Quadratic backward propagation of variance for nonlinear statistical circuit modeling

Accurate statistical modeling and simulation are keys to ensure that integrated circuits (ICs) meet specifications over the stochastic variations inherent in IC manufacturing technologies. Backward propagation of variance (BPV) is a general technique for statistical modeling of semiconductor devices. However, the BPV approach assumes that statistical fluctuations are not large, so that variations in device electrical performances can be modeled as linear functions of process parameters. With technology scaling, device performance variability over manufacturing variations becomes nonlinear. In this paper we extend the BPV technique to take into account these nonlinearities. We present the theory behind the technique, and apply it to specific examples. We also investigate the effectiveness of several possible solution algorithms

Fault Diagnosis of HVDC Systems Using Machine Learning Based Methods

With the development of high-power electronic technology, HVDC system is applied in the power system because of advantages in large-capacity and long-distance transmission, stability, and flexibility. Therefore, as the guarantee of reliable operating of HVDC system, fault diagnosis of the HVDC system is of great significance. In the current variety methods used in fault diagnosis, Machine Learning based methods have become a hotspot. To this end, the performance of several commonly used machine learning classifiers is compared in HVDC system. First of all, nine faults both in AC systems and DC systems of the HVDC system are set in the HVDC model in Simulink. Therefore, 10 operating states corresponding to the faults and normal operating are considered as the output classes of classifier. Seven parameters, such as DC voltage and DC current, are selected as fault feature parameters of each sample. By simulating the HVDC system in 10 operating states (including normal operating state) correspondingly, 20000 samples, each containing seven parameters, be obtained during the fault period. Then, the training sample set and the test sample set are established by 80% and 20% of the whole sample set. Subsequently, Decision Trees, the Support Vector Machine (SVM), K-Nearest Neighborhood Classifier (KNN), Ensemble classifiers, Discriminant Analysis, Backward Propagation Neural Network (BP-NN), long Short-Term Memory Neural Network (LSTM-NN), Extreme Learning Machine (ELM) was trained and tested. The accuracy of testing is used as the performance index of the model. In particular, for BP-NN, the impact of different transfer functions and learning rules combinations on the accuracy of the model was tested. For ELM, the impact of different activation functions on accuracy is tested. The results have shown that ELM and Bagged Trees have the best performance in HVDC fault diagnosis. The accuracy of these two methods are 92.23% and 96.5% respectively. However, in order to achieve better accuracy in ELM model, a large number of hidden layer nodes are set so that training time increases sharply

Fault Diagnosis of HVDC Systems Using Machine Learning Based Methods

With the development of high-power electronic technology, HVDC system is applied in the power system because of advantages in large-capacity and long-distance transmission, stability, and flexibility. Therefore, as the guarantee of reliable operating of HVDC system, fault diagnosis of the HVDC system is of great significance. In the current variety methods used in fault diagnosis, Machine Learning based methods have become a hotspot. To this end, the performance of several commonly used machine learning classifiers is compared in HVDC system. First of all, nine faults both in AC systems and DC systems of the HVDC system are set in the HVDC model in Simulink. Therefore, 10 operating states corresponding to the faults and normal operating are considered as the output classes of classifier. Seven parameters, such as DC voltage and DC current, are selected as fault feature parameters of each sample. By simulating the HVDC system in 10 operating states (including normal operating state) correspondingly, 20000 samples, each containing seven parameters, be obtained during the fault period. Then, the training sample set and the test sample set are established by 80% and 20% of the whole sample set. Subsequently, Decision Trees, the Support Vector Machine (SVM), K-Nearest Neighborhood Classifier (KNN), Ensemble classifiers, Discriminant Analysis, Backward Propagation Neural Network (BP-NN), long Short-Term Memory Neural Network (LSTM-NN), Extreme Learning Machine (ELM) was trained and tested. The accuracy of testing is used as the performance index of the model. In particular, for BP-NN, the impact of different transfer functions and learning rules combinations on the accuracy of the model was tested. For ELM, the impact of different activation functions on accuracy is tested. The results have shown that ELM and Bagged Trees have the best performance in HVDC fault diagnosis. The accuracy of these two methods are 92.23% and 96.5% respectively. However, in order to achieve better accuracy in ELM model, a large number of hidden layer nodes are set so that training time increases sharply

Intelligent failure-tolerant control

An overview of failure-tolerant control is presented, beginning with robust control, progressing through parallel and analytical redundancy, and ending with rule-based systems and artificial neural networks. By design or implementation, failure-tolerant control systems are 'intelligent' systems. All failure-tolerant systems require some degrees of robustness to protect against catastrophic failure; failure tolerance often can be improved by adaptivity in decision-making and control, as well as by redundancy in measurement and actuation. Reliability, maintainability, and survivability can be enhanced by failure tolerance, although each objective poses different goals for control system design. Artificial intelligence concepts are helpful for integrating and codifying failure-tolerant control systems, not as alternatives but as adjuncts to conventional design methods