25,343 research outputs found

    A Survey on Soft Subspace Clustering

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    Subspace clustering (SC) is a promising clustering technology to identify clusters based on their associations with subspaces in high dimensional spaces. SC can be classified into hard subspace clustering (HSC) and soft subspace clustering (SSC). While HSC algorithms have been extensively studied and well accepted by the scientific community, SSC algorithms are relatively new but gaining more attention in recent years due to better adaptability. In the paper, a comprehensive survey on existing SSC algorithms and the recent development are presented. The SSC algorithms are classified systematically into three main categories, namely, conventional SSC (CSSC), independent SSC (ISSC) and extended SSC (XSSC). The characteristics of these algorithms are highlighted and the potential future development of SSC is also discussed.Comment: This paper has been published in Information Sciences Journal in 201

    Deep Adaptive Feature Embedding with Local Sample Distributions for Person Re-identification

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    Person re-identification (re-id) aims to match pedestrians observed by disjoint camera views. It attracts increasing attention in computer vision due to its importance to surveillance system. To combat the major challenge of cross-view visual variations, deep embedding approaches are proposed by learning a compact feature space from images such that the Euclidean distances correspond to their cross-view similarity metric. However, the global Euclidean distance cannot faithfully characterize the ideal similarity in a complex visual feature space because features of pedestrian images exhibit unknown distributions due to large variations in poses, illumination and occlusion. Moreover, intra-personal training samples within a local range are robust to guide deep embedding against uncontrolled variations, which however, cannot be captured by a global Euclidean distance. In this paper, we study the problem of person re-id by proposing a novel sampling to mine suitable \textit{positives} (i.e. intra-class) within a local range to improve the deep embedding in the context of large intra-class variations. Our method is capable of learning a deep similarity metric adaptive to local sample structure by minimizing each sample's local distances while propagating through the relationship between samples to attain the whole intra-class minimization. To this end, a novel objective function is proposed to jointly optimize similarity metric learning, local positive mining and robust deep embedding. This yields local discriminations by selecting local-ranged positive samples, and the learned features are robust to dramatic intra-class variations. Experiments on benchmarks show state-of-the-art results achieved by our method.Comment: Published on Pattern Recognitio

    A Survey on Metric Learning for Feature Vectors and Structured Data

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    The need for appropriate ways to measure the distance or similarity between data is ubiquitous in machine learning, pattern recognition and data mining, but handcrafting such good metrics for specific problems is generally difficult. This has led to the emergence of metric learning, which aims at automatically learning a metric from data and has attracted a lot of interest in machine learning and related fields for the past ten years. This survey paper proposes a systematic review of the metric learning literature, highlighting the pros and cons of each approach. We pay particular attention to Mahalanobis distance metric learning, a well-studied and successful framework, but additionally present a wide range of methods that have recently emerged as powerful alternatives, including nonlinear metric learning, similarity learning and local metric learning. Recent trends and extensions, such as semi-supervised metric learning, metric learning for histogram data and the derivation of generalization guarantees, are also covered. Finally, this survey addresses metric learning for structured data, in particular edit distance learning, and attempts to give an overview of the remaining challenges in metric learning for the years to come.Comment: Technical report, 59 pages. Changes in v2: fixed typos and improved presentation. Changes in v3: fixed typos. Changes in v4: fixed typos and new method
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