Oscillation-based DFT for Second-order Bandpass OTA-C Filters

This document is the Accepted Manuscript version. Under embargo until 6 September 2018. The final publication is available at Springer via https://doi.org/10.1007/s00034-017-0648-9.This paper describes a design for testability technique for second-order bandpass operational transconductance amplifier and capacitor filters using an oscillation-based test topology. The oscillation-based test structure is a vectorless output test strategy easily extendable to built-in self-test. The proposed methodology converts filter under test into a quadrature oscillator using very simple techniques and measures the output frequency. Using feedback loops with nonlinear block, the filter-to-oscillator conversion techniques easily convert the bandpass OTA-C filter into an oscillator. With a minimum number of extra components, the proposed scheme requires a negligible area overhead. The validity of the proposed method has been verified using comparison between faulty and fault-free simulation results of Tow-Thomas and KHN OTA-C filters. Simulation results in 0.25μm CMOS technology show that the proposed oscillation-based test strategy for OTA-C filters is suitable for catastrophic and parametric faults testing and also effective in detecting single and multiple faults with high fault coverage.Peer reviewedFinal Accepted Versio

Design for testability of high-order OTA-C filters

Copyright © 2016 John Wiley & Sons, Ltd.A study of oscillation-based test for high-order Operational Transconductance Amplifier-C (OTA-C) filters is presented. The method is based on partition of a high-order filter into second-order filter functions. The opening Q-loop and adding positive feedback techniques are developed to convert the second-order filter section into a quadrature oscillator. These techniques are based on an open-loop configuration and an additional positive feedback configuration. Implementation of the two testability design methods for nth-order cascade, IFLF and leapfrog (LF) filters is presented, and the area overhead of the modified circuits is also discussed. The performances of the presented techniques are investigated. Fourth-order cascade, inverse follow-the-leader feedback (IFLF) and LF OTA-C filters were designed and simulated for analysis of fault coverage using the adding positive feedback method based on an analogue multiplexer. Simulation results show that the oscillation-based test method using positive feedback provides high fault coverage of around 97%, 96% and 95% for the cascade, IFLF and LF OTA-C filters, respectively. Copyright ÂPeer reviewe

Oscillation-Based Test Structure and Method for OTA-C Filters

“This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder." “Copyright IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.”This paper describes a design for testability technique for operational transconductance amplifier and capacitor filters using an oscillation-based test topology. The oscillation-based test structure is a vectorless output test strategy easily extendable to built-in self-test. The proposed methodology converts filter under test into a quadrature oscillator using very simple techniques and measures the output frequency. The oscillation frequency may be considered as a digital signal and it can be evaluated using digital circuitry therefore the test time is very small. These characteristics imply that the proposed method is very suitable for catastrophic and parametric faults testing and also effective in detecting single and multiple faults. The validity of the proposed method has been verified using comparison between faulty and fault-free simulation results of two integrator loop and Tow-Thomas filters. Simulation results in 0.25 mum CMOS technology show that the proposed oscillation-based test strategy for OTA-C filters has 87% fault coverage and with a minimum number of extra components, requires a negligible area overhead

A design for testability study on a high performance automatic gain control circuit.

A comprehensive testability study on a commercial automatic gain control circuit is presented which aims to identify design for testability (DfT) modifications to both reduce production test cost and improve test quality. A fault simulation strategy based on layout extracted faults has been used to support the study. The paper proposes a number of DfT modifications at the layout, schematic and system levels together with testability. Guidelines that may well have generic applicability. Proposals for using the modifications to achieve partial self test are made and estimates of achieved fault coverage and quality levels presente

System-level design and RF front-end implementation for a 3-10ghz multiband-ofdm ultrawideband receiver and built-in testing techniques for analog and rf integrated circuits

This work consists of two main parts: a) Design of a 3-10GHz UltraWideBand (UWB) Receiver and b) Built-In Testing Techniques (BIT) for Analog and RF circuits. The MultiBand OFDM (MB-OFDM) proposal for UWB communications has received significant attention for the implementation of very high data rate (up to 480Mb/s) wireless devices. A wideband LNA with a tunable notch filter, a downconversion quadrature mixer, and the overall radio system-level design are proposed for an 11-band 3.4-10.3GHz direct conversion receiver for MB-OFDM UWB implemented in a 0.25mm BiCMOS process. The packaged IC includes an RF front-end with interference rejection at 5.25GHz, a frequency synthesizer generating 11 carrier tones in quadrature with fast hopping, and a linear phase baseband section with 42dB of gain programmability. The receiver IC mounted on a FR-4 substrate provides a maximum gain of 67-78dB and NF of 5-10dB across all bands while consuming 114mA from a 2.5V supply. Two BIT techniques for analog and RF circuits are developed. The goal is to reduce the test cost by reducing the use of analog instrumentation. An integrated frequency response characterization system with a digital interface is proposed to test the magnitude and phase responses at different nodes of an analog circuit. A complete prototype in CMOS 0.35mm technology employs only 0.3mm2 of area. Its operation is demonstrated by performing frequency response measurements in a range of 1 to 130MHz on 2 analog filters integrated on the same chip. A very compact CMOS RF RMS Detector and a methodology for its use in the built-in measurement of the gain and 1dB compression point of RF circuits are proposed to address the problem of on-chip testing at RF frequencies. The proposed device generates a DC voltage proportional to the RMS voltage amplitude of an RF signal. A design in CMOS 0.35mm technology presents and input capacitance <15fF and occupies and area of 0.03mm2. The application of these two techniques in combination with a loop-back test architecture significantly enhances the testability of a wireless transceiver system

A built-in self-test technique for high speed analog-to-digital converters

Fundação para a Ciência e a Tecnologia (FCT) - PhD grant (SFRH/BD/62568/2009

Black hole spectroscopy by mode cleaning

We formulate a Bayesian framework to analyze ringdown gravitational waves from colliding binary black holes and test the no-hair theorem. The idea hinges on mode cleaning -- revealing subdominant oscillation modes by removing dominant ones using newly proposed ${\it rational~filters}$. By incorporating the filter into Bayesian inference, we construct a likelihood function that depends only on the mass and spin of the remnant black hole (no dependence on mode amplitudes and phases) and implement an efficient pipeline to constrain the remnant mass and spin without Markov chain Monte Carlo (MCMC). We test ringdown models by cleaning combinations of different modes and evaluating the consistency between the residual data and pure noise. The model evidence and Bayes factor are used to demonstrate the presence of a particular mode and to infer the mode starting time. In addition, we design a hybrid approach to estimate the remnant black hole properties exclusively from a single mode using MCMC after mode cleaning. We apply the framework to GW150914 and demonstrate more definitive evidence of the first overtone by cleaning the fundamental mode. This new framework provides a powerful tool for black hole spectroscopy in future gravitational-wave events

Biomimetic Based Applications

The interaction between cells, tissues and biomaterial surfaces are the highlights of the book "Biomimetic Based Applications". In this regard the effect of nanostructures and nanotopographies and their effect on the development of a new generation of biomaterials including advanced multifunctional scaffolds for tissue engineering are discussed. The 2 volumes contain articles that cover a wide spectrum of subject matter such as different aspects of the development of scaffolds and coatings with enhanced performance and bioactivity, including investigations of material surface-cell interactions

Design and debugging of multi-step analog to digital converters

With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. The trend of increasing integration level for integrated circuits has forced the A/D converter interface to reside on the same silicon in complex mixed-signal ICs containing mostly digital blocks for DSP and control. However, specifications of the converters in various applications emphasize high dynamic range and low spurious spectral performance. It is nontrivial to achieve this level of linearity in a monolithic environment where post-fabrication component trimming or calibration is cumbersome to implement for certain applications or/and for cost and manufacturability reasons. Additionally, as CMOS integrated circuits are accomplishing unprecedented integration levels, potential problems associated with device scaling – the short-channel effects – are also looming large as technology strides into the deep-submicron regime. The A/D conversion process involves sampling the applied analog input signal and quantizing it to its digital representation by comparing it to reference voltages before further signal processing in subsequent digital systems. Depending on how these functions are combined, different A/D converter architectures can be implemented with different requirements on each function. Practical realizations show the trend that to a first order, converter power is directly proportional to sampling rate. However, power dissipation required becomes nonlinear as the speed capabilities of a process technology are pushed to the limit. Pipeline and two-step/multi-step converters tend to be the most efficient at achieving a given resolution and sampling rate specification. This thesis is in a sense unique work as it covers the whole spectrum of design, test, debugging and calibration of multi-step A/D converters; it incorporates development of circuit techniques and algorithms to enhance the resolution and attainable sample rate of an A/D converter and to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover and compensate for the errors continuously. The power proficiency for high resolution of multi-step converter by combining parallelism and calibration and exploiting low-voltage circuit techniques is demonstrated with a 1.8 V, 12-bit, 80 MS/s, 100 mW analog to-digital converter fabricated in five-metal layers 0.18-µm CMOS process. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. Microscopic particles present in the manufacturing environment and slight variations in the parameters of manufacturing steps can all lead to the geometrical and electrical properties of an IC to deviate from those generated at the end of the design process. Those defects can cause various types of malfunctioning, depending on the IC topology and the nature of the defect. To relive the burden placed on IC design and manufacturing originated with ever-increasing costs associated with testing and debugging of complex mixed-signal electronic systems, several circuit techniques and algorithms are developed and incorporated in proposed ATPG, DfT and BIST methodologies. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. With the use of dedicated sensors, which exploit knowledge of the circuit structure and the specific defect mechanisms, the method described in this thesis facilitates early and fast identification of excessive process parameter variation effects. The expectation-maximization algorithm makes the estimation problem more tractable and also yields good estimates of the parameters for small sample sizes. To allow the test guidance with the information obtained through monitoring process variations implemented adjusted support vector machine classifier simultaneously minimize the empirical classification error and maximize the geometric margin. On a positive note, the use of digital enhancing calibration techniques reduces the need for expensive technologies with special fabrication steps. Indeed, the extra cost of digital processing is normally affordable as the use of submicron mixed signal technologies allows for efficient usage of silicon area even for relatively complex algorithms. Employed adaptive filtering algorithm for error estimation offers the small number of operations per iteration and does not require correlation function calculation nor matrix inversions. The presented foreground calibration algorithm does not need any dedicated test signal and does not require a part of the conversion time. It works continuously and with every signal applied to the A/D converter. The feasibility of the method for on-line and off-line debugging and calibration has been verified by experimental measurements from the silicon prototype fabricated in standard single poly, six metal 0.09-µm CMOS process

Oversampled analog-to-digital converter architectures based on pulse frequency modulation

Mención Internacional en el título de doctorThe purpose of this research work is providing new insights in the development of voltage-controlled oscillator based analog-to-digital converters (VCO-based ADCs). Time-encoding based ADCs have become of great interest to the designer community due to the possibility of implementing mostly digital circuits, which are well suited for current deep-submicron CMOS processes. Within this topic, VCO-based ADCs are one of the most promising candidates. VCO-based ADCs have typically been analyzed considering the output phase of the oscillator as a state variable, similar to the state variables considered in __ modulation loops. Although this assumption might take us to functional designs (as verified by literature), it does not take into account neither the oscillation parameters of the VCO nor the deterministic nature of quantization noise. To overcome this issue, we propose an interpretation of these type of systems based on the pulse frequency modulation (PFM) theory. This permits us to analytically calculate the quantization noise, in terms of the working parameters of the system. We also propose a linear model that applies to VCO-based systems. Thanks to it, we can determine the different error processes involved in the digitization of the input data, and the performance limitations which these processes direct to. A generic model for any order open-loop VCO-based ADCs is made based on the PFM theory. However, we will see that only the first-order case and a second order approximation can be implemented in practice. The PFM theory also allows us to propose novel approaches to both single-stage and multistage VCObased architectures. We describe open-loop architectures such as VCO-based architectures with digital precoding, PFM-based architectures that can be used as efficient ADCs or MASH architectures with optimal noise-transfer-function (NTF) zeros. We also make a first approach to the proposal and analysis of closed loop architectures. At the same time, we deal with one of the main limitations of VCOs (especially those built with ring oscillators), which is the non-linear voltage to- frequency relation. In this document, we describe two techniques mitigate this phenomenon. Firstly, we propose to use a pulse width modulator in front of the VCO. This way, there are only two possible oscillation states. Consequently, the oscillator works linearly. To validate the proposed technique, an experimental prototype was implemented in a 40-nm CMOS process. The chip showed noise problems that degraded the expected resolution, but allowed us to verify that the potential performance was close to the expected one. A potential signal-to-noise-distortion ratio (SNDR) equal to 56 dB was achieved in 20 MHz bandwidth, consuming 2.15 mW with an occupied area equal to 0.03 mm2. In comparison to other equivalent systems, the proposed architecture is simpler, while keeping similar power consumption and linearity properties. Secondly, we used a pulse frequency modulator to implement a second ADC. The proposed architecture is intrinsically linear and uses a digital delay line to increase the resolution of the converter. One experimental prototype was implemented in a 40-nm CMOS process using one of these architectures. Proper results were measured from this prototype. These results allowed us to verify that the PFM-based architecture could be used as an efficient ADC. The measured peak SNDR was equal to 53 dB in 20 MHz bandwidth, consuming 3.5 mW with an occupied area equal to 0.08 mm2. The architecture shows a great linearity, and in comparison to related work, it consumes less power and occupies similar area. In general, the theoretical analyses and the architectures proposed in the document are not restricted to any application. Nevertheless, in the case of the experimental chips, the specifications required for these converters were linked to communication applications (e.g. VDSL, VDSL2, or even G.fast), which means medium resolution (9-10 bits), high bandwidth (20 MHz), low power and low area.El propósito del trabajo presentado en este documento es aportar una nueva perspectiva para el diseño de convertidores analógico-digitales basados en osciladores controlados por tensión. Los convertidores analógico-digitales con codificación temporal han llamado la atención durante los últimos años de la comunidad de diseñadores debido a la posibilidad de implementarlos en su gran mayoría con circuitos digitales, los cuales son muy apropiados para los procesos de diseño manométricos. En este ámbito, los convertidores analógico-digitales basados en osciladores controlados por tensión son uno de los candidatos más prometedores. Los convertidores analógico-digitales basados en osciladores controlados por tensión han sido típicamente analizados considerando que la fase del oscilador es una variable de estado similar a las que se observan en los moduladores __. Aunque esta consideración puede llevarnos a diseños funcionales (como se puede apreciar en muchos artículos de la literatura), en ella no se tiene en cuenta ni los parámetros de oscilación ni la naturaleza determinística del ruido de cuantificación. Para solventar esta cuestión, en este documento se propone una interpretación alternativa de este tipo de sistemas haciendo uso de la teoría de la modulación por frecuencia de pulsos. Esto nos permite calcular de forma analítica las ecuaciones que modelan el ruido de cuantificación en función de los parámetros de oscilación. Se propone también un modelo lineal para el análisis de convertidores analógico-digitales basados en osciladores controlados por tensión. Este modelo permite determinar las diferentes fuentes de error que se producen durante el proceso de digitalización de los datos de entrada y las limitaciones que suponen. Un modelo genérico de convertidor de cualquier orden se propone con la ayuda de este modelo. Sin embargo, solo los casos de primer orden y una aproximación al caso de segundo orden se pueden implementar en la práctica. La teoría de la modulación por frecuencia de pulsos también permite nuevas perspectivas para la propuesta y el análisis tanto de arquitecturas de una sola etapa como de arquitecturas de varias etapas construidas con osciladores controlados por tensión. Se proponen y se describen arquitecturas en lazo abierto como son las basadas en osciladores controlador por tensión con moduladores digitales en la etapa de entrada, moduladores por frecuencia de pulsos que se utilizan como convertidores analógico-digitales eficientes o arquitecturas en cascada en las que se optimizan la distribución de los ceros en la función de transferencia del ruido. También se realiza una aproximación a la propuesta y el análisis de arquitecturas en lazo cerrado. Al mismo tiempo, se aborda una de las problemáticas más importantes de los osciladores controlados por tensión (especialmente en aquellos implementados mediante osciladores en anillo): la relación tensión-freculineal que presentan este tipo de circuitos. En el documento, se describen dos técnicas cuyo objetivo es mitigar esta limitación. La primera técnica de corrección se basa en el uso de un modulador por ancho de pulsos antes del oscilador controlado por tensión. De esta forma, solo existen dos estados de oscilación en el oscilador, se trabaja de forma lineal y no se genera distorsión en los datos de salida. La técnica se propone de forma teórica haciendo uso de la teoría desarrollada previamente. Para llevar a cabo la validación de la propuesta teórica se fabricó un prototipo experimental en un proceso CMOS de 40-nm. El chip mostró problemas de ruido que limitaban la resolución, sin embargo, nos permitió velicar que la resolución ideal que se podrá haber obtenido estaba muy cercana a la resolución esperada. Se obtuvo una potencial relación señal-(ruido-distorsión) igual a 56 dB en 20 MHz de ancho de banda, un consumo de 2.15 mW y un área igual a 0.03 mm2. En comparación con sistemas equivalentes, la arquitectura propuesta es más simple al mismo tiempo que se mantiene el consumo así como la linealidad. A continuación, se propone la implementación de un convertidor analógico digital mediante un modulador por frecuencia de pulsos. La arquitectura propuesta es intrínsecamente lineal y hace uso de una línea de retraso digital con el fin de mejorar la resolución del convertidor. Como parte del trabajo experimental, se fabricó otro chip en tecnología CMOS de 40 nm con dicha arquitectura, de la que se obtuvieron resultados notables. Estos resultados permitieron verificar que la arquitectura propuesta, en efecto, podrá emplearse como convertidor analógico-digital eficiente. La arquitectura consigue una relación real señal-(ruido-distorsión) igual a 53 dB en 20 MHz de ancho de banda, un consumo de 3.5 mW y un área igual a 0.08 mm2. Se obtiene una gran linealidad y, en comparación con arquitecturas equivalentes, el consumo es menor mientras que el área ocupada se mantiene similar. En general, las aportaciones propuestas en este documento se pueden aplicar a cualquier tipo de aplicación, independientemente de los requisitos de resolución, ancho de banda, consumo u área. Sin embargo, en el caso de los prototipos fabricados, las especificaciones se relacionan con el ámbito de las comunicaciones (VDSL, VDSL2, o incluso G.fast), en donde se requiere una resolución media (9-10 bits), alto ancho de banda (20 MHz), manteniendo bajo consumo y baja área ocupada.Programa Oficial de Doctorado en Ingeniería Eléctrica, Electrónica y AutomáticaPresidente: Michael Peter Kennedy.- Secretario: Antonio Jesús López Martín.- Vocal: Jörg Hauptman