Circuits and Systems Advances in Near Threshold Computing

Modern society is witnessing a sea change in ubiquitous computing, in which people have embraced computing systems as an indispensable part of day-to-day existence. Computation, storage, and communication abilities of smartphones, for example, have undergone monumental changes over the past decade. However, global emphasis on creating and sustaining green environments is leading to a rapid and ongoing proliferation of edge computing systems and applications. As a broad spectrum of healthcare, home, and transport applications shift to the edge of the network, near-threshold computing (NTC) is emerging as one of the promising low-power computing platforms. An NTC device sets its supply voltage close to its threshold voltage, dramatically reducing the energy consumption. Despite showing substantial promise in terms of energy efficiency, NTC is yet to see widescale commercial adoption. This is because circuits and systems operating with NTC suffer from several problems, including increased sensitivity to process variation, reliability problems, performance degradation, and security vulnerabilities, to name a few. To realize its potential, we need designs, techniques, and solutions to overcome these challenges associated with NTC circuits and systems. The readers of this book will be able to familiarize themselves with recent advances in electronics systems, focusing on near-threshold computing

Performance-aware predictive-model-based on-chip body-bias regulation strategy for an ULP multi-core cluster in 28 nm UTBB FD-SOI

The performance and reliability of Ultra-Low-Power (ULP) computing platforms are adversely affected by environmental temperature and process variations. Mitigating the effect of these phenomena becomes crucial when these devices operate near-threshold, due to the magnification of process variations and to the strong temperature inversion effect that affects advanced technology nodes in low-voltage corners, which causes huge overhead due to margining for timing closure. Supporting an extended range of reverse and forward body-bias, UTBB FD-SOI technology provides a powerful knob to compensate for such variations. In this work we propose a methodology to maximize energy efficiency at run-time exploiting body biasing on a ULP platform operating near-threshold. The proposed method relies on on-line performance measurements by means of Process Monitoring Blocks (PMBs) coupled with an on-chip low-power body bias generator. We correlate the measurement performed by the PMBs to the maximum achievable frequency of the system, deriving a predictive model able to estimate it with an error of 9.7% at 0.7 V. To minimize the effect of process variations we propose a calibration procedure that allows to use a PMB model affected by only the temperature-induced error, which reduces the frequency estimation error by 2.4x (from 9.7% to 4%). We finally propose a controller architecture relying on the derived models to automatically regulate at run-time the body bias voltage. We demonstrate that adjusting the body bias voltage against environmental temperature variations leads up to 2X reduction in the leakage power and a 15% improvement on the global energy consumption when the system operates at 0.7 V and 170 MHz