5,108 research outputs found

    Analog Defect Injection and Fault Simulation Techniques: A Systematic Literature Review

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    Since the last century, the exponential growth of the semiconductor industry has led to the creation of tiny and complex integrated circuits, e.g., sensors, actuators, and smart power. Innovative techniques are needed to ensure the correct functionality of analog devices that are ubiquitous in every smart system. The ISO 26262 standard for functional safety in the automotive context specifies that fault injection is necessary to validate all electronic devices. For decades, standardization of defect modeling and injection mainly focused on digital circuits and, in a minor part, on analog ones. An initial attempt is being made with the IEEE P2427 draft standard that started to give a structured and formal organization to the analog testing field. Various methods have been proposed in the literature to speed up the fault simulation of the defect universe for an analog circuit. A more limited number of papers seek to reduce the overall simulation time by reducing the number of defects to be simulated. This literature survey describes the state-of-the-art of analog defect injection and fault simulation methods. The survey is based on the Preferred Reporting Items for Systematic Reviews and Meta-Analyses (PRISMA) methodological flow, allowing for a systematic and complete literature survey. Each selected paper has been categorized and presented to provide an overview of all the available approaches. In addition, the limitations of the various approaches are discussed by showing possible future directions

    Fault-based Analysis of Industrial Cyber-Physical Systems

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    The fourth industrial revolution called Industry 4.0 tries to bridge the gap between traditional Electronic Design Automation (EDA) technologies and the necessity of innovating in many indus- trial fields, e.g., automotive, avionic, and manufacturing. This complex digitalization process in- volves every industrial facility and comprises the transformation of methodologies, techniques, and tools to improve the efficiency of every industrial process. The enhancement of functional safety in Industry 4.0 applications needs to exploit the studies related to model-based and data-driven anal- yses of the deployed Industrial Cyber-Physical System (ICPS). Modeling an ICPS is possible at different abstraction levels, relying on the physical details included in the model and necessary to describe specific system behaviors. However, it is extremely complicated because an ICPS is com- posed of heterogeneous components related to different physical domains, e.g., digital, electrical, and mechanical. In addition, it is also necessary to consider not only nominal behaviors but even faulty behaviors to perform more specific analyses, e.g., predictive maintenance of specific assets. Nevertheless, these faulty data are usually not present or not available directly from the industrial machinery. To overcome these limitations, constructing a virtual model of an ICPS extended with different classes of faults enables the characterization of faulty behaviors of the system influenced by different faults. In literature, these topics are addressed with non-uniformly approaches and with the absence of standardized and automatic methodologies for describing and simulating faults in the different domains composing an ICPS. This thesis attempts to overcome these state-of-the-art gaps by proposing novel methodologies, techniques, and tools to: model and simulate analog and multi-domain systems; abstract low-level models to higher-level behavioral models; and monitor industrial systems based on the Industrial Internet of Things (IIOT) paradigm. Specifically, the proposed contributions involve the exten- sion of state-of-the-art fault injection practices to improve the ICPSs safety, the development of frameworks for safety operations automatization, and the definition of a monitoring framework for ICPSs. Overall, fault injection in analog and digital models is the state of the practice to en- sure functional safety, as mentioned in the ISO 26262 standard specific for the automotive field. Starting from state-of-the-art defects defined for analog descriptions, new defects are proposed to enhance the IEEE P2427 draft standard for analog defect modeling and coverage. Moreover, dif- ferent techniques to abstract a transistor-level model to a behavioral model are proposed to speed up the simulation of faulty circuits. Therefore, unlike the electrical domain, there is no extensive use of fault injection techniques in the mechanical one. Thus, extending the fault injection to the mechanical and thermal fields allows for supporting the definition and evaluation of more reliable safety mechanisms. Hence, a taxonomy of mechanical faults is derived from the electrical domain by exploiting the physical analogies. Furthermore, specific tools are built for automatically instru- menting different descriptions with multi-domain faults. The entire work is proposed as a basis for supporting the creation of increasingly resilient and secure ICPS that need to preserve functional safety in any operating context

    The role of assumptions in knowledge engineering

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    The role of assumptions in knowledge engineering

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    Test analysis & fault simulation of microfluidic systems

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    This work presents a design, simulation and test methodology for microfluidic systems, with particular focus on simulation for test. A Microfluidic Fault Simulator (MFS) has been created based around COMSOL which allows a fault-free system model to undergo fault injection and provide test measurements. A post MFS test analysis procedure is also described.A range of fault-free system simulations have been cross-validated to experimental work to gauge the accuracy of the fundamental simulation approach prior to further investigation and development of the simulation and test procedure.A generic mechanism, termed a fault block, has been developed to provide fault injection and a method of describing a low abstraction behavioural fault model within the system. This technique has allowed the creation of a fault library containing a range of different microfluidic fault conditions. Each of the fault models has been cross-validated to experimental conditions or published results to determine their accuracy.Two test methods, namely, impedance spectroscopy and Levich electro-chemical sensors have been investigated as general methods of microfluidic test, each of which has been shown to be sensitive to a multitude of fault. Each method has successfully been implemented within the simulation environment and each cross-validated by first-hand experimentation or published work.A test analysis procedure based around the Neyman-Pearson criterion has been developed to allow a probabilistic metric for each test applied for a given fault condition, providing a quantitive assessment of each test. These metrics are used to analyse the sensitivity of each test method, useful when determining which tests to employ in the final system. Furthermore, these probabilistic metrics may be combined to provide a fault coverage metric for the complete system.The complete MFS method has been applied to two system cases studies; a hydrodynamic “Y” channel and a flow cytometry system for prognosing head and neck cancer.Decision trees are trained based on the test measurement data and fault conditions as a means of classifying the systems fault condition state. The classification rules created by the decision trees may be displayed graphically or as a set of rules which can be loaded into test instrumentation. During the course of this research a high voltage power supply instrument has been developed to aid electro-osmotic experimentation and an impedance spectrometer to provide embedded test

    Methods of Technical Prognostics Applicable to Embedded Systems

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    Hlavní cílem dizertace je poskytnutí uceleného pohledu na problematiku technické prognostiky, která nachází uplatnění v tzv. prediktivní údržbě založené na trvalém monitorování zařízení a odhadu úrovně degradace systému či jeho zbývající životnosti a to zejména v oblasti komplexních zařízení a strojů. V současnosti je technická diagnostika poměrně dobře zmapovaná a reálně nasazená na rozdíl od technické prognostiky, která je stále rozvíjejícím se oborem, který ovšem postrádá větší množství reálných aplikaci a navíc ne všechny metody jsou dostatečně přesné a aplikovatelné pro embedded systémy. Dizertační práce přináší přehled základních metod použitelných pro účely predikce zbývající užitné životnosti, jsou zde popsány metriky pomocí, kterých je možné jednotlivé přístupy porovnávat ať už z pohledu přesnosti, ale také i z pohledu výpočetní náročnosti. Jedno z dizertačních jader tvoří doporučení a postup pro výběr vhodné prognostické metody s ohledem na prognostická kritéria. Dalším dizertačním jádrem je představení tzv. částicového filtrovaní (particle filtering) vhodné pro model-based prognostiku s ověřením jejich implementace a porovnáním. Hlavní dizertační jádro reprezentuje případovou studii pro velmi aktuální téma prognostiky Li-Ion baterii s ohledem na trvalé monitorování. Případová studie demonstruje proces prognostiky založené na modelu a srovnává možné přístupy jednak pro odhad doby před vybitím baterie, ale také sleduje možné vlivy na degradaci baterie. Součástí práce je základní ověření modelu Li-Ion baterie a návrh prognostického procesu.The main aim of the thesis is to provide a comprehensive overview of technical prognosis, which is applied in the condition based maintenance, based on continuous device monitoring and remaining useful life estimation, especially in the field of complex equipment and machinery. Nowadays technical prognosis is still evolving discipline with limited number of real applications and is not so well developed as technical diagnostics, which is fairly well mapped and deployed in real systems. Thesis provides an overview of basic methods applicable for prediction of remaining useful life, metrics, which can help to compare the different approaches both in terms of accuracy and in terms of computational/deployment cost. One of the research cores consists of recommendations and guide for selecting the appropriate forecasting method with regard to the prognostic criteria. Second thesis research core provides description and applicability of particle filtering framework suitable for model-based forecasting. Verification of their implementation and comparison is provided. The main research topic of the thesis provides a case study for a very actual Li-Ion battery health monitoring and prognostics with respect to continuous monitoring. The case study demonstrates the prognostic process based on the model and compares the possible approaches for estimating both the runtime and capacity fade. Proposed methodology is verified on real measured data.

    Moving Towards Analog Functional Safety

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    Over the past century, the exponential growth of the semiconductor industry has led to the creation of tiny and complex integrated circuits, e.g., sensors, actuators, and smart power systems. Innovative techniques are needed to ensure the correct functionality of analog devices that are ubiquitous in every smart system. The standard ISO 26262 related to functional safety in the automotive context specifies that fault injection is necessary to validate all electronic devices. For decades, standardizing fault modeling, injection and simulation mainly focused on digital circuits and disregarding analog ones. An initial attempt is being made with the IEEE P2427 standard draft standard that started to give this field a structured and formal organization. In this context, new fault models, injection, and abstraction methodologies for analog circuits are proposed in this thesis to enhance this application field. The faults proposed by the IEEE P2427 standard draft standard are initially evaluated to understand the associated fault behaviors during the simulation. Moreover, a novel approach is presented for modeling realistic stuck-on/off defects based on oxide defects. These new defects proposed are required because digital stuck-at-fault models where a transistor is frozen in on-state or offstate may not apply well on analog circuits because even a slight variation could create deviations of several magnitudes. Then, for validating the proposed defects models, a novel predictive fault grouping based on faulty AC matrices is applied to group faults with equivalent behaviors. The proposed fault grouping method is computationally cheap because it avoids performing DC or transient simulations with faults injected and limits itself to faulty AC simulations. Using AC simulations results in two different methods that allow grouping faults with the same frequency response are presented. The first method is an AC-based grouping method that exploits the potentialities of the S-parameters ports. While the second is a Circle-based grouping based on the circle-fitting method applied to the extracted AC matrices. Finally, an open-source framework is presented for the fault injection and manipulation perspective. This framework relies on the shared semantics for reading, writing, or manipulating transistor-level designs. The ultimate goal of the framework is: reading an input design written in a specific syntax and then allowing to write the same design in another syntax. As a use case for the proposed framework, a process of analog fault injection is discussed. This activity requires adding, removing, or replacing nodes, components, or even entire sub-circuits. The framework is entirely written in C++, and its APIs are also interfaced with Python. The entire framework is open-source and available on GitHub. The last part of the thesis presents abstraction methodologies that can abstract transistor level models into Verilog-AMS models and Verilog- AMS piecewise and nonlinear models into C++. These abstracted models can be integrated into heterogeneous systems. The purpose of integration is the simulation of heterogeneous components embedded in a Virtual Platforms (VP) needs to be fast and accurate

    Self-calibrating models for dynamic monitoring and diagnosis

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    A method for automatically building qualitative and semi-quantitative models of dynamic systems, and using them for monitoring and fault diagnosis, is developed and demonstrated. The qualitative approach and semi-quantitative method are applied to monitoring observation streams, and to design of non-linear control systems
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