Physics-Based Mixed-Mode Reverse Recovery Modeling And Optimization Of Si PiN And MPS Fast Recovery Diodes

The paper presents the results of the application of physics-based mixed-mode simulations to the analysis and optimization of the reverse recovery for Si-based fast recovery diodes (FREDs) using Platinum (Pt) lifetime killing. The trap model parameters are extracted from Deep Level Transient Spectroscopy (DLTS) characterization. The model is validated against experimental characterization carried out on the current International Rectifier (IR) FRED PiN technology. Improved designs, using emitter control efficiency and merged PiN-Schottky structures, are analyzed. Comparison between simulated and measured results are presente

GaN-on-Silicon HEMTs and Schottky diodes for high voltage applications

Gallium Nitride (GaN) is considered a very promising material for use in the field of power devices as its application in power systems would result in a significant increase in the power density, reduced power losses, and the potential to operate at high frequencies. The wide bandgap of the material allows a high critical electric field to be sustained which can lead to the design of devices with a shorter drift region, and therefore with lower on-state resistance, if compared to a silicon-based device with the same breakdown voltage. The use of an AlGaN/GaN heterostructure allows the formation of a two-dimensional electron gas (2DEG) at the heterointerface where carriers can reach very high mobility values. These properties can lead to the production of High Electron Mobility Transistors (HEMTs) and Schottky barrier diodes with superior performance, even when compared to devices based on state-of-the-art technologies such as Silicon Carbide or superjunctions. Furthermore, epitaxial growth of GaN layers on silicon wafers allows a significant reduction in the production cost and makes these devices competitive from a price perspective. This thesis will deal with a variety of topics concerning the characterization, design and optimization of AlGaN/GaN HEMTs and Schottky diodes with a 600 to 650V rating. Discussion will span several topics from device cross-section physics to circuit implementation and will be based on both experimental results and advanced modelling. More specifically, the thesis is concerned with the characterization of AlGaN/GaN Schottky diodes and extraction of their main parameters such as ideality factor, barrier height and series resistance. A thorough investigation of their reverse recovery performance and a comparison to competing technologies is also given. Several topics which concern the operation of AlGaN/GaN HEMTs are then discussed. The underlying physics of p-gate enhancement mode transistors are analysed followed by a discussion of the challenges associated with the implementation of these devices at a circuit level. Finally, a comparison of the performance of a specific area-saving layout (Bonding pad over active area) and a conventional design is given. The thesis aims to significantly enhance the understanding of the behaviour of these devices to enable better or new commercial designs to emerge

Study of Novel Power Semiconductor Devices for Performance and Reliability.

Power Semiconductor Devices are crucial components in present day power electronic systems. The performance and efficiency of the devices have a direct correlation with the power system efficiency. This dissertation will examine some of the components that are commonly used in a power system, with emphasis on their performance characteristics and reliability. In recent times, there has a proliferation of charge balance devices in high voltage discrete power devices. We examine the same charge balance concept in a fast recovery diode and a MOSFET. This is crucial in the extending system performance at compact dimensions. At smaller device and system sizes, the performance trade-off between the ON and OFF states becomes all the more critical. The focus on reducing the switching losses while maintaining system reliability increases. In a conventional planar technology, the technology places a limit on the switching performance owing to the larger die sizes. Using a charge balance structure helps achieve the improved trade-off, while working towards ultimately improving system reliability, size and cost. Chapter 1 introduces the basic power system based on an inductive switching circuit, and the various components that determine its efficiency. Chapter 2 presents a novel Trench Fast Recovery Diode (FRD) structure with injection control is proposed in this dissertation. The proposed structure achieves improved carrier profile without the need for excess lifetime control. This substantially improves the device performance, especially at extreme temperatures (-40oC to 175oC). The device maintains low leakage at high temperatures, and it\u27s Qrr and Irm do not degrade as is the usual case in heavily electron radiated devices. A 1600 diode using this structure has been developed, with a low forward turn-on voltage and good reverse recovery properties. The experimental results show that the structure maintains its performance at high temperatures. In chapter 3, we develop a termination scheme for the previously mentioned diode. A major limitation on the performance of high voltage power semiconductor is the edge termination of the device. It is critical to maintain the breakdown voltage of the device without compromising the reliability of the device by controlling the surface electric field. A good termination structure is critical to the reliability of the power semiconductor device. The proposed termination uses a novel trench MOS with buried guard ring structure to completely eliminate high surface electric field in the silicon region of the termination. The termination scheme was applied towards a 1350 V fast recovery diode, and showed excellent results. It achieved 98% of parallel plane breakdown voltage, with low leakage and no shifts after High Temperature Reverse Bias testing due to mobile ion contamination from packaging mold compound. In chapter 4, we also investigate the device physics behind a superjunction MOSFET structure for improved robustness. The biggest issue with a completely charge balanced MOSFET is decreased robustness in an Unclamped Inductive Switching (UIS) Circuit. The equally charged P and N pillars result in a flat electric field profile, with the peak carrier density closer to the P-N junction at the surface. This results in an almost negligible positive dynamic Rds-on effect in the MOSFET. By changing the charge profile of the P-column, either by increasing it completely or by implementing a graded profile with the heavier P on top, we can change the field profile and shift the carrier density deeper into silicon, increasing the positive dynamic Rds-on effect. Simulation and experimental results are presented to support the theory and understanding. Chapter 5 summarizes all the theories presented and the contributions made by them in the field. It also seeks to highlight future work to be done in these areas

Composite power semiconductor switches for high-power applications

It is predicted that 80 % of the world’s electricity will flow through power electronic based converters by 2030, with a growing demand for renewable technolo gies and the highest levels of efficiency at every stage from generation to load. At the heart of a power electronic converter is the power semiconductor switch which is responsible for controlling and modulating the flow of power from the input to the output. The requirements for these power semiconductor switches are vast, and include: having an extremely low level of conduction and switching losses; being a low source of electromagnetic noise, and not being susceptible to external Electromagnetic Interference (EMI); and having a good level of ruggedness and reliability. These high-performance switches must also be economically viable and not have an unnecessarily large manufacturing related carbon footprint. This thesis investigates the switching performance of the two main semiconductor switches used in high-power applications — the well-established Silicon (Si)-Insulated-Gate Bipolar Transistor (IGBT) and the state-of-the-art Wide-Bandgap (WBG) Silicon-Carbide (SiC)-Metal–Oxide–Semiconductor Field-Effect Transistor (MOSFET). The SiC-MOSFET is ostensibly a better device than the Si-IGBT due to the lower level of losses, however the cost of the device is far greater and there are characteristics which can be troublesome, such as the high levels of oscillatory behaviour at the switching edges which can cause serious Electromagnetic Compatibility (EMC) issues. The operating mechanism of these devices, the materials which are used to make them, and their auxiliary components are critically analysed and discussed. This includes a head-to-head comparison of the two high-capacity devices in terms of their losses and switching characteristics. The design of a high-power Double-Pulse Test Rig (DPTR) and the associated high-bandwidth measurement platform is presented. This test rig is then extensively used throughout this thesis to experimentally characterise the switching performance of the aforementioned high-capacity power semiconductor devices. A hybrid switch concept — termed “The Diverter” — is investigated, with the motivation of achieving improved switching performance without the high-cost of a full SiC solution. This comprises a fully rated Si-IGBT as the main conduction device and a part-rated SiC-MOSFET which is used at the turn-off. The coordinated switching scheme for the Si/SiC-Diverter is experimentally examined to determine the required timings which yield the lowest turn-off loss and the lowest level of oscillatory behaviour and other EMI precursors. The thermal stress imposed on the part-rated SiC-MOSFET is considered in a junction temperature simulation and determined to be negligible. This concept is then analysed in a grid-tied converter simulation and compared to a fully rated SiC-MOSFET and Si-IGBT. A conduction assistance operating mode, which solely uses the part-rated SiC-MOSFET when within its rating, is also investigated. Results show that the Diverter achieves a significantly lower level of losses compared to a Si-IGBT and only marginally higher than a full SiC solution. This is achieved at a much lower cost than a full SiC solution and may also provide a better method of achieving high-current SiC switche

Modeling and Analysis of Power Processing Systems

The feasibility of formulating a methodology for the modeling and analysis of aerospace electrical power processing systems is investigated. It is shown that a digital computer may be used in an interactive mode for the design, modeling, analysis, and comparison of power processing systems

Finite element electrothermal modelling and characterization of single and parallel connected power devices

Power modules typically comprise of several power devices connected in parallel for the purpose of delivering high current capability. This is especially the case in SiC where small active area and low current MOSFETs are the only option due to defect density control and yield issues in the epitaxial growth of SiC wafers. Electrothermal variations between parallel connected devices can emerge from manufacturing variability, non-uniform degradation rates, variation in gate driving just to mention a few. The impact of electrothermal variation between parallel-connected devices as a function of device technology is thus important to consider especially since failure of the power module requires only failure in a single device. Furthermore, the impact of these electrothermal variations in parallel-connected devices on the total electrothermal ruggedness of the power module under anomalous switching conditions like unclamped inductive switching is important to consider for the different device technologies. In this thesis, the impact of initial junction temperature variation, switching rates and thermal boundary conditions between parallel-connected diodes have been evaluated for SiC Schottky and silicon PiN diodes under clamped and unclamped inductive switching. Finite element simulations have been used to support the experimental measurements. Similar studies have been performed in CoolMOS super-junction MOSFETs, silicon IGBTs and SiC power MOSFETs. New insights regarding the failure of parallel connected devices under unclamped inductive switching have been revealed from the models and measurements. Overall, the thesis makes a major contribution in the understanding of the electrothermal performance of parallel connected devices for different transistor and diode technologies

Challenges and New Trends in Power Electronic Devices Reliability

The rapid increase in new power electronic devices and converters for electric transportation and smart grid technologies requires a deepanalysis of their component performances, considering all of the different environmental scenarios, overload conditions, and high stressoperations. Therefore, evaluation of the reliability and availability of these devices becomes fundamental both from technical and economicalpoints of view. The rapid evolution of technologies and the high reliability level offered by these components have shown that estimating reliability through the traditional approaches is difficult, as historical failure data and/or past observed scenarios demonstrate. With the aim topropose new approaches for the evaluation of reliability, in this book, eleven innovative contributions are collected, all focusedon the reliability assessment of power electronic devices and related components

Contributions to the design of power modules for electric and hybrid vehicles: trends, design aspects and simulation techniques

314 p.En la última década, la protección del medio ambiente y el uso alternativo de energías renovables están tomando mayor relevancia tanto en el ámbito social y político, como científico. El sector del transporte es uno de los principales causantes de los gases de efecto invernadero y la polución existente, contribuyendo con hasta el 27 % de las emisiones a nivel global. En este contexto desfavorable, la electrificación de los vehículos de carretera se convierte en un factor crucial. Para ello, la transición de la actual flota de vehículos de carretera debe ser progresiva forzando la investigación y desarrollo de nuevos conceptos a la hora de producir vehículos eléctricos (EV) y vehículos eléctricos híbridos (HEV) más eficientes, fiables, seguros y de menor coste. En consecuencia, para el desarrollo y mejora de los convertidores de potencia de los HEV/EV, este trabajo abarca los siguientes aspectos tecnológicos: - Arquitecturas de la etapa de conversión de potencia. Las principales topologías que pueden ser implementadas en el tren de potencia para HEV/EV son descritas y analizadas, teniendo en cuenta las alternativas que mejor se adaptan a los requisitos técnicos que demandan este tipo de aplicaciones. De dicha exposición se identifican los elementos constituyentes fundamentales de los convertidores de potencia que forman parte del tren de tracción para automoción.- Nuevos dispositivos semiconductores de potencia. Los nuevos objetivos y retos tecnológicos solo pueden lograrse mediante el uso de nuevos materiales. Los semiconductores Wide bandgap (WBG), especialmente los dispositivos electrónicos de potencia basados en nitruro de galio (GaN) y carburo de silicio (SiC), son las alternativas más prometedoras al silicio (Si) debido a las mejores prestaciones que poseen dichos materiales, lo que permite mejorar la conductividad térmica, aumentar las frecuencias de conmutación y reducir las pérdidas.- Análisis de técnicas de rutado, conexionado y ensamblado de módulos de potencia. Los módulos de potencia fabricados con dies en lugar de dispositivos discretos son la opción preferida por los fabricantes para lograr las especificaciones indicadas por la industria de la automoción. Teniendo en cuenta los estrictos requisitos de eficiencia, fiabilidad y coste es necesario revisar y plantear nuevos layouts de las etapas de conversión de potencia, así como esquemas y técnicas de paralelización de los circuitos, centrándose en las tecnologías disponibles.Teniendo en cuenta dichos aspectos, la presente investigación evalúa las alternativas de semiconductores de potencia que pueden ser implementadas en aplicaciones HEV/EV, así como su conexionado para la obtención de las densidades de potencia requeridas, centrándose en la técnica de paralelización de semiconductores. Debido a la falta de información tanto científica como comercial e industrial sobre dicha técnica, una de las principales contribuciones del presente trabajo ha sido la propuesta y verificación de una serie de criterios de diseño para el diseño de módulos de potencia. Finalmente, los resultados que se han extraído de los circuitos de potencia propuestos demuestran la utilidad de dichos criterios de diseño, obteniendo circuitos con bajas impedancias parásitas y equilibrados eléctrica y térmicamente. A nivel industrial, el conocimiento expuesto en la presente tesis permite reducir los tiempos de diseño a la hora de obtener prototipos de ciertas garantías, permitiendo comenzar la fase de prototipado habiéndose realizado comprobaciones eléctricas y térmicas

Journal of Telecommunications and Information Technology, 2000, nr 3,4

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