Integral equation mei applied to three-dimensional arbitrary surfaces

The authors present a new formulation of the integral equation of the measured equation of invariance (MEI) as a confined field integral equation discretised by the method of moments, in which the use of numerically derived testing functions results in an approximately sparse linear system with storage memory requirements and a CPU time for computing the matrix coefficients proportional to the number of unknowns.Peer ReviewedPostprint (published version

Design and development of a multipurpose, boresighted star tracker

Design and development of boresighted star tracke

Acceleration of Seed Ordering and Selection for High Quality Delay Test

Seed ordering and selection is a key technique to provide high-test quality with limited resources in Built-In Self Test (BIST) environment. We present a hard-to-detect delay fault selection method to accelerate the computation time in seed ordering and selection processes. This selection method can be used to restrict faults for test generation executed in an early stage in seed ordering and selection processes, and reduce a test pattern count and therefore a computation time. We evaluate the impact of the selection method both in deterministic BIST, where one test pattern is decoded from one seed, and mixed-mode BIST, where one seed is expanded to two or more patterns. The statistical delay quality level (SDQL) is adopted as test quality measure, to represent ability to detect small delay defects (SDDs). Experimental results show that our proposed method can significantly reduce computation time from 28% to 63% and base set seed counts from 21% to 67% while slightly sacrificing test quality

A novel reseeding mechanism for pseudo-random testing of VLSI circuits

[[abstract]]During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide sufficiently high fault coverage and many patterns were undetected fault (useless patterns). In order to reduce the test time, we can remove useless patterns or change them to useful patterns (fault dropping). In this paper, we reseed, modify the pseudo-random, and use an additional bit counter to improve test length and achieve high fault coverage. The fact is that a random test set contains useless patterns, so we present a technique, including both reseeding and bit modifying to remove useless patterns or change them to useful patterns, and when the patterns change, we pick out the numbers with less bits, leading to very short test length. The technique we present is applicable for single-stuck-at faults. The seeds we use are deterministic so 100% fault coverage can be achieve.[[conferencetype]]國際[[conferencedate]]20050523~20050526[[booktype]]紙本[[conferencelocation]]Kobe, Japa

Compressed Skewed-Load Delay Test Generation Based on Evolution and Deterministic Initialization of Populations

The current design and manufacturing semiconductor technologies require to test the products against delay related defects. However, complex acpSOC require low-overhead testability methods to keep the test cost at an acceptable level. Skewed-load tests seem to be the appropriate way to test delay faults in these acpSOC because the test application requires only one storage element per scan cell. Compressed skewed-load test generator based on genetic algorithm is proposed for wrapper-based logic cores of acpSOC. Deterministic population initialization is used to ensure the highest achievable aclTDF coverage for the given wrapper and scan cell order. The developed method performs test data compression by generating test vectors containing already overlapped test vector pairs. The experimental results show high fault coverages, decreased test lengths and better scalability in comparison to recent methods