Jitter and phase noise in ring oscillators

A companion analysis of clock jitter and phase noise of single-ended and differential ring oscillators is presented. The impulse sensitivity functions are used to derive expressions for the jitter and phase noise of ring oscillators. The effect of the number of stages, power dissipation, frequency of oscillation, and short-channel effects on the jitter and phase noise of ring oscillators is analyzed. Jitter and phase noise due to substrate and supply noise is discussed, and the effect of symmetry on the upconversion of 1/f noise is demonstrated. Several new design insights are given for low jitter/phase-noise design. Good agreement between theory and measurements is observed

Low-Cost On-Chip Clock Jitter Measurement Scheme

In this paper, we present a low-cost, on-chip clock jitter digital measurement scheme for high performance microprocessors. It enables in situ jitter measurement during the test or debug phase. It provides very high measurement resolution and accuracy, despite the possible presence of power supply noise (representing a major source of clock jitter), at low area and power costs. The achieved resolution is scalable with technology node and can in principle be increased as much as desired, at low additional costs in terms of area overhead and power consumption. We show that, for the case of high performance microprocessors employing ring oscillators (ROs) to measure process parameter variations (PPVs), our jitter measurement scheme can be implemented by reusing part of such ROs, thus allowing to measure clock jitter with a very limited cost increase compared with PPV measurement only, and with no impact on parameter variation measurement resolution

Design of a Digital Temperature Sensor based on Thermal Diffusivity in a Nanoscale CMOS Technology

Temperature sensors are widely used in microprocessors to monitor on-chip temperature gradients and hot-spots, which are known to negatively impact reliability. Such sensors should be small to facilitate floor planning, fast to track millisecond thermal transients, and easy to trim to reduce the associated costs. Recently, it has been shown that thermal diffusivity (TD) sensors can meet these requirements. These sensors operate by digitalizing the temperature-dependent delay associated with the diffusion of heat pulses through an electro-thermal filter (ETF), which, in standard CMOS, can be readily implemented as a resistive heater surrounded by a thermopile. Unlike BJT-based temperature sensors, their accuracy actually improves with CMOS scaling, since it is mainly limited by the accuracy of the heather/thermopile spacing. In this work is presented the electrical design of an highly digital TD sensor in 0.13 µm CMOS with an accuracy better than 1 ºC resolution at with 1 kS/s sampling rate, and which compares favourably to state-of-the-art sensors with similar accuracy and sampling rates [1][2][3][4]. This advance is mainly enabled by the adoption of a highly digital CCO-based phasedomain ΔΣ ADC. The TD sensor presented consists of an ETF, a transconductance stage, a current-controlled oscillator (CCO) and a 6 bit digital counter. In order to be easily ported to nanoscale CMOS technologies, it is proposed to use a sigmadelta modulator based on a CCO as an alternative to traditional modulators. And since 70% of the sensor’s area is occupied by digital circuitry, porting the sensor to latest CMOS technologies process should reduce substantially the occupied die area, and thus reduce significantly the total sensor area

Exploration of Ring Oscillator Based Temperature Sensors Network Accuracy on FPGA

During the last decades, technology scaling in reconfigurable logic devices enabled implementing complicated designs which results in higher power density and on-chip temperature. Since higher operating temperature of chips is a critical problem in electronics devices, thermal management techniques are highly required. To provide a thermal map of reconfigurable logic devices, a network of sensors is needed. In this work, a ring-oscillator-based temperature sensor is used to create a sensor network. Then, a design space exploration is done among several sensor networks with the various sensor configurations including different ring oscillator length, the number of sensors in the examined network and various sampling time. We propose three criteria for exploring and comparing the efficiency of sensors network based on the thermal overhead and also measurement accuracy and precision among plenty of configurations on the Virtex-6 FPGA

Low jitter phase-locked loop clock synthesis with wide locking range

The fast growing demand of wireless and high speed data communications has driven efforts to increase the levels of integration in many communications applications. Phase noise and timing jitter are important design considerations for these communications applications. The desire for highly complex levels of integration using low cost CMOS technologies works against the minimization of timing jitter and phase noise for communications systems which employ a phase-locked loop for frequency and clock synthesis with on-chip VCO. This dictates an integrated CMOS implementation of the VCO with very low phase noise performance. The ring oscillator VCOs based on differential delay cell chains have been used successfully in communications applications, but thermal noise induced phase noise have to be minimized in order not to limit their applicability to some applications which impose stringent timing jitter and phase noise requirements on the PLL clock synthesizer. Obtaining lower timing jitter and phase noise at the PLL output also requires the minimization of noise in critical circuit design blocks as well as the optimization of the loop bandwidth of the PLL. In this dissertation the fundamental performance limits of CMOS PLL clock synthesizers based on ring oscillator VCOs are investigated. The effect of flicker and thermal noise in MOS transistors on timing jitter and phase noise are explored, with particular emphasis on source coupled NMOS differential delay cells with symmetric load elements. Several new circuit architectures are employed for the charge pump circuit and phase-frequency detector (PFD) to minimize the timing jitter due to the finite dead zone in the PFD and the current mismatch in the charge pump circuit. The selection of the optimum PLL loop bandwidth is critical in determining the phase noise performance at the PLL output. The optimum loop bandwidth and the phase noise performance of the PLL is determined using behavioral simulations. These results are compared with transistor level simulated results and experimental results for the PLL clock synthesizer fabricated in a 0.35 µm CMOS technology with good agreement. To demonstrate the proposed concept, a fully integrated CMOS PLL clock synthesizer utilizing integer-N frequency multiplier technique to synthesize several clock signals in the range of 20-400 MHz with low phase noise was designed. Implemented in a standard 0.35-µm N-well CMOS process technology, the PLL achieves a period jitter of 6.5-ps (rms) and 38-ps (peak-to-peak) at 216 MHz with a phase noise of -120 dBc/Hz at frequency offsets above 10 KHz. The specific research contributions of this work include (1) proposing, designing, and implementing a new charge pump circuit architecture that matches current levels and therefore minimizes one source of phase noise due to fluctuations in the control voltage of the VCO, (2) an improved phase-frequency detector architecture which has improved characteristics in lock condition, (3) an improved ring oscillator VCO with excellent thermal noise induced phase noise characteristics, (4) the application of selfbiased techniques together with fixed bias to CMOS low phase noise PLL clock synthesizer for digital video communications ,and (5) an analytical model that describes the phase noise performance of the proposed VCO and PLL clock synthesizer

High-speed communication circuits: voltage control oscillators and VCO-derived filters

Voltage Controlled Oscillators (VCO) and filters are the two main topics of focus in this dissertation.;A temperature and process compensated VCO, which is designed to operate at 2 GHz, and whose frequency variation due to incoming data is limited to 1% of its center frequency was presented. The test results show that, without process changes present, the frequency variation due to a temperature change over 0°C to 100°C is around 1.1% of its center frequency. This is a reduction of a factor of 10 when compared to the temperature variation of a conventional VCO.;A new method of designing continuous-time monolithic filters derived from well-known voltage controlled oscillators (VCOs) was introduced. These VCO-derived filters are capable of operating at very high frequencies in standard CMOS processes. Prototype low-pass and band-pass filters designed in a TSMC 0.25 mum process are discussed. Simulation results for the low-pass filter designed for a cutoff frequency of 4.3 GHz show a THD of -40 dB for a 200 mV peak-peak sinusoidal input. The band-pass filter has a resonant frequency programmable from 2.3 GHz to 3.1 GHz, a programmable Q from 3 to 85, and mid-band THD of -40 dB for an 80 mV peak-peak sinusoidal input signal.;A third contribution in this dissertation was the design of a new current mirror with accurate mirror gain for low beta bipolar transistors. High mirror gain accuracy is achieved by using a split-collector transistor to compensate for base currents of the source-coupled

A Unified Multibit PUF and TRNG based on Ring Oscillators for Secure IoT Devices

Physically Unclonable Functions (PUFs) and True Random Number Generators (TRNGs) are cryptographic primitives very well suited for secure IoT devices. This paper proposes a circuit, named multibit-RO-PUF-TRNG, which offers the advantages of unifying PUF and TRNG in the same design. It is based on counting the oscillations of pairs of ring oscillators (ROs), one of them acting as reference. Once the counter of the reference oscillator reaches a fixed value, the count value of the other RO is employed to provide the TRNG and the multibit PUF response. A mathematical model is presented that supports not only the circuit foundations but also a novel and simple calibration procedure that allows optimizing the selection of the design parameters. Experimental results are illustrated with large datasets from two families of FPGAs with different process nodes (90 nm and 28 nm). These results confirm that the proposed calibration provides TRNG and PUF responses with high quality. The raw TRNG bits do not need post-processing and the PUF bits (even 6 bits per RO) show very small aliasing. In the application context of obfuscating and reconstructing secrets generated by the TRNG, the multibit PUF response, together with the proposal of using error-correcting codes and RO selection adapted to each bit, provide savings of at least 79.38% of the ROs compared to using a unibit PUF without RO selection. The proposal has been implemented as an APB peripheral of a VexRiscv RV32I core to illustrate its use in a secure FPGA-based IoT device