-art biasing parameter finder which automatically extracts pulsing parameters that induce repeatable analogue resistive switching. IV measurements taken during analogue resistive switching are then utilised to model the internal atomic structure of two devices, via fittings by the Simmons tunnelling barrier model. These reveal that voltage pulses modulate a nano-tunnelling gap along a conical shape. Further retention measurements are performed which reveal that under certain conditions, TiO2 memristors become volatile at short time scales. This volatile behaviour is then implemented into a novel SPICE volatile memristor model. These characterisation methods of solid-state devices allowed for inclusion of TiO2 memristors in practical electronic circuits. Firstly, in the context of large analogue resistive crossbars, a crosspoint reading method is analysed and improved via a 3-step technique. Its scaling performance is then quantified via SPICE simulations. Next, the observed volatile dynamics of memristors are exploited in two separate sequence detectors, with applications in neuromorphic engineering. Finally, the memristor as a programmable resistive weight is exploited to synthesise a memristive programmable gain amplifier and a practical memristive automatic gain control circuit.Open Acces

Memristive crossbars as hardware accelerators: modelling, design and new uses

Digital electronics has given rise to reliable, affordable, and scalable computing devices. However, new computing paradigms present challenges. For example, machine learning requires repeatedly processing large amounts of data; this creates a bottleneck in conventional computers, where computing and memory are separated. To add to that, Moore’s “law” is plateauing and is thus unlikely to address the increasing demand for computational power. In-memory computing, and specifically hardware accelerators for linear algebra, may address both of these issues. Memristive crossbar arrays are a promising candidate for such hardware accelerators. Memristive devices are fast, energy-efficient, and—when arranged in a crossbar structure—can compute vector-matrix products. Unfortunately, they come with their own set of limitations. The analogue nature of these devices makes them stochastic and thus less reliable compared to digital devices. It does not, however, necessarily make them unsuitable for computing. Nevertheless, successful deployment of analogue hardware accelerators requires a proper understanding of their drawbacks, ways of mitigating the effects of undesired physical behaviour, and applications where some degree of stochasticity is tolerable. In this thesis, I investigate the effects of nonidealities in memristive crossbar arrays, introduce techniques of minimising those negative effects, and present novel crossbar circuit designs for new applications. I mostly focus on physical implementations of neural networks and investigate the influence of device nonidealities on classification accuracy. To make memristive neural networks more reliable, I explore committee machines, rearrangement of crossbar lines, nonideality-aware training, and other techniques. I find that they all may contribute to the higher accuracy of physically implemented neural networks, often comparable to the accuracy of their digital counterparts. Finally, I introduce circuits that extend dot product computations to higher-rank arrays, different linear algebra operations, and quaternion vectors and matrices. These present opportunities for using crossbar arrays in new ways, including the processing of coloured images

Assessment and Improvement of the Pattern Recognition Performance of Memdiode-Based Cross-Point Arrays with Randomly Distributed Stuck-at-Faults

In this work, the effect of randomly distributed stuck-at faults (SAFs) in memristive crosspoint array (CPA)-based single and multi-layer perceptrons (SLPs and MLPs, respectively) intended for pattern recognition tasks is investigated by means of realistic SPICE simulations. The quasi-static memdiode model (QMM) is considered here for the modelling of the synaptic weights implemented with memristors. Following the standard memristive approach, the QMM comprises two coupled equations, one for the electron transport based on the double-diode equation with a single series resistance and a second equation for the internal memory state of the device based on the so-called logistic hysteron. By modifying the state parameter in the current-voltage characteristic, SAFs of different severeness are simulated and the final outcome is analysed. Supervised ex-situ training and two well-known image datasets involving hand-written digits and human faces are employed to assess the inference accuracy of the SLP as a function of the faulty device ratio. The roles played by the memristor’s electrical parameters, line resistance, mapping strategy, image pixelation, and fault type (stuck-at-ON or stuck-at-OFF) on the CPA performance are statistically analysed following a Monte-Carlo approach. Three different re-mapping schemes to help mitigate the effect of the SAFs in the SLP inference phase are thoroughly investigated.In this work, the effect of randomly distributed stuck-at faults (SAFs) in memristive cross-point array (CPA)-based single and multi-layer perceptrons (SLPs and MLPs, respectively) intended for pattern recognition tasks is investigated by means of realistic SPICE simulations. The quasi-static memdiode model (QMM) is considered here for the modelling of the synaptic weights implemented with memristors. Following the standard memristive approach, the QMM comprises two coupled equations, one for the electron transport based on the double-diode equation with a single series resistance and a second equation for the internal memory state of the device based on the so-called logistic hysteron. By modifying the state parameter in the current-voltage characteristic, SAFs of different severeness are simulated and the final outcome is analysed. Supervised ex-situ training and two well-known image datasets involving hand-written digits and human faces are employed to assess the inference accuracy of the SLP as a function of the faulty device ratio. The roles played by the memristor?s electrical parameters, line resistance, mapping strategy, image pixelation, and fault type (stuck-at-ON or stuck-at-OFF) on the CPA performance are statistically analysed following a Monte-Carlo approach. Three different re-mapping schemes to help mitigate the effect of the SAFs in the SLP inference phase are thoroughly investigated.Fil: Aguirre, Fernando Leonel. Universidad Tecnológica Nacional. Facultad Regional Buenos Aires. Unidad de Investigación y Desarrollo de las Ingenierías; Argentina. Universitat Autònoma de Barcelona; España. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Pazos, Sebastián Matías. Universidad Tecnológica Nacional. Facultad Regional Buenos Aires. Unidad de Investigación y Desarrollo de las Ingenierías; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Palumbo, Félix Roberto Mario. Universidad Tecnológica Nacional. Facultad Regional Buenos Aires. Unidad de Investigación y Desarrollo de las Ingenierías; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Morell, Antoni. Universitat Autònoma de Barcelona; EspañaFil: Suñé, Jordi. Universitat Autònoma de Barcelona; EspañaFil: Miranda, Enrique. Universitat Autònoma de Barcelona; Españ

Enhancing Reliability of Studies on Single Filament Memristive Switching via an Unconventional cAFM Approach

Memristive devices are highly promising for implementing neuromorphic functionalities in future electronic hardware, and direct insights into memristive phenomena on the nanoscale are of fundamental importance to reaching this. Conductive atomic force microscopy (cAFM) has proven to be an essential tool for probing memristive action locally on the nanoscale, but the significance of the acquired data frequently suffers from the nonlocality associated with the thermal drift of the tip in ambient conditions. Furthermore, comparative studies of different configurations of filamentary devices have proven to be difficult, because of an immanent variability of the filament properties between different devices. Herein, these problems are addressed by constraining the memristive action directly at the apex of the probe through functionalization of a cAFM tip with an archetypical memristive stack, which is comprised of Ag/Si3N4. The design of such functionalized cantilevers (entitled here as "memtips") allowed the capture of the long-term intrinsic current response, identifying temporal correlations between switching events, and observing emerging spiking dynamics directly at the nanoscale. Utilization of an identical memtip for measurements on different counter electrodes made it possible to directly compare the impact of different device configurations on the switching behavior of the same filament. Such an analytical approach in ambient conditions will pave the way towards a deeper understanding of filamentary switching phenomena on the nanoscale