KAPow: A System Identification Approach to Online Per-Module Power Estimation in FPGA Designs

In a modern FPGA system-on-chip design, it is often insufficient to simply assess the total power consumption of the entire circuit by design-time estimation or runtime power rail measurement. Instead, to make better runtime decisions, it is desirable to understand the power consumed by each individual module in the system. In this work, we combine boardlevel power measurements with register-level activity counting to build an online model that produces a breakdown of power consumption within the design. Online model refinement avoids the need for a time-consuming characterisation stage and also allows the model to track long-term changes to operating conditions. Our flow is named KAPow, a (loose) acronym for ‘K’ounting Activity for Power estimation, which we show to be accurate, with per-module power estimates as close to ±5mW of true measurements, and to have low overheads. We also demonstrate an application example in which a permodule power breakdown can be used to determine an efficient mapping of tasks to modules and reduce system-wide power consumption by over 8%

Optimizing Scrubbing by Netlist Analysis for FPGA Configuration Bit Classification and Floorplanning

Existing scrubbing techniques for SEU mitigation on FPGAs do not guarantee an error-free operation after SEU recovering if the affected configuration bits do belong to feedback loops of the implemented circuits. In this paper, we a) provide a netlist-based circuit analysis technique to distinguish so-called critical configuration bits from essential bits in order to identify configuration bits which will need also state-restoring actions after a recovered SEU and which not. Furthermore, b) an alternative classification approach using fault injection is developed in order to compare both classification techniques. Moreover, c) we will propose a floorplanning approach for reducing the effective number of scrubbed frames and d), experimental results will give evidence that our optimization methodology not only allows to detect errors earlier but also to minimize the Mean-Time-To-Repair (MTTR) of a circuit considerably. In particular, we show that by using our approach, the MTTR for datapath-intensive circuits can be reduced by up to 48.5% in comparison to standard approaches

ACT: A DFT tool for self-timed circuits

Journal ArticleThis paper presents a Design for Testability (DFT) tool called ACT (Asynchronous Circuit Testing) which uses a partial scan technique to make macro-module based selftimed circuits testable. The ACT tool is the first oFits kind for testing macro-module based self-timed circuits. ACT modifies designs automatically to incorporate partial scan and provides a complete path from schematic capturie to physical layout. It also has a test generation system to generate vectors for the testable design and to compute fault coverage of the generated tests. The test generatioin system includes a module for doing critical hazard free (.est generation using a new 6-valued algebra. ACT has been hilt around commercial tools from Viewlogic and Cascade. A Viewlogic schematic is used as the design entry point and Cascade tools are used for technology mapping

Technology Mapping, Design for Testability, and Circuit Optimizations for NULL Convention Logic Based Architectures

Delay-insensitive asynchronous circuits have been the target of a renewed research effort because of the advantages they offer over traditional synchronous circuits. Minimal timing analysis, inherent robustness against power-supply, temperature, and process variations, reduced energy consumption, less noise and EMI emission, and easy design reuse are some of the benefits of these circuits. NULL Convention Logic (NCL) is one of the mainstream asynchronous logic design paradigms that has been shown to be a promising method for designing delay-insensitive asynchronous circuits. This dissertation investigates new areas in NCL design and test and is made of three sections. The first section discusses different CMOS implementations of NCL gates and proposes new circuit techniques to enhance their operation. The second section focuses on mapping multi-rail logic expressions to a standard NCL gate library, which is a form of technology mapping for a category of NCL design automation flows. Finally, the last section proposes design for testability techniques for a recently developed low-power variant of NCL called Sleep Convention Logic (SCL)