Heterogeneous 2.5D integration on through silicon interposer

© 2015 AIP Publishing LLC. Driven by the need to reduce the power consumption of mobile devices, and servers/data centers, and yet continue to deliver improved performance and experience by the end consumer of digital data, the semiconductor industry is looking for new technologies for manufacturing integrated circuits (ICs). In this quest, power consumed in transferring data over copper interconnects is a sizeable portion that needs to be addressed now and continuing over the next few decades. 2.5D Through-Si-Interposer (TSI) is a strong candidate to deliver improved performance while consuming lower power than in previous generations of servers/data centers and mobile devices. These low-power/high-performance advantages are realized through achievement of high interconnect densities on the TSI (higher than ever seen on Printed Circuit Boards (PCBs) or organic substrates), and enabling heterogeneous integration on the TSI platform where individual ICs are assembled at close proximity

A DLL Based Test Solution for 3D ICs

Integrated circuits (ICs) are rapidly changing and vertical integration and packaging strategies have already become an important research topic. 2.5D and 3D IC integrations have obvious advantages over the conventional two dimensional IC implementations in performance, capacity, and power consumption. A passive Si interposer utilizing Through-Silicon via (TSV) technology is used for 2.5D IC integration. TSV is also the enabling technology for 3D IC integration. TSV manufacturing defects can affect the performance of stacked devices and reduce the yield. Manufacturing test methodologies for TSVs have to be developed to ensure fault-free devices. This thesis presents two test methods for TSVs in 2.5D and 3D ICs utilizing Delay-Locked Loop (DLL) modules. In the test method developed for TSVs in 2.5D ICs, a DLL is used to determine the propagation delay for fault detection. TSV faults in 3D ICs are detected through observation of the control voltage of a DLL. The proposed test methods present a robust performance against Process, supply Voltage and Temperature (PVT) variations due to the inherent feedback of DLLs. 3D full-wave simulations are performed to extract circuit level models for TSVs and fragments of an interposer wires using HFSS simulation tools. The extracted TSV models are then used to perform circuit level simulations using ADS tools from Agilent. Simulation results indicate that the proposed test solution for TSVs can detect manufacturing defects affecting the TSV propagation delay

US Microelectronics Packaging Ecosystem: Challenges and Opportunities

The semiconductor industry is experiencing a significant shift from traditional methods of shrinking devices and reducing costs. Chip designers actively seek new technological solutions to enhance cost-effectiveness while incorporating more features into the silicon footprint. One promising approach is Heterogeneous Integration (HI), which involves advanced packaging techniques to integrate independently designed and manufactured components using the most suitable process technology. However, adopting HI introduces design and security challenges. To enable HI, research and development of advanced packaging is crucial. The existing research raises the possible security threats in the advanced packaging supply chain, as most of the Outsourced Semiconductor Assembly and Test (OSAT) facilities/vendors are offshore. To deal with the increasing demand for semiconductors and to ensure a secure semiconductor supply chain, there are sizable efforts from the United States (US) government to bring semiconductor fabrication facilities onshore. However, the US-based advanced packaging capabilities must also be ramped up to fully realize the vision of establishing a secure, efficient, resilient semiconductor supply chain. Our effort was motivated to identify the possible bottlenecks and weak links in the advanced packaging supply chain based in the US.Comment: 22 pages, 8 figure

MICROELECTRONICS PACKAGING TECHNOLOGY ROADMAPS, ASSEMBLY RELIABILITY, AND PROGNOSTICS

This paper reviews the industry roadmaps on commercial-off-the shelf (COTS) microelectronics packaging technologies covering the current trends toward further reducing size and increasing functionality. Due tothe breadth of work being performed in this field, this paper presents only a number of key packaging technologies. The topics for each category were down-selected by reviewing reports of industry roadmaps including the International Technology Roadmap for Semiconductor (ITRS) and by surveying publications of the International Electronics Manufacturing Initiative (iNEMI) and the roadmap of association connecting electronics industry (IPC). The paper also summarizes the findings of numerous articles and websites that allotted to the emerging and trends in microelectronics packaging technologies. A brief discussion was presented on packaging hierarchy from die to package and to system levels. Key elements of reliability for packaging assemblies were presented followed by reliabilty definition from a probablistic failure perspective. An example was present for showing conventional reliability approach using Monte Carlo simulation results for a number of plastic ball grid array (PBGA). The simulation results were compared to experimental thermal cycle test data. Prognostic health monitoring (PHM) methods, a growing field for microelectronics packaging technologies, were briefly discussed. The artificial neural network (ANN), a data-driven PHM, was discussed in details. Finally, it presented inter- and extra-polations using ANN simulation for thermal cycle test data of PBGA and ceramic BGA (CBGA) assemblies

ECO-CHIP: Estimation of Carbon Footprint of Chiplet-based Architectures for Sustainable VLSI

Decades of progress in energy-efficient and low-power design have successfully reduced the operational carbon footprint in the semiconductor industry. However, this has led to an increase in embodied emissions, encompassing carbon emissions arising from design, manufacturing, packaging, and other infrastructural activities. While existing research has developed tools to analyze embodied carbon at the computer architecture level for traditional monolithic systems, these tools do not apply to near-mainstream heterogeneous integration (HI) technologies. HI systems offer significant potential for sustainable computing by minimizing carbon emissions through two key strategies: ``reducing" computation by reusing pre-designed chiplet IP blocks and adopting hierarchical approaches to system design. The reuse of chiplets across multiple designs, even spanning multiple generations of integrated circuits (ICs), can substantially reduce embodied carbon emissions throughout the operational lifespan. This paper introduces a carbon analysis tool specifically designed to assess the potential of HI systems in facilitating greener VLSI system design and manufacturing approaches. The tool takes into account scaling, chiplet and packaging yields, design complexity, and even carbon overheads associated with advanced packaging techniques employed in heterogeneous systems. Experimental results demonstrate that HI can achieve a reduction of embodied carbon emissions up to 70\% compared to traditional large monolithic systems. These findings suggest that HI can pave the way for sustainable computing practices, contributing to a more environmentally conscious semiconductor industry.Comment: Under review at HPCA2

Development of Silicon Photonic Multi Chip Module Transceivers

The exponential growth of data generation–driven in part by the proliferation of applications such as high definition streaming, artificial intelligence, and the internet of things–presents an impending bottleneck for electrical interconnects to fulfill data center bandwidth demands. Links now require bandwidths in excess of multiple Tbps while operating on the order of picojoules per bit, in addition to constraints on areal bandwidth densities and pin I/O bandwidth densities. Optical communications built on a silicon photonic platform offers a potential solution to develop power efficient, high bandwidth, low attenuation, small footprint links, all while building off the mature CMOS ecosystem. The development of silicon photonic foundries supporting multi project wafer runs with associated process design kit components supports a path towards widespread commercial production by increasing production volume while reducing fabrication and development costs. While silicon photonics can always be improved in terms of performance and yield, one of the central challenges is the integration of the silicon photonic integrated circuits with the driving electronic integrated circuits and data generating compute nodes such as CPUs, FPGAs, and ASICs. The co-packaging of the photonics with the electronics is crucial for adoption of silicon photonics in datacenters, as improper integration negates all the potential benefits of silicon photonics. The work in this dissertation is centered around the development of silicon photonic multi chip module transceivers to aid in the deployment of silicon photonics within data centers. Section one focuses on silicon photonic integration and highlights multiple integrated transceiver prototypes. The central prototype features a photonic integrated circuit with bus waveguides with WDM microdisk modulators for the transmitter and WDM demuxes with drop ports to photodiodes for the receiver. The 2.5D integrated prototype utilizes a thinned silicon interposer and TIA electronic integrated circuits. The architecture, integration, characterization, performance, and scalability of the prototype are discussed. The development of this first prototype identified key design considerations necessary for designing multi chip module silicon photonic prototypes, which will be addressed in this section. Finally, other multi chip module silicon photonic prototypes will be overviewed. These include a 2.5D integrated transceiver with a different electronic integrated circuit TIA, a 3D integrated receiver, an active interposer network on chip, and a 2.5D integrated transceiver with custom electronic integrated circuits. Section two focuses on research that supports the development of silicon photonic transceivers. The thermal crosstalk from neighboring microdisk modulators as a function of modulator pitch is investigated. As modulators are placed at denser pitches to accommodate areal bandwidth density requirements in transceivers, this thermal crosstalk will become significant. In this section, designs and results from several iterations of custom microring modulators are reported. Custom microring modulators allow for scaling up the number of channels in microring transceivers by offering the ability to fabricate variable resonances and provide a platform for further innovation in bandwidth, free spectral range, and energy efficiency. The designs and results of higher order modulation format modulators, both microring based and Mach Zehnder based, are discussed. High order modulators offer a path towards scaling transceiver total throughput without having to increase the channel counts or component bandwidth. Together, the work in these two sections supports the development of silicon photonic transceivers to aid in the adoption of silicon photonics into data generating systems

Compliant copper microwire arrays for reliable interconnections between large low-CTE packages and printed wiring board

The trend to high I/O density, performance and miniaturization at low cost is driving the industry towards shrinking interposer design rules, requiring a new set of packaging technologies. Low-CTE packages from silicon, glass and low-CTE organic substrates enable high interconnection density, high reliability and integration of system components. However, the large CTE mismatch between the package and the board presents reliability challenges for the board-level interconnections. Novel stress-relief structures that can meet reliability requirements along with electrical performance while meeting the cost constraints are needed to address these challenges. This thesis focuses on a comprehensive methodology starting with modeling, design, fabrication and characterization to validate such stress-relief structures. This study specifically explores SMT-compatible stress-relief microwire arrays in thin polymer carriers as a unique and low-cost solution for reliable board-level interconnections between large low-CTE packages and printed wiring boards. The microwire arrays are pre-fabricated in ultra-thin carriers using low-cost manufacturing processes such as laser vias and copper electroplating, which are then assembled in between the interposer and printed wiring board (PWB) as stress-relief interlayers. The microwire array results in dramatic reduction in solder stresses and strains, even with larger interposer sizes (20 mm × 20 mm), at finer pitch (400 microns), without the need for underfill. The parallel wire arrays result in low resistance and inductance, and therefore do not degrade the electrical performance. The scalability of the structures and the unique processes, from micro to nanowires, provides extendibility to finer pitch and larger package sizes. Finite element method (FEM) was used to study the reliability of the interconnections to provide guidelines for the test vehicle design. The models were built in 2.5D geometries to study the reliability of 400 µm-pitch interconnections with a 100 µm thick, 20 mm × 20 mm silicon package that was SMT-assembled onto an organic printed wiring board. The performance of the microwire array interconnection is compared to that of ball grid array (BGA) interconnections, in warpage, equivalent plastic strain and projected fatigue life. A unique set of materials and processes was used to demonstrate the low-cost fabrication of microwire arrays. Copper microwires with 12 µm diameter and 50 µm height were fabricated on both sides of a 50 µm thick, thermoplastic polymer carrier using dryfilm based photolithography and bottom-up electrolytic plating. The copper microwire interconnections were assembled between silicon interposer and FR-4 PWB through SMT-compatible process. Thermal mechanical reliability of the interconnections was characterized by thermal cycling test from -40°C to 125°C. The initial fatigue failure in the interconnections was identified at 700 cycles in the solder on the silicon package side, which is consistent with the modeling results. This study therefore demonstrated a highly-reliable and SMT-compatible solution for board-level interconnections between large low-CTE packages and printed wiring board.Ph.D

Microfluidic thermal management of 2.5D and 3D microsystems

Both 2.5 dimensional (2.5D) and 3 dimensional (3D) stacked integrated chip (SIC) heterogeneous architectures are promising to go beyond Moore's law for compact, high-performance, energy-efficient microsystems. However, these systems face significant thermal management challenges due to the increased volumetric heat generation rates, and reduced surface area. In addition, highly spatially and temporally non-uniform heat generation occurs due to different functionalities of various heterogeneous chips. This dissertation focuses on thermal management challenges for both 2.5D and 3D-SICs, by utilizing micro-gap liquid cooling with enhanced non-uniform heterogeneous pin-fin structures. Single phase convection thermal performance of heterogeneous pin-fin enhanced micro-gap liquid cooling under non-uniform power map has been evaluated under steady state conditions. Heat transfer and pressure drop characteristics of dielectric coolants in cooling manifold with cooling enhanced structure and hergeneous pin-fins have been parametrically studied by full-scale computational fluid mechanics/heat transfer (CFD/HT) to achieve non-uniform cooling capacities for multi-chip test structures of 2.5D-SICs. Non-uniform heterogeneous pin-fin structures in cold plates have been numerically and systematically optimized using design of experiment method, coupling with full-scale CFD/HT simulations. A compact thermal model accounting for both spatially and temporally varying heat-flux distributions for inter-layer liquid cooling of 3D-SICs, with realistic leakage power simulation feature has also been developed as a thermal-electrical co-design tool for 3D-SICs. In addition to the active micro-gap liquid cooling thermal managements, this dissertation also investigates the passive micro-gap two-phase liquid cooling using a miniature-thermosyphon with dielectric coolant Novec 7200, for future 3D-SICs. Experimental characterizations, including heat transfer measurements, and bubble flow visualizations are performed under two phase conditions. Implementation of miniature-thermosyphon on 3D-SICs provides non-uniform in-plane as well as cross-plane cooling capacities, which can be used and further enhanced for 3D-SICs thermal management with heterogeneous chips.Ph.D

三次元集積回路におけるチップ間ノイズ結合のその場評価と解析手法に関する研究

博士（工学）神戸大