Interconnect yield analysis and fault tolerance for field programmable gate arrays

Imperial Users onl

Spare parts planning and control for maintenance operations

This paper presents a framework for planning and control of the spare parts supply chain inorganizations that use and maintain high-value capital assets. Decisions in the framework aredecomposed hierarchically and interfaces are described. We provide relevant literature to aiddecision making and identify open research topics. The framework can be used to increasethe e¿ciency, consistency and sustainability of decisions on how to plan and control a spareparts supply chain. This point is illustrated by applying it in a case-study. Applicability of theframework in di¿erent environments is also investigated

Design Space Exploration and Resource Management of Multi/Many-Core Systems

The increasing demand of processing a higher number of applications and related data on computing platforms has resulted in reliance on multi-/many-core chips as they facilitate parallel processing. However, there is a desire for these platforms to be energy-efficient and reliable, and they need to perform secure computations for the interest of the whole community. This book provides perspectives on the aforementioned aspects from leading researchers in terms of state-of-the-art contributions and upcoming trends

Ultra Reliable Computing Systems

For high security and safety applications as well as general purpose applications, it is necessary to have ultra reliable computing systems. This dissertation describes our system of self-testable and self-repairable digital devices, especially, EPLDs (Electrically Programmable Logic Devices). In addition to significantly improving the reliability of digital systems, our self-healing and re-configurable system design with added repair capability can also provide higher yields, lower testing costs, and faster time-to-market for the semiconductor industry. The digital system in our approach is composed of blocks, which realize combinational and sequential circuits using GALs (Generic Array Logic Devices). We describe three techniques for fault-locating and fault-repairing in these devices. The methodology we used for evaluation of these methods and a comparison with devices that have no self-repair capability was simulation of the self-repair algorithms. Our simulations show that the lifetime for a GAL-based EPLD that uses our multiple self-repairing methods is longer than the lifetime of a GAL-based EPLD that uses a single self-repair method or no self-repair method. Specifically, our work demonstrates that the lifetime of a GAL can be increased by adding extra columns in the AND array of a GAL and extra output ORs in a GAL. It also gives information on how many extra columns and extra ORs a GAL needs and which self-repairing method should be used to guarantee a given lifetime. Thus, we can estimate an ideal point, where the maximum reliability can be reached with the minimum cost

Architecting Fail-Safe Supply Chains / Networks

Disruptions are large-scale stochastic events that rarely happen but have a major effect on supply networks’ topology. Some examples include: air traffic being suspended due to weather or terrorism, labor unions strike, sanctions imposed or lifted, company mergers, etc. Variations are small-scale stochastic events that frequently happen but only have a trivial effect on the efficiency of flow planning in supply networks. Some examples include: fluctuations in market demands (e.g. demand is always stochastic in competitive markets) and performance of production facilities (e.g. there is not any perfect production system in reality). A fail-safe supply network is one that mitigates the impact of variations and disruptions and provides an acceptable level of service. This is achieved by keeping connectivity in its topology against disruptions (structurally fail-safe) and coordinating the flow through the facilities against variations (operationally fail-safe). In this talk, I will show that to have a structurally fail-safe supply network, its topology should be robust against disruptions by positioning mitigation strategies and be resilient in executing these strategies. Considering “Flexibility” as a risk mitigation strategy, I answer the question “What are the best flexibility levels and flexibility speeds for facilities in structurally fail-safe supply networks?” Also, I will show that to have an operationally fail-safe supply network, its flow dynamics should be reliable against demand- and supply-side variations. In the presence of these variations, I answer the question “What is the most profitable flow dynamics throughout a supply network that is reliable against variations?” The method is verified using data from an engine maker. Findings include: i) there is a tradeoff between robustness and resilience in profit-based supply networks; ii) this tradeoff is more stable in larger supply networks with higher product supply quantities; and iii) supply networks with higher reliability in their flow planning require more flexibilities to be robust. Finally, I will touch upon possible extensions of the work into non-profit relief networks for disaster management

Techniques for the realization of ultra- reliable spaceborne computer Final report

Bibliography and new techniques for use of error correction and redundancy to improve reliability of spaceborne computer

Lifetime reliability of multi-core systems: modeling and applications.

Huang, Lin.Thesis (M.Phil.)--Chinese University of Hong Kong, 2011.Includes bibliographical references (leaves 218-232).Abstracts in English and Chinese.Abstract --- p.iAcknowledgement --- p.ivChapter 1 --- Introduction --- p.1Chapter 1.1 --- Preface --- p.1Chapter 1.2 --- Background --- p.5Chapter 1.3 --- Contributions --- p.6Chapter 1.3.1 --- Lifetime Reliability Modeling --- p.6Chapter 1.3.2 --- Simulation Framework --- p.7Chapter 1.3.3 --- Applications --- p.9Chapter 1.4 --- Thesis Outline --- p.10Chapter I --- Modeling --- p.12Chapter 2 --- Lifetime Reliability Modeling --- p.13Chapter 2.1 --- Notation --- p.13Chapter 2.2 --- Assumption --- p.16Chapter 2.3 --- Introduction --- p.16Chapter 2.4 --- Related Work --- p.19Chapter 2.5 --- System Model --- p.21Chapter 2.5.1 --- Reliability of A Surviving Component --- p.22Chapter 2.5.2 --- Reliability of a Hybrid k-out-of-n:G System --- p.26Chapter 2.6 --- Special Cases --- p.31Chapter 2.6.1 --- Case I: Gracefully Degrading System --- p.31Chapter 2.6.2 --- Case II: Standby Redundant System --- p.33Chapter 2.6.3 --- Case III: l-out-of-3:G System with --- p.34Chapter 2.7 --- Numerical Results --- p.37Chapter 2.7.1 --- Experimental Setup --- p.37Chapter 2.7.2 --- Experimental Results and Discussion --- p.40Chapter 2.8 --- Conclusion --- p.43Chapter 2.9 --- Appendix --- p.44Chapter II --- Simulation Framework --- p.47Chapter 3 --- AgeSim: A Simulation Framework --- p.48Chapter 3.1 --- Introduction --- p.48Chapter 3.2 --- Preliminaries and Motivation --- p.51Chapter 3.2.1 --- Prior Work on Lifetime Reliability Analysis of Processor- Based Systems --- p.51Chapter 3.2.2 --- Motivation of This Work --- p.53Chapter 3.3 --- The Proposed Framework --- p.54Chapter 3.4 --- Aging Rate Calculation --- p.57Chapter 3.4.1 --- Lifetime Reliability Calculation --- p.58Chapter 3.4.2 --- Aging Rate Extraction --- p.60Chapter 3.4.3 --- Discussion on Representative Workload --- p.63Chapter 3.4.4 --- Numerical Validation --- p.65Chapter 3.4.5 --- Miscellaneous --- p.66Chapter 3.5 --- Lifetime Reliability Model for MPSoCs with Redundancy --- p.68Chapter 3.6 --- Case Studies --- p.70Chapter 3.6.1 --- Dynamic Voltage and Frequency Scaling --- p.71Chapter 3.6.2 --- Burst Task Arrival --- p.75Chapter 3.6.3 --- Task Allocation on Multi-Core Processors --- p.77Chapter 3.6.4 --- Timeout Policy on Multi-Core Processors with Gracefully Degrading Redundancy --- p.78Chapter 3.7 --- Conclusion --- p.79Chapter 4 --- Evaluating Redundancy Schemes --- p.83Chapter 4.1 --- Introduction --- p.83Chapter 4.2 --- Preliminaries and Motivation --- p.85Chapter 4.2.1 --- Failure Mechanisms --- p.85Chapter 4.2.2 --- Related Work and Motivation --- p.86Chapter 4.3 --- Proposed Analytical Model for the Lifetime Reliability of Proces- sor Cores --- p.88Chapter 4.3.1 --- "Impact of Temperature, Voltage, and Frequency" --- p.88Chapter 4.3.2 --- Impact of Workloads --- p.92Chapter 4.4 --- Lifetime Reliability Analysis for Multi-core Processors with Vari- ous Redundancy Schemes --- p.95Chapter 4.4.1 --- Gracefully Degrading System (GDS) --- p.95Chapter 4.4.2 --- Processor Rotation System (PRS) --- p.97Chapter 4.4.3 --- Standby Redundant System (SRS) --- p.98Chapter 4.4.4 --- Extension to Heterogeneous System --- p.99Chapter 4.5 --- Experimental Methodology --- p.101Chapter 4.5.1 --- Workload Description --- p.102Chapter 4.5.2 --- Temperature Distribution Extraction --- p.102Chapter 4.5.3 --- Reliability Factors --- p.103Chapter 4.6 --- Results and Discussions --- p.103Chapter 4.6.1 --- Wear-out Rate Computation --- p.103Chapter 4.6.2 --- Comparison on Lifetime Reliability --- p.105Chapter 4.6.3 --- Comparison on Performance --- p.110Chapter 4.6.4 --- Comparison on Expected Computation Amount --- p.112Chapter 4.7 --- Conclusion --- p.118Chapter III --- Applications --- p.119Chapter 5 --- Task Allocation and Scheduling for MPSoCs --- p.120Chapter 5.1 --- Introduction --- p.120Chapter 5.2 --- Prior Work and Motivation --- p.122Chapter 5.2.1 --- IC Lifetime Reliability --- p.122Chapter 5.2.2 --- Task Allocation and Scheduling for MPSoC Designs --- p.124Chapter 5.3 --- Proposed Task Allocation and Scheduling Strategy --- p.126Chapter 5.3.1 --- Problem Definition --- p.126Chapter 5.3.2 --- Solution Representation --- p.128Chapter 5.3.3 --- Cost Function --- p.129Chapter 5.3.4 --- Simulated Annealing Process --- p.130Chapter 5.4 --- Lifetime Reliability Computation for MPSoC Embedded Systems --- p.133Chapter 5.5 --- Efficient MPSoC Lifetime Approximation --- p.138Chapter 5.5.1 --- Speedup Technique I - Multiple Periods --- p.139Chapter 5.5.2 --- Speedup Technique II - Steady Temperature --- p.139Chapter 5.5.3 --- Speedup Technique III - Temperature Pre- calculation --- p.140Chapter 5.5.4 --- Speedup Technique IV - Time Slot Quantity Control --- p.144Chapter 5.6 --- Experimental Results --- p.144Chapter 5.6.1 --- Experimental Setup --- p.144Chapter 5.6.2 --- Results and Discussion --- p.146Chapter 5.7 --- Conclusion and Future Work --- p.152Chapter 6 --- Energy-Efficient Task Allocation and Scheduling --- p.154Chapter 6.1 --- Introduction --- p.154Chapter 6.2 --- Preliminaries and Problem Formulation --- p.157Chapter 6.2.1 --- Related Work --- p.157Chapter 6.2.2 --- Problem Formulation --- p.159Chapter 6.3 --- Analytical Models --- p.160Chapter 6.3.1 --- Performance and Energy Models for DVS-Enabled Pro- cessors --- p.160Chapter 6.3.2 --- Lifetime Reliability Model --- p.163Chapter 6.4 --- Proposed Algorithm for Single-Mode Embedded Systems --- p.165Chapter 6.4.1 --- Task Allocation and Scheduling --- p.165Chapter 6.4.2 --- Voltage Assignment for DVS-Enabled Processors --- p.168Chapter 6.5 --- Proposed Algorithm for Multi-Mode Embedded Systems --- p.169Chapter 6.5.1 --- Feasible Solution Set --- p.169Chapter 6.5.2 --- Searching Procedure for a Single Mode --- p.171Chapter 6.5.3 --- Feasible Solution Set Identification --- p.171Chapter 6.5.4 --- Multi-Mode Combination --- p.177Chapter 6.6 --- Experimental Results --- p.178Chapter 6.6.1 --- Experimental Setup --- p.178Chapter 6.6.2 --- Case Study --- p.180Chapter 6.6.3 --- Sensitivity Analysis --- p.181Chapter 6.6.4 --- Extensive Results --- p.183Chapter 6.7 --- Conclusion --- p.185Chapter 7 --- Customer-Aware Task Allocation and Scheduling --- p.186Chapter 7.1 --- Introduction --- p.186Chapter 7.2 --- Prior Work and Problem Formulation --- p.188Chapter 7.2.1 --- Related Work and Motivation --- p.188Chapter 7.2.2 --- Problem Formulation --- p.191Chapter 7.3 --- Proposed Design-Stage Task Allocation and Scheduling --- p.192Chapter 7.3.1 --- Solution Representation and Moves --- p.193Chapter 7.3.2 --- Cost Function --- p.196Chapter 7.3.3 --- Impact of DVFS --- p.198Chapter 7.4 --- Proposed Algorithm for Online Adjustment --- p.200Chapter 7.4.1 --- Reliability Requirement for Online Adjustment --- p.201Chapter 7.4.2 --- Analytical Model --- p.203Chapter 7.4.3 --- Overall Flow --- p.204Chapter 7.5 --- Experimental Results --- p.205Chapter 7.5.1 --- Experimental Setup --- p.205Chapter 7.5.2 --- Results and Discussion --- p.207Chapter 7.6 --- Conclusion --- p.211Chapter 7.7 --- Appendix --- p.211Chapter 8 --- Conclusion and Future Work --- p.214Chapter 8.1 --- Conclusion --- p.214Chapter 8.2 --- Future Work --- p.215Bibliography --- p.23