Software-based fault-tolerant routing algorithm in multidimensional networks

Massively parallel computing systems are being built with hundreds or thousands of components such as nodes, links, memories, and connectors. The failure of a component in such systems will not only reduce the computational power but also alter the network's topology. The software-based fault-tolerant routing algorithm is a popular routing to achieve fault-tolerance capability in networks. This algorithm is initially proposed only for two dimensional networks (Suh et al., 2000). Since, higher dimensional networks have been widely employed in many contemporary massively parallel systems; this paper proposes an approach to extend this routing scheme to these indispensable higher dimensional networks. Deadlock and livelock freedom and the performance of presented algorithm, have been investigated for networks with different dimensionality and various fault regions. Furthermore, performance results have been presented through simulation experiments

Testability enhancement of a basic set of CMOS cells

Testing should be evaluated as the ability of the test patterns to cover realistic faults, and high quality IC products demand high quality testing. We use a test strategy based on physical design for testability (to discover both open and short faults, which are difficult or even impossible to detect). Consequentially, layout level design for testability (LLDFT) rules have been developed, which prevent the faults, or at least reduce the chance of their appearing. The main purpose of this work is to apply a practical set of LLDFT rules to the library cells designed by the Centre Nacional de Microelectrònica (CNM) and obtain a highly testable cell library. The main results of the application of the LLDFT rules (area overheads and performance degradation) are summarized and the results are significant since IC design is highly repetitive; a small effort to improve cell layout can bring about great improvement in design

A Fault-Tolerant T-Type Multilevel Inverter Topology With Increased Overload Capability and Soft-Switching Characteristics

he performance of a novel three-phase four-leg fault-tolerant T-type inverter topology is introduced in this paper. This inverter topology provides a fault-tolerant solution to any open-circuit and certain short-circuit switching faults in the power devices. During any of the fault-tolerant operation modes for these device faults, there is no derating required in the inverter output voltage or output power. In addition, overload capability is increased in this new T-type inverter compared to that in the conventional three-level T-type inverter. Such increase in inverter overload capability is due to the utilization of the redundant leg for overload current sharing with other main phase legs under healthy condition. Moreover, if the redundant phase leg is composed of silicon carbide metal-oxide-semiconductor field-effect transistors, quasi-zero-voltage switching, and zero-current switching of the silicon insulated-gate bipolar transistors (IGBTs) in the conventional main phase legs can be achieved at certain switching states, which can significantly relieve the thermal stress on the outer IGBTs and improve the whole inverter efficiency. Simulation and experimental results are given to verify the efficacy and merits of this high-performance fault-tolerant T-type inverter topology

DFT and BIST of a multichip module for high-energy physics experiments

Engineers at Politecnico di Torino designed a multichip module for high-energy physics experiments conducted on the Large Hadron Collider. An array of these MCMs handles multichannel data acquisition and signal processing. Testing the MCM from board to die level required a combination of DFT strategie

LOT: Logic Optimization with Testability - new transformations for logic synthesis

A new approach to optimize multilevel logic circuits is introduced. Given a multilevel circuit, the synthesis method optimizes its area while simultaneously enhancing its random pattern testability. The method is based on structural transformations at the gate level. New transformations involving EX-OR gates as well as Reed–Muller expansions have been introduced in the synthesis of multilevel circuits. This method is augmented with transformations that specifically enhance random-pattern testability while reducing the area. Testability enhancement is an integral part of our synthesis methodology. Experimental results show that the proposed methodology not only can achieve lower area than other similar tools, but that it achieves better testability compared to available testability enhancement tools such as tstfx. Specifically for ISCAS-85 benchmark circuits, it was observed that EX-OR gate-based transformations successfully contributed toward generating smaller circuits compared to other state-of-the-art logic optimization tools

On-board B-ISDN fast packet switching architectures. Phase 2: Development. Proof-of-concept architecture definition report

For the next-generation packet switched communications satellite system with onboard processing and spot-beam operation, a reliable onboard fast packet switch is essential to route packets from different uplink beams to different downlink beams. The rapid emergence of point-to-point services such as video distribution, and the large demand for video conference, distributed data processing, and network management makes the multicast function essential to a fast packet switch (FPS). The satellite's inherent broadcast features gives the satellite network an advantage over the terrestrial network in providing multicast services. This report evaluates alternate multicast FPS architectures for onboard baseband switching applications and selects a candidate for subsequent breadboard development. Architecture evaluation and selection will be based on the study performed in phase 1, 'Onboard B-ISDN Fast Packet Switching Architectures', and other switch architectures which have become commercially available as large scale integration (LSI) devices

Performance modeling of fault-tolerant circuit-switched communication networks

Circuit switching (CS) has been suggested as an efficient switching method for supporting simultaneous communications (such as data, voice, and images) across parallel systems due to its ability to preserve both communication performance and fault-tolerant demands in such systems. In this paper we present an efficient scheme to capture the mean message latency in 2D torus with CS in the presence of faulty components. We have also conducted extensive simulation experiments, the results of which are used to validate the analytical mode