The Analysis and Application of Redundant Multi-stage ADC Resolution Improvements Through PDF Residue Shaping

An analysis of the statistics of multi-stage (pipeline, SAR and algorithmic) ADCs with redundancy is performed and the ability to achieve an extra 6dB of resolution in ADCs with half-bit redundancy is shown due to probability density function (PDF) residue shaping. This paper classifies redundancy techniques to show that only some have properties leading to statistical resolution improvements. When properly implemented, resolution gains are maintained even in the presence of large sub-ADC non-linearity. ADC design criteria for maximizing these resolution increases through PDF residue shaping are described including improved back-end ADCs, stage comparator offset bounds, and the use of scaled conventional restoring with Z added levels (CRZ) stage redundancy. PDF residue shaped structural improvements are also quantified in relation to ideal and non-ideal traditional multi-stage ADC structures.Keywords: Algorithmic ADC, Error correction, Redundancy resolution improvement, Multi-stage ADC, SAR redundancy, Residue shaping, Pipeline redundanc

Noise shaping Asynchronous SAR ADC based time to digital converter

Time-to-digital converters (TDCs) are key elements for the digitization of timing information in modern mixed-signal circuits such as digital PLLs, DLLs, ADCs, and on-chip jitter-monitoring circuits. Especially, high-resolution TDCs are increasingly employed in on-chip timing tests, such as jitter and clock skew measurements, as advanced fabrication technologies allow fine on-chip time resolutions. Its main purpose is to quantize the time interval of a pulse signal or the time interval between the rising edges of two clock signals. Similarly to ADCs, the performance of TDCs are also primarily characterized by Resolution, Sampling Rate, FOM, SNDR, Dynamic Range and DNL/INL. This work proposes and demonstrates 2nd order noise shaping Asynchronous SAR ADC based TDC architecture with highest resolution of 0.25 ps among current state of art designs with respect to post-layout simulation results. This circuit is a combination of low power/High Resolution 2nd Order Noise Shaped Asynchronous SAR ADC backend with simple Time to Amplitude converter (TAC) front-end and is implemented in 40nm CMOS technology. Additionally, special emphasis is given on the discussion on various current state of art TDC architectures.Electrical and Computer Engineerin

Capacitor Mismatch Calibration Technique to Improve the SFDR of 14-Bit SAR ADC

This paper presents mismatch calibration technique to improve the SFDR in a 14-bit successive approximation register (SAR) analog-to-digital converter (ADC) for wearable electronics application. Behavioral Monte-Carlo simulations are applied to demonstrate the effect of the proposed method where no complex digital calibration algorithm or auxiliary calibration DAC needed. Simulation results show that with a mismatch error typical of modern technology, the SFDR is enhanced by more than 20 dB with the proposed technique for a 14-bit SAR ADC

Low-Power SAR ADCs:Basic Techniques and Trends

With the advent of small, battery-powered devices, power efficiency has become of paramount importance. For analog-to-digital converters (ADCs), the successive approximation register (SAR) architecture plays a prominent role thanks to its ability to combine power efficiency with a simple architecture, a broad application scope, and technology portability. In this review article, the basic design challenges for low-power SAR ADCs are summarized and several design techniques are illustrated. Furthermore, the limitations of SAR ADCs are outlined and hybrid architecture trends, such as noise-shaping SAR ADCs and pipelined SAR ADCs, are briefly introduced and clarified with examples

Digital Background Self-Calibration Technique for Compensating Transition Offsets in Reference-less Flash ADCs

This Dissertation focusses on proving that background calibration using adaptive algorithms are low-cost, stable and effective methods for obtaining high accuracy in flash A/D converters. An integrated reference-less 3-bit flash ADC circuit has been successfully designed and taped out in UMC 180 nm CMOS technology in order to prove the efficiency of our proposed background calibration. References for ADC transitions have been virtually implemented built-in in the comparators dynamic-latch topology by a controlled mismatch added to each comparator input front-end. An external very simple DAC block (calibration bank) allows control the quantity of mismatch added in each comparator front-end and, therefore, compensate the offset of its effective transition with respect to the nominal value. In order to assist to the estimation of the offset of the prototype comparators, an auxiliary A/D converter with higher resolution and lower conversion speed than the flash ADC is used: a 6-bit capacitive-DAC SAR type. Special care in synchronization of analogue sampling instant in both ADCs has been taken into account. In this thesis, a criterion to identify the optimum parameters of the flash ADC design with adaptive background calibration has been set. With this criterion, the best choice for dynamic latch architecture, calibration bank resolution and flash ADC resolution are selected. The performance of the calibration algorithm have been tested, providing great programmability to the digital processor that implements the algorithm, allowing to choose the algorithm limits, accuracy and quantization errors in the arithmetic. Further, systematic controlled offset can be forced in the comparators of the flash ADC in order to have a more exhaustive test of calibration

DIGITALLY ASSISTED TECHNIQUES FOR NYQUIST RATE ANALOG-to-DIGITAL CONVERTERS

With the advance of technology and rapid growth of digital systems, low power high speed analog-to-digital converters with great accuracy are in demand. To achieve high effective number of bits Analog-to-Digital Converter(ADC) calibration as a time consuming process is a potential bottleneck for designs. This dissertation presentsa fully digital background calibration algorithm for a 7-bit redundant flash ADC using split structure and look-up table based correction. Redundant comparators are used in the flash ADC design of this work in order to tolerate large offset voltages while minimizing signal input capacitance. The split ADC structure helps by eliminating the unknown input signal from the calibration path. The flash ADC has been designed in 180nm IBM CMOS technology and fabricated through MOSIS. This work was supported by Analog Devices, Wilmington,MA. While much research on ADC design has concentrated on increasing resolution and sample rate, there are many applications (e.g. biomedical devices and sensor networks) that do not require high performance but do require low power energy efficient ADCs. This dissertation also explores on design of a low quiescent current 100kSps Successive Approximation (SAR) ADC that has been used as an error detection ADC for an automotive application in 350nm CD (CMOS-DMOS) technology. This work was supported by ON Semiconductor Corp, East Greenwich,RI

Testing a fault tolerant mixed-signal design under TID and heavy ions

This work presents results of three distinctradiation tests performed upon a fault tolerant data acqui-sition system comprising a design diversity redundancytechnique. The first and second experiments are Total Ion-izing Dose (TID) essays, comprising gamma and X-rayirradiations. The last experiment considers single eventeffects, in which two heavy ion irradiation campaignsare carried out. The case study system comprises threeanalog-to-digital converters and two software-based vot-ers, besides additional software and hardware resourcesused for controlling, monitoring and memory manage-ment. The applied Diversity Triple Modular Redundancy(DTMR) technique, comprises different levels of diversity(temporal and architectural). The circuit was designed ina programmable System-on-Chip (PSoC), fabricated in a130nm CMOS technology process. Results show that thetechnique may increase the lifetime of the system underTID if comparing with a non-redundant implementation.Considering the heavy ions experiments the system wasproved effective to tolerate 100% of the observed errorsoriginated in the converters, while errors in the process-ing unit present a higher criticality. Critical errors occur-ring in one of the voters were also observed. A secondheavy ion campaign was then carried out to investigatethe voters reliability, comparing the the dynamic cross sec-tion of three different software-based voter schemes im-plemented in the considered PSoC

Design and implementation of Radix-3/Radix-2 based novel hybrid SAR ADC in scaled CMOS technologies

This thesis focuses on low power and high speed design techniques for successive approximation register (SAR) analog-to-digital converters (ADCs) in nanoscale CMOS technologies. SAR ADCs’ speed is limited by the number of bits of resolution. An N-bit conventional SAR ADC takes N conversion cycles. To speed up the conversion process, we introduce a radix-3 SAR ADC which can compute 1:6 bits per cycle. To our knowledge, it is the first fully programmable and efficiently hardware controlled radix-3 SAR ADC. We had to use two comparators per cycle due to ADC architecture and we proposed a simple calibration scheme for the comparators. Also, as the architecture of the DAC array is completely different from the architecture of conventional radix-2 SAR ADC’s DAC arrays, we came up with an algorithm for calibration of capacitors of the DAC. Low power SAR ADCs face two major challenges especially at high resolutions: (1) increased comparator power to suppress the noise, and (2) increased DAC switching energy due to the large DAC size. Due to our proposed architecture,the radix-3 SAR ADC uses two comparators per cycle and two differential DACs. To improve the comparator’s power efficiency, an efficient and low cost calibration technique has been introduced. It allows a low power and noisy comparator to achieve high signal-to-noise ratio (SNR). To improve the DAC switching energy, we introduced a radix-3/radix-2 based novel hybrid SAR ADC. We use two single ended DACs for radix-3 SAR ADC and these two single ended DACs can be used as one differential DAC for radix-2 SAR ADC. So, overall, we only have a single DAC as conventional radix- 2 SAR ADC. In addition, a monotonic switching technique is adopted for radix-2 search to reduce the DAC capacitor size and hence, to reduce switching power. It can reduce the total number of unit capacitors by four times. Our proposed hybrid SAR ADC can achieve less DAC energy compared to radix-3 and radix-2 SAR ADCs. Also, to utilize technology scaling, we used the minimum capacitor size allowed by thermal noise limitations. To achieve high resolution, we introduced calibration algorithm for the DAC array. As mentioned earlier, the radix-3 SAR ADC offers higher power than conventional radix-2 SAR ADC because of simultaneous use of two comparators. In the proposed hybrid SAR ADC, we will be using radix-3 search for first few MSB bits. So, the resolution required for radix-3 comparators are much larger than the LSB value of 10-bit ADC. By implementing calibration of comparators, we can use low power, high input referred offset and high speed comparators for radix-3 search. Radix-2 search will be used for rest of the bits and the resolution of the radix-2 comparator has to be less than the required LSB value. So, a high power, low input referred offset and high speed comparator is used for radix-2 search. Also, we introduced clock gating for comparators. So, radix-3 comparators will not toggle during radix-2 search and the radix-2 comparators will be inactive during radix-3 search. By using the aforementioned techniques, the overall comparator power is definitely less than a radix-3 SAR ADC and comparable to a conventional radix-2 SAR ADC. A prototype radix-3/radix-2 based hybrid SAR ADC with the proposed technique is designed and fabricated in 40nm CMOS technology. It achieves an SNDR of 56.9 dB and consumes only 0.38 mW power at 30MS/s, leading to a Walden figure of merit of 21.5 fJ/conv-step.Electrical and Computer Engineerin

Design Techniques for High-Performance SAR A/D Converters

The design of electronics needs to account for the non-ideal characteristics of the device technologies used to realize practical circuits. This is particularly important in mixed analog-digital design since the best device technologies are very different for digital compared to analog circuits. One solution for this problem is to use a calibration correction approach to remove the errors introduced by devices, but this adds complexity and power dissipation, as well as reducing operation speed, and so must be optimised. This thesis addresses such an approach to improve the performance of certain types of analog-to-digital converter (ADC) used in advanced telecommunications, where speed, accuracy and power dissipation currently limit applications. The thesis specifically focuses on the design of compensation circuits for use in successive approximation register (SAR) ADCs. ADCs are crucial building blocks in communication systems, in general, and for mobile networks, in particular. The recently launched fifth generation of mobile networks (5G) has required new ADC circuit techniques to meet the higher speed and lower power dissipation requirements for 5G technology. The SAR has become one of the most favoured architectures for designing high-performance ADCs, but the successive nature of the circuit operation makes it difficult to reach ∼GS/s sampling rates at reasonable power consumption. Here, two calibration techniques for high-performance SAR ADCs are presented. The first uses an on-chip stochastic-based mismatch calibration technique that is able to accurately compute and compensate for the mismatch of a capacitive DAC in a SAR ADC. The stochastic nature of the proposed calibration method enables determination of the mismatch of the CAPDAC with a resolution much better than that of the DAC. This allows the unit capacitor to scale down to as low as 280aF for a 9-bit DAC. Since the CAP-DAC causes a large part of the overall dynamic power consumption and directly determines both the sizes of the driving and sampling switches and the size of the input capacitive load of the ADC and the kT/C noise power, a small CAP-DAC helps the power efficiency. To validate the proposed calibration idea, a 10-bit asynchronous SAR ADC was fabricated in 28-nm CMOS. Measurement results show that the proposed stochastic calibration improves the ADC’s SFDR and SNDR by 14.9 dB, 11.5 dB, respectively. After calibration, the fabricated SAR ADC achieves an ENOB of 9.14 bit at a sampling rate of 85 MS/s, resulting in a Walden FoM of 10.9 fJ/c-s. The second calibration technique is a timing-skew calibration for a time-interleaved (TI) SAR ADC that calibrates/computes the inter-channel timing and offset mismatch simultaneously. Simulation results show the effectiveness of this calibration method. When used together, the proposed mismatch calibration technique and the timing-skew calibration technique enables a TI SAR ADC to be designed that can achieve a sampling rate of ∼GS/s with 10-bit resolution and a power consumption as low as ∼10mW; specifications that satisfy the requirements of 5G technology