A survey of scan-capture power reduction techniques

With the advent of sub-nanometer geometries, integrated circuits (ICs) are required to be checked for newer defects. While scan-based architectures help detect these defects using newer fault models, test data inflation happens, increasing test time and test cost. An automatic test pattern generator (ATPG) exercise’s multiple fault sites simultaneously to reduce test data which causes elevated switching activity during the capture cycle. The switching activity results in an IR drop exceeding the devices under test (DUT) specification. An increase in IR-drop leads to failure of the patterns and may cause good DUTs to fail the test. The problem is severe during at-speed scan testing, which uses a functional rated clock with a high frequency for the capture operation. Researchers have proposed several techniques to reduce capture power. They used various methods, including the reduction of switching activity. This paper reviews the recently proposed techniques. The principle, algorithm, and architecture used in them are discussed, along with key advantages and limitations. In addition, it provides a classification of the techniques based on the method used and its application. The goal is to present a survey of the techniques and prepare a platform for future development in capture power reduction during scan testing

DP-fill: a dynamic programming approach to X-filling for minimizing peak test power in scan tests

At-speed testing is crucial to catch small delay defects that occur during the manufacture of high performance digital chips. Launch-Off-Capture (LOC) and Launch-Off-Shift (LOS) are two prevalently used schemes for this purpose. LOS scheme achieves higher fault coverage while consuming lesser test time over LOC scheme, but dissipates higher power during the capture phase of the at-speed test. Excessive IR-drop during capture phase on the power grid causes false delay failures leading to significant yield reduction that is unwarranted. As reported in literature, an intelligent filling of don't care bits (X-filling) in test cubes has yielded significant power reduction. Given that the tests output by automatic test pattern generation (ATPG) tools for big circuits have large number of don't care bits, the X-filling technique is very effective for them. Assuming that the design for testability (DFT) scheme preserves the state of the combinational logic between capture phases of successive patterns, this paper maps the problem of optimal X-filling for peak power minimization during LOS scheme to a variant of interval coloring problem and proposes a dynamic programming (DP) algorithm for the same along with a theoretical proof for its optimality. To the best of our knowledge, this is the first ever reported X-filling algorithm that is optimal. The proposed algorithm when experimented on ITC99 benchmarks produced peak power savings of up to 34% over the best known low power X-filling algorithm for LOS testing. Interestingly, it is observed that the power savings increase with the size of the circuit

Doctor of Philosophy

dissertationIn-memory big data applications are growing in popularity, including in-memory versions of the MapReduce framework. The move away from disk-based datasets shifts the performance bottleneck from slow disk accesses to memory bandwidth. MapReduce is a data-parallel application, and is therefore amenable to being executed on as many parallel processors as possible, with each processor requiring high amounts of memory bandwidth. We propose using Near Data Computing (NDC) as a means to develop systems that are optimized for in-memory MapReduce workloads, offering high compute parallelism and even higher memory bandwidth. This dissertation explores three different implementations and styles of NDC to improve MapReduce execution. First, we use 3D-stacked memory+logic devices to process the Map phase on compute elements in close proximity to database splits. Second, we attempt to replicate the performance characteristics of the 3D-stacked NDC using only commodity memory and inexpensive processors to improve performance of both Map and Reduce phases. Finally, we incorporate fixed-function hardware accelerators to improve sorting performance within the Map phase. This dissertation shows that it is possible to improve in-memory MapReduce performance by potentially two orders of magnitude by designing system and memory architectures that are specifically tailored to that end

フィールドにおけるテスト印加と低電力論理BISTに関する研究

Advances in semiconductor process technology have resulted in various aging issues in field operation of Very Large Scale Integration (VLSI) circuits. For example, HCI (Hot carrier injection), BTI (Bias Temperature Instability), TDDB (Time Dependent Dielectric Breakdown) are well-known aging phenomena, and they can increase the circuit delay resulting in serious reliability problems. In order to avoid system failures caused by aging, recent design usually sets a certain timing margin in operational frequency of the circuit. However, it is difficult to determine the size of the proper timing margin because of the difficulty of prediction of its aging speed in actual use that is related to operational environment. Pessimistic prediction may result in performance sacrificing although it will improve the reliability of the system. BIST-based field test is a promising way to guarantee the reliability of the circuit through detecting the aging-induced faults during the circuit operation. However, the field test has a limitation on test application time, which makes it difficult to achieve high test quality. Therefore an effective test application method at field is required. In addition to the requirement of short test application time, the BIST-based field test requires performing at-speed testing in order to detect timing-related defects. However, it is well known that power dissipation during testing is much higher than that in normal circuit operation. Because excessive power dissipation causes higher IR-drop and higher temperature, it results in delay increase during testing, and in turn, causing false at-speed testing and yield loss. While many low power test methods have been proposed to tackle the test power issue, inadequate test power reduction and lower fault coverage still remain as important issues. Moreover, low power testing that just focuses on power reduction is insufficient. When the test power is reduced to a very low level, a timing-related defect may be missed by the test, and a defective circuit will appear to be a good part passing the test. Therefore, appropriate test power control is necessary though it was out of considering in the existing methods. In this dissertation, we first proposed a new test application to satisfy the limitation of short test application time for BIST-based field test, and then we proposed a new low power BIST scheme that focuses on controlling the test power to a specified value for improving the field test quality. In chapter 3, a new field test application method named “rotating test” is presented in which a set of generated test patterns to detect aging-induced faults is partitioned into several subsets, and apply each subset in one test session at field. In order to maximize the test quality for rotating test, we proposed test partitioning methods that refer to two items: First one aims at maximizing fault coverage of each subset obtained by partitioning. Second one aims at minimizing the detection time interval of all faults in rotating test to avoid system failures. Experimental results demonstrated the effectiveness of the proposed partitioning methods. In chapter 4, we proposed a new low power BIST scheme which can control the scan-in power, scan-out power and capture power while keeping test coverage at high level. In this scheme, a new circuit called pseudo low-pass filter (PLPF) is developed for scan-in power control, and a multi-cycle capture test technique is employed to reduce the capture power. In order to control scan-out power dissipated by test responses, we proposed a novel method that selects some flip-flops in scan chains at logic design phase, and fills the selected flip-flops with proper values before starting scan-shift operation so as to reduce the switching activity associated with scan-out. The experimental results for ISCAS-89 and ITC-99 benchmark circuits show that significant scan-in power reduction rate (the original rate of 50% is reduced to 7~8%) and capture power reduction rate (the original rate of 20% is reduced to 6~7%) were derived. With the scan-out controlling method, the scan-out power can be reduced from 17.2% to 8.4%, which could not be achieved by the conventional methods. Moreover, in order to control the test power to the specified rate to accommodate the various test power requirements. A scan-shift power controlling scheme was also discussed. It showed the capability of controlling any scan-shift toggle rate between 6.7% and 50%.九州工業大学博士学位論文 学位記番号:情工博甲第289号　学位授与年月日:平成26年3月25日1. INTRODUCTION|2. PRELIMINARY|3. BIST-BASED FIELD ROTATING TEST FOR AGING-INDUCED FAULT DETECTION|4. TEST POWER REDUCTION FOR LOGIC-BIST|5. SUMMARY九州工業大学平成25年

Low-Capture-Power Test Generation for Scan-Based At-Speed Testing

Scan-based at-speed testing is a key technology to guarantee timing-related test quality in the deep submicron era. However, its applicability is being severely challenged since significant yield loss may occur from circuit malfunction due to excessive IR drop caused by high power dissipation when a test response is captured. This paper addresses this critical problem with a novel low-capture-power X-filling method of assigning 0\u27s and 1\u27s to unspecified (X) bits in a test cube obtained during ATPG. This method reduces the circuit switching activity in capture mode and can be easily incorporated into any test generation flow to achieve capture power reduction without any area, timing, or fault coverage impact. Test vectors generated with this practical method greatly improve the applicability of scan-based at-speed testing by reducing the risk of test yield lossIEEE International Conference on Test, 2005, 8 November 2005, Austin, TX, US

Image Processing Using FPGAs

This book presents a selection of papers representing current research on using field programmable gate arrays (FPGAs) for realising image processing algorithms. These papers are reprints of papers selected for a Special Issue of the Journal of Imaging on image processing using FPGAs. A diverse range of topics is covered, including parallel soft processors, memory management, image filters, segmentation, clustering, image analysis, and image compression. Applications include traffic sign recognition for autonomous driving, cell detection for histopathology, and video compression. Collectively, they represent the current state-of-the-art on image processing using FPGAs

EFFECT OF SILICA NANOCONFINEMENT OF LIPID BILAYERS ON ITS PHASE TRANSITION AND ON THE COLLOIDAL STABILITY OF SILICA NANOPARTICLES

In this work, we incorporated 4-(N-Boc-aminometyl) phenylboronic acid (BA), at different concentrations, into 1,2-dipalmitoyl-sn-glycero-3- phosphocholine (DPPC) bilayers confined within nanopores of two different mean pore diameters of 7.4 nm and 11.7 nm of micron sized silica particles. The confinement of DPPC into nanopores resulted in the depression in the main phase transition temperatures compared to the liposomal system. The addition of BA was found to induce disruptions in the acyl chains of the lipid molecules at all concentrations of the solute. The lipid bilayer cooperativity was found to be higher in the confined systems compared to the liposomal systems despite the presence of higher disorder in the hydrophobic acyl chains in the former as suggested by lower main phase transition temperatures. The partition coefficient of BA within the bilayers of DPPC was found to be higher in liposomal systems in comparison to the confined systems. The differences in mean pore sizes of the micron sized silica did not result in any significant differences in the partitioning behaviour of BA within DPPC. The results helped us understand the partitioning of BA in systems in which DPPC was confined into silica nanopores relative to DPPC liposomes. The knowledge of the behaviour of boronic acid in confined systems can help us in designing biomimetic systems, with optimum concentrations of the embedded molecule, to serve the purpose of separation of compounds from dilute aqueous solutions. Subsequently, the method of evaporation deposition was used to fill the pores of silica nanoparticles with 1,2-dipalmitoyl-sn-glycero-3- phosphocholine (DPPC) and assess the effect of increasing the mass ratio of lipid to silica nanoparticles on the zeta potential and colloidal stability of the nanoparticles. An increase in the mass ratio resulted in observable reductions in magnitudes of zeta potential of the resulting nanoparticles compared to bare silica nanoparticles. Lipid enveloping of pore filled silica nanoparticles results in zeta potentials comparable to that of DPPC liposomes. The reductions in zeta potentials of the lipid filled silica nanoparticles were hypothesized to be the result of several isolated lipid bilayers covering the exterior surface of the nanoparticles, besides filling the nanopores. The complete assessment of colloidal stability of the system necessitates obtaining of information regarding the changes in hydrodynamic diameters and the settling behaviour, with extended time periods, of the lipid filled particles in conjunction with the obtained values of zeta potential of the system. The determination of the optimal amount of lipids that can be deposited into the silica nanopores would enable the designing of systems involving extraction and sensing of highly lipophilic molecules from dilute solutions

Test Strategies for Low Power Devices

Ultra low-power devices are being developed for embedded applications in bio-medical electronics, wireless sensor networks, environment monitoring and protection, etc. The testing of these low-cost, low-power devices is a daunting task. Depending on the target application, there are stringent guidelines on the number of defective parts per million shipped devices. At the same time, since such devices are cost-sensitive, test cost is a major consideration. Since system-level power-management techniques are employed in these devices, test generation must be power-management-aware to avoid stressing the power distribution infrastructure in the test mode. Structural test techniques such as scan test, with or without compression, can result in excessive heat dissipation during testing and damage the package. False failures may result due to the electrical and thermal stressing of the device in the test mode of operation, leading to yield loss. This paper considers different aspects of testing low-power devices and some new techniques to address these problems.Design, Automation and Test in Europe (DATE \u2708), 10-14 March 2008, Munich, German

Efficient Test Set Modification for Capture Power Reduction

The occurrence of high switching activity when the response to a test vector is captured by flipflops in scan testing may cause excessive IR drop, resulting in significant test-induced yield loss. This paper addresses the problem with a novel method based on test set modification, featuring (1) a new constrained X-identification technique that turns a properly selected set of bits in a fullyspecified test set into X-bits without fault coverage loss, and (2) a new LCP (low capture power) X-filling technique that optimally assigns 0’s and 1’s to the X-bits for the purpose of reducing the switching activity of the resulting test set in capture mode. This method can be readily applied in any test generation flow for capture power reduction without any impact on area, timing, test set size, and fault coverage