Interconnect yield analysis and fault tolerance for field programmable gate arrays

Imperial Users onl

Ultra-low-power SRAM design in high variability advanced CMOS

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2009.Cataloged from PDF version of thesis.Includes bibliographical references (p. 163-181).Embedded SRAMs are a critical component in modern digital systems, and their role is preferentially increasing. As a result, SRAMs strongly impact the overall power, performance, and area, and, in order to manage these severely constrained trade-offs, they must be specially designed for target applications. Highly energy-constrained systems (e.g. implantable biomedical devices, multimedia handsets, etc.) are an important class of applications driving ultra-low-power SRAMs. This thesis analyzes the energy of an SRAM sub-array. Since supply- and threshold-voltage have a strong effect, targets for these are established in order to optimize energy. Despite the heavy emphasis on leakage-energy, analysis of a high-density 256x256 sub-array in 45nm LP CMOS points to two necessary optimizations: (1) aggressive supply-voltage reduction (in addition to Vt elevation), and (2) performance enhancement. Important SRAM metrics, including read/write/hold-margin and read-current, are also investigated to identify trade-offs of these optimizations. Based on the need to lower supply-voltage, a 0.35V 256kb SRAM is demonstrated in 65nm LP CMOS. It uses an 8T bit-cell with peripheral circuit-assists to improve write-margin and bit-line leakage. Additionally, redundancy, to manage the increasing impact of variability in the periphery, is proposed to improve the area-offset trade-off of sense-amplifiers, demonstrating promise for highly advanced technology nodes. Based on the need to improve performance, which is limited by density constraints, a 64kb SRAM, using an offset-compensating sense-amplifier, is demonstrated in 45nm LP CMOS with high-density 0.25[mu]m2 bit-cells.(cont.) The sense-amplifier is regenerative, but non -strobed, overcoming timing uncertainties limiting performance, and it is single-ended, for compatibility with 8T cells. Compared to a conventional strobed sense-amplifier, it achieves 34% improvement in worst-case access-time and 4x improvement in the standard deviation of the access-time.by Naveen Verma.Ph.D

Resilience of an embedded architecture using hardware redundancy

In the last decade the dominance of the general computing systems market has being replaced by embedded systems with billions of units manufactured every year. Embedded systems appear in contexts where continuous operation is of utmost importance and failure can be profound. Nowadays, radiation poses a serious threat to the reliable operation of safety-critical systems. Fault avoidance techniques, such as radiation hardening, have been commonly used in space applications. However, these components are expensive, lag behind commercial components with regards to performance and do not provide 100% fault elimination. Without fault tolerant mechanisms, many of these faults can become errors at the application or system level, which in turn, can result in catastrophic failures. In this work we study the concepts of fault tolerance and dependability and extend these concepts providing our own definition of resilience. We analyse the physics of radiation-induced faults, the damage mechanisms of particles and the process that leads to computing failures. We provide extensive taxonomies of 1) existing fault tolerant techniques and of 2) the effects of radiation in state-of-the-art electronics, analysing and comparing their characteristics. We propose a detailed model of faults and provide a classification of the different types of faults at various levels. We introduce an algorithm of fault tolerance and define the system states and actions necessary to implement it. We introduce novel hardware and system software techniques that provide a more efficient combination of reliability, performance and power consumption than existing techniques. We propose a new element of the system called syndrome that is the core of a resilient architecture whose software and hardware can adapt to reliable and unreliable environments. We implement a software simulator and disassembler and introduce a testing framework in combination with ERA’s assembler and commercial hardware simulators

Design of Variation-Tolerant Circuits for Nanometer CMOS Technology: Circuits and Architecture Co-Design

Aggressive scaling of CMOS technology in sub-90nm nodes has created huge challenges. Variations due to fundamental physical limits, such as random dopants fluctuation (RDF) and line edge roughness (LER) are increasing significantly with technology scaling. In addition, manufacturing tolerances in process technology are not scaling at the same pace as transistor's channel length due to process control limitations (e.g., sub-wavelength lithography). Therefore, within-die process variations worsen with successive technology generations. These variations have a strong impact on the maximum clock frequency and leakage power for any digital circuit, and can also result in functional yield losses in variation-sensitive digital circuits (such as SRAM). Moreover, in nanometer technologies, digital circuits show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost while achieving higher performance and density. It is therefore not surprising that the International Technology Roadmap for Semiconductors (ITRS) lists variability as one of the most challenging obstacles for IC design in nanometer regime. To facilitate variation-tolerant design, we study the impact of random variations on the delay variability of a logic gate and derive simple and scalable statistical models to evaluate delay variations in the presence of within-die variations. This work provides new design insight and highlights the importance of accounting for the effect of input slew on delay variations, especially at lower supply voltages. The derived models are simple, scalable, bias dependent and only require the knowledge of easily measurable parameters. This makes them useful in early design exploration, circuit/architecture optimization as well as technology prediction (especially in low-power and low-voltage operation). The derived models are verified using Monte Carlo SPICE simulations using industrial 90nm technology. Random variations in nanometer technologies are considered one of the largest design considerations. This is especially true for SRAM, due to the large variations in bitcell characteristics. Typically, SRAM bitcells have the smallest device sizes on a chip. Therefore, they show the largest sensitivity to different sources of variations. With the drastic increase in memory densities, lower supply voltages and higher variations, statistical simulation methodologies become imperative to estimate memory yield and optimize performance and power. In this research, we present a methodology for statistical simulation of SRAM read access yield, which is tightly related to SRAM performance and power consumption. The proposed flow accounts for the impact of bitcell read current variation, sense amplifier offset distribution, timing window variation and leakage variation on functional yield. The methodology overcomes the pessimism existing in conventional worst-case design techniques that are used in SRAM design. The proposed statistical yield estimation methodology allows early yield prediction in the design cycle, which can be used to trade off performance and power requirements for SRAM. The methodology is verified using measured silicon yield data from a 1Mb memory fabricated in an industrial 45nm technology. Embedded SRAM dominates modern SoCs and there is a strong demand for SRAM with lower power consumption while achieving high performance and high density. However, in the presence of large process variations, SRAMs are expected to consume larger power to ensure correct read operation and meet yield targets. We propose a new architecture that significantly reduces array switching power for SRAM. The proposed architecture combines built-in self-test (BIST) and digitally controlled delay elements to reduce the wordline pulse width for memories while ensuring correct read operation; hence, reducing switching power. A new statistical simulation flow was developed to evaluate the power savings for the proposed architecture. Monte Carlo simulations using a 1Mb SRAM macro from an industrial 45nm technology was used to examine the power reduction achieved by the system. The proposed architecture can reduce the array switching power significantly and shows large power saving - especially as the chip level memory density increases. For a 48Mb memory density, a 27% reduction in array switching power can be achieved for a read access yield target of 95%. In addition, the proposed system can provide larger power saving as process variations increase, which makes it a very attractive solution for 45nm and below technologies. In addition to its impact on bitcell read current, the increase of local variations in nanometer technologies strongly affect SRAM cell stability. In this research, we propose a novel single supply voltage read assist technique to improve SRAM static noise margin (SNM). The proposed technique allows precharging different parts of the bitlines to VDD and GND and uses charge sharing to precisely control the bitline voltage, which improves the bitcell stability. In addition to improving SNM, the proposed technique also reduces memory access time. Moreover, it only requires one supply voltage, hence, eliminates the need of large area voltage shifters. The proposed technique has been implemented in the design of a 512kb memory fabricated in 45nm technology. Results show improvements in SNM and read operation window which confirms the effectiveness and robustness of this technique

FPGA Qualification and Failure Rate Estimation Methodology for LHC Environments Using Benchmarks Test Circuits

When studying the behavior of a field programmable gate array (FPGA) under radiation, the most commonly used methodology consists in evaluating the single-event effect (SEE) cross section of its elements individually. However, this method does not allow the estimation of the device failure rate when using a custom design. An alternative approach based on benchmark circuits is presented in this article. It allows standardized application-level testing, which makes the comparison between different FPGAs easier. Moreover, it allows the evaluation of the FPGA failure rate independent of the application that will be implemented. The employed benchmark circuit belongs to the ITC’99 benchmark suite developed at Politecnico di Torino. Using the proposed methodology, the response of four FPGAs—the NG-Medium, the ProASIC3, the SmartFusion2, and the PolarFire—was evaluated under high-energy protons. Radiation tests with thermal neutrons were also conducted on the PolarFire to assess its potential sensitivity to them. Moreover, its performances in terms of total ionizing dose (TID) effects have been evaluated by measuring the degradation of the propagation delay during irradiatio

Fault and Defect Tolerant Computer Architectures: Reliable Computing With Unreliable Devices

This research addresses design of a reliable computer from unreliable device technologies. A system architecture is developed for a fault and defect tolerant (FDT) computer. Trade-offs between different techniques are studied and yield and hardware cost models are developed. Fault and defect tolerant designs are created for the processor and the cache memory. Simulation results for the content-addressable memory (CAM)-based cache show 90% yield with device failure probabilities of 3 x 10(-6), three orders of magnitude better than non fault tolerant caches of the same size. The entire processor achieves 70% yield with device failure probabilities exceeding 10(-6). The required hardware redundancy is approximately 15 times that of a non-fault tolerant design. While larger than current FT designs, this architecture allows the use of devices much more likely to fail than silicon CMOS. As part of model development, an improved model is derived for NAND Multiplexing. The model is the first accurate model for small and medium amounts of redundancy. Previous models are extended to account for dependence between the inputs and produce more accurate results

Analyse und Erweiterung eines fehler-toleranten NoC für SRAM-basierte FPGAs in Weltraumapplikationen

Data Processing Units for scientific space mission need to process ever higher volumes of data and perform ever complex calculations. But the performance of available space-qualified general purpose processors is just in the lower three digit megahertz range, which is already insufficient for some applications. As an alternative, suitable processing steps can be implemented in hardware on a space-qualified SRAM-based FPGA. However, suitable devices are susceptible against space radiation. At the Institute for Communication and Network Engineering a fault-tolerant, network-based communication architecture was developed, which enables the construction of processing chains on the basis of different processing modules within suitable SRAM-based FPGAs and allows the exchange of single processing modules during runtime, too. The communication architecture and its protocol shall isolate non SEU mitigated or just partial SEU mitigated modules affected by radiation-induced faults to prohibit the propagation of errors within the remaining System-on-Chip. In the context of an ESA study, this communication architecture was extended with further components and implemented in a representative hardware platform. Based on the acquired experiences during the study, this work analyses the actual fault-tolerance characteristics as well as weak points of this initial implementation. At appropriate locations, the communication architecture was extended with mechanisms for fault-detection and fault-differentiation as well as with a hardware-based monitoring solution. Both, the former measures and the extension of the employed hardware-platform with selective fault-injection capabilities for the emulation of radiation-induced faults within critical areas of a non SEU mitigated processing module, are used to evaluate the effects of radiation-induced faults within the communication architecture. By means of the gathered results, further measures to increase fast detection and isolation of faulty nodes are developed, selectively implemented and verified. In particular, the ability of the communication architecture to isolate network nodes without SEU mitigation could be significantly improved.Instrumentenrechner für wissenschaftliche Weltraummissionen müssen ein immer höheres Datenvolumen verarbeiten und immer komplexere Berechnungen ausführen. Die Performanz von verfügbaren qualifizierten Universalprozessoren liegt aber lediglich im unteren dreistelligen Megahertz-Bereich, was für einige Anwendungen bereits nicht mehr ausreicht. Als Alternative bietet sich die Implementierung von entsprechend geeigneten Datenverarbeitungsschritten in Hardware auf einem qualifizierten SRAM-basierten FPGA an. Geeignete Bausteine sind jedoch empfindlich gegenüber der Strahlungsumgebung im Weltraum. Am Institut für Datentechnik und Kommunikationsnetze wurde eine fehlertolerante netzwerk-basierte Kommunikationsarchitektur entwickelt, die innerhalb eines geeigneten SRAM-basierten FPGAs Datenverarbeitungsmodule miteinander nach Bedarf zu Verarbeitungsketten verbindet, sowie den Austausch von einzelnen Modulen im Betrieb ermöglicht. Nicht oder nur partiell SEU mitigierte Module sollen bei strahlungsbedingten Fehlern im Modul durch das Protokoll und die Fehlererkennungsmechanismen der Kommunikationsarchitektur isoliert werden, um ein Ausbreiten des Fehlers im restlichen System-on-Chip zu verhindern. Im Kontext einer ESA Studie wurde diese Kommunikationsarchitektur um Komponenten erweitert und auf einer repräsentativen Hardwareplattform umgesetzt. Basierend auf den gesammelten Erfahrungen aus der Studie, wird in dieser Arbeit eine Analyse der tatsächlichen Fehlertoleranz-Eigenschaften sowie der Schwachstellen dieser ursprünglichen Implementierung durchgeführt. Die Kommunikationsarchitektur wurde an geeigneten Stellen um Fehlerdetektierungs- und Fehlerunterscheidungsmöglichkeiten erweitert, sowie um eine hardwarebasierte Überwachung ergänzt. Sowohl diese Maßnahmen, als auch die Erweiterung der Hardwareplattform um gezielte Fehlerinjektions-Möglichkeiten zum Emulieren von strahlungsinduzierten Fehlern in kritischen Komponenten eines nicht SEU mitigierten Prozessierungsmoduls werden genutzt, um die tatsächlichen auftretenden Effekte in der Kommunikationsarchitektur zu evaluieren. Anhand der Ergebnisse werden weitere Verbesserungsmaßnahmen speziell zur schnellen Detektierung und Isolation von fehlerhaften Knoten erarbeitet, selektiv implementiert und verifiziert. Insbesondere die Fähigkeit, fehlerhafte, nicht SEU mitigierte Netzwerkknoten innerhalb der Kommunikationsarchitektur zu isolieren, konnte dabei deutlich verbessert werden

A Sustainable Autonomic Architecture for Organically Reconfigurable Computing Systems

A Sustainable Autonomic Architecture for Organically Reconfigurable Computing System based on SRAM Field Programmable Gate Arrays (FPGAs) is proposed, modeled analytically, simulated, prototyped, and measured. Low-level organic elements are analyzed and designed to achieve novel self-monitoring, self-diagnosis, and self-repair organic properties. The prototype of a 2-D spatial gradient Sobel video edge-detection organic system use-case developed on a XC4VSX35 Xilinx Virtex-4 Video Starter Kit is presented. Experimental results demonstrate the applicability of the proposed architecture and provide the infrastructure to quantify the performance and overcome fault-handling limitations. Dynamic online autonomous functionality restoration after a malfunction or functionality shift due to changing requirements is achieved at a fine granularity by exploiting dynamic Partial Reconfiguration (PR) techniques. A Genetic Algorithm (GA)-based hardware/software platform for intrinsic evolvable hardware is designed and evaluated for digital circuit repair using a variety of well-accepted benchmarks. Dynamic bitstream compilation for enhanced mutation and crossover operators is achieved by directly manipulating the bitstream using a layered toolset. Experimental results on the edge-detector organic system prototype have shown complete organic online refurbishment after a hard fault. In contrast to previous toolsets requiring many milliseconds or seconds, an average of 0.47 microseconds is required to perform the genetic mutation, 4.2 microseconds to perform the single point conventional crossover, 3.1 microseconds to perform Partial Match Crossover (PMX) as well as Order Crossover (OX), 2.8 microseconds to perform Cycle Crossover (CX), and 1.1 milliseconds for one input pattern intrinsic evaluation. These represent a performance advantage of three orders of magnitude over the JBITS software framework and more than seven orders of magnitude over the Xilinx design flow. Combinatorial Group Testing (CGT) technique was combined with the conventional GA in what is called CGT-pruned GA to reduce repair time and increase system availability. Results have shown up to 37.6% convergence advantage using the pruned technique. Lastly, a quantitative stochastic sustainability model for reparable systems is formulated to evaluate the Sustainability of FPGA-based reparable systems. This model computes at design-time the resources required for refurbishment to meet mission availability and lifetime requirements in a given fault-susceptible missions. By applying this model to MCNC benchmark circuits and the Sobel Edge-Detector in a realistic space mission use-case on Xilinx Virtex-4 FPGA, we demonstrate a comprehensive model encompassing the inter-relationships between system sustainability and fault rates, utilized, and redundant hardware resources, repair policy parameters and decaying reparability