Investigations into the feasibility of an on-line test methodology

This thesis aims to understand how information coding and the protocol that it supports can affect the characteristics of electronic circuits. More specifically, it investigates an on-line test methodology called IFIS (If it Fails It Stops) and its impact on the design, implementation and subsequent characteristics of circuits intended for application specific lC (ASIC) technology. The first study investigates the influences of information coding and protocol on the characteristics of IFIS systems. The second study investigates methods of circuit design applicable to IFIS cells and identifies the· technique possessing the characteristics most suitable for on-line testing. The third study investigates the characteristics of a 'real-life' commercial UART re-engineered using the techniques resulting from the previous two studies. The final study investigates the effects of the halting properties endowed by the protocol on failure diagnosis within IFIS systems. The outcome of this work is an identification and characterisation of the factors that influence behaviour, implementation costs and the ability to test and diagnose IFIS designs

Développement des techniques de test et de diagnostic pour les FPGA hiérarchique de type mesh

The evolution trend of shrinking feature size and increasing complexity in modern electronics is being slowed down due to physical limits that generate numerous imperfections and defects during fabrication steps or projected life time of the chip. Field Programmable Gate Arrays (FPGAs) are used in complex digital systems mainly due to their reconfigurability and shorter time-to-market. To maintain a high reliability of such systems, FPGAs should be tested thoroughly for defects. FPGA architecture optimization for area saving and better signal routability is an ongoing process which directly impacts the overall FPGA testability, hence the reliability. This thesis presents a complete strategy for test and diagnosis of manufacturing defects in mesh-based FPGAs containing a novel multilevel interconnects topology which promises to provide better area and routability. Efficiency of the proposed test schemes is analyzed in terms of test cost, respective fault coverage and diagnostic resolution.L’évolution tendant à réduire la taille et augmenter la complexité des circuits électroniques modernes, est en train de ralentir du fait des limitations technologiques, qui génèrent beaucoup de d’imperfections et de defaults durant la fabrication ou la durée de vie de la puce. Les FPGAs sont utilisés dans les systèmes numériques complexes, essentiellement parce qu’ils sont reconfigurables et rapide à commercialiser. Pour garder une grande fiabilité de tels systèmes, les FPGAs doivent être testés minutieusement pour les defaults. L’optimisation de l’architecture des FPGAs pour l’économie de surface et une meilleure routabilité est un processus continue qui impacte directement la testabilité globale et de ce fait, la fiabilité. Cette thèse présente une stratégie complète pour le test et le diagnostique des defaults de fabrication des “mesh-based FPGA” contenant une nouvelle topologie d’interconnections à plusieurs niveaux, ce qui promet d’apporter une meilleure routabilité. Efficacité des schémas proposes est analysée en termes de temps de test, couverture de faute et résolution de diagnostique

The Automatic Synthesis of Fault Tolerant and Fault Secure VLSI Systems

This thesis investigates the design of fault tolerant and fault secure (FTFS) systems within the framework of silicon compilation. Automatic design modification is used to introduce FTFS characteristics into a design. A taxonomy of FTFS techniques is introduced and is used to identify a number of features which an "automatic design for FTFS" system should exhibit. A silicon compilation system, Chip Churn 2 (CC2), has been implemented and has been used to demonstrate the feasibility of automatic design of FTFS systems. The CC2 system provides a design language, simulation facilities and a back-end able to produce CMOS VLSI designs. A number of FTFS design methods have been implemented within the CC2 environment; these methods range from triple modular redundancy to concurrent parity code checking. The FTFS design methods can be applied automatically to general designs in order to realise them as FTFS systems. A number of example designs are presented; these are used to illustrate the FTFS modification techniques which have been implemented. Area results for CMOS devices are presented; this allows the modification methods to be compared. A number of problems arising from the methods are highlighted and some solutions suggested

Integrated Application of Active Controls (IAAC) technology to an advanced subsonic transport project: Current and advanced act control system definition study. Volume 2: Appendices

The current status of the Active Controls Technology (ACT) for the advanced subsonic transport project is investigated through analysis of the systems technical data. Control systems technologies under examination include computerized reliability analysis, pitch axis fly by wire actuator, flaperon actuation system design trade study, control law synthesis and analysis, flutter mode control and gust load alleviation analysis, and implementation of alternative ACT systems. Extensive analysis of the computer techniques involved in each system is included

Test and Diagnosis of Integrated Circuits

The ever-increasing growth of the semiconductor market results in an increasing complexity of digital circuits. Smaller, faster, cheaper and low-power consumption are the main challenges in semiconductor industry. The reduction of transistor size and the latest packaging technology (i.e., System-On-a-Chip, System-In-Package, Trough Silicon Via 3D Integrated Circuits) allows the semiconductor industry to satisfy the latest challenges. Although producing such advanced circuits can benefit users, the manufacturing process is becoming finer and denser, making chips more prone to defects.The work presented in the HDR manuscript addresses the challenges of test and diagnosis of integrated circuits. It covers:- Power aware test;- Test of Low Power Devices;- Fault Diagnosis of digital circuits

Contract Testing for Reliable Embedded Systems

Embedded systems comprise diverse technologies complicating their design. By creating virtual prototypes of the target system, Electronic System Level Design, the early analysis of a system composed by electronics and software is possible. However, the concrete interaction between hardware modules and between hardware and software is left for late development stages and real prototype making. Generally, interaction between components is assumed to be correct. However, it has to be assumed on development implicitly because interaction between components is not considered in the functionality design. While single components are mostly thoroughly tested and guarantee certain reliability levels, their interaction is based on often underspecified interfaces. Although component usage is mostly specified, operational constraints are often left out. Finally, not only the interaction between components but also with the environment and the user are not ensured. Generally, only functional integration tests are executed and corner-cases are left out, leaving uncovered faults that only manifest as failures later when their cost is higher. Therefore, this work aims at component interaction through specification of interfaces, test generation and real-time test execution. The specification is based on the design-by-contract approach of software that specifies semantics of component interaction in addition to the syntactical definition through functions. In the first part of this work, a specification for the interaction between hardware modules is given. With the automatic real-time test execution, fulfillment of specified preconditions for correct component operation can be checked. In component-based design, the component is trusted and thus, its functionality is assumed to be correct when certain postconditions are specified. In a correct component assembly, component postconditions fulfill preconditions of other components resulting in an operational system. The specification of preconditions follows the definition of environmental properties, acceptable input sequences for interfacing pins, as well as acceptable signal parameters, such as voltage levels, slope times, delays and glitches. Postconditions are defined by the description of a functionality accompanying constraints, such as timing. These parameters are automatically determined on operation by a testing circuit. Parameters that violate the specification are signaled by the testing circuit and failure is detected. The chosen parameters can give hint of the reason for the failure being an evidence of a circuit fault. In the example of an Inter-Integrated Circuit (I2C) communication system, we define contracts and show comparisons between contract violation, fault categorization and failure occurrence under signal fault injection. To complete this work, support for fault analysis on the electronic system level design is given. For this, the data transfers between the high-level models used in the design are augmented with the defined contract parameters. With a specific interface, digital faults are generated for transactions with violating signal parameters that can be tracked by the system. This way, recovery mechanisms for synchronous communication are proposed and tested. In the second part, the interaction between hardware and software is tackled providing special methods for developing device drivers. For this, we do not only specify the interface between hardware and software but also map the hardware control elements to software, partially generating the software interface for a device. This is necessary because drivers handle devices with internal control elements like registers, data streams and interrupts that cannot be represented on software. This systematic composition of drivers facilitates the development of a device interface called the device mechanism. It is the lowest layer of a two-layer architecture for driver development. The device mechanism carries out the access to the device exporting a pure software interface. This interface is based on the device implementation being, thus, fully specified. Further data processing required for compliance with the operating system or application is carried out in the driver policy, the layer on top of it. With the definition of a software layer for device control, contracts specifying constraints of this interface are proposed. These contracts are based on implementation constraints of the device and on its dynamic behavior. Therefore, an extended finite state machine models the dynamic behavior of the device. Based on it, functions of the device mechanism can be augmented with preconditions on the state or on state machine variables. These conditions are then checked on runtime. After execution of a function, its postconditions are ensured, such as timing. This guarantees that different driver policies, operating systems or firmwares, use this same device mechanism fulfilling its constraints. On the example of a Philips webcam, we develop the complete driver for Linux based on our architecture, creating contracts for its device mechanism. Following the systematic composition and the contract approach, driver bugs are avoided that otherwise violate allowed values for device data and execution orders of device protocols

Laboratory Directed Research and Development FY2010 Annual Report

A premier applied-science laboratory, Lawrence Livermore National Laboratory (LLNL) has at its core a primary national security mission - to ensure the safety, security, and reliability of the nation's nuclear weapons stockpile without nuclear testing, and to prevent and counter the spread and use of weapons of mass destruction: nuclear, chemical, and biological. The Laboratory uses the scientific and engineering expertise and facilities developed for its primary mission to pursue advanced technologies to meet other important national security needs - homeland defense, military operations, and missile defense, for example - that evolve in response to emerging threats. For broader national needs, LLNL executes programs in energy security, climate change and long-term energy needs, environmental assessment and management, bioscience and technology to improve human health, and for breakthroughs in fundamental science and technology. With this multidisciplinary expertise, the Laboratory serves as a science and technology resource to the U.S. government and as a partner with industry and academia. This annual report discusses the following topics: (1) Advanced Sensors and Instrumentation; (2) Biological Sciences; (3) Chemistry; (4) Earth and Space Sciences; (5) Energy Supply and Use; (6) Engineering and Manufacturing Processes; (7) Materials Science and Technology; Mathematics and Computing Science; (8) Nuclear Science and Engineering; and (9) Physics

Aeronautical engineering, a continuing bibliography with indexes

This bibliography lists 823 reports, articles, and other documents introduced into the NASA scientific and technical information system in November 1984