Radiation Hardened by Design Methodologies for Soft-Error Mitigated Digital Architectures

abstract: Digital architectures for data encryption, processing, clock synthesis, data transfer, etc. are susceptible to radiation induced soft errors due to charge collection in complementary metal oxide semiconductor (CMOS) integrated circuits (ICs). Radiation hardening by design (RHBD) techniques such as double modular redundancy (DMR) and triple modular redundancy (TMR) are used for error detection and correction respectively in such architectures. Multiple node charge collection (MNCC) causes domain crossing errors (DCE) which can render the redundancy ineffectual. This dissertation describes techniques to ensure DCE mitigation with statistical confidence for various designs. Both sequential and combinatorial logic are separated using these custom and computer aided design (CAD) methodologies. Radiation vulnerability and design overhead are studied on VLSI sub-systems including an advanced encryption standard (AES) which is DCE mitigated using module level coarse separation on a 90-nm process with 99.999% DCE mitigation. A radiation hardened microprocessor (HERMES2) is implemented in both 90-nm and 55-nm technologies with an interleaved separation methodology with 99.99% DCE mitigation while achieving 4.9% increased cell density, 28.5 % reduced routing and 5.6% reduced power dissipation over the module fences implementation. A DMR register-file (RF) is implemented in 55 nm process and used in the HERMES2 microprocessor. The RF array custom design and the decoders APR designed are explored with a focus on design cycle time. Quality of results (QOR) is studied from power, performance, area and reliability (PPAR) perspective to ascertain the improvement over other design techniques. A radiation hardened all-digital multiplying pulsed digital delay line (DDL) is designed for double data rate (DDR2/3) applications for data eye centering during high speed off-chip data transfer. The effect of noise, radiation particle strikes and statistical variation on the designed DDL are studied in detail. The design achieves the best in class 22.4 ps peak-to-peak jitter, 100-850 MHz range at 14 pJ/cycle energy consumption. Vulnerability of the non-hardened design is characterized and portions of the redundant DDL are separated in custom and auto-place and route (APR). Thus, a range of designs for mission critical applications are implemented using methodologies proposed in this work and their potential PPAR benefits explored in detail.Dissertation/ThesisDoctoral Dissertation Electrical Engineering 201

A high-resolution time interpolator based on a delay locked loop and an RC delay line

An architecture for a time interpolation circuit with an rms error of ~25 ps has been developed in a 0.7- mu m CMOS technology. It is based on a delay locked loop (DLL) driven by a 160-MHz reference clock and a passive RC delay line controlled by an autocalibration circuit. Start-up calibration of the RC delay line is performed using code density tests (CDT). The very small temperature/voltage dependence of R and C parameters and the self calibrating DLL results in a low- power, high-resolution time interpolation circuit in a standard digital CMOS technology. (11 refs)

An Analog Multiphase Self-Calibrating DLL to Minimize the Effects of Process, Supply Voltage, and Temperature Variations

Delay locked loops have been found to be useful tools in such applications as computing, TDCs, and communications. These system can be found in space exploration vehicles and satellites, which operate in extreme environments. Unfortunately, in these environments supply voltage and temperature will not be constant, therefore they must be under consideration when designing a DLL. Furthermore, solar radiation in conjunction with the varying environmental aspects, could cause the delay locked loop to lose it locked state. Delay locked loops are inherently good at tracking these environmental aspects, but in order to do so, the voltage controlled delay line must exhibit a very large gain, which translates to a large capture range. Assuming charged particles hit a key node in the DLL (e.g. the control voltage), the DLL would lose lock and would have to recapture it. Depending on the severity of the uctuation, this relocking process could easily take on the order of many microseconds assuming the bandwidth was kept low to minimize jitter. To date, no delay locked loops have been published for extreme environment applications. In many other extreme environment circuits, calibration techniques have been applied to minimize the environmental effects. Whereas there have been multiple calibration methods published related to delay locked loops, none of them were intended for extreme environments. Furthermore, none of these methods are directly suitable for an analog multiphase delay locked loop. The self-calibrating DLL in this work includes an all digital calibration circuit, as well as a system transient monitor. The coarse calibration helps minimize global process, voltage, and temperature errors for an analog multiphase DLL. The system monitor is used to detect any transients that might cause the DLL to unlock, which could be used to allow the DLL to be recalibrated to the new environmental conditions. The presented measurement results will demonstrate that the DLL can be used in extreme environments such as space, or other extreme environment applications

Continuous-Time and Companding Digital Signal Processors Using Adaptivity and Asynchronous Techniques

The fully synchronous approach has been the norm for digital signal processors (DSPs) for many decades. Due to its simplicity, the classical DSP structure has been used in many applications. However, due to its rigid discrete-time operation, a classical DSP has limited efficiency or inadequate resolution for some emerging applications, such as processing of multimedia and biological signals. This thesis proposes fundamentally new approaches to designing DSPs, which are different from the classical scheme. The defining characteristic of all new DSPs examined in this thesis is the notion of "adaptivity" or "adaptability." Adaptive DSPs dynamically change their behavior to adjust to some property of their input stream, for example the rate of change of the input. This thesis presents both enhancements to existing adaptive DSPs, as well as new adaptive DSPs. The main class of DSPs that are examined throughout the thesis are continuous-time (CT) DSPs. CT DSPs are clock-less and event-driven; they naturally adapt their activity and power consumption to the rate of their inputs. The absence of a clock also provides a complete avoidance of aliasing in the frequency domain, hence improved signal fidelity. The core of this thesis deals with the complete and systematic design of a truly general-purpose CT DSP. A scalable design methodology for CT DSPs is presented. This leads to the main contribution of this thesis, namely a new CT DSP chip. This chip is the first general-purpose CT DSP chip, able to process many different classes of CT and synchronous signals. The chip has the property of handling various types of signals, i.e. various different digital modulations, both synchronous and asynchronous, without requiring any reconfiguration; such property is presented for the first time CT DSPs and is impossible for classical DSPs. As opposed to previous CT DSPs, which were limited to using only one type of digital format, and whose design was hard to scale for different bandwidths and bit-widths, this chip has a formal, robust and scalable design, due to the systematic usage of asynchronous design techniques. The second contribution of this thesis is a complete methodology to design adaptive delay lines. In particular, it is shown how to make the granularity, i.e. the number of stages, adaptive in a real-time delay line. Adaptive granularity brings about a significant improvement in the line's power consumption, up to 70% as reported by simulations on two design examples. This enhancement can have a direct large power impact on any CT DSP, since a delay line consumes the majority of a CT DSP's power. The robust methodology presented in this thesis allows safe dynamic reconfiguration of the line's granularity, on-the-fly and according to the input traffic. As a final contribution, the thesis also examines two additional DSPs: one operating the CT domain and one using the companding technique. The former operates only on level-crossing samples; the proposed methodology shows a potential for high-quality outputs by using a complex interpolation function. Finally, a companding DSP is presented for MPEG audio. Companding DSPs adapt their dynamic range to the amplitude of their input; the resulting can offer high-quality outputs even for small inputs. By applying companding to MPEG DSPs, it is shown how the DSP distortion can be made almost inaudible, without requiring complex arithmetic hardware

Formal Verification and In-Situ Test of Analog and Mixed-Signal Circuits

As CMOS technologies continuously scale down, designing robust analog and mixed-signal (AMS) circuits becomes increasingly difficult. Consequently, there are pressing needs for AMS design checking techniques, more specifically design verification and design for testability (DfT). The purpose of verification is to ensure that the performance of an AMS design meets its specification under process, voltage and temperature (PVT) variations and different working conditions, while DfT techniques aim at embedding testability into the design, by adding auxiliary circuitries for testing purpose. This dissertation focuses on improving the robustness of AMS designs in highly scaled technologies, by developing novel formal verification and in-situ test techniques. Compared with conventional AMS verification that relies more on heuristically chosen simulations, formal verification provides a mathematically rigorous way of checking the target design property. A formal verification framework is proposed that incorporates nonlinear SMT solving techniques and simulation exploration to efficiently verify the dynamic properties of AMS designs. A powerful Bayesian inference based technique is applied to dynamically tradeoff between the costs of simulation and nonlinear SMT. The feasibility and efficacy of the proposed methodology are demonstrated on the verification of lock time specification of a charge-pump PLL. The powerful and low-cost digital processing capabilities of today?s CMOS technologies are enabling many new in-situ test schemes in a mixed-signal environment. First, a novel two-level structure of GRO-PVDL is proposed for on-chip jitter testing of high-speed high-resolution applications with a gated ring oscillator (GRO) at the first level to provide a coarse measurement and a Vernier-style structure at the second level to further measure the residue from the first level with a fine resolution. With the feature of quantization noise shaping, an effective resolution of 0.8ps can be achieved using a 90nm CMOS technology. Second, the reconfigurability of recent all-digital PLL designs is exploited to provide in-situ output jitter test and diagnosis abilities under multiple parametric variations of key analog building blocks. As an extension, an in-situ test scheme is proposed to provide online testing for all-digital PLL based polar transmitters

Architectures and Circuits Leveraging Injection-Locked Oscillators for Ultra-Low Voltage Clock Synthesis and Reference-less Receivers for Dense Chip-to-Chip Communications

High performance computing is critical for the needs of scientific discovery and economic competitiveness. An extreme-scale computing system at 1000x the performance of today’s petaflop machines will exhibit massive parallelism on multiple vertical fronts, from thousands of computational units on a single processor to thousands of processors in a single data center. To facilitate such a massively-parallel extreme-scale computing, a key challenge is power. The challenge is not power associated with base computation but rather the problem of transporting data from one chip to another at high enough rates. This thesis presents architectures and techniques to achieve low power and area footprint while achieving high data rates in a dense very-short reach (VSR) chip-to-chip (C2C) communication network. High-speed serial communication operating at ultra-low supplies improves the energy-efficiency and lowers the power envelop of a system doing an exaflop of loops. One focus area of this thesis is clock synthesis for such energy-efficient interconnect applications operating at high speeds and ultra-low supplies. A sub-integer clockfrequency synthesizer is presented that incorporates a multi-phase injection-locked ring-oscillator-based prescaler for operation at an ultra-low supply voltage of 0.5V, phase-switching based programmable division for sub-integer clock-frequency synthesis, and automatic calibration to ensure injection lock. A record speed of 9GHz has been demonstrated at 0.5V in 45nm SOI CMOS. It consumes 3.5mW of power at 9.12GHz and 0.052 of area, while showing an output phase noise of -100dBc/Hz at 1MHz offset and RMS jitter of 325fs; it achieves a net of -186.5 in a 45-nm SOI CMOS process. This thesis also describes a receiver with a reference-less clocking architecture for high-density VSR-C2C links. This architecture simplifies clock-tree planning in dense extreme-scaling computing environments and has high-bandwidth CDR to enable SSC for suppressing EMI and to mitigate TX jitter requirements. It features clock-less DFE and a high-bandwidth CDR based on master-slave ILOs for phase generation/rotation. The RX is implemented in 14nm CMOS and characterized at 19Gb/s. It is 1.5x faster that previous reference-less embedded-oscillator based designs with greater than 100MHz jitter tolerance bandwidth and recovers error-free data over VSR-C2C channels. It achieves a power-efficiency of 2.9pJ/b while recovering error-free data (BER 200MHz and the INL of the ILO-based phase-rotator (32- Steps/UI) is <1-LSB. Lastly, this thesis develops a time-domain delay-based modeling of injection locking to describe injection-locking phenomena in nonharmonic oscillators. The model is used to predict the locking bandwidth, and the locking dynamics of the locked oscillator. The model predictions are verified against simulations and measurements of a four-stage differential ring oscillator. The model is further used to predict the injection-locking behavior of a single-ended CMOS inverter based ring oscillator, the lock range of a multi-phase injection-locked ring-oscillator-based prescaler, as well as the dynamics of tracking injection phase perturbations in injection-locked masterslave oscillators; demonstrating its versatility in application to any nonharmonic oscillator

Integration of a Digital Built-in Self-Test for On-Chip Memories

The ability of testing on-chip circuitry is extremely essential to ASIC implemen- tations today. However, providing functional tests and verification for on-chip (embedded) memories always poses a huge number of challenges to the designer. Therefore, a co-existing automated built-in self-test block with the Design Under Test (DUT) seems crucial to provide comprehensive, efficient and robust testing features. The target DUT of this thesis project is the state-of-the-arts Ultra Low Power (ULP) dual-port SRAMs designed in ASIC group of EIT department at Lund University. This thesis starts from system RTL modeling and verification from an earlier project, and then goes through ASIC design phase in 28 nm FD-SOI technology from ST-Microelectronics. All scripts during the ASIC design phase are developed in TCL. This design is implemented with multiple power domains (using CPF approach and introducing level-shifters at crossing-points between domains) and multiple clock sources in order to make it possible to perform various measurements with a high reliability on different flavours of a dual-port SRAM.This design is able to reduce dramatically the complexity of verification and measurement to integrated memories. This digital integrated circuit (IC) is developed as an application-specific IC (ASIC) chip for functional verification of integrated memories and measuring them in different aspects such as power consumption. The design is automated and capable of being reconfigured easily in terms of required actions and data for testing on-chip memories. Put it in other words, this design has automated and optimized the generation of what data to be stored on which location on memories as well as how they have been treated and interpreted later on. For instance, it refreshes and delivers different operation modes and working patterns to the entire test system in order to fully utilize integrated memories, of which such an automation is instructed by the stimuli to the chip. Besides, the pattern generation of the stimuli is implemented on MATLAB in an automated way. Due to constant advancements in chip manufacturing technology, more devices are squeezed into the same silicon area. Meaning that in order to monitor more internal signals introduced by the increased complexity of the circuits, more dedicated input/output ports (the physical interface between the chip internal signals and outside world) are required, that makes the chip bonding and testing in the future difficult and time-consuming. Additionally, memories usually have a bigger number of pins for signal reactions than other circuit blocks do, the method of dealing with so many pins should also be taken into account. Thus, a few techniques are adopted in this system to assist the designers deal with all mentioned issues. Once the ASIC chip has been fabricated (manufactured) and bonded, the on-chip memories can be tested directly on a printed circuit board in a simple and flexible way: Once test instruction input is loaded into the chip, the system starts to update the system settings and then to generate the internal configurations(parameters) so that all different operations, modes or instructions related to memory testing are automatically processed

Jitter measurement built-in self-test circuit for phase locked loops

Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2005.Includes bibliographical references (p. 77-79).This paper discusses the development of a new type of BIST circuit, the (VDL)2, with the purpose of measuring jitter in IBM's phase locked loops. The (VDL)2, which stands for Variable Vernier Digital Delay Locked Line, implements both cycle-to-cycle and phase jitter measurements, by using a digital delay locked loop and a 60 stage Vernier delay line. This achieves a nominal jitter resolution of 10 ps with a capture range of +/- 150 ps and does so in real time. The proposed application for this circuit is during manufacturing test of the PLL. The circuit is implemented in IBM's 90 nm process and was completed in the PLL and Clocking Development ASIC group at IBM Microelectronics in Essex Junction, Vermont as part of the VI-A program.by Brandon Ray Kam.M.Eng