Design and application of reconfigurable circuits and systems

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Fast and Robust Design of CMOS VCO for Optimal Performance

The exponentially growing design complexity with technological advancement calls for a large scope in the analog and mixed signal integrated circuit design automation. In the automation process, performance optimization under different environmental constraints is of prime importance. The analog integrated circuits design strongly requires addressing multiple competing performance objectives for optimization with ability to find global solutions in a constrained environment. The integrated circuit (IC) performances are significantly affected by the device, interconnect and package parasitics. Inclusion of circuit parasitics in the design phase along with performance optimization has become a bare necessity for faster prototyping. Besides this, the fabrication process variations have a predominant effect on the circuit performance, which is directly linked to the acceptability of manufactured integrated circuit chips. This necessitates a manufacturing process tolerant design. The development of analog IC design methods exploiting the computational intelligence of evolutionary techniques for optimization, integrating the circuit parasitic in the design optimization process in a more meaningful way and developing process fluctuation tolerant optimal design is the central theme of this thesis. Evolutionary computing multi-objective optimization techniques such as Non-dominated Sorting Genetic Algorithm-II and Infeasibility Driven Evolutionary Algorithm are used in this thesis for the development of parasitic aware design techniques for analog ICs. The realistic physical and process constraints are integrated in the proposed design technique. A fast design methodology based on one of the efficient optimization technique is developed and an extensive worst case process variation analysis is performed. This work also presents a novel process corner variation aware analog IC design methodology, which would effectively increase the yield of chips in the acceptable performance window. The performance of all the presented techniques is demonstrated through the application to CMOS ring oscillators, current starved and xi differential voltage controlled oscillators, designed in Cadence Virtuoso Analog Design Environment

MOCAST 2021

The 10th International Conference on Modern Circuit and System Technologies on Electronics and Communications (MOCAST 2021) will take place in Thessaloniki, Greece, from July 5th to July 7th, 2021. The MOCAST technical program includes all aspects of circuit and system technologies, from modeling to design, verification, implementation, and application. This Special Issue presents extended versions of top-ranking papers in the conference. The topics of MOCAST include:Analog/RF and mixed signal circuits;Digital circuits and systems design;Nonlinear circuits and systems;Device and circuit modeling;High-performance embedded systems;Systems and applications;Sensors and systems;Machine learning and AI applications;Communication; Network systems;Power management;Imagers, MEMS, medical, and displays;Radiation front ends (nuclear and space application);Education in circuits, systems, and communications

Timing Closure in Chip Design

Achieving timing closure is a major challenge to the physical design of a computer chip. Its task is to find a physical realization fulfilling the speed specifications. In this thesis, we propose new algorithms for the key tasks of performance optimization, namely repeater tree construction; circuit sizing; clock skew scheduling; threshold voltage optimization and plane assignment. Furthermore, a new program flow for timing closure is developed that integrates these algorithms with placement and clocktree construction. For repeater tree construction a new algorithm for computing topologies, which are later filled with repeaters, is presented. To this end, we propose a new delay model for topologies that not only accounts for the path lengths, as existing approaches do, but also for the number of bifurcations on a path, which introduce extra capacitance and thereby delay. In the extreme cases of pure power optimization and pure delay optimization the optimum topologies regarding our delay model are minimum Steiner trees and alphabetic code trees with the shortest possible path lengths. We presented a new, extremely fast algorithm that scales seamlessly between the two opposite objectives. For special cases, we prove the optimality of our algorithm. The efficiency and effectiveness in practice is demonstrated by comprehensive experimental results. The task of circuit sizing is to assign millions of small elementary logic circuits to elements from a discrete set of logically equivalent, predefined physical layouts such that power consumption is minimized and all signal paths are sufficiently fast. In this thesis we develop a fast heuristic approach for global circuit sizing, followed by a local search into a local optimum. Our algorithms use, in contrast to existing approaches, the available discrete layout choices and accurate delay models with slew propagation. The global approach iteratively assigns slew targets to all source pins of the chip and chooses a discrete layout of minimum size preserving the slew targets. In comprehensive experiments on real instances, we demonstrate that the worst path delay is within 7% of its lower bound on average after a few iterations. The subsequent local search reduces this gap to 2% on average. Combining global and local sizing we are able to size more than 5.7 million circuits within 3 hours. For the clock skew scheduling problem we develop the first algorithm with a strongly polynomial running time for the cycle time minimization in the presence of different cycle times and multi-cycle paths. In practice, an iterative local search method is much more efficient. We prove that this iterative method maximizes the worst slack, even when restricting the feasible schedule to certain time intervals. Furthermore, we enhance the iterative local approach to determine a lexicographically optimum slack distribution. The clock skew scheduling problem is then generalized to allow for simultaneous data path optimization. In fact, this is a time-cost tradeoff problem. We developed the first combinatorial algorithm for computing time-cost tradeoff curves in graphs that may contain cycles. Starting from the lowest-cost solution, the algorithm iteratively computes a descent direction by a minimum cost flow computation. The maximum feasible step length is then determined by a minimum ratio cycle computation. This approach can be used in chip design for several optimization tasks, e.g. threshold voltage optimization or plane assignment. Finally, the optimization routines are combined into a timing closure flow. Here, the global placement is alternated with global performance optimization. Netweights are used to penalize the length of critical nets during placement. After the global phase, the performance is improved further by applying more comprehensive optimization routines on the most critical paths. In the end, the clock schedule is optimized and clocktrees are inserted. Computational results of the design flow are obtained on real-world computer chips

Algorithms for Circuit Sizing in VLSI Design

One of the key problems in the physical design of computer chips, also known as integrated circuits, consists of choosing a  physical layout  for the logic gates and memory circuits (registers) on the chip. The layouts have a high influence on the power consumption and area of the chip and the delay of signal paths.  A discrete set of predefined layouts  for each logic function and register type with different physical properties is given by a library. One of the most influential characteristics of a circuit defined by the layout is its size. In this thesis we present new algorithms for the problem of choosing sizes for the circuits and its continuous relaxation,  and  evaluate these in theory and practice. A popular approach is based on Lagrangian relaxation and projected subgradient methods. We show that seemingly heuristic modifications that have been proposed for this approach can be theoretically justified by applying the well-known multiplicative weights algorithm. Subsequently, we propose a new model for the sizing problem as a min-max resource sharing problem. In our context, power consumption and signal delays are represented by resources that are distributed to customers. Under certain assumptions we obtain a polynomial time approximation for the continuous relaxation of the sizing problem that improves over the Lagrangian relaxation based approach. The new resource sharing algorithm has been implemented as part of the BonnTools software package which is developed at the Research Institute for Discrete Mathematics at the University of Bonn in cooperation with IBM. Our experiments on the ISPD 2013 benchmarks and state-of-the-art microprocessor designs provided by IBM illustrate that the new algorithm exhibits more stable convergence behavior compared to a Lagrangian relaxation based algorithm. Additionally, better timing and reduced power consumption was achieved on almost all instances. A subproblem of the new algorithm consists of finding sizes minimizing a weighted sum of power consumption and signal delays. We describe a method that approximates the continuous relaxation of this problem in polynomial time under certain assumptions. For the discrete problem we provide a fully polynomial approximation scheme under certain assumptions on the topology of the chip. Finally, we present a new algorithm for timing-driven optimization of registers. Their sizes and locations on a chip are usually determined during the clock network design phase, and remain mostly unchanged afterwards although the timing criticalities on which they were based can change. Our algorithm permutes register positions and sizes within so-called  clusters  without impairing the clock network such that it can be applied late in a design flow. Under mild assumptions, our algorithm finds an optimal solution which maximizes the worst cluster slack. It is implemented as part of the BonnTools and improves timing of registers on state-of-the-art microprocessor designs by up to 7.8% of design cycle time. </div

Algorithmic techniques for nanometer VLSI design and manufacturing closure

As Very Large Scale Integration (VLSI) technology moves to the nanoscale regime, design and manufacturing closure becomes very difficult to achieve due to increasing chip and power density. Imperfections due to process, voltage and temperature variations aggravate the problem. Uncertainty in electrical characteristic of individual device and wire may cause significant performance deviations or even functional failures. These impose tremendous challenges to the continuation of Moore's law as well as the growth of semiconductor industry. Efforts are needed in both deterministic design stage and variation-aware design stage. This research proposes various innovative algorithms to address both stages for obtaining a design with high frequency, low power and high robustness. For deterministic optimizations, new buffer insertion and gate sizing techniques are proposed. For variation-aware optimizations, new lithography-driven and post-silicon tuning-driven design techniques are proposed. For buffer insertion, a new slew buffering formulation is presented and is proved to be NP-hard. Despite this, a highly efficient algorithm which runs > 90x faster than the best alternatives is proposed. The algorithm is also extended to handle continuous buffer locations and blockages. For gate sizing, a new algorithm is proposed to handle discrete gate library in contrast to unrealistic continuous gate library assumed by most existing algorithms. Our approach is a continuous solution guided dynamic programming approach, which integrates the high solution quality of dynamic programming with the short runtime of rounding continuous solution. For lithography-driven optimization, the problem of cell placement considering manufacturability is studied. Three algorithms are proposed to handle cell flipping and relocation. They are based on dynamic programming and graph theoretic approaches, and can provide different tradeoff between variation reduction and wire- length increase. For post-silicon tuning-driven optimization, the problem of unified adaptivity optimization on logical and clock signal tuning is studied, which enables us to significantly save resources. The new algorithm is based on a novel linear programming formulation which is solved by an advanced robust linear programming technique. The continuous solution is then discretized using binary search accelerated dynamic programming, batch based optimization, and Latin Hypercube sampling based fast simulation

Enhancing Variation-aware Analog Circuits Sizing

Today's analog design and verification face significant challenges due to circuit complexity and short time-to-market windows. Moreover, variations in design parameters have an adversely impact on the correctness and performance of analog circuits. Circuit sizing consists in determining the device sizes and biasing voltages and currents such that the circuit satisfies its specifications. Traditionally, analog circuit sizing has been carried out by optimization-based methods, which of course will still be important in the future. Unfortunately, these techniques cannot guarantee an exhaustive coverage of the design search space and hence, are not able to ensure the non-existence of higher quality design solutions. The sizing problem becomes more complicated and computationally expensive under design parameters fluctuation. Indeed, existing yield analysis methods are computationally expensive and still encounter issues in problems with a high-dimensional process parameter space. In this thesis, we present new approaches for enhancing variation-aware analog circuit sizing. The circuit sizing problem is encoded using nonlinear constraints. A new algorithm using Satisfiability Modulo Theory (SMT) solving techniques exhaustively explores the analog design space and computes a continuous set of feasible sizing solutions. Next, a yield optimization stage aims to select the candidate design solution with the highest yield rate in the presence of process parameters variation. For this purpose, a novel method for the computation of parametric yield is proposed. The method combines the advantages of sparse regression and SMT solving techniques. The key idea is to characterize the failure regions as a collection of hyperrectangles in the parameters space. The yield estimation is based on a geometric calculation of probabilistic volumes subtended by the located hyperrectangles. The method can provide very large speed-up over Monte Carlo methods, when a high prediction accuracy is required. A new approach for improving analog yield optimization is also proposed. The optimization is performed in two steps. First, a global optimization phase samples the most potential optimal sub-regions of the feasible design space. The global search locates a design point near the optimal solution. Second, a local optimization phase uses the near optimal solution as a starting point. Also, it constructs linear interpolating models of the yield to explore the basin of convergence and to reach the global optimum. We illustrate the efficiency of the proposed methods on various analog circuits. The application of the yield analysis method on an integrated ring oscillator and a 6T static RAM proves that it is suitable for handling problems with tens of process parameters and can provide speedup of 5X-2000X over Monte Carlo methods. Furthermore, the application of our yield optimization methodology on the examples of a two-stage amplifier and a cascode amplifier shows that our approach can achieve higher quality in analog synthesis and unrivaled coverage of the analog design space when compared to traditional optimization techniques

Manufacturability Aware Design.

The aim of this work is to provide solutions that optimize the tradeoffs among design, manufacturability, and cost of ownership posed by technology scaling and sub-wavelength lithography. These solutions may take the form of robust circuit designs, cost-effective resolution technologies, accurate modeling considering process variations, and design rules assessment. We first establish a framework for assessing the impact of process variation on circuit performance, product value and return on investment on alternative processes. Key features include comprehensive modeling and different handling on die-to-die and within-die variation, accurate models of correlations of variation, realistic and quantified projection to future process nodes, and performance sensitivity analysis to improved control of individual device parameter and variation sources. Then we describe a novel minimum cost of correction methodology which determines the level of correction of each layout feature such that the prescribed parametric yield is attained with minimum RET (Resolution Enhancement Technology) cost. This timing driven OPC (Optical Proximity Correction) insertion flow uses a mathematical programming based slack budgeting algorithm to determine OPC level for all polysilicon gate geometries. Designs adopting this methodology show up to 20% MEBES (Manufacturing Electron Beam Exposure System) data volume reduction and 39% OPC runtime improvement. When the systematic correction residual errors become unavoidable, we analyze their impact on a state-of-art microprocessor's speedpath skew. A platform is created for diagnosing and improving OPC quality on gates with specific functionality such as critical gates or matching transistors. Significant changes in full-chip timing analysis indicate the necessity of a post-OPC performance verification design flow. Finally, we quantify the performance, manufacturability and mask cost impact of globally applying several common restrictive design rules. Novel approaches such as locally adapting FDRs (flexible design rules) based on image parameters range, and DRC Plus (preferred design rule enforcement with 2D pattern matching) are also described.Ph.D.Electrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/57676/2/jiey_1.pd