10,201 research outputs found

    Experimental analysis of computer system dependability

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    This paper reviews an area which has evolved over the past 15 years: experimental analysis of computer system dependability. Methodologies and advances are discussed for three basic approaches used in the area: simulated fault injection, physical fault injection, and measurement-based analysis. The three approaches are suited, respectively, to dependability evaluation in the three phases of a system's life: design phase, prototype phase, and operational phase. Before the discussion of these phases, several statistical techniques used in the area are introduced. For each phase, a classification of research methods or study topics is outlined, followed by discussion of these methods or topics as well as representative studies. The statistical techniques introduced include the estimation of parameters and confidence intervals, probability distribution characterization, and several multivariate analysis methods. Importance sampling, a statistical technique used to accelerate Monte Carlo simulation, is also introduced. The discussion of simulated fault injection covers electrical-level, logic-level, and function-level fault injection methods as well as representative simulation environments such as FOCUS and DEPEND. The discussion of physical fault injection covers hardware, software, and radiation fault injection methods as well as several software and hybrid tools including FIAT, FERARI, HYBRID, and FINE. The discussion of measurement-based analysis covers measurement and data processing techniques, basic error characterization, dependency analysis, Markov reward modeling, software-dependability, and fault diagnosis. The discussion involves several important issues studies in the area, including fault models, fast simulation techniques, workload/failure dependency, correlated failures, and software fault tolerance

    A two-level structure for advanced space power system automation

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    The tasks to be carried out during the three-year project period are: (1) performing extensive simulation using existing mathematical models to build a specific knowledge base of the operating characteristics of space power systems; (2) carrying out the necessary basic research on hierarchical control structures, real-time quantitative algorithms, and decision-theoretic procedures; (3) developing a two-level automation scheme for fault detection and diagnosis, maintenance and restoration scheduling, and load management; and (4) testing and demonstration. The outlines of the proposed system structure that served as a master plan for this project, work accomplished, concluding remarks, and ideas for future work are also addressed

    Rapid mapping of digital integrated circuit logic gates via multi-spectral backside imaging

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    Modern semiconductor integrated circuits are increasingly fabricated at untrusted third party foundries. There now exist myriad security threats of malicious tampering at the hardware level and hence a clear and pressing need for new tools that enable rapid, robust and low-cost validation of circuit layouts. Optical backside imaging offers an attractive platform, but its limited resolution and throughput cannot cope with the nanoscale sizes of modern circuitry and the need to image over a large area. We propose and demonstrate a multi-spectral imaging approach to overcome these obstacles by identifying key circuit elements on the basis of their spectral response. This obviates the need to directly image the nanoscale components that define them, thereby relaxing resolution and spatial sampling requirements by 1 and 2 - 4 orders of magnitude respectively. Our results directly address critical security needs in the integrated circuit supply chain and highlight the potential of spectroscopic techniques to address fundamental resolution obstacles caused by the need to image ever shrinking feature sizes in semiconductor integrated circuits

    AES-EPO study program, volume I Final study report

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    Conceptual study of possible solutions to long- term and time-critical reliability problems affecting Apollo command module guidance and control compute

    Statistical fault detection in photovoltaic systems

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    Faults in photovoltaic (PV) systems, which can result in energy loss, system shutdown or even serious safety breaches, are often difficult to avoid. Fault detection in such systems is imperative to improve their reliability, productivity, safety and efficiency. Here, an innovative model-based fault-detection approach for early detection of shading of PV modules and faults on the direct current (DC) side of PV systems is proposed. This approach combines the flexibility, and simplicity of a one-diode model with the extended capacity of an exponentially weighted moving average (EWMA) control chart to detect incipient changes in a PV system. The one-diode model, which is easily calibrated due to its limited calibration parameters, is used to predict the healthy PV array’s maximum power coordinates of current, voltage and power using measured temperatures and irradiances. Residuals, which capture the difference between the measurements and the predictions of the one-diode model, are generated and used as fault indicators. Then, the EWMA monitoring chart is applied on the uncorrelated residuals obtained from the one-diode model to detect and identify the type of fault. Actual data from the grid-connected PV system installed at the Renewable Energy Development Center, Algeria, are used to assess the performance of the proposed approach. Results show that the proposed approach successfully monitors the DC side of PV systems and detects temporary shading.Peer ReviewedPostprint (author's final draft
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