Computação de funções elementares em FPGA

Mestrado em Engenharia Electrónica e TelecomunicaçõesSince C.Y.Lee first proposed the idea of representing switching circuits as decision diagrams, there has been some interest in developing these diagrams in order to make them more compact and effective. One of the main applications of this technique is to represent circuits that perform elementary functions, such as cosine, sine, square root, etc. In this thesis, we try to prove that by choosing the right polarity for an Arithmetic Decision Diagram we can compactly and effectively represent a switching function and implement it in hardware. This thesis proposes algorithms that can compactly implement a given elementary function in hardware by finding the best possible polarity for the respective Arithmetic Decision Diagram.Desde que C.Y.Lee propôs a ideia de representar funções de comutação sob a forma de diagramas de decisão, tem havido algum interesse em desenvolver estes diagramas de modo a torná-los mais compactos e eficientes. Uma das principais aplicações desta técnica é representar circuitos que realizem funções elementares, como é o caso do seno, coseno, raíz quadrada, etc. Nesta tese tentamos provar que escolhendo a polaridade certa para um Diagrama de Decisão Aritmético é possível representar compacta e eficazmente uma função de comutação e implementá-la em hardware. Esta tese propõe algoritmos que conseguem implementar compactamente uma dada função elementar em hardware encontrando a melhor polaridade possível para o respetivo Diagrama de Decisão Aritmético

IC design for reliability

textAs the feature size of integrated circuits goes down to the nanometer scale, transient and permanent reliability issues are becoming a significant concern for circuit designers. Traditionally, the reliability issues were mostly handled at the device level as a device engineering problem. However, the increasing severity of reliability challenges and higher error rates due to transient upsets favor higher-level design for reliability (DFR). In this work, we develop several methods for DFR at the circuit level. A major source of transient errors is the single event upset (SEU). SEUs are caused by high-energy particles present in the cosmic rays or emitted by radioactive contaminants in the chip packaging materials. When these particles hit a N+/P+ depletion region of an MOS transistor, they may generate a temporary logic fault. Depending on where the MOS transistor is located and what state the circuit is at, an SEU may result in a circuit-level error. We analyze SEUs both in combinational logic and memories (SRAM). For combinational logic circuit, we propose FASER, a Fast Analysis tool of Soft ERror susceptibility for cell-based designs. The efficiency of FASER is achieved through its static and vector-less nature. In order to evaluate the impact of SEU on SRAM, a theory for estimating dynamic noise margins is developed analytically. The results allow predicting the transient error susceptibility of an SRAM cell using a closedform expression. Among the many permanent failure mechanisms that include time-dependent oxide breakdown (TDDB), electro-migration (EM), hot carrier effect (HCE), and negative bias temperature instability (NBTI), NBTI has recently become important. Therefore, the main focus of our work is NBTI. NBTI occurs when the gate of PMOS is negatively biased. The voltage stress across the gate generates interface traps, which degrade the threshold voltage of PMOS. The degraded PMOS may eventually fail to meet timing requirement and cause functional errors. NBTI becomes severe at elevated temperatures. In this dissertation, we propose a NBTI degradation model that takes into account the temperature variation on the chip and gives the accurate estimation of the degraded threshold voltage. In order to account for the degradation of devices, traditional design methods add guard-bands to ensure that the circuit will function properly during its lifetime. However, the worst-case based guard-bands lead to significant penalty in performance. In this dissertation, we propose an effective macromodel-based reliability tracking and management framework, based on a hybrid network of on-chip sensors, consisting of temperature sensors and ring oscillators. The model is concerned specifically with NBTIinduced transistor aging. The key feature of our work, in contrast to the traditional tracking techniques that rely solely on direct measurement of the increase of threshold voltage or circuit delay, is an explicit macromodel which maps operating temperature to circuit degradation (the increase of circuit delay). The macromodel allows for costeffective tracking of reliability using temperature sensors and is also essential for enabling the control loop of the reliability management system. The developed methods improve the over-conservatism of the device-level, worstcase reliability estimation techniques. As the severity of reliability challenges continue to grow with technology scaling, it will become more important for circuit designers/CAD tools to be equipped with the developed methods.Electrical and Computer Engineerin

Reliable chip design from low powered unreliable components

The pace of technological improvement of the semiconductor market is driven by Moore’s Law, enabling chip transistor density to double every two years. The transistors would continue to decline in cost and size but increase in power. The continuous transistor scaling and extremely lower power constraints in modern Very Large Scale Integrated(VLSI) chips can potentially supersede the benefits of the technology shrinking due to reliability issues. As VLSI technology scales into nanoscale regime, fundamental physical limits are approached, and higher levels of variability, performance degradation, and higher rates of manufacturing defects are experienced. Soft errors, which traditionally affected only the memories, are now also resulting in logic circuit reliability degradation. A solution to these limitations is to integrate reliability assessment techniques into the Integrated Circuit(IC) design flow. This thesis investigates four aspects of reliability driven circuit design: a)Reliability estimation; b) Reliability optimization; c) Fault-tolerant techniques, and d) Delay degradation analysis. To guide the reliability driven synthesis and optimization of combinational circuits, highly accurate probability based reliability estimation methodology christened Conditional Probabilistic Error Propagation(CPEP) algorithm is developed to compute the impact of gate failures on the circuit output. CPEP guides the proposed rewriting based logic optimization algorithm employing local transformations. The main idea behind this methodology is to replace parts of the circuit with functionally equivalent but more reliable counterparts chosen from a precomputed subset of Negation-Permutation-Negation(NPN) classes of 4-variable functions. Cut enumeration and Boolean matching driven by reliability-aware optimization algorithm are used to identify the best possible replacement candidates. Experiments on a set of MCNC benchmark circuits and 8051 functional microcontroller units indicate that the proposed framework can achieve up to 75% reduction of output error probability. On average, about 14% SER reduction is obtained at the expense of very low area overhead of 6.57% that results in 13.52% higher power consumption. The next contribution of the research describes a novel methodology to design fault tolerant circuitry by employing the error correction codes known as Codeword Prediction Encoder(CPE). Traditional fault tolerant techniques analyze the circuit reliability issue from a static point of view neglecting the dynamic errors. In the context of communication and storage, the study of novel methods for reliable data transmission under unreliable hardware is an increasing priority. The idea of CPE is adapted from the field of forward error correction for telecommunications focusing on both encoding aspects and error correction capabilities. The proposed Augmented Encoding solution consists of computing an augmented codeword that contains both the codeword to be transmitted on the channel and extra parity bits. A Computer Aided Development(CAD) framework known as CPE simulator is developed providing a unified platform that comprises a novel encoder and fault tolerant LDPC decoders. Experiments on a set of encoders with different coding rates and different decoders indicate that the proposed framework can correct all errors under specific scenarios. On average, about 1000 times improvement in Soft Error Rate(SER) reduction is achieved. Last part of the research is the Inverse Gaussian Distribution(IGD) based delay model applicable to both combinational and sequential elements for sub-powered circuits. The Probability Density Function(PDF) based delay model accurately captures the delay behavior of all the basic gates in the library database. The IGD model employs these necessary parameters, and the delay estimation accuracy is demonstrated by evaluating multiple circuits. Experiments results indicate that the IGD based approach provides a high matching against HSPICE Monte Carlo simulation results, with an average error less than 1.9% and 1.2% for the 8-bit Ripple Carry Adder(RCA), and 8-bit De-Multiplexer(DEMUX) and Multiplexer(MUX) respectively

KAVUAKA: a low-power application-specific processor architecture for digital hearing aids

The power consumption of digital hearing aids is very restricted due to their small physical size and the available hardware resources for signal processing are limited. However, there is a demand for more processing performance to make future hearing aids more useful and smarter. Future hearing aids should be able to detect, localize, and recognize target speakers in complex acoustic environments to further improve the speech intelligibility of the individual hearing aid user. Computationally intensive algorithms are required for this task. To maintain acceptable battery life, the hearing aid processing architecture must be highly optimized for extremely low-power consumption and high processing performance.The integration of application-specific instruction-set processors (ASIPs) into hearing aids enables a wide range of architectural customizations to meet the stringent power consumption and performance requirements. In this thesis, the application-specific hearing aid processor KAVUAKA is presented, which is customized and optimized with state-of-the-art hearing aid algorithms such as speaker localization, noise reduction, beamforming algorithms, and speech recognition. Specialized and application-specific instructions are designed and added to the baseline instruction set architecture (ISA). Among the major contributions are a multiply-accumulate (MAC) unit for real- and complex-valued numbers, architectures for power reduction during register accesses, co-processors and a low-latency audio interface. With the proposed MAC architecture, the KAVUAKA processor requires 16 % less cycles for the computation of a 128-point fast Fourier transform (FFT) compared to related programmable digital signal processors. The power consumption during register file accesses is decreased by 6 %to 17 % with isolation and by-pass techniques. The hardware-induced audio latency is 34 %lower compared to related audio interfaces for frame size of 64 samples.The final hearing aid system-on-chip (SoC) with four KAVUAKA processor cores and ten co-processors is integrated as an application-specific integrated circuit (ASIC) using a 40 nm low-power technology. The die size is 3.6 mm2. Each of the processors and co-processors contains individual customizations and hardware features with a varying datapath width between 24-bit to 64-bit. The core area of the 64-bit processor configuration is 0.134 mm2. The processors are organized in two clusters that share memory, an audio interface, co-processors and serial interfaces. The average power consumption at a clock speed of 10 MHz is 2.4 mW for SoC and 0.6 mW for the 64-bit processor.Case studies with four reference hearing aid algorithms are used to present and evaluate the proposed hardware architectures and optimizations. The program code for each processor and co-processor is generated and optimized with evolutionary algorithms for operation merging,instruction scheduling and register allocation. The KAVUAKA processor architecture is com-pared to related processor architectures in terms of processing performance, average power consumption, and silicon area requirements

The Fifth NASA Symposium on VLSI Design

The fifth annual NASA Symposium on VLSI Design had 13 sessions including Radiation Effects, Architectures, Mixed Signal, Design Techniques, Fault Testing, Synthesis, Signal Processing, and other Featured Presentations. The symposium provides insights into developments in VLSI and digital systems which can be used to increase data systems performance. The presentations share insights into next generation advances that will serve as a basis for future VLSI design

The 1991 3rd NASA Symposium on VLSI Design

Papers from the symposium are presented from the following sessions: (1) featured presentations 1; (2) very large scale integration (VLSI) circuit design; (3) VLSI architecture 1; (4) featured presentations 2; (5) neural networks; (6) VLSI architectures 2; (7) featured presentations 3; (8) verification 1; (9) analog design; (10) verification 2; (11) design innovations 1; (12) asynchronous design; and (13) design innovations 2

Measurements, Models, Systems and Design

531 s.

Space Communications: Theory and Applications. Volume 3: Information Processing and Advanced Techniques. A Bibliography, 1958 - 1963

Annotated bibliography on information processing and advanced communication techniques - theory and applications of space communication

Proceedings of the 22nd Conference on Formal Methods in Computer-Aided Design – FMCAD 2022

The Conference on Formal Methods in Computer-Aided Design (FMCAD) is an annual conference on the theory and applications of formal methods in hardware and system verification. FMCAD provides a leading forum to researchers in academia and industry for presenting and discussing groundbreaking methods, technologies, theoretical results, and tools for reasoning formally about computing systems. FMCAD covers formal aspects of computer-aided system design including verification, specification, synthesis, and testing

Proceedings of the 22nd Conference on Formal Methods in Computer-Aided Design – FMCAD 2022

The Conference on Formal Methods in Computer-Aided Design (FMCAD) is an annual conference on the theory and applications of formal methods in hardware and system verification. FMCAD provides a leading forum to researchers in academia and industry for presenting and discussing groundbreaking methods, technologies, theoretical results, and tools for reasoning formally about computing systems. FMCAD covers formal aspects of computer-aided system design including verification, specification, synthesis, and testing