AI/ML Algorithms and Applications in VLSI Design and Technology

An evident challenge ahead for the integrated circuit (IC) industry in the nanometer regime is the investigation and development of methods that can reduce the design complexity ensuing from growing process variations and curtail the turnaround time of chip manufacturing. Conventional methodologies employed for such tasks are largely manual; thus, time-consuming and resource-intensive. In contrast, the unique learning strategies of artificial intelligence (AI) provide numerous exciting automated approaches for handling complex and data-intensive tasks in very-large-scale integration (VLSI) design and testing. Employing AI and machine learning (ML) algorithms in VLSI design and manufacturing reduces the time and effort for understanding and processing the data within and across different abstraction levels via automated learning algorithms. It, in turn, improves the IC yield and reduces the manufacturing turnaround time. This paper thoroughly reviews the AI/ML automated approaches introduced in the past towards VLSI design and manufacturing. Moreover, we discuss the scope of AI/ML applications in the future at various abstraction levels to revolutionize the field of VLSI design, aiming for high-speed, highly intelligent, and efficient implementations

On-line health monitoring of passive electronic components using digitally controlled power converter

This thesis presents System Identification based On-Line Health Monitoring to analyse the dynamic behaviour of the Switch-Mode Power Converter (SMPC), detect, and diagnose anomalies in passive electronic components. The anomaly detection in this research is determined by examining the change in passive component values due to degradation. Degradation, which is a long-term process, however, is characterised by inserting different component values in the power converter. The novel health-monitoring capability enables accurate detection of passive electronic components despite component variations and uncertainties and is valid for different topologies of the switch-mode power converter. The need for a novel on-line health-monitoring capability is driven by the need to improve unscheduled in-service, logistics, and engineering costs, including the requirement of Integrated Vehicle Health Management (IVHM) for electronic systems and components. The detection and diagnosis of degradations and failures within power converters is of great importance for aircraft electronic manufacturers, such as Thales, where component failures result in equipment downtime and large maintenance costs. The fact that existing techniques, including built-in-self test, use of dedicated sensors, physics-of-failure, and data-driven based health-monitoring, have yet to deliver extensive application in IVHM, provides the motivation for this research ... [cont.]

Prognostics and health management of power electronics

Prognostics and health management (PHM) is a major tool enabling systems to evaluate their reliability in real-time operation. Despite ground-breaking advances in most engineering and scientific disciplines during the past decades, reliability engineering has not seen significant breakthroughs or noticeable advances. Therefore, self-awareness of the embedded system is also often required in the sense that the system should be able to assess its own health state and failure records, and those of its main components, and take action appropriately. This thesis presents a radically new prognostics approach to reliable system design that will revolutionise complex power electronic systems with robust prognostics capability enhanced Insulated Gate Bipolar Transistors (IGBT) in applications where reliability is significantly challenging and critical. The IGBT is considered as one of the components that is mainly damaged in converters and experiences a number of failure mechanisms, such as bond wire lift off, die attached solder crack, loose gate control voltage, etc. The resulting effects mentioned are complex. For instance, solder crack growth results in increasing the IGBT’s thermal junction which becomes a source of heat turns to wire bond lift off. As a result, the indication of this failure can be seen often in increasing on-state resistance relating to the voltage drop between on-state collector-emitter. On the other hand, hot carrier injection is increased due to electrical stress. Additionally, IGBTs are components that mainly work under high stress, temperature and power consumptions due to the higher range of load that these devices need to switch. This accelerates the degradation mechanism in the power switches in discrete fashion till reaches failure state which fail after several hundred cycles. To this end, exploiting failure mechanism knowledge of IGBTs and identifying failure parameter indication are background information of developing failure model and prognostics algorithm to calculate remaining useful life (RUL) along with ±10% confidence bounds. A number of various prognostics models have been developed for forecasting time to failure of IGBTs and the performance of the presented estimation models has been evaluated based on two different evaluation metrics. The results show significant improvement in health monitoring capability for power switches.Furthermore, the reliability of the power switch was calculated and conducted to fully describe health state of the converter and reconfigure the control parameter using adaptive algorithm under degradation and load mission limitation. As a result, the life expectancy of devices has been increased. These all allow condition-monitoring facilities to minimise stress levels and predict future failure which greatly reduces the likelihood of power switch failures in the first place

Towards Computational Efficiency of Next Generation Multimedia Systems

To address throughput demands of complex applications (like Multimedia), a next-generation system designer needs to co-design and co-optimize the hardware and software layers. Hardware/software knobs must be tuned in synergy to increase the throughput efficiency. This thesis provides such algorithmic and architectural solutions, while considering the new technology challenges (power-cap and memory aging). The goal is to maximize the throughput efficiency, under timing- and hardware-constraints

Hardware / Software Architectural and Technological Exploration for Energy-Efficient and Reliable Biomedical Devices

Nowadays, the ubiquity of smart appliances in our everyday lives is increasingly strengthening the links between humans and machines. Beyond making our lives easier and more convenient, smart devices are now playing an important role in personalized healthcare delivery. This technological breakthrough is particularly relevant in a world where population aging and unhealthy habits have made non-communicable diseases the first leading cause of death worldwide according to international public health organizations. In this context, smart health monitoring systems termed Wireless Body Sensor Nodes (WBSNs), represent a paradigm shift in the healthcare landscape by greatly lowering the cost of long-term monitoring of chronic diseases, as well as improving patients' lifestyles. WBSNs are able to autonomously acquire biological signals and embed on-node Digital Signal Processing (DSP) capabilities to deliver clinically-accurate health diagnoses in real-time, even outside of a hospital environment. Energy efficiency and reliability are fundamental requirements for WBSNs, since they must operate for extended periods of time, while relying on compact batteries. These constraints, in turn, impose carefully designed hardware and software architectures for hosting the execution of complex biomedical applications. In this thesis, I develop and explore novel solutions at the architectural and technological level of the integrated circuit design domain, to enhance the energy efficiency and reliability of current WBSNs. Firstly, following a top-down approach driven by the characteristics of biomedical algorithms, I perform an architectural exploration of a heterogeneous and reconfigurable computing platform devoted to bio-signal analysis. By interfacing a shared Coarse-Grained Reconfigurable Array (CGRA) accelerator, this domain-specific platform can achieve higher performance and energy savings, beyond the capabilities offered by a baseline multi-processor system. More precisely, I propose three CGRA architectures, each contributing differently to the maximization of the application parallelization. The proposed Single, Multi and Interleaved-Datapath CGRA designs allow the developed platform to achieve substantial energy savings of up to 37%, when executing complex biomedical applications, with respect to a multi-core-only platform. Secondly, I investigate how the modeling of technology reliability issues in logic and memory components can be exploited to adequately adjust the frequency and supply voltage of a circuit, with the aim of optimizing its computing performance and energy efficiency. To this end, I propose a novel framework for workload-dependent Bias Temperature Instability (BTI) impact analysis on biomedical application results quality. Remarkably, the framework is able to determine the range of safe circuit operating frequencies without introducing worst-case guard bands. Experiments highlight the possibility to safely raise the frequency up to 101% above the maximum obtained with the classical static timing analysis. Finally, through the study of several well-known biomedical algorithms, I propose an approach allowing energy savings by dynamically and unequally protecting an under-powered data memory in a new way compared to regular error protection schemes. This solution relies on the Dynamic eRror compEnsation And Masking (DREAM) technique that reduces by approximately 21% the energy consumed by traditional error correction codes

Comprehensive Designs of Innovate Secure Hardware Devices against Machine Learning Attacks and Power Analysis Attacks

Hardware security is an innovate subject oriented from growing demands of cybersecurity and new information vulnerabilities from physical leakages on hardware devices. However, the mainstream of hardware manufacturing industry is still taking benefits of products and the performance of chips as priority, restricting the design of hardware secure countermeasures under a compromise to a finite expense of overheads. Consider the development trend of hardware industries and state-of-the-art researches of architecture designs, this dissertation proposes some new physical unclonable function (PUF) designs as countermeasures to side-channel attacks (SCA) and machine learning (ML) attacks simultaneously. Except for the joint consideration of hardware and software vulnerabilities, those designs also take efficiencies and overhead problems into consideration, making the new-style of PUF more possible to be merged into current chips as well as their design concepts. While the growth of artificial intelligence and machine-learning techniques dominate the researching trends of Internet of things (IoT) industry, some mainstream architectures of neural networks are implemented as hypothetical attacking model, whose results are used as references for further lifting the performance, the security level, and the efficiency in lateral studies. In addition, a study of implementation of neural networks on hardware designs is proposed, this realized the initial attempt to introduce AI techniques to the designs of voltage regulation (VR). All aforementioned works are demonstrated to be of robustness to threats with corresponding power attack tests or ML attack tests. Some conceptional models are proposed in the last of the dissertation as future plans so as to realize secure on-chip ML models and hardware countermeasures to hybrid threats

Prognostics of Insulated Gate Bipolar Transistors

Insulated gate bipolar transistors (IGBTs) are the devices of choice for medium and high power, low frequency applications. IGBTs have been reported to fail under excessive electrical and thermal stresses in variable speed drives and are considered as reliability problems in wind turbines, inverters in hybrid electric vehicles and railway traction motors. There is a need to develop methods to detect anomalous behavior and predict the remaining useful life (RUL) of IGBTs to prevent system downtime and costly failures. In this study, a framework for prognostics of IGBTs was developed to provide early warnings of failure and predict the remaining useful life. The prognostic framework was implemented on non punch through (NPT) IGBTs. Power cycling of IGBTs was performed and the gate-emitter voltage, collector-emitter voltage, collector-emitter current and case temperature was monitored in-situ during aging. The on-state collector-emitter current (ICE(ON)) and collector-emitter voltage (VCE(ON)) were identified as precursors to IGBT failure. Electrical characterization and X-ray analysis was performed before and after aging to map degradation in the devices to observed trends in the precursor parameters. A Mahalanobis distance based approach was used for anomaly detection. The initial ICE(ON) and VCE(ON) parameters were used to compute the healthy MD distance. This healthy MD distance was transformed and the mean and standard deviation of the transformed MD data was obtained. The μ+3σ upper bound obtained from the transformed healthy MD was then used as a threshold for anomaly detection. This approach was able to detect anomalous behavior in IGBTs before failure. Upon anomaly detection, a particle filter approach was used for predicting the remaining useful life of the IGBTs. A system model was developed using the degradation trend of the VCE(ON) parameter. This model was obtained by a least squares regression of the IGBT degradation curve. The tracking and prediction performance of the model with the particle filter was demonstrated