383 research outputs found

    Circuit Techniques for Low-Power and Secure Internet-of-Things Systems

    Full text link
    The coming of Internet of Things (IoT) is expected to connect the physical world to the cyber world through ubiquitous sensors, actuators and computers. The nature of these applications demand long battery life and strong data security. To connect billions of things in the world, the hardware platform for IoT systems must be optimized towards low power consumption, high energy efficiency and low cost. With these constraints, the security of IoT systems become a even more difficult problem compared to that of computer systems. A new holistic system design considering both hardware and software implementations is demanded to face these new challenges. In this work, highly robust and low-cost true random number generators (TRNGs) and physically unclonable functions (PUFs) are designed and implemented as security primitives for secret key management in IoT systems. They provide three critical functions for crypto systems including runtime secret key generation, secure key storage and lightweight device authentication. To achieve robustness and simplicity, the concept of frequency collapse in multi-mode oscillator is proposed, which can effectively amplify the desired random variable in CMOS devices (i.e. process variation or noise) and provide a runtime monitor of the output quality. A TRNG with self-tuning loop to achieve robust operation across -40 to 120 degree Celsius and 0.6 to 1V variations, a TRNG that can be fully synthesized with only standard cells and commercial placement and routing tools, and a PUF with runtime filtering to achieve robust authentication, are designed based upon this concept and verified in several CMOS technology nodes. In addition, a 2-transistor sub-threshold amplifier based "weak" PUF is also presented for chip identification and key storage. This PUF achieves state-of-the-art 1.65% native unstable bit, 1.5fJ per bit energy efficiency, and 3.16% flipping bits across -40 to 120 degree Celsius range at the same time, while occupying only 553 feature size square area in 180nm CMOS. Secondly, the potential security threats of hardware Trojan is investigated and a new Trojan attack using analog behavior of digital processors is proposed as the first stealthy and controllable fabrication-time hardware attack. Hardware Trojan is an emerging concern about globalization of semiconductor supply chain, which can result in catastrophic attacks that are extremely difficult to find and protect against. Hardware Trojans proposed in previous works are based on either design-time code injection to hardware description language or fabrication-time modification of processing steps. There have been defenses developed for both types of attacks. A third type of attack that combines the benefits of logical stealthy and controllability in design-time attacks and physical "invisibility" is proposed in this work that crosses the analog and digital domains. The attack eludes activation by a diverse set of benchmarks and evades known defenses. Lastly, in addition to security-related circuits, physical sensors are also studied as fundamental building blocks of IoT systems in this work. Temperature sensing is one of the most desired functions for a wide range of IoT applications. A sub-threshold oscillator based digital temperature sensor utilizing the exponential temperature dependence of sub-threshold current is proposed and implemented. In 180nm CMOS, it achieves 0.22/0.19K inaccuracy and 73mK noise-limited resolution with only 8865 square micrometer additional area and 75nW extra power consumption to an existing IoT system.PHDElectrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttps://deepblue.lib.umich.edu/bitstream/2027.42/138779/1/kaiyuan_1.pd

    Proposal and Analysis of a Novel Class of PUFs Based on Galois Ring Oscillators

    Get PDF
    In this article, the possibility of using Galois ring oscillators to construct physically unclonable functions (PUFs) has been studied. The idea is to use novel PUF architectures, similar as the ring oscillator PUFs that, instead of comparing frequencies, compare the statistical bias of pairs of oscillators implemented in different locations. To study the viability of these systems, three different Galois oscillators have been implemented in several locations in several FPGAs and we have studied the main properties of their bias: repeatability, variability with the location, variability with the FPGA and spatial autocorrelation. Based on this study, we have determined that the bias of these oscillators meet the requirements that are needed to be used to construct a PUF. Finally, a PUF based on comparing the bias of neighboring 7-LUT Galois ring oscillators have been implemented and analyzed. The experimental results show that this PUF generates uniform responses that are highly reproducible and unique, making this PUF suitable for being used in identification applications

    Online Timing Slack Measurement and its Application in Field-Programmable Gate Arrays

    Get PDF
    Reliability, power consumption and timing performance are key concerns for today's integrated circuits. Measurement techniques capable of quantifying the timing characteristics of a circuit, while it is operating, facilitate a range of benefits. Delay variation due to environmental and operational conditions, and degradation can be monitored by tracking changes in timing performance. Using the measurements in a closed-loop to control power supply voltage or clock frequency allows for the reduction of timing safety margins, leading to improvements in power consumption or throughput performance through the exploitation of better-than worst-case operation. This thesis describes a novel online timing slack measurement method which can directly measure the timing performance of a circuit, accurately and with minimal overhead. Enhancements allow for the improvement of absolute accuracy and resolution. A compilation flow is reported that can automatically instrument arbitrary circuits on FPGAs with the measurement circuitry. On its own this measurement method is able to track the "health" of an integrated circuit, from commissioning through its lifetime, warning of impending failure or instigating pre-emptive degradation mitigation techniques. The use of the measurement method in a closed-loop dynamic voltage and frequency scaling scheme has been demonstrated, achieving significant improvements in power consumption and throughput performance.Open Acces

    A Multi-Gigahertz Analog Transient Recorder Integrated Circuit

    Full text link
    A monolithic multi-channel analog transient recorder, implemented using switched capacitor sample-and-hold circuits and a high-speed analogically-adjustable delay-line-based write clock, has been designed, fabricated and tested. The 2.1 by 6.9 mm layout, in 1.2 micron CMOS, includes over 31,000 transistors and 2048 double polysilicon capacitors. The circuit contains four parallel channels, each with a 512 deep switched-capacitor sample-and-hold system. A 512 deep edge sensitive tapped active delay line uses look-ahead and 16 way interleaving to develop the 512 sample and hold clocks, each as little as 3.2 ns wide and 200 ps apart. Measurements of the device have demonstrated 5 GHz maximum sample rate, at least 350 MHz bandwidth, an extrapolated rms aperture uncertainty per sample of 0.7 ps, and a signal to rms noise ratio of 2000:1.Comment: 64 pages, 17 figures. Thesis, University of California, Berkeley, 199

    Side-channel attacks and countermeasures in the design of secure IC's devices for cryptographic applications

    Get PDF
    Abstract--- A lot of devices which are daily used have to guarantee the retention of sensible data. Sensible data are ciphered by a secure key by which only the key holder can get the data. For this reason, to protect the cipher key against possible attacks becomes a main issue. The research activities in hardware cryptography are involved in finding new countermeasures against various attack scenarios and, in the same time, in studying new attack methodologies. During the PhD, three different logic families to counteract Power Analysis were presented and a novel class of attacks was studied. Moreover, two different activities related to Random Numbers Generators have been addressed

    Characterization of Interconnection Delays in FPGAS Due to Single Event Upsets and Mitigation

    Get PDF
    RÉSUMÉ L’utilisation incessante de composants électroniques à géométrie toujours plus faible a engendré de nouveaux défis au fil des ans. Par exemple, des semi-conducteurs à mémoire et à microprocesseur plus avancés sont utilisés dans les systèmes avioniques qui présentent une susceptibilité importante aux phénomènes de rayonnement cosmique. L'une des principales implications des rayons cosmiques, observée principalement dans les satellites en orbite, est l'effet d'événements singuliers (SEE). Le rayonnement atmosphérique suscite plusieurs préoccupations concernant la sécurité et la fiabilité de l'équipement avionique, en particulier pour les systèmes qui impliquent des réseaux de portes programmables (FPGA). Les FPGA à base de cellules de mémoire statique (SRAM) présentent une solution attrayante pour mettre en oeuvre des systèmes complexes dans le domaine de l’avionique. Les expériences de rayonnement réalisées sur les FPGA ont dévoilé la vulnérabilité de ces dispositifs contre un type particulier de SEE, à savoir, les événements singuliers de changement d’état (SEU). Un SEU est considérée comme le changement de l'état d'un élément bistable (c'est-à-dire, un bit-flip) dû à l'effet d'un ion, d'un proton ou d’un neutron énergétique. Cet effet est non destructif et peut être corrigé en réécrivant la partie de la SRAM affectée. Les changements de délai (DC) potentiels dus aux SEU affectant la mémoire de configuration de routage ont été récemment confirmés. Un des objectifs de cette thèse consiste à caractériser plus précisément les DC dans les FPGA causés par les SEU. Les DC observés expérimentalement sont présentés et la modélisation au niveau circuit de ces DC est proposée. Les circuits impliqués dans la propagation du délai sont validés en effectuant une modélisation précise des blocs internes à l'intérieur du FPGA et en exécutant des simulations. Les résultats montrent l’origine des DC qui sont en accord avec les mesures expérimentales de délais. Les modèles proposés au niveau circuit sont, aux meilleures de notre connaissance, le premier travail qui confirme et explique les délais combinatoires dans les FPGA. La conception d'un circuit moniteur de délai pour la détection des DC a été faite dans la deuxième partie de cette thèse. Ce moniteur permet de détecter un changement de délai sur les sections critiques du circuit et de prévenir les pannes de synchronisation engendrées par les SEU sans utiliser la redondance modulaire triple (TMR).----------ABSTRACT The unrelenting demand for electronic components with ever diminishing feature size have emerged new challenges over the years. Among them, more advanced memory and microprocessor semiconductors are being used in avionic systems that exhibit a substantial susceptibility to cosmic radiation phenomena. One of the main implications of cosmic rays, which was primarily observed in orbiting satellites, is single-event effect (SEE). Atmospheric radiation causes several concerns regarding the safety and reliability of avionics equipment, particularly for systems that involve field programmable gate arrays (FPGA). SRAM-based FPGAs, as an attractive solution to implement systems in aeronautic sector, are very susceptible to SEEs in particular Single Event Upset (SEU). An SEU is considered as the change of the state of a bistable element (i.e., bit-flip) due to the effect of an energetic ion or proton. This effect is non-destructive and may be fixed by rewriting the affected part. Sensitivity evaluation of SRAM-based FPGAs to a physical impact such as potential delay changes (DC) has not been addressed thus far in the literature. DCs induced by SEU can affect the functionality of the logic circuits by disturbing the race condition on critical paths. The objective of this thesis is toward the characterization of DCs in SRAM-based FPGAs due to transient ionizing radiation. The DCs observed experimentally are presented and the circuit-level modeling of those DCs is proposed. Circuits involved in delay propagation are reverse-engineered by performing precise modeling of internal blocks inside the FPGA and executing simulations. The results show the root cause of DCs that are in good agreement with experimental delay measurements. The proposed circuit level models are, to the best of our knowledge, the first work on modeling of combinational delays in FPGAs.In addition, the design of a delay monitor circuit for DC detection is investigated in the second part of this thesis. This monitor allowed to show experimentally cumulative DCs on interconnects in FPGA. To this end, by avoiding the use of triple modular redundancy (TMR), a mitigation technique for DCs is proposed and the system downtime is minimized. A method is also proposed to decrease the clock frequency after DC detection without interrupting the process

    MOS CURRENT MODE LOGIC (MCML) ANALYSIS FOR QUIET DIGITAL CIRCUITRY AND CREATION OF A STANDARD CELL LIBRARY FOR REDUCING THE DEVELOPMENT TIME OF MIXED-SIGNAL CHIPS

    Get PDF
    Many modern digital systems use forms of CMOS logical implementation due to the straight forward design nature of CMOS logic and minimal device area since CMOS uses fewer transistors than other logic families. To achieve high-performance requirements in mixed-signal chip development and quiet, noiseless circuitry, this thesis provides an alternative toCMOSin the form of MOS Current Mode Logic (MCML). MCML dissipates constant current and does not produce noise during value changing in a circuit CMOS circuits do. CMOS logical networks switch during clock ticks and with every device switching, noise is created on the supply and ground to deal with the transitions. Creating a noiseless standard cell library with MCML allows use of circuitry that uses low voltage switching with 1.5V between logic levels in a quiet or mixed-signal environment as opposed to the full rail to rail swinging of CMOS logic. This allows cohesive implementation with analog circuitry on the same chip due to constant current and lower switching ranges not creating rail noise during digital switching. Standard cells allow for the Cadence tools to automatically generate circuits and Cadence serves as the development platform for the MCML standard cells. The theory surrounding MCML is examined along with current and future applications well-suited for MCML are researched and explored with the goal of highlighting valid candidate circuits for MCML. Inverters and NAND gates with varying current drives are developed to meet these specialized goals and are simulated to prove viability for quiet, mixed-signal applications. Analysis and results show that MCML is a superior implementation choice compared toCMOSfor high speed and mixed signal applications due to frequency independent power dissipation and lack of generated noise during operation. Noise results show rail current deviations of 50nA to 300nA during switching over an average operating current of 20µA to 80µA respectively. The multiple order of magnitude difference between noise and signal allow the MCML cells to dissipate constant power and thus perform with no noise added to a system. Additional simulated results of a 31-stage ring oscillator result in a frequency for MCML of 1.57GHz simulated versus the 150.35MHz that MOSIS tested on a fabricated 31-stage CMOS oscillator. The layouts designed for the standard cell library conform to existing On Semiconductor ami06 technology dimensions and allow for design of any logical function to be fabricated. The I/O signals of each cell operate at the same input and output voltage swings which allow seamless integration with each other for implementation in any logical configuration

    The Fifth NASA Symposium on VLSI Design

    Get PDF
    The fifth annual NASA Symposium on VLSI Design had 13 sessions including Radiation Effects, Architectures, Mixed Signal, Design Techniques, Fault Testing, Synthesis, Signal Processing, and other Featured Presentations. The symposium provides insights into developments in VLSI and digital systems which can be used to increase data systems performance. The presentations share insights into next generation advances that will serve as a basis for future VLSI design

    Radiation Tolerant Electronics, Volume II

    Get PDF
    Research on radiation tolerant electronics has increased rapidly over the last few years, resulting in many interesting approaches to model radiation effects and design radiation hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation hardened electronics for space applications, high-energy physics experiments such as those on the large hadron collider at CERN, and many terrestrial nuclear applications, including nuclear energy and safety management. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their ionizing radiation susceptibility has raised many exciting challenges, which are expected to drive research in the coming decade.After the success of the first Special Issue on Radiation Tolerant Electronics, the current Special Issue features thirteen articles highlighting recent breakthroughs in radiation tolerant integrated circuit design, fault tolerance in FPGAs, radiation effects in semiconductor materials and advanced IC technologies and modelling of radiation effects

    Compact Modeling and Physical Design Automation of Inkjet-Printed Electronics Technology

    Get PDF
    • …
    corecore