Stochastic Analysis on RAID Reliability for Solid-State Drives

Solid-state drives (SSDs) have been widely deployed in desktops and data centers. However, SSDs suffer from bit errors, and the bit error rate is time dependent since it increases as an SSD wears down. Traditional storage systems mainly use parity-based RAID to provide reliability guarantees by striping redundancy across multiple devices, but the effectiveness of RAID in SSDs remains debatable as parity updates aggravate the wearing and bit error rates of SSDs. In particular, an open problem is that how different parity distributions over multiple devices, such as the even distribution suggested by conventional wisdom, or uneven distributions proposed in recent RAID schemes for SSDs, may influence the reliability of an SSD RAID array. To address this fundamental problem, we propose the first analytical model to quantify the reliability dynamics of an SSD RAID array. Specifically, we develop a "non-homogeneous" continuous time Markov chain model, and derive the transient reliability solution. We validate our model via trace-driven simulations and conduct numerical analysis to provide insights into the reliability dynamics of SSD RAID arrays under different parity distributions and subject to different bit error rates and array configurations. Designers can use our model to decide the appropriate parity distribution based on their reliability requirements.Comment: 12 page

Architectural Techniques to Enable Reliable and Scalable Memory Systems

High capacity and scalable memory systems play a vital role in enabling our desktops, smartphones, and pervasive technologies like Internet of Things (IoT). Unfortunately, memory systems are becoming increasingly prone to faults. This is because we rely on technology scaling to improve memory density, and at small feature sizes, memory cells tend to break easily. Today, memory reliability is seen as the key impediment towards using high-density devices, adopting new technologies, and even building the next Exascale supercomputer. To ensure even a bare-minimum level of reliability, present-day solutions tend to have high performance, power and area overheads. Ideally, we would like memory systems to remain robust, scalable, and implementable while keeping the overheads to a minimum. This dissertation describes how simple cross-layer architectural techniques can provide orders of magnitude higher reliability and enable seamless scalability for memory systems while incurring negligible overheads.Comment: PhD thesis, Georgia Institute of Technology (May 2017

Redundant disk arrays: Reliable, parallel secondary storage

During the past decade, advances in processor and memory technology have given rise to increases in computational performance that far outstrip increases in the performance of secondary storage technology. Coupled with emerging small-disk technology, disk arrays provide the cost, volume, and capacity of current disk subsystems, by leveraging parallelism, many times their performance. Unfortunately, arrays of small disks may have much higher failure rates than the single large disks they replace. Redundant arrays of inexpensive disks (RAID) use simple redundancy schemes to provide high data reliability. The data encoding, performance, and reliability of redundant disk arrays are investigated. Organizing redundant data into a disk array is treated as a coding problem. Among alternatives examined, codes as simple as parity are shown to effectively correct single, self-identifying disk failures

Memory systems for high-performance computing: the capacity and reliability implications

Memory systems are signicant contributors to the overall power requirements, energy consumption, and the operational cost of large high-performance computing systems (HPC). Limitations of main memory systems in terms of latency, bandwidth and capacity, can signicantly affect the performance of HPC applications, and can have strong negative impact on system scalability. In addition, errors in the main memory system can have a strong impact on the reliability, accessibility and serviceability of large-scale clusters. This thesis studies capacity and reliability issues in modern memory systems for high-performance computing. The choice of main memory capacity is an important aspect of high-performance computing memory system design. This choice becomes in- creasingly important now that 3D-stacked memories are entering the market. Compared with conventional DIMMs, 3D memory chiplets provide better performance and energy efficiency but lower memory capacities. Therefore the adoption of 3D-stacked memories in the HPC domain depends on whether we can find use cases that require much less memory than is available now. We analyze memory capacity requirements of important HPC benchmarks and applications. The study identifies the HPC applications and use cases with memory footprints that could be provided by 3D-stacked memory chiplets, making a first step towards the adoption of this novel technology in the HPC domain. For HPC domains where large memory capacities are required, we propose scaling-in of HPC applications to reduce energy consumption and the running time of a batch of jobs. We also propose upgrading the per-node memory capacity, which enables greater degree of scaling-in and additional energy savings. Memory system is one of the main causes of hardware failures. In each generation, the DRAM chip density and the amount of the memory in systems increase, while the DRAM technology process is constantly shrinking. Therefore, we could expect that the DRAM failures could have a serious impact on the future-systems reliability. This thesis studies DRAM errors observed on a production HPC system during a period of two years. We clearly distinguish between two different approaches for the DRAM error analysis: categorical analysis and the analysis of error rates. The first approach compares the errors at the DIMM level and partitions the DIMMs into various categories, e.g. based on whether they did or did not experience an error. The second approach is to analyze the error rates, i.e., to present the total number of errors relative to other statistics, typically the number of MB-hours or the duration of the observation period. We show that although DRAM error analysis may be performed with both approaches, they are not interchangeable and can lead to completely different conclusions. We further demonstrate the importance of providing statistical significance and presenting results that have practical value and real-life use. We show that various widely-accepted approaches for DRAM error analysis may provide data that appear to support an interesting conclusion, but are not statistically signifcant, meaning that they could merely be the result of chance. We hope the study of methods for DRAM error analysis presented in this thesis will become a standard for any future analysis of DRAM errors in the field.Los sistemas de memoria son contribuyentes significativos al consumo de energía y al coste de operación de los sistemas de computación de altas prestaciones (HPC). Limitaciones de los sistemas de memoria en términos de latencia, ancho de banda y capacidad, pueden afectar significativamente el rendimiento de aplicaciones HPC, y pueden tener un fuerte impacto negativo en la escalabilidad del sistema. Además, los errores en el sistema de memoria principal pueden tener un fuerte impacto sobre la confiabilidad, disponibilidad y capacidad de servicio de los clusters a gran escala. Esta tesis estudia problemas de capacidad y confiabilidad de los sistemas modernos de computación de altas prestaciones. La elección de capacidad de la memoria principal es un aspecto importante del diseño de sistemas de computación de altas prestaciones. Esta elección empieza ser cada vez más importante con memorias 3D apareciendo en el mercado. Comparados con los DIMMs convencionales, los chips de memoria 3D proporcionan mejor rendimiento y eficiencia energética, pero menores capacidades de memoria. Por lo tanto, la adopción de memorias 3D en el dominio HPC depende de si es posible encontrar casos de uso que requieren mucha menos memoria de la que está disponible ahora. Analizamos los requisitos de capacidad de memoria de importantes benchmarks y aplicaciones de HPC. El estudio identifica las aplicaciones de HPC y los casos de uso con huellas de memoria que podrían ser proporcionadas por los chips de memoria 3D dando un primer paso hacia la adopción de esta nueva tecnología en el dominio HPC. Para dominios HPC donde se requieren grandes capacidades de memoria, proponemos scaling-in de las aplicaciones de HPC para reducir el consumo de energía y el tiempo de ejecución de un lote de tareas. También proponemos ampliar la capacidad de memoria que permite un mayor grado de scaling-in y ahorros de energía adicionales. El sistema de memoria es una de las principales causas de fallas de hardware. En cada generación, la densidad del chip DRAM y la cantidad de memoria en el sistema aumentan, mientras el proceso de tecnología DRAM se reduce constantemente. Por lo tanto, podríamos esperar que los fallos DRAM podrían tener un serio impacto en la confiabilidad de los sistemas en el futuro. Esta tesis estudia los errores de DRAM observados en un sistema de producción HPC durante un período de dos años. Nosotros distinguimos claramente dos enfoques diferentes de análisis de error DRAM: análisis categórico y análisis de tasas de error. El primer enfoque compara los errores en el nivel DIMM y divide los DIMMs en varias categorías, por ejemplo, dependiendo si tuvieron o no un error. El segundo enfoque es analizar las tasas de error, es decir, presentar el número total de errores relativos a otras estadísticas, generalmente el número de MB-horas o la duración del período de observación. Mostramos que aunque el análisis de error DRAM se puede realizar con ambos enfoques, estos no son intercambiables y pueden llevar a conclusiones completamente diferentes. Demostramos la importancia de proporcionar significación estadística y presentar resultados que tienen un valor práctico y uso en la vida real. Mostramos que varios enfoques de análisis de errores de DRAM pueden proporcionar datos que apoyan una conclusión interesante, pero no son estadísticamente significativos, lo que significa que simplemente podrían ser el resultado de casualidad. Esperamos que el estudio de los métodos para el análisis de errores DRAM presentados en esta tesis se convertirá en un estándar para cualquier análisis futuro de errores de DRAM en el campo.Postprint (published version

Architecting heterogeneous memory systems with 3D die-stacked memory

The main objective of this research is to efficiently enable 3D die-stacked memory and heterogeneous memory systems. 3D die-stacking is an emerging technology that allows for large amounts of in-package high-bandwidth memory storage. Die-stacked memory has the potential to provide extraordinary performance and energy benefits for computing environments, from data-intensive to mobile computing. However, incorporating die-stacked memory into computing environments requires innovations across the system stack from hardware and software. This dissertation presents several architectural innovations to practically deploy die-stacked memory into a variety of computing systems. First, this dissertation proposes using die-stacked DRAM as a hardware-managed cache in a practical and efficient way. The proposed DRAM cache architecture employs two novel techniques: hit-miss speculation and self-balancing dispatch. The proposed techniques virtually eliminate the hardware overhead of maintaining a multi-megabytes SRAM structure, when scaling to gigabytes of stacked DRAM caches, and improve overall memory bandwidth utilization. Second, this dissertation proposes a DRAM cache organization that provides a high level of reliability for die-stacked DRAM caches in a cost-effective manner. The proposed DRAM cache uses error-correcting code (ECCs), strong checksums (CRCs), and dirty data duplication to detect and correct a wide range of stacked DRAM failures—from traditional bit errors to large-scale row, column, bank, and channel failures—within the constraints of commodity, non-ECC DRAM stacks. With only a modest performance degradation compared to a DRAM cache with no ECC support, the proposed organization can correct all single-bit failures, and 99.9993% of all row, column, and bank failures. Third, this dissertation proposes architectural mechanisms to use large, fast, on-chip memory structures as part of memory (PoM) seamlessly through the hardware. The proposed design achieves the performance benefit of on-chip memory caches without sacrificing a large fraction of total memory capacity to serve as a cache. To achieve this, PoM implements the ability to dynamically remap regions of memory based on their access patterns and expected performance benefits. Lastly, this dissertation explores a new usage model for die-stacked DRAM involving a hybrid of caching and virtual memory support. In the common case where system’s physical memory is not over-committed, die-stacked DRAM operates as a cache to provide performance and energy benefits to the system. However, when the workload’s active memory demands exceed the capacity of the physical memory, the proposed scheme dynamically converts the stacked DRAM cache into a fast swap device to avoid the otherwise grievous performance penalty of swapping to disk.Ph.D

NSSDC Conference on Mass Storage Systems and Technologies for Space and Earth Science Applications, volume 2

This report contains copies of nearly all of the technical papers and viewgraphs presented at the NSSDC Conference on Mass Storage Systems and Technologies for Space and Earth Science Application. This conference served as a broad forum for the discussion of a number of important issues in the field of mass storage systems. Topics include the following: magnetic disk and tape technologies; optical disk and tape; software storage and file management systems; and experiences with the use of a large, distributed storage system. The technical presentations describe, among other things, integrated mass storage systems that are expected to be available commercially. Also included is a series of presentations from Federal Government organizations and research institutions covering their mass storage requirements for the 1990's

Exploration of Erasure-Coded Storage Systems for High Performance, Reliability, and Inter-operability

With the unprecedented growth of data and the use of low commodity drives in local disk-based storage systems and remote cloud-based servers has increased the risk of data loss and an overall increase in the user perceived system latency. To guarantee high reliability, replication has been the most popular choice for decades, because of simplicity in data management. With the high volume of data being generated every day, the storage cost of replication is very high and is no longer a viable approach. Erasure coding is another approach of adding redundancy in storage systems, which provides high reliability at a fraction of the cost of replication. However, the choice of erasure codes being used affects the storage efficiency, reliability, and overall system performance. At the same time, the performance and interoperability are adversely affected by the slower device components and complex central management systems and operations. To address the problems encountered in various layers of the erasure coded storage system, in this dissertation, we explore the different aspects of storage and design several techniques to improve the reliability, performance, and interoperability. These techniques range from the comprehensive evaluation of erasure codes, application of erasure codes for highly reliable and high-performance SSD system, to the design of new erasure coding and caching schemes for Hadoop Distributed File System, which is one of the central management systems for distributed storage. Detailed evaluation and results are also provided in this dissertation

Proceedings of the NSSDC Conference on Mass Storage Systems and Technologies for Space and Earth Science Applications

The proceedings of the National Space Science Data Center Conference on Mass Storage Systems and Technologies for Space and Earth Science Applications held July 23 through 25, 1991 at the NASA/Goddard Space Flight Center are presented. The program includes a keynote address, invited technical papers, and selected technical presentations to provide a broad forum for the discussion of a number of important issues in the field of mass storage systems. Topics include magnetic disk and tape technologies, optical disk and tape, software storage and file management systems, and experiences with the use of a large, distributed storage system. The technical presentations describe integrated mass storage systems that are expected to be available commercially. Also included is a series of presentations from Federal Government organizations and research institutions covering their mass storage requirements for the 1990's

Goddard Conference on Mass Storage Systems and Technologies, Volume 1

Copies of nearly all of the technical papers and viewgraphs presented at the Goddard Conference on Mass Storage Systems and Technologies held in Sep. 1992 are included. The conference served as an informational exchange forum for topics primarily relating to the ingestion and management of massive amounts of data and the attendant problems (data ingestion rates now approach the order of terabytes per day). Discussion topics include the IEEE Mass Storage System Reference Model, data archiving standards, high-performance storage devices, magnetic and magneto-optic storage systems, magnetic and optical recording technologies, high-performance helical scan recording systems, and low end helical scan tape drives. Additional topics addressed the evolution of the identifiable unit for processing purposes as data ingestion rates increase dramatically, and the present state of the art in mass storage technology