Neural Network Methods for Radiation Detectors and Imaging

Recent advances in image data processing through machine learning and especially deep neural networks (DNNs) allow for new optimization and performance-enhancement schemes for radiation detectors and imaging hardware through data-endowed artificial intelligence. We give an overview of data generation at photon sources, deep learning-based methods for image processing tasks, and hardware solutions for deep learning acceleration. Most existing deep learning approaches are trained offline, typically using large amounts of computational resources. However, once trained, DNNs can achieve fast inference speeds and can be deployed to edge devices. A new trend is edge computing with less energy consumption (hundreds of watts or less) and real-time analysis potential. While popularly used for edge computing, electronic-based hardware accelerators ranging from general purpose processors such as central processing units (CPUs) to application-specific integrated circuits (ASICs) are constantly reaching performance limits in latency, energy consumption, and other physical constraints. These limits give rise to next-generation analog neuromorhpic hardware platforms, such as optical neural networks (ONNs), for high parallel, low latency, and low energy computing to boost deep learning acceleration

Quantitative subsurface defect evaluation by pulsed phase thermography: depth retrieval with the phase

La Thermographie de Phase Pulsée (TPP) est une technique d’Évaluation Non-Destructive basée sur la Transformée de Fourier pouvant être considérée comme étant le lien entre la Thermographie Pulsée, pour laquelle l’acquisition de données est rapide, et la Thermographie Modulée, pour laquelle l’extraction de la profondeur est directe. Une nouvelle technique d’inversion de la profondeur reposant sur l’équation de la longueur de diffusion thermique : μ=(α /πf)½, est proposée. Le problème se résume alors à la détermination de la fréquence de borne fb, c à d, la fréquence à laquelle un défaut à une profondeur particulière présente un contraste de phase suffisant pour être détecté dans le spectre des fréquences. Cependant, les profils de température servant d’entrée en TPP, sont des signaux non-périodiques et non-limités en fréquence pour lesquels, des paramètres d’échantillonnage Δt, et de troncature w(t), doivent être soigneusement choisis lors du processus de discrétisation du signal. Une méthodologie à quatre étapes, basée sur la Dualité Temps-Fréquence de la Transformée de Fourier discrète, est proposée pour la détermination interactive de Δt et w(t), en fonction de la profondeur du défaut. Ainsi, pourvu que l’information thermique utilisée pour alimenter l’algorithme de TPP soit correctement échantillonnée et tronquée, une solution de la forme : z=C1μ, peut être envisagée, où les valeurs expérimentales de C1 se situent typiquement entre 1.5 et 2. Bien que la détermination de fb ne soit pas possible dans le cas de données thermiques incorrectement échantillonnées, les profils de phase exhibent quoi qu’il en soit un comportement caractéristique qui peut être utilisé pour l’extraction de la profondeur. La fréquence de borne apparente f’b, peut être définie comme la fréquence de borne évaluée à un seuil de phase donné φd et peut être utilisée en combinaison avec la définition de la phase pour une onde thermique : φ=z /μ, et le diamètre normalisé Dn=D/z, pour arriver à une expression alternative. L'extraction de la profondeur dans ce cas nécessite d'une étape additionnelle pour récupérer la taille du défaut.Pulsed Phase Thermography (PPT) is a NonDestructive Testing and Evaluation (NDT& E) technique based on the Fourier Transform that can be thought as being the link between Pulsed Thermography, for which data acquisition is fast and simple; and Lock-In thermography, for which depth retrieval is straightforward. A new depth inversion technique using the phase obtained by PPT is proposed. The technique relies on the thermal diffusion length equation, i.e. μ=(α /π·f)½, in a similar manner as in Lock-In Thermography. The inversion problem reduces to the estimation of the blind frequency, i.e. the limiting frequency at which a defect at a particular depth presents enough phase contrast to be detected on the frequency spectra. However, an additional problem arises in PPT when trying to adequately establish the temporal parameters that will produce the desired frequency response. The decaying thermal profiles such as the ones serving as input in PPT, are non-periodic, non-band-limited functions for which, adequate sampling Δt, and truncation w(t), parameters should be selected during the signal discretization process. These parameters are both function of the depth of the defect and of the thermal properties of the specimen/defect system. A four-step methodology based on the Time-Frequency Duality of the discrete Fourier Transform is proposed to interactively determine Δt and w(t). Hence, provided that thermal data used to feed the PPT algorithm is correctly sampled and truncated, the inversion solution using the phase takes the form: z=C 1 μ, for which typical experimental C 1 values are between 1.5 and 2. Although determination of fb is not possible when working with badly sampled data, phase profiles still present a distinctive behavior that can be used for depth retrieval purposes. An apparent blind frequency f’b , can be defined as the blind frequency at a given phase threshold φd , and be used in combination with the phase delay definition for a thermal wave: φ=z /μ, and the normalized diameter, Dn=D/z, to derive an alternative expression. Depth extraction in this case requires an additional step to recover the size of the defect.La Termografía de Fase Pulsada (TFP) es una técnica de Evaluación No-Destructiva basada en la Transformada de Fourier y que puede ser vista como el vínculo entre la Termografía Pulsada, en la cual la adquisición de datos se efectúa de manera rápida y sencilla, y la Termografía Modulada, en la que la extracción de la profundidad es directa. Un nuevo método de inversión de la profundidad por TFP es propuesto a partir de la ecuación de la longitud de difusión térmica: μ=(α /π·f)½. El problema de inversion se reduce entonces a la determinación de la frecuencia límite fb (frecuencia a la cual un defecto de profundidad determinada presenta un contraste de fase suficiente para ser detectado en el espectro de frecuencias). Sin embargo, las curvas de temperatura utilizadas como entrada en TFP, son señales no-periódicas y no limitadas en frecuencia para las cuales, los parámetros de muestreo Δt, y de truncamiento w(t), deben ser cuidadosamente seleccionados durante el proceso de discretización de la señal. Una metodología de cuatro etapas, basada en la Dualidad Tiempo-Frecuencia de la Transformada de Fourier discreta, ha sido desarrollada para la determinación interactiva de Δt y w(t), en función de la profundidad del defecto. Así, a condición que la información de temperatura sea correctamente muestreada y truncada, el problema de inversión de la profundidad por la fase toma la forma : z=C 1 μ, donde los valores experimentales de C 1 se sitúan típicamente entre 1.5 y 2. Si bien la determinación de fb no es posible en el caso de datos térmicos incorrectamente muestreados, los perfiles de fase exhiben de cualquier manera un comportamiento característico que puede ser utilizado para la extracción de la profundidad. La frecuencia límite aparente f’b , puede ser definida como la frecuencia límite evaluada en un umbral de fase dado φd , y puede utilizarse en combinación con la definición de la fase para una onda térmica: φ=z /μ, y el diámetro normalizado Dn , para derivar una expresión alternativa. La determinación de la profundidad en este caso, requiere de una etapa adicional para recuperar el tamaño del defecto

Real-time Digital Signal Processing for Software-defined Optical Transmitters and Receivers

A software-defined optical Tx is designed and demonstrated generating signals with various formats and pulse-shapes in real-time. Special pulse-shapes such as OFDM or Nyquist signaling were utilized resulting in a highly efficient usage of the available fiber channel bandwidth. This was achieved by parallel data processing with high-end FPGAs. Furthermore, highly efficient Rx algorithms for carrier and timing recovery as well as for polarization demultiplexing were developed and investigated

CMOS SPAD-based image sensor for single photon counting and time of flight imaging

The facility to capture the arrival of a single photon, is the fundamental limit to the detection of quantised electromagnetic radiation. An image sensor capable of capturing a picture with this ultimate optical and temporal precision is the pinnacle of photo-sensing. The creation of high spatial resolution, single photon sensitive, and time-resolved image sensors in complementary metal oxide semiconductor (CMOS) technology offers numerous benefits in a wide field of applications. These CMOS devices will be suitable to replace high sensitivity charge-coupled device (CCD) technology (electron-multiplied or electron bombarded) with significantly lower cost and comparable performance in low light or high speed scenarios. For example, with temporal resolution in the order of nano and picoseconds, detailed three-dimensional (3D) pictures can be formed by measuring the time of flight (TOF) of a light pulse. High frame rate imaging of single photons can yield new capabilities in super-resolution microscopy. Also, the imaging of quantum effects such as the entanglement of photons may be realised. The goal of this research project is the development of such an image sensor by exploiting single photon avalanche diodes (SPAD) in advanced imaging-specific 130nm front side illuminated (FSI) CMOS technology. SPADs have three key combined advantages over other imaging technologies: single photon sensitivity, picosecond temporal resolution and the facility to be integrated in standard CMOS technology. Analogue techniques are employed to create an efficient and compact imager that is scalable to mega-pixel arrays. A SPAD-based image sensor is described with 320 by 240 pixels at a pitch of 8μm and an optical efficiency or fill-factor of 26.8%. Each pixel comprises a SPAD with a hybrid analogue counting and memory circuit that makes novel use of a low-power charge transfer amplifier. Global shutter single photon counting images are captured. These exhibit photon shot noise limited statistics with unprecedented low input-referred noise at an equivalent of 0.06 electrons. The CMOS image sensor (CIS) trends of shrinking pixels, increasing array sizes, decreasing read noise, fast readout and oversampled image formation are projected towards the formation of binary single photon imagers or quanta image sensors (QIS). In a binary digital image capture mode, the image sensor offers a look-ahead to the properties and performance of future QISs with 20,000 binary frames per second readout with a bit error rate of 1.7 x 10-3. The bit density, or cumulative binary intensity, against exposure performance of this image sensor is in the shape of the famous Hurter and Driffield densitometry curves of photographic film. Oversampled time-gated binary image capture is demonstrated, capturing 3D TOF images with 3.8cm precision in a 60cm range

Single-Laser Multi-Terabit/s Systems

Optical communication systems carry the bulk of all data traffic worldwide. This book introduces multi-Terabit/s transmission systems and three key technologies for next generation networks. A software-defined multi-format transmitter, an optical comb source and an optical processing scheme for the fast Fourier transform for Tbit/s signals. Three world records demonstrate the potential: The first single laser 10 Tbit/s and 26 Tbit/s OFDM and the first 32.5 Tbit/s Nyquist WDM experiments

Single-Laser Multi-Terabit/s Systems

Optical communication systems carry the bulk of all data traffic worldwide. This book introduces multi-Terabit/s transmission systems and three key technologies for next generation networks. A software-defined multi-format transmitter, an optical comb source and an optical processing scheme for the fast Fourier transform for Tbit/s signals. Three world records demonstrate the potential: The first single laser 10 Tbit/s and 26 Tbit/s OFDM and the first 32.5 Tbit/s Nyquist WDM experiments

Modern Applications in Optics and Photonics: From Sensing and Analytics to Communication

Optics and photonics are among the key technologies of the 21st century, and offer potential for novel applications in areas such as sensing and spectroscopy, analytics, monitoring, biomedical imaging/diagnostics, and optical communication technology. The high degree of control over light fields, together with the capabilities of modern processing and integration technology, enables new optical measurement systems with enhanced functionality and sensitivity. They are attractive for a range of applications that were previously inaccessible. This Special Issue aims to provide an overview of some of the most advanced application areas in optics and photonics and indicate the broad potential for the future