464 research outputs found
Error tolerant multimedia stream processing: There's plenty of room at the top (of the system stack)
There is a growing realization that the expected fault rates and energy dissipation stemming from increases in CMOS integration will lead to the abandonment of traditional system reliability in favor of approaches that offer reliability to hardware-induced errors across the application, runtime support, architecture, device and integrated-circuit (IC) layers. Commercial stakeholders of multimedia stream processing (MSP) applications, such as information retrieval, stream mining systems, and high-throughput image and video processing systems already feel the strain of inadequate system-level scaling and robustness under the always-increasing user demand. While such applications can tolerate certain imprecision in their results, today's MSP systems do not support a systematic way to exploit this aspect for cross-layer system resilience. However, research is currently emerging that attempts to utilize the error-tolerant nature of MSP applications for this purpose. This is achieved by modifications to all layers of the system stack, from algorithms and software to the architecture and device layer, and even the IC digital logic synthesis itself. Unlike conventional processing that aims for worst-case performance and accuracy guarantees, error-tolerant MSP attempts to provide guarantees for the expected performance and accuracy. In this paper we review recent advances in this field from an MSP and a system (layer-by-layer) perspective, and attempt to foresee some of the components of future cross-layer error-tolerant system design that may influence the multimedia and the general computing landscape within the next ten years. © 1999-2012 IEEE
SIMD-Swift: Improving Performance of Swift Fault Detection
The general tendency in modern hardware is an increase in fault rates, which is caused by the decreased operation voltages and feature sizes. Previously, the issue of hardware faults was mainly approached only in high-availability enterprise servers and in safety-critical applications, such as transport or aerospace domains. These fields generally have very tight requirements, but also higher budgets. However, as fault rates are increasing, fault tolerance solutions are starting to be also required in applications that have much smaller profit margins. This brings to the front the idea of software-implemented hardware fault tolerance, that is, the ability to detect and tolerate hardware faults using software-based techniques in commodity CPUs, which allows to get resilience almost for free. Current solutions, however, are lacking in performance, even though they show quite good fault tolerance results.
This thesis explores the idea of using the Single Instruction Multiple Data (SIMD) technology for executing all program\'s operations on two copies of the same data. This idea is based on the observation that SIMD is ubiquitous in modern CPUs and is usually an underutilized resource. It allows us to detect bit-flips in hardware by a simple comparison of two copies under the assumption that only one copy is affected by a fault.
We implemented this idea as a source-to-source compiler which performs hardening of a program on the source code level. The evaluation of our several implementations shows that it is beneficial to use it for applications that are dominated by arithmetic or logical operations, but those that have more control-flow or memory operations are actually performing better with the regular instruction replication. For example, we managed to get only 15% performance overhead on Fast Fourier Transformation benchmark, which is dominated by arithmetic instructions, but memory-access-dominated Dijkstra algorithm has shown a high overhead of 200%
Classification of Resilience Techniques Against Functional Errors at Higher Abstraction Layers of Digital Systems
Nanoscale technology nodes bring reliability concerns back to the center stage of digital system design. A systematic classification of approaches that increase system resilience in the presence of functional hardware (HW)-induced errors is presented, dealing with higher system abstractions, such as the (micro) architecture, the mapping, and platform software (SW). The field is surveyed in a systematic way based on nonoverlapping categories, which add insight into the ongoing work by exposing similarities and differences. HW and SW solutions are discussed in a similar fashion so that interrelationships become apparent. The presented categories are illustrated by representative literature examples to illustrate their properties. Moreover, it is demonstrated how hybrid schemes can be decomposed into their primitive components
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A Performance-Efficient and Practical Processor Error Recovery Framework
Continued reduction in the size of a transistor has affected the reliability of pro-
cessors built using them. This is primarily due to factors such as inaccuracies while
manufacturing, as well as non-ideal operating conditions, causing transistors to slow
down consistently, eventually leading to permanent breakdown and erroneous operation
of the processor. Permanent transistor breakdown, or faults, can occur at any point in
time in the processor’s lifetime. Errors are the discrepancies in the output of faulty
circuits. This dissertation shows that the components containing faults can continue
operating if the errors caused by them are within certain bounds. Further, the lifetime
of a processor can be increased by adding supportive structures that start working
once the processor develops these hard errors.
This dissertation has three major contributions, namely REPAIR, FaultSim and
PreFix. REPAIR is a fault tolerant system with minimal changes to the processor
design. It uses an external Instruction Re-execution Unit (IRU) to perform operations,
which the faulty processor might have erroneously executed. Instructions that are
found to use faulty hardware are then re-executed on the IRU. REPAIR shows that
the performance overhead of such targeted re-execution is low for a limited number of
faults.
FaultSim is a fast fault-simulator capable of simulating large circuits at the transistor
level. It is developed in this dissertation to understand the effect of faults on different
circuits. It performs digital logic based simulations, trading off analogue accuracy with
speed, while still being able to support most fault models. A 32-bit addition takes
under 15 micro-seconds, while simulating more than 1500 transistors. It can also be
integrated into an architectural simulator, which added a performance overhead of 10 to 26 percent to a simulation. The results obtained show that single faults cause an
error in an adder in less than 10 percent of the inputs.
PreFix brings together the fault models created using FaultSim and the design
directions found using REPAIR. PreFix performs re-execution of instructions on a
remote core, which pick up instructions to execute using a global instruction buffer.
Error prediction and detection are used to reduce the number of re-executed instructions.
PreFix has an area overhead of 3.5 percent in the setup used, and the performance
overhead is within 5 percent of a fault-free case. This dissertation shows that faults
in processors can be tolerated without explicitly switching off any component, and
minimal redundancy is sufficient to achieve the same
Energy-Efficient and Reliable Computing in Dark Silicon Era
Dark silicon denotes the phenomenon that, due to thermal and power constraints, the fraction of transistors that can operate at full frequency is decreasing in each technology generation. Moore’s law and Dennard scaling had been backed and coupled appropriately for five decades to bring commensurate exponential performance via single core and later muti-core design. However, recalculating Dennard scaling for recent small technology sizes shows that current ongoing multi-core growth is demanding exponential thermal design power to achieve linear performance increase. This process hits a power wall where raises the amount of dark or dim silicon on future multi/many-core chips more and more. Furthermore, from another perspective, by increasing the number of transistors on the area of a single chip and susceptibility to internal defects alongside aging phenomena, which also is exacerbated by high chip thermal density, monitoring and managing the chip reliability before and after its activation is becoming a necessity. The proposed approaches and experimental investigations in this thesis focus on two main tracks: 1) power awareness and 2) reliability awareness in dark silicon era, where later these two tracks will combine together. In the first track, the main goal is to increase the level of returns in terms of main important features in chip design, such as performance and throughput, while maximum power limit is honored. In fact, we show that by managing the power while having dark silicon, all the traditional benefits that could be achieved by proceeding in Moore’s law can be also achieved in the dark silicon era, however, with a lower amount. Via the track of reliability awareness in dark silicon era, we show that dark silicon can be considered as an opportunity to be exploited for different instances of benefits, namely life-time increase and online testing. We discuss how dark silicon can be exploited to guarantee the system lifetime to be above a certain target value and, furthermore, how dark silicon can be exploited to apply low cost non-intrusive online testing on the cores. After the demonstration of power and reliability awareness while having dark silicon, two approaches will be discussed as the case study where the power and reliability awareness are combined together. The first approach demonstrates how chip reliability can be used as a supplementary metric for power-reliability management. While the second approach provides a trade-off between workload performance and system reliability by simultaneously honoring the given power budget and target reliability
Approximate Computing Survey, Part II: Application-Specific & Architectural Approximation Techniques and Applications
The challenging deployment of compute-intensive applications from domains
such Artificial Intelligence (AI) and Digital Signal Processing (DSP), forces
the community of computing systems to explore new design approaches.
Approximate Computing appears as an emerging solution, allowing to tune the
quality of results in the design of a system in order to improve the energy
efficiency and/or performance. This radical paradigm shift has attracted
interest from both academia and industry, resulting in significant research on
approximation techniques and methodologies at different design layers (from
system down to integrated circuits). Motivated by the wide appeal of
Approximate Computing over the last 10 years, we conduct a two-part survey to
cover key aspects (e.g., terminology and applications) and review the
state-of-the art approximation techniques from all layers of the traditional
computing stack. In Part II of our survey, we classify and present the
technical details of application-specific and architectural approximation
techniques, which both target the design of resource-efficient
processors/accelerators & systems. Moreover, we present a detailed analysis of
the application spectrum of Approximate Computing and discuss open challenges
and future directions.Comment: Under Review at ACM Computing Survey
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