Too Trivial To Test? An Inverse View on Defect Prediction to Identify Methods with Low Fault Risk

Background. Test resources are usually limited and therefore it is often not possible to completely test an application before a release. To cope with the problem of scarce resources, development teams can apply defect prediction to identify fault-prone code regions. However, defect prediction tends to low precision in cross-project prediction scenarios. Aims. We take an inverse view on defect prediction and aim to identify methods that can be deferred when testing because they contain hardly any faults due to their code being "trivial". We expect that characteristics of such methods might be project-independent, so that our approach could improve cross-project predictions. Method. We compute code metrics and apply association rule mining to create rules for identifying methods with low fault risk. We conduct an empirical study to assess our approach with six Java open-source projects containing precise fault data at the method level. Results. Our results show that inverse defect prediction can identify approx. 32-44% of the methods of a project to have a low fault risk; on average, they are about six times less likely to contain a fault than other methods. In cross-project predictions with larger, more diversified training sets, identified methods are even eleven times less likely to contain a fault. Conclusions. Inverse defect prediction supports the efficient allocation of test resources by identifying methods that can be treated with less priority in testing activities and is well applicable in cross-project prediction scenarios.Comment: Submitted to PeerJ C

Bug or Not? Bug Report Classification Using N-Gram IDF

Previous studies have found that a significant number of bug reports are misclassified between bugs and non-bugs, and that manually classifying bug reports is a time-consuming task. To address this problem, we propose a bug reports classification model with N-gram IDF, a theoretical extension of Inverse Document Frequency (IDF) for handling words and phrases of any length. N-gram IDF enables us to extract key terms of any length from texts, these key terms can be used as the features to classify bug reports. We build classification models with logistic regression and random forest using features from N-gram IDF and topic modeling, which is widely used in various software engineering tasks. With a publicly available dataset, our results show that our N-gram IDF-based models have a superior performance than the topic-based models on all of the evaluated cases. Our models show promising results and have a potential to be extended to other software engineering tasks.Comment: 5 pages, ICSME 201