DESIGN OF ANALOG CIRCUITS USING PSEUDO FLOATING GATE

In this paper we present pseudo floating gate and its bidirectional property. Inverter also can be implemented using bidirectional property. The inverter can be made bidirectional simply by interchanging vdd and gnd and no need to add any circuitry or any amplifier. We are using this inverter to implement the differentiator and integrator. We are first implementing inverter using pseudo floating gate. The bidirectionality of the gate is further evolved to be able to control signal flow conditions. And finally using this inverter we are implementing differentiator and integrator. Typical applications are in filter design and IO ports in ICs. Linearity and AC simulations are presented to show the good properties and versatility suited for Bi-directional analog circuit design

0.5V 3rd-order Tunable gm-C Filter

This paper proposes a 3rd-order gm-C filter that operates with the extremely low voltage supply of 0.5V. The employed transconductor is capable for operating in an extremely low voltage power supply environment. A benefit offered by the employed transconductor is that the filter’s cut-off frequency can be tuned, through a dc control current, for relatively large ranges. The filter structure was designed using normal threshold transistors of a triple-well 0.13μm CMOS process and is operated under a 0.5V supply voltage; its behavior has been evaluated through simulation results by utilizing the Analog Design Environment of the Cadence software

1.5V fully programmable CMOS Membership Function Generator Circuit with proportional DC-voltage control

A Membership Function Generator Circuit (MFGC) with bias supply of 1.5 Volts and independent DC-voltage programmable functionalities is presented. The realization is based on a programmable differential current mirror and three compact voltage-to-current converters, allowing continuous and quasi-linear adjustment of the center position, height, width and slopes of the triangular/trapezoidal output waveforms. HSPICE simulation results of the proposed circuit using the parameters of a double-poly, three metal layers, 0.5 μm CMOS technology validate the functionality of the proposed architecture, which exhibits a maximum deviation of the linearity in the programmability of 7 %

Techniques of Energy-Efficient VLSI Chip Design for High-Performance Computing

How to implement quality computing with the limited power budget is the key factor to move very large scale integration (VLSI) chip design forward. This work introduces various techniques of low power VLSI design used for state of art computing. From the viewpoint of power supply, conventional in-chip voltage regulators based on analog blocks bring the large overhead of both power and area to computational chips. Motivated by this, a digital based switchable pin method to dynamically regulate power at low circuit cost has been proposed to make computing to be executed with a stable voltage supply. For one of the widely used and time consuming arithmetic units, multiplier, its operation in logarithmic domain shows an advantageous performance compared to that in binary domain considering computation latency, power and area. However, the introduced conversion error reduces the reliability of the following computation (e.g. multiplication and division.). In this work, a fast calibration method suppressing the conversion error and its VLSI implementation are proposed. The proposed logarithmic converter can be supplied by dc power to achieve fast conversion and clocked power to reduce the power dissipated during conversion. Going out of traditional computation methods and widely used static logic, neuron-like cell is also studied in this work. Using multiple input floating gate (MIFG) metal-oxide semiconductor field-effect transistor (MOSFET) based logic, a 32-bit, 16-operation arithmetic logic unit (ALU) with zipped decoding and a feedback loop is designed. The proposed ALU can reduce the switching power and has a strong driven-in capability due to coupling capacitors compared to static logic based ALU. Besides, recent neural computations bring serious challenges to digital VLSI implementation due to overload matrix multiplications and non-linear functions. An analog VLSI design which is compatible to external digital environment is proposed for the network of long short-term memory (LSTM). The entire analog based network computes much faster and has higher energy efficiency than the digital one

Identifying worst case test vectors for FPGA exposed to total ionization dose using design for testability techniques

Electronic devices often operate in harsh environments which contain a variation of radiation sources. Radiation may cause different kinds of damage to proper operation of the devices. Their sources can be found in terrestrial environments, or in extra-terrestrial environments like in space, or in man-made radiation sources like nuclear reactors, biomedical devices and high energy particles physics experiments equipment. Depending on the operation environment of the device, the radiation resultant effect manifests in several forms like total ionizing dose effect (TID), or single event effects (SEEs) such as single event upset (SEU), single event gate rupture (SEGR), and single event latch up (SEL). TID effect causes an increase in the delay and the leakage current of CMOS circuits which may damage the proper operation of the integrated circuit. To ensure proper operation of these devices under radiation, thorough testing must be made especially in critical applications like space and military applications. Although the standard which describes the procedure for testing electronic devices under radiation emphasizes the use of worst case test vectors (WCTVs), they are never used in radiation testing due to the difficulty of generating these vectors for circuits under test. For decades, design for testability (DFT) has been the best choice for test engineers to test digital circuits in industry. It has become a very mature technology that can be relied on. DFT is usually used with automatic test patterns generation (ATPG) software to generate test vectors to test application specific integrated circuits (ASICs), especially with sequential circuits, against faults like stuck at faults and path delay faults. Surprisingly, however, radiation testing has not yet made use of this reliable technology. In this thesis, a novel methodology is proposed to extend the usage of DFT to generate WCTVs for delay failure in Flash based field programmable gate arrays (FPGAs) exposed to total ionizing dose (TID). The methodology is validated using MicroSemi ProASIC3 FPGA and cobalt 60 facility

A Ringamp-Assisted, Output Capacitor-less Analog CMOS Low-Dropout Voltage Regulator

Continued advancements in state-of-the-art integrated circuits have furthered trends toward higher computational performance and increased functionality within smaller circuit area footprints, all while improving power efficiencies to meet the demands of mobile and battery-powered applications. A significant portion of these advancements have been enabled by continued scaling of CMOS technology into smaller process node sizes, facilitating faster digital systems and power optimized computation. However, this scaling has degraded classic analog amplifying circuit structures with reduced voltage headroom and lower device output resistance; and thus, lower available intrinsic gain. This work investigates these trends and their impact for fine-grain Low-Dropout (LDO) Voltage Regulators, leading to a presented design methodology and implementation of a state-of-the-art Ringamp-Assisted, Output Capacitor-less Analog CMOS LDO Voltage Regulator capable of both power scaling and process node scaling for general SoC applications

Product assurance technology for procuring reliable, radiation-hard, custom LSI/VLSI electronics

Advanced measurement methods using microelectronic test chips are described. These chips are intended to be used in acquiring the data needed to qualify Application Specific Integrated Circuits (ASIC's) for space use. Efforts were focused on developing the technology for obtaining custom IC's from CMOS/bulk silicon foundries. A series of test chips were developed: a parametric test strip, a fault chip, a set of reliability chips, and the CRRES (Combined Release and Radiation Effects Satellite) chip, a test circuit for monitoring space radiation effects. The technical accomplishments of the effort include: (1) development of a fault chip that contains a set of test structures used to evaluate the density of various process-induced defects; (2) development of new test structures and testing techniques for measuring gate-oxide capacitance, gate-overlap capacitance, and propagation delay; (3) development of a set of reliability chips that are used to evaluate failure mechanisms in CMOS/bulk: interconnect and contact electromigration and time-dependent dielectric breakdown; (4) development of MOSFET parameter extraction procedures for evaluating subthreshold characteristics; (5) evaluation of test chips and test strips on the second CRRES wafer run; (6) two dedicated fabrication runs for the CRRES chip flight parts; and (7) publication of two papers: one on the split-cross bridge resistor and another on asymmetrical SRAM (static random access memory) cells for single-event upset analysis

Hybrid Multicarrier Random Space Vector PWM for the Mitigation the Acoustic Noise

The pulse width modulation (PWM) inverter is obvious for any industrial and power sector application. Particularly industrial drives are very keen on the industrial standards. Many modulations approached such a drives objects of DC-link consumption, harmonics suppression in lower and higher order spectrum and noise reduction. The still random PWM is a best candidate for reducing the noises on the PWM operated AC drives. There are various Random PWM (RPWM) methods has been developed and investigated for the PWM inverter fed drive noise reductions, still the shortcomings are existence on these method items of their less randomness and complex digital circuitry. These PWM dealt the spreading harmonics there by decreasing harmonic effects on the system. However, these techniques overlook the effect of acoustic noise and DC -link utilizations Therefore, in this paper mainly deals with to combined RPWM principle in space vector PWM (SVPWM) to generate random PWM generation using asymmetric frequency multi carrier called multicarrier random space vector PWM (MCRSVPWM). The SVM agreements with multicarrier (different fixed frequencies as carrier waves) which are chosen with the aid of a random binary bit generator. The proposed RSVM generated pulses with a randomized triangular carrier (4 ± 1.5 kHz), while the conventional RPWM method contains of the random pulse position with a fixed frequency triangular carrier. The simulation study is performed through MATLAB/Simulink for 3 HP asynchronous induction motor drive. The Experimental validation of proposed MCRSVPWM is tested with 2kW six switch (Power MOSFET – SCH2080KE) inverter power module fed induction motor drive.publishedVersio