Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level

In recent technology nodes, reliability is considered a part of the standard design ¿ow at all levels of embedded system design. While techniques that use only low-level models at gate- and register transfer-level offer high accuracy, they are too inefficient to consider the overall application of the embedded system. Multi-level models with high abstraction are essential to efficiently evaluate the impact of physical defects on the system. This paper provides a methodology that leverages state-of-the-art techniques for efficient fault simulation of structural faults together with transaction-level modeling. This way it is possible to accurately evaluate the impact of the faults on the entire hardware/software system. A case study of a system consisting of hardware and software for image compression and data encryption is presented and the method is compared to a standard gate/RT mixed-level approac

VLSI Implementation of Deep Neural Network Using Integral Stochastic Computing

The hardware implementation of deep neural networks (DNNs) has recently received tremendous attention: many applications in fact require high-speed operations that suit a hardware implementation. However, numerous elements and complex interconnections are usually required, leading to a large area occupation and copious power consumption. Stochastic computing has shown promising results for low-power area-efficient hardware implementations, even though existing stochastic algorithms require long streams that cause long latencies. In this paper, we propose an integer form of stochastic computation and introduce some elementary circuits. We then propose an efficient implementation of a DNN based on integral stochastic computing. The proposed architecture has been implemented on a Virtex7 FPGA, resulting in 45% and 62% average reductions in area and latency compared to the best reported architecture in literature. We also synthesize the circuits in a 65 nm CMOS technology and we show that the proposed integral stochastic architecture results in up to 21% reduction in energy consumption compared to the binary radix implementation at the same misclassification rate. Due to fault-tolerant nature of stochastic architectures, we also consider a quasi-synchronous implementation which yields 33% reduction in energy consumption w.r.t. the binary radix implementation without any compromise on performance.Comment: 11 pages, 12 figure

Silicon compilation

Silicon compilation is a term used for many different purposes. In this paper we define silicon compilation as a mapping from some higher level description into layout. We define the basic issues in structural and behavioral silicon compilation and some possible solutions to those issues. Finally, we define the concept of an intelligent silicon compiler in which the compiler evaluates the quality of the generated design and attempts to improve it if it is not satisfactory

Testability Analysis of Synchronous Sequential Circuits Based On Structural Data

Bounds on test sequence length can be used as a testability measure. We give a procedure to compute the upper bound on test sequence length for an arbitrary sequential circuit. We prove that the bound is exact for a certain class of circuits. Three design rules are specified to yield circuits with lower test sequence bounds

Fault diagnosis of operational synchronous digital systems

Diagnosing faults on operational synchronous digital system

A Signal Distribution Network for Sequential Quantum-dot Cellular Automata Systems

The authors describe a signal distribution network for sequential systems constructed using the Quantum-dot Cellular Automata (QCA) computing paradigm. This network promises to enable the construction of arbitrarily complex QCA sequential systems in which all wire crossings are performed using nearest neighbor interactions, which will improve the thermal behavior of QCA systems as well as their resistance to stray charge and fabrication imperfections. The new sequential signal distribution network is demonstrated by the complete design and simulation of a two-bit counter, a three-bit counter, and a pattern detection circuit

Doctor of Philosophy

dissertationThe design of integrated circuit (IC) requires an exhaustive verification and a thorough test mechanism to ensure the functionality and robustness of the circuit. This dissertation employs the theory of relative timing that has the advantage of enabling designers to create designs that have significant power and performance over traditional clocked designs. Research has been carried out to enable the relative timing approach to be supported by commercial electronic design automation (EDA) tools. This allows asynchronous and sequential designs to be designed using commercial cad tools. However, two very significant holes in the flow exist: the lack of support for timing verification and manufacturing test. Relative timing (RT) utilizes circuit delay to enforce and measure event sequencing on circuit design. Asynchronous circuits can optimize power-performance product by adjusting the circuit timing. A thorough analysis on the timing characteristic of each and every timing path is required to ensure the robustness and correctness of RT designs. All timing paths have to conform to the circuit timing constraints. This dissertation addresses back-end design robustness by validating full cyclical path timing verification with static timing analysis and implementing design for testability (DFT). Circuit reliability and correctness are necessary aspects for the technology to become commercially ready. In this study, scan-chain, a commercial DFT implementation, is applied to burst-mode RT designs. In addition, a novel testing approach is developed along with scan-chain to over achieve 90% fault coverage on two fault models: stuck-at fault model and delay fault model. This work evaluates the cost of DFT and its coverage trade-off then determines the best implementation. Designs such as a 64-point fast Fourier transform (FFT) design, an I2C design, and a mixed-signal design are built to demonstrate power, area, performance advantages of the relative timing methodology and are used as a platform for developing the backend robustness. Results are verified by performing post-silicon timing validation and test. This work strengthens overall relative timed circuit flow, reliability, and testability

RT-level fast fault simulator

In this paper a new fast fault simulation technique is presented for calculation of fault propagation through HLPs (High Level Primitives). ROTDDs (Reduced Ordered Ternary Decision Diagrams) are used to describe HLP modules. The technique is implemented in the HTDD RT-level fault simulator. The simulator is evaluated with some ITC99 benchmarks. A hypothesis is proved that a test set coverage of physical failures can be anticipated with high accuracy when RTL fault model takes into account optimization strategies that are used in CAE system applied

Secondary techniques for increasing fault coverage of fault detection test sequences for asynchronous sequential networks

The generation of fault detection sequences for asynchronous sequential networks is considered here. Several techniques exist for the generation of fault detection sequences on combinational and clocked sequential networks. Although these techniques provide closed solutions for combinational and clocked networks, they meet with much less success when used as strategies on asynchronous networks. It is presently assumed that the general asynchronous problem defies closed solution. For this reason, a secondary procedure is presented here to facilitate increased fault coverage by a given fault detection test sequence. This procedure is successful on all types of logic networks but is, perhaps, most useful in the asynchronous case since this is the problem on which other techniques fail. The secondary procedure has been designed to improve the fault coverage accomplished by any fault detection sequence regardless of the origin of the sequence. The increased coverage is accomplished by a minimum amount of additional internal hardware and/or a minimum of additional package outputs. The procedure presented here will function as part of an overall digital fault detection system, which will be composed of: 1) a compatible digital logic simulator, 2) a set of fault detection sequence generators, 3) secondary procedures for increasing fault coverage, 4) procedures to allow for diagnosis to a variable level. This research is directed at presenting a complete solution to the problems involved with developing secondary procedures for increasing the fault coverage of fault detection sequences --Abstract, pages ii-iii

NASA Space Engineering Research Center for VLSI systems design

This annual review reports the center's activities and findings on very large scale integration (VLSI) systems design for 1990, including project status, financial support, publications, the NASA Space Engineering Research Center (SERC) Symposium on VLSI Design, research results, and outreach programs. Processor chips completed or under development are listed. Research results summarized include a design technique to harden complementary metal oxide semiconductors (CMOS) memory circuits against single event upset (SEU); improved circuit design procedures; and advances in computer aided design (CAD), communications, computer architectures, and reliability design. Also described is a high school teacher program that exposes teachers to the fundamentals of digital logic design